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Bi-Directional Differential-TTL I/O PXI Card
GX5642
The GX5642 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), Functional Test, and factory automation applications. The GX5642 consists of 64 bi-directional TTL-to-differential LVDS I/O channels. Each channel has two ports (TTL and LVDS) and can be individually set to operate in either conversion or static I/O modes.
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TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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VXI 12-Channel Digital-to-Analog
65DA2-55
NAI’s 65DA2-55 is a 12-channel Digital-to-Analog Instrument on a VXI board. This single-slot, message-based board provides twelve independent, single-ended, 16-bit, Digital-to-Analog (D/A) channels.
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Instrument Bracket Kit, Receiver, Slide Configuration, For 28" And Longer
310113507
Instrument Bracket Kit, Receiver, Slide Configuration, for 28" and longer.
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Instrument Bracket Kit With Strain Relief, Slide Configuration, For 28" And Longer
310113453
Strain Relief
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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3-Axis Non-Robotic Automated Testing System
AT3
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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PXI Digital Test Instrument
PXIe-6943
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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PXIe, 28.2 Gbps, 48-Channel PXI High-Speed Serial Instrument
PXIe-7903 / 788917-01
The PXIe-7903 is designed for engineers who need high-performance FPGA coprocessing capabilities or who need to validate, interface through, and test serial protocols. It includes a Xilinx Virtex UltraScale+ FPGA to implement various high-speed serial protocols, and it is programmable with the LabVIEW FPGA Module for maximum application-specific customization and reuse. The PXIe-7903 takes advantage of FPGA multigigabit transceivers to deliver 48 TX and RX serial lanes.
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Spectroscopy Card
microDXP
The microDXP is a complete, low power compact digital spectroscopy card design for a wide range of handheld, benchtop and other embedded applications, lowering cost and speeding time-to-market.
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Instrument Bracket Kit, w/ Strain Relief, Slide Configuration, for 28"+ Slide Kits
310113002
Instrument Bracket Kit, w/ Strain Relief, Slide Configuration, for 28"+ Slide Kits Similar to instrument bracket p/n 310113453, but includes cutout to accommodate air intake on NI PXIe-1088 chassis. Only compatible with slide configurations 28" and longer. Not compatible with cable tray. Not recommended for use with 2+ tier 90 Series systems (905, 9075, etc.).Used to mount testing instrument to slides and also allows test instrument to slide out for maintenance access. Provides strain relief in front area of bracket. Compatible with chassis (see drawing for more information)
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Instruments
Advanced Thermal Solutions, Inc.
ATS designs and fabricates the most extensive line of thermal test instruments specifically designed for the electronics industry. These research-quality, state-of-the-art instruments include Pressure, Temperature and Velocity Measurement Systems, Airflow and Heat Flux Controllers, Micron-level Thermography Systems and Cold-Plate Thermal Characterization Systems.
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Instrumentation
Unholtz-Dickie designs and manufactures a variety of transducer signal conditioners, accelerometers, remote charge preamplifiers, vibration monitors & limiters, transducer testers, buffer amplifiers and other special purpose instrumentation accessories for vibration testing.
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Specialty Instruments
Advanced Thermal Solutions, Inc.
ATS offers a variety of unique specialty instruments, designed for specific applications across the electronics industry. These instruments range from providing heat flux measurements and cold plate characterization, to precise isothermal surface temperature control and fan flow characterization.
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Particulate Instruments
Teledyne Advanced Pollution Instrumentation
Teledyne API offers a combination of particulate matter measurements to meet a variety of data quality objectives for regulatory ambient air quality monitoring. All T Series instruments offer two front-panel USB ports, an advanced touch screen full color display, customizable user interface with predictive maintenance alerts, one-touch real-time graphing, and multiple language support.
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Portable Instruments
Our hand-held measurement instruments are built with field HVAC engineers and operators in mind. Designed for speed, reliability and portability, they cover the majority of air-quality parameters typically found in the HVAC sector: speed, temperature, humidity, airflow and lighting levels. What’s more, our instruments also detect gases and assess air quality.
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Instruments
Organizations working on new thermosets or new thermoset formulations need an intimate understanding of how these materials cure before they can proceed to the next step in the research, quality control, or production process. What happens when the material is heated? When is the best time to apply pressure to squeeze out voids? How fast does the material react at 120C? 150C? 180C? Most organizations today address this need by curing a sample for an arbitrary amount of time before using inexact, error-prone manual methods, or complex thermal analytical instruments to test cure state. Maybe the sample has reached the end of cure, but maybe not. With traditional methods, it’s difficult to tell for sure. How can organizations determine whether they’re processing materials longer than necessary? Dielectric cure monitoring lets them know for sure.
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Portable Instrument
ST-2000 W
Standard Electric Works Co., Ltd
● Principle : Electrodynamometer type● Accuracy : ±0.5% of full scale● Scale Length : Approx. 135mm(5-3/8”)● Scale Divisions : 120● Frequency Ranges : AC 25 to 1000Hz (COSØ=1.0) (suitable for DC) AC 25 to 500Hz (COSØ=0.2)
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LXI Instruments
ProDAQ 61xx Series
The ProDAQ 61xx Series is a family of LXI Instruments based on the ProDAQ 6100 LXI architecture, which provides high-througput and precise synchronization for a new family of high-performance standalone LXI instruments.
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Custom Instruments
Mensor provides custom instruments such as high speed or high volume pressure controllers to meet specific customer requirements. These custom instruments are used to deliver pressure in high speed production environments and high volume testing applications.
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Scanning Instruments
X-Rite scanning solutions automate press-side color control and are ideal for printers and converters who want to benefit from fast, accurate color. These systems not only remove the possibility of human error, they speed up make-ready and generate predictable and repeatable color results.
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VXI Instruments
NAI offers a wide range of COTS and custom VXI-based Instruments. These boards are specifically designed for defense, commercial aerospace, and industrial applications. Our DSP-based designs offer very high function density, high resolution and accuracy, and low power consumption. Standard features include extensive diagnostics, Background Built-In-Test (BIT), auto-ranging of signal inputs, self-calibration, galvanic isolation, and field programmable parameters. A VISA PNP Software Support Kit (SSK) is provided to facilitate application development.
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