Time-of-Flight SIMS

PHI nanoTOF II - Physical Electronics

PHI’s patented TRIFT mass spectrometer with Parallel Imaging MS/MS provides superior sensitivity, low spectral background, unique ability to image highly topographic surfaces, high mass accuracy and mass resolution, and unambiguous high mass peaks identification with parallel tandem MS imaging capability. The PHI nanoTOF II can be configured with a wide variety of options to optimize performance for organic materials, inorganic materials, or both, depending on customer requirements.