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Probe Systems

use programmable motorized staging to position contacting pin s.

See Also: Probe Stations, Flying Probes


Showing results: 1 - 15 of 406 items found.

  • Probe Systems

    Mini-PS4L - SemiProbe

    The mini-PS4L series of probe systems are built using a similar concept as our patented Probe System for Life (PS4L) Architecture. The base system is built on a 300 mm x 300 mm metric breadboard and that allows the user to configure the system to meet the application and budget.

  • Probe System

    Acculogic FLS 980 Dxi - Terotest Systems Ltd.

    Flying Probe systems do not require test fixtures, have few restrictions on board access and can test boards with a virtually unlimited number of networks. They also allow developers to complete test programs in a short time.The FLS980 Dxi guarantees superior probing precision and repeatability, even as component sizes and denser packaging technologies pose challenges to other test engineers.

  • Probe Systems

    PacketMicro Inc.

    These flexible probe stations are designed for the ever-changing test configurations required in a engineering lab. Combined with durable probes or your own high-speed probes, PacketMicro probe stations are the most cost-effective probing solutions in the industry.

  • Probe System

    Acculogic Sprint 4510 - Terotest Systems Ltd.

    The Sprint 4510 family of flying probers are well known for their speed, reliability, ease of use and large world-wide installed base.Flying probe testers have few restrictions on access, require no test fixtures, and can test boards with virtually unlimited number of nets, allowing test developers to turn a program around in a short time.

  • Probe System for Life

    PS4L - SemiProbe

    The Probe System for Life, or PS4L, is SemiProbe’s patented adaptive probe system architecture. Unlike traditional probe systems, all of the basics components of our systems, including the bases, stages, chucks, microscope mounts, and manipulators, are interchangeable, upgrade-able, and configurable. The PS4L Adaptive Architecture ensures and optimal test configuration for each individual customer application.

  • Electrical Probe Systems

    Instec, Inc.

    INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.​Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.

  • Probe Based Systems

    aixACCT Systems GmbH

    The integration of additional measurement technology in probers enables you to flexibly expand the analysis options in the ongoing production process. With the introduction of our Automation Assistant software platform, we have therefore equipped a large number of probers with a wide variety of analysis tools.

  • MPI Manual Probe Systems

    MPI Advanced Semiconductor Test

    manual probe systems are open, easy to use and cost effective yet highly accurate. These systems are designed for precision analysis of substrates and wafers up to 150, 200 and 300mm.

  • Touch Probes And Vision Systems

    Heidenhain Corp.

    HEIDENHAIN offers universal, high-accuracy touch probes for machine tools, enabling exact tool measurement, edge measurement on parts, and more. Proven technologies, such as wear-free optical sensors, collision protection, and integrated cleaning blowers, make these touch probes a dependable asset for tool and part measurement. The vision systems from HEIDENHAIN can also be conveniently deployed to monitor tools for even greater process reliability.

  • MPI PCB Probe Systems

    MPI Advanced Semiconductor Test

    Every MPI manual probe systems can be configured with a variety of different holders for printed circuit boards (PCB’s) in order to provide in addition to on-wafer, versatile, convenient, and accurate Signal Integrity (SI) measurements with single-ended or differential RF probes. Measuring signals at the end of the channel for eye-patterns, deterministic jitter, distortion, TDR (Time Domain Reflectometry) impedance, cross-talk, coupling, and losses, or even S-parameters is easily accomplished.

  • Wafer Probe Test System

    STI3000 - Solidus Technologies, Inc.

    The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.

  • MPI SiPH Probe Systems

    MPI Advanced Semiconductor Test

    MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE

  • Flying Probe Test Systems

    Terotest Systems Ltd.

    Flying probe testers work by In-circuit testing the board via a number of moving test probes. They have the advantage over traditional In-circuit testers of not requiring a dedicated "bed of nails" test fixture thus reducing the price for each different board being tested. However, modern Flying Prober testers offer so much more than just In-circuit testing. They enable the user to combine In-circuit, AOI, Functional, Device Programming and Boundary Scan testing, in one test system.

  • MPI Automated Probe Systems

    MPI Advanced Semiconductor Test

    MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.

  • Flying Probe Test System

    A8a - atg Luther & Maelzer

    The A8a test system provides the flexibility of flying probe testers while delivering high throughput testing for bare board printed circuit boards (PCBs). The target market for the A8a is the electrical test of tablet and PC motherboards and high density interconnect (HDI) products for smart phones. The A8a is designed for high productivity, reliability and test accuracy. To achieve high throughput the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to zero seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes.

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