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IoT Developer Device
Thingsee One
Thingsee One is a smart developer device for Internet of Things (IoT) application and solution development. The device is designed for the easier and faster deployment of new IoT applications and services at a fraction of the current cost. Thanks to its robust structure, wide variety of fully programmable sensors and extensive cellular connectivity, Thingsee One is an ideal host for a multitude of different applications.
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Wireless System For Test And Measurement
TM400 Compact
The TM400 system was designed to provide the ideal link between calibrated test microphones and measurement equipment such as SIM®, SIA SMAART Live®, TEF® or other systems. By using a radio link, long cables can be eliminated thus saving time and providing opportunities for additional measurements to increase accuracy. The microphone can even be moved around in the venue while the audience is present – something that is impossible with a cabled measurement microphone.
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High-Voltage Test Device
PGK 70 HB
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PGK HB. There are hardly any other longer-lasting, more robust and cost-effective testing devices than the two-piece high-voltage test devices from the PGK HB series. They generate continuous adjustable test voltages with mains frequency or optionally DC with positive or negative polarity. The display instruments for current and voltage, the safety control unit and the regulating transformer for the voltage are integrated in the operating unit.* Testing of medium- and high-voltage cables* DC voltage testing of up to 70 kV output voltage with positive or negative polarity* AC voltage testing - up to 55 kV for switchgear, busbars and insulating elements* Easy-to-maintain 2-piece design
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Transducer Test System
TTS-030
For the generation of unique bond links the use of high-quality components is an essential precondition. Despite all care in the production of ultrasonic transducers again and again unexpected effects occur, which only manifest themselves in the use of those transducers and which also have the reason in the transducer itself.
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Resonant Testing System
Originally designed to precrack specimens for fracture mechanics, the current versions offer much more possibilities due to a modular concept:*Bending up to 160 Nm*Tension/Compression up to 8 kN*Torsion
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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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IoT & Sensor Network Devices
Multiple Access Communications Ltd.
For many years it has been technically possible to connect devices to the internet using cellular technology, but the relatively high cost of doing so has meant that it was only economic for high value devices. Today, with the emergence of a range of low-power, wide-area network (LPWAN) technologies it is possible to add connectivity to many millions of devices that only a few years ago would not have justified the cost. These LPWANs are fuelling a rapid growth in the Internet of Things (IoT) and enabling new applications that promise to revolutionise many aspects of life and work.
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System Devices for Radiomonitoring
Monitoring stations need auxiliary equipment to ensure optimal alignment and control of the antenna or antennas or to provide users with RF signal filtering functions close to the antenna, depending on requirements. Customers around the world use the innovative system devices for monitoring stations from Rohde & Schwarz to meet these requirements. These devices stand for performance, quality, flexible deployment options and a wide range of possible configurations, which is why they are an optimum solution for any radiomonitoring application when used in conjunction with the other products in the Rohde & Schwarz radiomonitoring and radiolocation portfolio.
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Optics Test Systems
WAS 160: Wedge Angle Sensor
Optik Elektronik Gerätetechnik GmbH
Portable measuring head for wedge errors and radius of curvature, eg of car windshields, airplanes and helicopters. It can be used for any other glass panes.
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Portable System for High-Boltage Solid Dielectrics Testing
HVTS-70/50
Portable system HVTS-70/50 is designed for carrying out high-voltage withstand testing of cable insulation and other solid dielectrics with DC (rectified) voltage up to 70 kV and AC voltage up to 50 kV RMS at industrial frequency (f = 50 Hz).
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Projectile Speed Measurement Test System
This test equipment will help manufacturers, trading standards, consumer bodies, CPSC, CPSIA laboratories and regulatory authorities to check that they meet the requirements of ASTM F963 - 08 Standard Consumer Safety Specification for Toy Safety and ISO 8124-1:2009 projectile Safety of Toys –Part 1:Safety aspects related to mechanical and physical properties. It may also be valuable for certain sports equipment and related tests.
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Electrical Circuits Control Device
ZET 452
ZET 452 is an automated module for electrical circuits parameters control that is used for electrical circuits impedance and insulation resistance monitoring in automated mode. The monitoring is performed in accordance with the set participation and without participation of an operator. ZET 452 allows to reduce the time necessary for verification procedure more than in 20 times if compared with the standard measurement instruments normally used for these purposes.
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Temperature Input Device
The Temperature Input Device is a thermocouple measurement device featuring InstantDAQ technology. InstantDAQ technology includes built-in software for viewing and logging data that automatically loads when you plug in the device, so you can instantly take temperature measurements with your PC. You can connect the Temperature Input Device to any USB port to use your PC as a display and monitor data in real time. The device is compatible with J, K, R, S, T, N, E, and B thermocouples.The Temperature Input Device includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.
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Millimeter Wave Control Devices
Ducommun millimeter wave products include various control devices for system integration. The CAE, CPS, CPD and CPM series control devices are discrete or MMIC based PIN diode attenuators and switches. The CAF, CAL, CAR and CPL series control devices are waveguide based mechanical tunable attenuators and phase shifters. These devices are offered to cover the frequency range from 18 GHz to 110 GHz.
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Automotive & Industrial Cycle Testing System
CV
The CV is Bitrode's economical cycle life test equipment for the network based line of battery laboratory equipment. Designed to work with VisuaLCN Lab Client software, the CV provides standard or fully customized charge, discharge and rest cycles for automotive and industrial batteries. The Model CV is also useful for reserve capacity and charge acceptance testing with recharge.
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Pneumatic Horizontal Shock Response Spectrum Test System
KRD15 series
KRD15 series is the state-of-the-art shock response spectrum tester that adopts compressed gas energy to provide impact energy, push the shock hammer to impact the resonance plate, and generate high energy shock. Comparing to traditional pendulum shock response spectrum tester, this machine has the advantages of high energy, stable performance, high reliability, good repeatability, easy adjustment, safety and environmental protection. It is mainly applied in the industries of aerospace, aviation and ships.
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Universal Testing Systems (Up To 300 KN)
6800 Series
Instron’s 6800 Series universal testing systems deliver high-performance mechanical testing up to 300 kN. Designed for precision and durability, these systems offer exceptional measurement accuracy (±0.5% down to 1/1000th of load cell capacity) and fast data acquisition rates up to 5 kHz. Ideal for tensile, compression, flexure, torsion, peel, lap shear, and many other test types, the 6800 Series provides the flexibility and control needed to handle everything from delicate specimens to high-strength materials, making it a trusted solution for demanding testing environments.
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PCIe® Gen5 NVMe SBExpress Test System
SBExpress-RM5
The SANBlaze SBExpress-RM5 is a complete turnkey PCIe® Gen5 NVMe SSD Drive validation test system. The SBExpress-RM5 feature set provides unique functions applicable to all aspects of a product lifecycle, from development and QA, to design validation and manufacturing test cycles. The ability to drive Gen5 NVMe SSDs with a wide range of configurable attributes provides engineers with a flexible, multi-controller supported validation test platform. Development, qualification, and certification test cycles can be highly automated, thus reducing overall test time, and rapidly surfacing errors and non-conformance.The SANBlaze SBExpress-RM5 hardware provides a rackmount chassis with sixteen dual or single port front-accessible drives.
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Accelerated Life Test Systems
Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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CCD Device Handlers
Exatron has been in a unique position to supply handling systems for the new CCD device market. Manufacturers of CCD devices came to Exatron when these devices were new, looking for custom handling applications, and Exatron responded by modifying its Model 3000B, 3000BL, 5000, 5080, and 8000 systems to accommodate CCD devices.
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Modular Test System
DMT
The DMT Tester is a modular test system that allows rapid measurement of electrical and non-electrical parameters of functional units. The system also allows basic ICT measurement with optional accessories. It is conceived as modular, with the possibility of integrating a wide range of own and external instruments. The DMT tester is controlled by its own SCADUS software.
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Device Finder
Device Finder is a cross-platform application from Hall Research to find HR's IP enabled products on the local network. The software runs on Windows, MAC and Linux. Software not only finds HR devices but also allows user to new assign IP address(static/dynamic) to found device. It also has an ability to find devices which are on the different Subnet/VLAN but are on the same local network (connected to the same router).
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Memory Test System
T5221
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Compression, Paper And Pulp Test Systems
From basic tension and compression testing to advanced materials testing
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Incircuit and Functional Test Systems
REINHARDT System- und Messelectronic GmbH
We offer test systems which vary in their expansion and can be used for different ranges of automatic testing.
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Standards Reference for Test Systems PXI Card
GX1034
The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system's source and measure baseband instrumentation resulting in simplified support / maintenance logistics and improved system availability.
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AC / DC Electronic Loads – Benchtop Testing to Automated Test Systems
Chroma Systems Solutions, Inc.
Chroma is the global leader in Electronic Load manufacturing. Chroma’s AC Electronic Loads are designed for testing uninterruptible power supplies(UPS), Off-Grid Inverters, AC sources, and other power devices such as switches, circuit breakers, fuses and connectors. Chroma’s DC Electronic Loads are used for power testing in all markets including automatic test systems, LED, power supply testing, battery testing, and fuel cell testing. Chroma loads can do it all including full current down to 0.4VDC, CZ mode, user defined waveforms, timing measurements, and 3 current ranges per load. Chroma’s electronic loads come standard with either USB or RS232 ports for control and can be configured for GPIB (IEEE-488) control as well.
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High Voltage DC Cable Test Systems
We can offer from ±18kVdc to ±30kVdc units which all have automatic earthing for discharging capacitive loads. They are designed to perform tests on installed cables and jointing systems.
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Lamp Cap Temperature Rise Test System
TMP-L
TMP-L is according to IEC60360-1998 and GB2512-2001 (Standard method of measurement of lamp cap temperature rise). It is used to test the working and environmental temperature as well as temperature-rise of the burner and lamp. It meets the requirement of IEC and GB Standards.
