Dynamically Controlled, High Speed Digital I/O PXI Express Card

GX5292e - Marvin Test Solutions, Inc.

The GX5292e is a high performance, cost-effective 3U PXI Express dynamic digital I/O boards offering 32 TTL or LVDS input or output channels with dynamic direction control. The GX5292e also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 100 MHz. The single board design supports both master and slave functionality without the use of add-on modules.

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Digital I/O

Format: PXI

Subcomponents

VHDCI (Female): Quantity: 1
VHDCI (Female): Quantity: 1
VHDCI (Female): Quantity: 1
VHDCI (Female): Quantity: 1

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Dynamic Digital I/O Instrumentation

Marvin Test Solutions, Inc.

High-speed and static 3U and 6U PXI and PCI digital I/O instrumentation. Offering test rates to 200 MHz and programmable logic levels of -10 V to +15 V, our digital products feature the highest performance and most cost effective digital test solutions in the industry.

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Dynamically Controlled High Speed Digital I/O PXI Card

GX5290 Series - Marvin Test Solutions, Inc.

The GX5290 Series are a high performance, cost-effective 3U PXI dynamic digital I/O boards offering 32 digital input or output channels with dynamic direction control. The GX5290 Series also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.

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Dynamically Controlled, High Voltage Digital I/O PXI Card With Pin Electronics

GX5055 - Marvin Test Solutions, Inc.

The GX5055 represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the GX5050, the GX5055 offers high performance pin electronics and an enhanced timing generator in a compact, 6U PXI form factor.

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High Performance 50 MHz Dynamic Digital I/O PXI Subsystem

GX5960 Series - Marvin Test Solutions, Inc.

The GX5960 digital subsystem represents the highest level of performance available for PXI-based digital instrumentation and features high performance pin electronics and a timing generator / sequencer in a compact, 6U PXI form factor. The GX5960 series consists of the GX5961 clock generator board with 16 driver / sensor channels and the GX5964 driver / sensor board which supports 32 bi-directional I/O channels. Up to 528 digital I/O channels can be supported by the GX5960 digital subsystem. Each digital channel features a wide drive / sense voltage range of -14 V to +26 V (maximum swing of 24 volts) which can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and a load value (with commutation voltage level) – offering the user complete flexibility when creating test programs and fixtures for multiple UUTs. In addition, each channel offers a parametric measurement unit (PMU) for DC measurements.

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Dynamically Controlled High Speed Digital I/O PXI Card

GX5280 Series - Marvin Test Solutions, Inc.

The GX5280 Series are high performance, cost-effective 3U PXI dynamic digital I/O boards with 32 TTL input or output channels and 32 LVDS input or output channels. The GX5280 Series offers an industry leading 512 MB of on-board memory and supports test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.

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Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card

GX5296 - Marvin Test Solutions, Inc.

The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).

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Dynamically Controlled High Speed Digital I/O PXI Card

GX5050 - Marvin Test Solutions, Inc.

The GX5050 is a high speed Dynamic Digital I/O card that provides a full set of features that is comparable to high speed I/O products found in large functional test systems. The card shares an identical architecture with the GC5050, but the GX5050 is a PXI card (6U) and the GC5050 is a PCI card. Both have the ability to operate independently of the host computer when in RUN mode.

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Dynamically Controlled High Speed Digital I/O PXI Card

GX5150 Series - Marvin Test Solutions, Inc.

The GX5150 Series are high speed, 6U PXI, sequenced digital I/O instruments. The GX5150 master controller has 32 bits of I/O channels that supports test rates of up to 50 MHz and a vector depth of up to 128 Mb per pin. The GX5151 slave offers the same timing characteristics and multiple I/O level configurations when used in conjunction with the GX5150. The GX5150 can control up to 15 GX5151 boards using the same timing and sequencer.

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Digital Stimulus Response PXI Card

GX5152 Series - Marvin Test Solutions, Inc.

The GX5152 Series are high speed, 6U PXI, digital I/O instruments. The GX5152 master controller has 32 I/O channels that supports test rates up to 50 MHz and vector depths up to 128 Mb per pin. The GX5153 slave offers the same timing characteristics and multiple I/O level configurations when used in conjunction with the GX5152. The GX5152 can control up to 15 GX5153 boards using the same timing and sequencer.

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