Search Results for System Under Test
BK8020 - ECM Noise Under RF Test System The BaKo Type BK8020 ECM Noise Under RF Test System tests microphones under RF noise, using a ‘Direct Injection Test’ in the frequency range of 5MHz~2.5GHz with an amplitude modulated (AM) disturbance signal of 1kHz. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When you finish testing, you can print data as an MS Excel report or save it for comparison and analysis.
BK8021 - Handset Noise Under RF Test System If you need to evaluate the resistance of cellphones to RF interferance, the BaKo Type BK8021 Handset Noise Under RF Test System is what you need. It performs four tests to evaluate the Sending Noise, Sending Sensitivity, Sending Loudness, Sidetone Masking, Receiving Sensitivity and Receiving Loudness.
1251023116 - Simple Transient Emission Analysis System Under Driving Mode FAMS-100 Simple Transient Emission Analysis System Under Driving Mode is the newest exhaust testing system developed by our company, which meets the requirement of the simple transient test under running mode contained in our National Standard GB18285-2005 and HJ/T 290-2006, and which can be used as a steady state test under running mode or as a dual idle speed test.
VC SERIES VIBROCHAMBER® - Test System A system for performing the reliability test under a specified temperature and humidity condition or the evaluation test under a combined environmental condition with a vibration test.
RT-Tester - Test Automation System Designed to perform automated hardware-in-the-loop tests and software component test on process or thread level for embedded real-time systems. The functional components of RT-Tester can be structured as shown in the figure to the left. Please click on the small image to enlarge the picture. The System Under Test (SUT) denotes the object to be tested.
XJEase - Test System Building an XJEase test system requires no knowledge of the underlying JTAG technology. All device tests written in XJEase are independent of the specific circuit under test. Tests are written from the device's perspective; they specify the pin levels required to run the test and any pin states expected as a result.
LB302 - Test system The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The 'device under test' (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance. Every new test system has the same pinning as it was defined during the process of standardization. This allows it to perform a self-test using a special adapter. In addition, it is also now possible for the adapter manufacturer to build a DUT adapter without knowledge of the test system.
Test System Software The software shipped with every Analyst system includes the VisualMDA Test Executive that runs under Windows XP (and Windows 2000).
Oriel - Fading Test System The Oriel® Fading Test System is the result of scientists at Carnegie Mellon University developing a method for testing light - induced fading of museum artifacts, with an Oriel Light Source and Components. This testing method was then replicated by other Conservationists. Here we describe the application, which we offer as a complete system under model 80190 Fading Test System.
DTS270 - Unit Level Test System The Phillips DTS270 Unit Level Test Sytem is a low cost comprehensive, automated test system capable of powering, fixturing, stimulating, and monitoring a wide range of electronic units under test (UUTs). The various pieces of test equipment are controlled and monitored from a single test environment software application operating on a Windows NT PC.
KT-6000 - Aerospace Test System We developed our standard Aerospace Test System KT-6000 “PAUL“ to meet the specific requirements of the aerospace industry. The system is designed against the backdrop of its usability as a complete system tester, which can be adapted to the respective test requirements of various devices under test (DUT) using different test unit adapters (TUA). Besides standard ATE functionality, the system supports the integration of test equipment for
BCT-2000 - Battery Capacity Test System The best proven method for determining whether a battery will perform is to test it under load conditions. Proper load testing is the only way to determine where the battery resides on its expected life curve. The Albér BCT-2000 capacity test system will test any battery in service today.
FGP - HVDC outdoor test system Certain HV tests (e.g.: for overhead lines, insulator chains, etc.) are often carried out under outdoor conditions. For this purpose HIGHVOLT provides suitable outdoor test systems that are designed according to the proven circuit principles of an indoor test system. The outdoor test systems can be customized individually.
Tank type Alternating voltage AC Test Transformer - AC Dielectric Test System Conventional AC test transformers are especially designed to testing objects of medium capacitance. These system are particularly suited for tests requiring stable voltage even if the load changes under voltage (corona, wet & pollution tests) or when the load in inductive (inductive voltage transformer).
HCTT - AC Dielectric Test System Himalayal AC test system is based on more than 20 years experiance. The AC test transformer are especially designed for medium capacitance test object, e.g. power transformer, power cable, motor, generator, GIS switchgear. HCTT serial test transformer's output voltage and power rating can meet the requirement of stable voltage and load changed under voltage. The modules designation enable the system reach ultra high voltage requirement. Himalayal has successful supplied the 2250kV 4500kVA (Three modules) test transformer
ANGULAR VELOCITY TEST SYSTEM It proves powerful in measuring and verifying characteristics of an angular sensor such as gyro sensor. It also permits to perform measurements under combined environmental conditions by combining with a temperature chamber.
303 Series - Relay Test System The SemiTek 303-Relay Test System is PC-based and designed to test the integrity of electromechanical or coax relay devices. The system may be configured for multi-terminal testing right from the main station and the PC.
With production and final test in mind, the 303-Relay Test System can perform an array of tests and control device output binning in a fraction of the time of any other tester on the market.
Under program control, the test system can test:
* Pull In/Drop Out
* Contact Voltage Drop
* Insulation Leakage
* Variable AC Coil Frequency
* Coil Resistance
* Contact Resistance
* Dielectric Withstanding.
To maximize the system’s resources, multiple switching cards can be configured for additional test terminals (subject to space) allowing an operator to test at one site while prepping another. This helps to maximize the use of the system. In this configuration, each terminal may test the same or a different relay part.
DX-2012SA - AC Hysteresis Graph Test System Under continuous frequency of 1 kHz to 500 kHz, automatic measurement of magnetic hysteresis loop of the soft magnetic materials such as silicon steel, precision alloy, non-crystal and ferrite, accurate measurement on the dynamic magnetic characteristic parameters such as amplitude permeability µa, loss angle d, loss iron Pc, remanence Br and coercivity Hc.
BRAT 67 - PXI Test System PXI Test Systems are capable of replacing a wide assortment of analog and digital hand-held and desktop instrumentation. These test instruments are packaged in a small chassis that will fit on most technicians' desktops. The instruments may be used either manually with software panels or under program control with support for several modern programming languages.
IST-TH - Reliability Test System IST - TH is an innovative and proven PCB reliability test system. IST relies on a patented coupon design. Coupons are specially designed with inbuilt heater and test traces, the coupon takes into account the areas of the actual board under test which are most susceptible to early failure. The benefits of adopting IST for reliability test are savings of time and increased ability to analyze the PCB at the point of failure. All this is delivered in an economic, environmentally sound way with significant economies over traditional oven or Liquid / liquid shock methods.
IST 8900 - DISCRETE SEMICONDUCTOR TEST SYSTEM WITH CURVE TRACER As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device's lifecycle. The IST Model 8900 Discrete Semiconductor Test System allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
SMS - Signal Measurement System The Signal Measurement System (SMS) provides real-time RF monitoring and analysis for hardware-in-the-loop, installed system, and open-air range applications. It validates the test environment by verifying threat simulator signals, measures SUT (System Under Test) response to this environment in real-time, allows correlation of Electronic Countermeasures (ECM) with threat activity, and monitors test progress to indicate failures or anomalies.
Torrent 6200 LTS - LTE Test System » The Torrent 6200 LTS The Torrent 6200 LTS (LTE Test System) is designed to comprehensively test enhanced Node Bs (eNBs) as well as mobile stations in a complete, turnkey LTE esystem. It builds on the architecutre established by the the Torrent 7200 WiMAX and like it promises to allow thousands of emulated mobiles to stress test the eNB or eNBs under test. The Torrent 6200 will be available in two varients; one which actually tests the airlink and one which bypasses it entirely for cases in which MAC rather than MAC/PHY testing is of interest. Availability: 1H11.
201 Series - Discrete Semiconductor Test System The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required.
Under program control, the 201.net tests a growing number of devices including:
* Diodes / Zeners
* Bipolar Transistors
* Field Effect Transistors
* MOSFET Depletion
* JFet / JFet NO
* Mechanical Relays
* Triac / SCRs
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