Electron Spectroscopy for Chemical Analysis
determine the atomic composition of a surface.
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Town Gas Analysis
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Periodical monitoring of calorific values is necessary to ensure a stable supply of town gas. Since Shimadzu’s system GC is robust and designed for automated analysis, it is widely used for 24 hour/day online analysis in this field.
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Electronic Load System
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Electronic loads are required for testing fuel cells such as PEMFC, AFC, PAFC, MCFC, SOFC. These electronic loads are designed either in IGBT technology with power, current and voltage ranges according to specific requirements or in transistor technology. Electronic loads in IGBT technology are designed for high voltage ranges up to 900 V, current ranges up to 1000 A, and power ranges up to 480 kW.
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Bioacoustic Analysis and Experimentation
SIGNALtm
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Is the recognized standard in bioacoustic analysis for accuracy, flexibility, mathematical power and automation.
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IP / VoIP Analysis & Simulation
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GL offers high density Ethernet/IP tester variant which includes mTOP™ 1U/2U rack mount enclosures within which PacketExpert™ portable USB units are stacked to provide high density GigE ports form factor solution for testing GigE switches, routers and network conditions.
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Time Frequency Analysis Function
OS-0527
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This function can evaluate transient phenomena that were difficult to capture by FFT analysis, and display clearly time change of the frequency component while maintaining its frequency resolution . The OS-0527 is equipped with STFT (Short Time Fourier Transform) and Wavelet transform.
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Headspace Gas Analysis
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The headspace gas analyzer adopts a professional structure design and is equipped with a high-precision sensor, which can accurately and conveniently determine the content and mixing ratio of O2 and CO2 in hollow packaging containers such as sealed packaging bags, bottles and cans. The equipment is used for headspace gas analysis and detection of various sealed packaging bags, packaging containers, vials, ampoules and other products.
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Spectroscopy
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Engineered from the outset with “ease-of-use” in mind, every Andor Spectroscopy system features a combination of market leading detectors and spectral instruments, seamlessly controlled through Andor’s dedicated and intuitive Solis software platform. From configuration of these pre-aligned, pre-calibrated instruments to integration into each unique laboratory set-up, Andor Spectroscopy solutions allow researchers around the world to focus quickly on their own challenges.
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Raman Spectroscopy Analysis Laboratory
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Rocky Mountain Laboratories, Inc.
Raman is used to analyze organic and inorganic materials. Bulk and small particle materials can be analyzed. Raman microscopy allows for the identification of particle as small as 1 µm.
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On-line FT-NIR Analysis
MATRIX-F
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The advantages of real time, on-line FT-NIR analysis have been well established. However, conventional spectrometers can only be installed close to the process that they are monitoring, which makes the analyzer be exposed to a hostile environment, like drastic temperature changes and exposure to dust and dirt. Furthermore, the instrument needs to be positioned in hard-to-access and often Ex-protected area.
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Measuring and Analysis Software
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With over 10 years of experience, IVS-KA6000 PV Test IV software has been developed by Enli Technology. IVS-KA5000, the previous generation, has more than 500 users. IVS-KA6000 is evolved from IVS-KA5000 based on users’ feedback and experience. IVS-KA6000 can control a variety of SMUs and perform data collection of current and voltage based on setting parameters by users. The formulas and algorithms of IVS-KA6000 are …
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Real-Time Broadcast Analysis
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Mediaproxy provides a comprehensive suite of software-based analysis applications to help you attend to on-air issues quickly and resolve them efficiently. Employing the latest user interface technologies, complex analysis tasks are made easy and seamless, including your mobile devices.
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Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
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HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
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Signal Analysis
FFT Analysis
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The program FFT (Fast Fourier Transform) Analysis is used for narrow-band spectral processing of signals coming from the input channels of ADC modules and FFT spectrum analyzers (in real-time or recorded time realization view mode), as well as for viewing various spectral characteristics of signals.
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Analysis
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External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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Reservoir Analysis
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Reservoir Analysis Instruments determine the flow-related properties of the reservoir fluids and formation so that producers can optimize their production and recovery techniques.
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Optical Spectroscopy Software
Spekwin32
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One of this software''s main goals is the consistent display of spectra coming from different sources. At the moment, about 36 different spectral file types from commercially available spectrometer systems can be read. By using Copy&Paste via the clipboard, arbitrary data can also be introduced into Spekwin32 for fast visualization.
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Failure Analysis
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A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)
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Saturable Spectroscopy Laser Lock Module
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A compact, mechanically-robust laser frequency reference.
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Product
Electronic Loads
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PeakTech Prüf- und Messtechnik GmbH
Can be used for important test procedures in quality assurance as well as e.g. testing of power supplies and control units, batteries, fuel and solar cells. For precise load control for various purposes, this device offers load control according to constant voltage (CV), constant current (CC), constant load resistance (CR) or constant power (CP) with a highly precise resolution of 1mW, 1mV, 1mΩ and 1mA. The device also offers additional test modes, e.g. the battery test or the dynamic test. The PC interface and software offer the option of implementing freely programmable test sequences with data evaluation.
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Near-infrared Spectroscopy Evaluation Module
DLP® NIRscan™ Nano
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The DLP NIRscan Nano is a compact battery-operated evaluation module (EVM) for portable near-infrared spectroscopy solutions. Featuring the DLP2010NIR digital micromirror device (DMD), the NIRscan Nano supports Bluetooth low energy to enable mobile lab measurements for hand-held spectrometers.
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Particle Analysis for Liquids
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With our partner Pamas we have developed the microscopic image analysis system PAMAS FastPatch 2 GO for automatic membrane filter analysis.
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Programmable AC Electronic Load
63800
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Chroma Systems Solutions, Inc.
The Chroma 63800 Loads can simulate load conditions under high crest factor and varying power factors with real time compensation even when the voltage waveform is distorted. This special feature provides real world simulation capability and prevents overstressing resulting in reliable and unbiased test results.
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Electronic Crockmeter
TF411
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TESTEX Testing Equipment Systems Ltd.
Electronic Crockmeter, to determine the colour fastness of textiles to dry or wet rubbing. A pinned acrylic sample holder ensures rapid sample mounting and repeatability of results. Crockmeter Fitted with a pre-determined electronic counter for strokes up to 999,999 times.
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Surface Analysis
Dimension FastScan Bio
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The Dimension FastScan Bio Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.
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Dynamic Signal Acquisition and Analysis
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m+p Analyzer systems are available for field and laboratory use from 4 to many hundreds of measurement channels. From gathering simple time history data to narrowband (FFT) spectra, fractional octaves, wavelets, shock response spectra and much more, m+p Analyzer real time analyzers can be used with a wide range of instrumentation hardware including our own m+p VibPilot, m+p VibRunner and m+p VibMobile systems, National Instruments (CompactDAQ USB, PCI, PXI) and VTI Instruments (PCI). Low cost portable instruments to systems for distributed measurements can be configured for maximum flexibility. Measurement data from all sources are stored in a common format so it is easy to compare and handle results from any measurement source.
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DCME Analysis System
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DCME Analysis System (SCL-DAS) is a software based application, which is designed to classify, process and decompressed the compressed signals transmitted over the satellite links.DCME Analysis System supports most of the commercially available DCMEs including PCM, ADPCM, DX-3000, DX-7000, DTX-600, DTX-360, DTX-240 (D,E,F,T), CELTIC-3G, OKI TC-2000 etc. While processing the compressed/normal E1 carrier, the SCL-DAS provides the processed intelligible output in the form of Voice and Fax along with Originating Point Country, Destination Point Country, Outgoing Number, Incoming Number etc.
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Electronic Safety Sensors
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Non-contact, RFID-based devices designed to monitor movable guards like doors, panels, and hoods in industrial machinery.
