Net
Link transmissions in communication systems.
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Product
Multi-Channel 1553 Interface for PCI Express 4 Lane Systems
PCIE4L-1553
Interface Card
Alta Data Technologies’ PCIE4L-1553 interface module is a multi-channel (1-4), ½ size, 4 Lane PCI Express 1553 card supported by the latest software technologies. The PCI Express card is based on the industry’s most advanced 32-bit 1553 FPGA protocol engine, AltaCore™, and by a feature-rich application programming interface, AltaAPI™, which is a multi-layer ANSI C and Windows .NET (MSVS 2005/08/10 C++, C#, VB .NET) architecture. This hardware and software package provides increased system performance and reduces integration time.
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Unit Testing & Mocking Solution for .NET
Isolate
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Part of Typemock Isolator,The Complete Unit Testing & Mocking Solution for .NET From mocking to coverage to automated test suggestions
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Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test
GATS-3200
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* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
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Power Monitor
ACScout-NETBB
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The ACScout-NETBB adds a battery backup to everything ACScout NET already does. Now your monitored power data is logged and backed up using the battery. The ACScout is still a highly reliable, easy-to-use AC power monitor that plugs into an electrical outlet. It records surges, outages and variations in voltage and frequency as well as ambient temperature and can now backup all data logged with help of a new battery.
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Product
Drop Weight Impact Testing Machine
DWTT Series
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Jinan Testing Equipment IE Corporation
DWTT Drop Weight Impact Testing System is suitable for drop weight tear test of various kinds of ferrite, especially for the test of DWTT for pipeline steel as ASTM-E 436, API-RP 5L3, ASTM-E 208 and DIN EN 10274. DWTT has integrated mechanical, electrical, and automatic control technology, and achieved full automation of feeding, hammer lifting impact, and fracture specimen collection. The load frame has a four-column design, features in stable supporting structure, rigid, dual sliding rails. The Drop Weight Drop Weight Tester is equipped with positioning mechanism, anti-dumping mechanism, safety mechanism, hydraulic buffer devices and security guard net. The impact energy is determined by the lifting height and configuration of different net weights. DWTT Drop Weight Impact Testing System is the essential quality control equipment for pipeline manufacturers, steel mills, iron and steel enterprises, and is also widely used for research institutes.1. Buffer device is equipped to avoid the second impact and absorb the residual energy after breaking the specimen so as to prevent the weigher and anvil from destroying. The installation of safety mechanism, buffer device, and security guard net will effectively secure the testing machine and its operation to extend its life.2. Configuration of the specimen-feeding system, anti-second impact device, and specimen centering mechanism will guarantee a quick, accurate and reliable test.
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Product
Multi-Channel, Multi-Protocol 1553 and ARINC 1/2 Size PCIe 4-Lane Interface Card
PCIEC4L-MA4
Interface Module
Alta Data Technologies’ PCIEC4L-MA4 interface module is a multi-channel, multi-protocol 1553 and ARINC ½ size PCI Express 4 Lane interface card (PMC on 4 Lane PCI Express Carrier) is supported by the latest software technologies. The PCIEC4L card is based on the industry’s most advanced 32-bit FPGA protocol engine, AltaCore™, and by a feature-rich application programming interface, AltaAPI™, which is a multi-layer ANSI C and Windows .NET (MSVS 2005/08/10 C++, C#, VB .NET) architecture. This hardware and software package provides increased system performance and reduces integration time.
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MIL-STD-1553 A / B Test And Simulation PC / 104+ Module
PC104p-1553
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*Dual redundant*1, 2, 4 or 8 channels*Simultaneous bus controller, 31 remote terminals, bus monitor*Error entry and detection*FPGA based hardware architecture*Multi-level trigger for data acquisition and filtering*10 programmable, discrete I / O*IRIG-B timecode encoder / decoder with free-running mode*Real-time recording and physical bus playback*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, LabView Real-Time and other systems*Supports ARINC429 and ARINC 664 operations
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MIL-STD-1553 A / B Test And Simulation PCI Module
PCI-C1553
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*Dual redundant*1, 2 or 4 channels*Simultaneous bus controller, 31 remote terminals, bus monitor*Error entry and detection*FPGA based hardware architecture*Multi-level trigger for data acquisition and filtering*10 programmable, discrete I / O (up to 30V)*IRIG-B timecode encoder / decoder with free-running mode*Real-time recording and physical bus playback*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, LabView Real-Time and other systems
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LUCID Camera SDK
LUCID Arena
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Free software for Lucid cameras.Allows you to configure the camera as well as capture images.The following libraries are also available:- Arena C++ library- Arena C library- Arena .NET library- Arena Python library
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Design for Testability (DFT Test)
test
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Performance Profiler / Memory Leak Detector
GlowCode
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GlowCode is a complete real-time performance and memory profiler for Windows and .NET programmers who develop applications with C++, C#, or any .NET Framework-compliant language. GlowCode helps programmers optimize application performance, with tools to detect memory leaks and resource flaws, isolate performance bottlenecks, profile and tune code, trace real-time program execution, ensure code coverage, isolate boxing errors, identify excessive memory usage, and find hyperactive and loitering objects.
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MIL-STD-1553 A / B Test And Simulation VXIbus Module
VXI-1553
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*1, 2, 4 or 8 channels*Simultaneous bus controller, 31 remote terminals, bus monitor*Error entry and detection*FPGA based hardware architecture*Multi-level trigger for data acquisition and filtering*10 programmable, discrete I / O*IRIG-B timecode encoder / decoder with free-running mode*Real-time recording and physical bus playback*Supports: C, C ++, C # and .net*VISA based VXI Plug & Play driver*Optional twinax front end
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MIL-STD-1553 PCI Interface Card
PCI-1553
Interface Card
Alta Data Technologies’ PCI-1553 and PCIC-1553 (PMC on PCI carrier) interface modules are multi-channel (1-4) 1553 cards supported by the latest software technologies. These PCI cards are based on the industry’s most advanced 32-bit 1553 FPGA protocol engine, AltaCore™, and by a feature-rich application programming interface, AltaAPI™, which is a multi-layer ANSI C and Windows .NET 2.0 (MSVS 2005 C++, C#, VB .NET) architecture. This hardware and software package provides increased system performance and reduces integration time.
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New Link system Control and Image Capture Software
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New uncluttered and intuitive user interfaceLive display of current status for easy monitoringFull control of heating and cooling rate, limit and hold time of up to 100 rampsRow by Row control of Vacuum, Humidity, Tensile Force and Shear modes controllable and synchronised with TemperatureParameters of connected Linkam sensors displayed and stored - e.g. Vacuum, Humidity, Force, XY position and Pressure (dependent on connected stage type)Real Time chart of temperature and other measured parametersTrigger I/O for synchronisation with other equipmentTriggers recorded and plotted row by rowAutomatic setup of controls and parameter limits based on stage type connectedFull five point temperature calibrationUSB 2.0 to T96 and CSS450 ControllersOptional modules including Linkam Imaging Systems with high performance camerasIncludes .NET Components for easy integration into 3rd party applications e.g. LabViewNative 64 bit application
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C Series Voltage And Current Input Module
Current Input Module
The C Series Voltage and Current Input Module features up to 16 input channels with built-in noise rejection. You can use this module to combine the two most common inputs to reduce the overall number of modules you need in your measurement system.The C Series Voltage and Current Input Module includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.
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Toolbox.NET
Software for Data Exchange
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The Toolbox .NET provides firmware upgrade capabilities and data transfer stored in internal instrument memory to a PC. The Toolbox .NET is based on Microsoft .NET Framework 3.5 and will operate with the following Raytech products:
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Data Lake Analytics
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Easily develop and run massively parallel data transformation and processing programs in U-SQL, R, Python, and .NET over petabytes of data. With no infrastructure to manage, you can process data on demand, scale instantly, and only pay per job.
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Flying Probe Testers
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Flying probe test systems require no test fixturing, have few restrictions on board access, and can test boards with virtually unlimited number of nets. These systems also allow developers to complete test programs in a short time.
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Product
C Series Digital Module
Digital Input Module
The C Series Digital Module interacts with a range of industrial switches, transducers, and devices. Some modules include an LED per channel that indicates the state of the channel. It supports input, output, or a combination of digital lines, and they can interact with a variety of voltages and logic levels, so they are well-suited for a variety of benchtop and industrial environments. Additionally, the C Series Digital Module also offers isolation options and sinking or sourcing capabilities to add further protection to your digital I/O application. When you use the C Series Digital Module with CompactRIO, you can use LabVIEW FPGA to create custom high-speed counter/timers, digital communication protocols, pulse generation, and more.The C Series Digital Module includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.
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Temperature Input Device
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The Temperature Input Device is a thermocouple measurement device featuring InstantDAQ technology. InstantDAQ technology includes built-in software for viewing and logging data that automatically loads when you plug in the device, so you can instantly take temperature measurements with your PC. You can connect the Temperature Input Device to any USB port to use your PC as a display and monitor data in real time. The device is compatible with J, K, R, S, T, N, E, and B thermocouples.The Temperature Input Device includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.
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Functional Testing Services
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We manage an in-house team of testing specialists having sufficient experience to perform quality functional testing activities.ImpactQA exhibits cross-browser & cross-platform testing capabilities together with the latest interoperability testing methods to assess functionalities across multi-faceted systems.Unlike other functional testing services, our testing model is loaded with adaptable properties to perform white-box testing and functional testing of Java and .Net applications.
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Three-Phase Network Analyzer
NET VISION 2010
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NET VISION 2010 is a portable device designed for a quick and precise measurement of the electric values of a three-phase network. It is used by power engineers for check of AC motors, relay current protections, electricity meters, etc.
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C Series Temperature Input Module
Module
The C Series Temperature Input Module features up to 16 channels of temperature input from either thermocouples or RTDS. This module can include anti-aliasing filters, open-thermocouple detection, and cold-junction compensation. Additionally, the module also feature isolation for safety, noise immunity, and high common-mode voltage range.The C Series Temperature Input Module includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.
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Product
1149.6 Boundary Scan Feature, GTE 10.00p
K8213A
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Keysight’s Interconnect Plus Boundary Scan 1149.6 feature enables all the tools required to develop and execute this test method on the board under test. Compared to the 1149.1 standards, the 1149.6 standards define test methods for the boundary scan devices that are designed with AC coupled signals or differential nets needed for high-speed operations of the device.
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Product
Test & Measurement Services
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We specialize in the development of advanced automatic test applications based on NI TestStand.- Development of NI Test Stand test programs, with code modules in LabVIEW, LabWindows/CVI, Measurement Studio/.NET, C/C++, and ActiveX/COM- Integration of test and measurement instrumentation, switching, and UUT bus interfaces- Customization of step types, process models, operator interfaces, reports, and databases- Integration in the enterprise software infrastructure (XML data formats, databases, web applications, etc.)- Integration of the NI TestStand ATML Toolkit
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Product
High Speed Digital Analog
ITA
The Automatic Test Equipment is designed to provide R&D and the Production floor with a high quality, reliable and easy to use Test Station comprised of COTS equipment from industry leading instrument manufactures. The measurement switching has low thermal offset allowing for micro volt measurements. The switching also accommodates both stimulus and measurement up to 5 Amps. Also to provide High Speed and Static Digital Stimulus and Response that covers LVDS, 3.3V, TTL, CMOS and Industrial logic families. For Serial communications there are SPI, I2C, RS232/485, USB and Ethernet. The system has nine programmable DC power supplies that are capable of powering both the UUT and the UUT interface separately. The system can interface with a variety of UUT’s via an ITA. Each system comes with the Imperial Test Executive, National Instruments TestStand, CVI, LabView and .NET Runtime.
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Product
C Series Voltage Input Module
Module
The C Series Voltage Input Module helps you work with voltage measurement applications. This module features isolation to separate channels from each other, from COM, or from earth ground for safety, noise immunity, and high common-mode voltage range. The module features up to 100 V of overvoltage protection for errant signal connection or unexpected outputs to the individual channels. You can use included options such as configurable input ranges, output channels, various connectors, and enclosed or non-enclosed modules.The C Series Voltage Input Module includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.
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Test System
Series 201
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The 201.net is fully programmable to electrically test and ensure the integrity of discrete semiconductor devices. The system is modular in design with each stimulus module individually addressable for specific test requirements.
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Pickering Software Drivers and Applications
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We provide driver packages for LXI and PXI products offering seamless installation and support of all popular Programming languages such as C/C++, LabVIEW™, LabVIEW RT, .NET, VB, LabWindows/CVI, MATLAB®, Python, ATEasy, TestStand™, Veristand™ and Switch Executive™ (via the IVI driver).
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Product
Load Cell DIN Rail Signal Amplifier
LCD20
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Our intelligent strain gauge bridge amplifier is a compact, stackable microprocessor based unit specifically designed to control and monitor process applications. Flexible connection to most load cells, pressure or strain gauges over a wide range of sensitivities. The unit provides isolated current 4-20mA and voltage 0-10V analogue outputs and two digital inputs. Two set point relays can be configured to set thresholds such as net, gross, peak and valley. Powered from a wide ranging DC supply, the DIN rail amplifier is supplied with 2 part screw connectors for ease of installation.
