Probe Systems
use programmable motorized staging to position contacting pin s.
See Also: Probe Stations, Flying Probes
- Optomistic Products
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Fiber-Optic Probes
Designed with an unparalleled optical quality finish, Optomistic Products has developed a wide array of Fiber-optic Probes to accommodate your specific LED test requirement and mechanical constraints.
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Mid Bus Probes
MBP850
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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Coaxial Cable Termination Toolkit
ICFP
Ardent’s ICFP is a next generation coaxial cable termination toolkit for advanced system design de-embedding, de-bugging, and calibration. Designed for the lowest loss access to signal paths on an IC circuit footprint, this solution is a simple, cost effective alternative to expensive probers and x-y tables for Engineers who need to probe multiple signals at once.
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Bridge Coordinate Measuring Machines
Measurement results with high accuracy are particularly important for quality assurance. Bridge coordinate measuring machines from ZEISS have a precise probe system that convinces with high measuring speed. The various solutions and systems can be tailored directly to individual requirements.
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The Nanoworkbench
In light microscopy it is natural to use toolsets like tweezers, knives, probes and several different measurement tools. Without this many present-day products and methods would not exist. The operators of SEM/FIB-Systems generally work without toolsets, although the wavelength limit of light is no physical boundary. It can be imagined how technology would be pushed when a SEM/FIB Workbench reaches the same degree of practicability and utilization as toolsets for light microscopes. The...show more -
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Semi-auto 4 Point Probe System for Solar Cell Substrate
RG-100PV
*Measurement system for thin film on substrate samples for multi-points measurement*Even pitch and random pitch for Max.1,000 points*2-D/3-D square mapping software for even pitch
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Precision Capacitive Position Sensor
6810
Break the nanometer resolution barrier -- achieve picometer resolution with our highest resolution position sensorPrecision Position Sensor for Non Contact Displacement Measurement - Model 6810MicroSense introduces our new Model 6810 high resolution capacitive position sensor. The 6810, in combination with 6000 series probes, is a non-contact displacement measurement system intended to provide exceptionally high resolution, low noise measurements.
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BROADCAST PROBE
VB120
The VB120 BROADCAST PROBE is a blade based platform for continuous digital TV monitoring, its modular concept providing the flexibility needed for a cost-effective surveillance system tailor-made for each operator. System scalability in terms of monitoring capacity, signal formats handled and functionality ensures a future-proof solution, an invaluable asset in an ever changing world.
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Automated Tester
With high labor costs in Europe and the US, and the surge in labor cost in Asia, automated test solutions are in demand. Automated systems also improve traceability and reduce operator mistakes.The combination of automation with high throughput test systems is perfect to extend the usage of Flying Probe Testers to mid size production/sample volumes.
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Surveyor Thickness Gauge
Multigauge 5650
The Multigauge 5650 Surveyor Thickness Gauge is a simple, robust ultrasonic thickness gauge designed specifically for ship and small craft surveyors, but can also be used in applications where different measurement modes are required. The user has a choice of Multiple Echo, Echo to Echo or Single Echo to cover all requirements. The gauge can be used for metal, GRP or plastic measurement and it automatically switches modes and settings depending on the type of probe fitted. The easy to use keypad...show more -
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C-V Plotters
Materials Development Corporation
MDC will tailor your CSM/Win Semiconductor Measurement System for your exact requirements. Choose the best capacitance meter, output device, and probe station for your needs. All CSM/Win C-V plotters feature the latest Dell Computers. The computer and capacitance meters are rackmounted in one compact enclosure. When ordered with a hot chuck or probe station, MDC can deliver a turnkey system of unparalleled performance.
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Flying Probe Systems
Smaller production series and fast prototyping requirements combined with zero fixturing costs are factors driving the development of Flying Probe testers. Today, Flying Probe Technology has matured and Columbia can supply single- or double-sided flying probe testers to be used on both loaded and bare PCBs.
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Geo / Cryogenic / NDE Instrumentation
Tristan designs and fabricates custom magnetometer systems to study the magnetic properties of samples. SQUID systems are extremely sensitive instruments designed to detect small electromagnetic signals. By combining SQUID electronics with various special purpose probes and auxiliary electronics, laboratory systems having a variety of capabilities are made available. - See more at: http://www.tristantech.com/#sthash.JlYDZcjM.dpuf
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Automation Solutions
We have customized (partially) automated measuring solutions that can be fully integrated seamlessly across all levels of your plant – from cleanroom-compatible measuring systems for automated production to robot-assisted probes in thickness measurement. Whether X-ray, terahertz or electromagnetic, random sampling or 100 % inspection: We offer measurement technology that allows you to inspect surfaces quickly and under constant conditions, save time and costs and ensure the quality of your production.
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Differential Active Probe, 1.7 GHz
DP0013A
The Keysight DP0013A is the 1.7 GHz model of the DP001xA Series differential active probes. These provide the superior general-purpose differential signal measurements required for many of today’s high-speed power-related measurements such as motor drives, automotive differential bus measurements, and high-speed digital system designs.
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6-24V Car Circuit Tester
1951
Peaceful Thriving Enterprise Co Ltd
Check on 6-24V system. The alligator (earth) clip is suitable for earth and the tip of the contact probe is placed onto the part to be used. If current is present the test light will glow.
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EMCTD Broadband RF Safety Systems
The EMCTD analog Smart Fieldmeter® is easy to read and to operate. The EMCTD broadband electromagnetic probe covers the 0.2 to 3000 MHz spectrum where most common industrial, communications, medical and government RF emitters are found. The ANGPE-3000 system enables checking of home, office, and workplace RF levels. The system is designed to conveniently measure RF levels around WiFi access points, RFID systems and rooftop antennas; to find transmitter cabinet radiation, locate transmissio...show more -
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Infrared Thermometer Smart and Wireless Probe
805i
The testo 805i Smart Probe is an infrared (IR) thermometer that provides non-contact temperature readings; great for checking breakers, motors, ducts, and registers from a distance. The measurement area is indicated by a circular laser pattern which asssures accurate targeting measurement. Use the testo Smart Probes App to take photos of objects and include the laser pattern and the temperature reading for your reference. Easily adjust the emissivity within the App and store data as files or share via text or email. The testo 805i works on smart devices with either Android or Apple operating systems.
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ATE Integration
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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Ultra-High Vacuum Scanning Kelvin Probe
Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The as...show more -
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Custom solutions
Novacam develops custom interferometric solutions to address particular inspection and imaging needs of specialized applications and OEM markets. Our modular interferometer components offer a superior and cost-effective platform for developing high-performance systems and assemblies. We will collaborate with your application experts to devise the optimal combination of inteferometric (OCT) hardware, non-contact fiber-based sensor probes, and system software.As needed, Novacam engineers: devel...show more -
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Flying Prober Test System
QTOUCH1404C
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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Probe Card Analyzers
PB1500
The PB1500 is a low cost probe card analyzer system. It has the capability to perform all the tests done on the larger PB3600/6500 probe card analyzers, but at a lower cost for low pincount cards. A maximum of 1,280 channels may be configured in the PB1500 MUX system. The Precision Measurement Unit (PMU) has the same accuracy, repeatability and range as the larger analyzers. The repair process consists of selecting a failing probe, which moves it under the binocular microscope and positions a crosshair over the correct position for that probe.
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Scanning Electrochemical Systems
The VersaSCAN is a single platform capable of providing spatial resolution to both electrochemical and materials-based measurements. Each VersaSCAN is based on a common high-resolution, long-travel, closed-loop positioning system mounted to a vibration-resistant optical base. Different auxiliary pieces are mounted to the positioning system. These ancillary pieces (e.g., an electrometer, piezo vibration unit, or a laser sensor) provide functionality to the positioning system for different scanning probe experiments. VersaSTAT potentiostats and Signal Recovery Lock-in Amplifiers are integrated via ethernet control to make accurate measurements of these small signals.
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Flying Probe Tester
Pilot 4D M4
The Pilot 4D M4 is a full-performance, double-sided, flying probe test system with an extremely high level of flexibility, making it the ideal solution for those with a wide variety of testing needs, from prototypes to small/medium production volume, through the repair of field returns and reverse engineering. The vertical, compact architecture and the excellent board clamping system ensure that there is no oscillation of the board under test, which in turn greatly facilitates the precise positioning of the probes on the test points.
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Non-Destructive Subsurface Layer Profiling
NMR-Mouse one-sided NMR
The unique, powerful Profile NMR-MOUSE® probe works hand-in-hand with the Kea2 spectrometer. The Profile NMR-MOUSE is a portable, open NMR sensor equipped with a novel permanent magnet geometry that generates a flat sensitive volume parallel to the scanner surface. The system can measure *Proton density as a function of depth *T2 NMR relaxation times *T1 NMR relaxation times *Self-Diffusion coefficient of liquids
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MPI Automated Probe Systems
MPI Advanced Semiconductor Test
MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
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CMOS Image Sensor
CIS
CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment S...show more -
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HVAC/R Environmental Meter
FLIR EM54
The FLIR EM54 is ideal for inspecting and troubleshooting HVAC/R ducting systems within residential, commercial, and industrial facilities. This meter can help you verify that duct inlets and outlets have the specified volumetric flow – a prerequisite to an efficient functional system. Featuring humidity, wet bulb, and dew point functions, the EM54 can measure deviations from proper relative humidity levels. Plus, the included Type-K contact temperature probe is useful to check electric motors and thermal equipment components for proper operating temperatures.
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Building Inspection System with Moisture Hygrometer & MSX® IR Camera
FLIR MR277
The MR277 is the first FLIR building inspection system to combine the advantages of Infrared Guided Measurement (IGM) and our patented Multi-Spectral Dynamic Imaging (MSX) with advanced environmental sensors to help you quickly locate, clearly identify, and easily document problems. IGM technology and a laser pointer isolate the area where you can use the integrated pinless moisture sensor for non-invasive readings or external pin probe for invasive measurements. With automatically calculated en...show more -
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Real-time and Direct Correlative Nanoscopy
LabRAM Soleil Nano
Fully integrated system based on our OmegaScope scanning probe microscope and LabRAM Soleil Raman microscope. LabRAM Soleil Nano offers unprecedented capabilities for direct co-localized AFM-Raman and photoluminescence measurements. AFM imaging modes (topographic, electrical, mechanical, etc.) and Raman acquisition can be performed either sequentially or simultaneously at the same location of the sample surface. Optical nano-resolution is also achievable with Tip-Enhanced Raman Spectroscopy and Photoluminescence (TERS/ TEPL). LabRAM Soleil Nano is compatible with the environmental chamber for AFM and Raman measurements in controlled atmosphere and at low temperatures.
