Search results for System Under Test
FAMS-100 - Simple Transient Emission Analysis System Under Driving Mode FAMS-100 Simple Transient Emission Analysis System Under Driving Mode is the newest exhaust testing system developed by our company, which meets the requirement of the simple transient test under running mode contained in our National Standard GB18285-2005 and HJ/T 290-2006, and which can be used as a steady state test under running mode or as a dual idle speed test.
VC SERIES VIBROCHAMBER® - Test System A system for performing the reliability test under a specified temperature and humidity condition or the evaluation test under a combined environmental condition with a vibration test.
RT-Tester - Test Automation System Designed to perform automated hardware-in-the-loop tests and software component test on process or thread level for embedded real-time systems. The functional components of RT-Tester can be structured as shown in the figure to the left. Please click on the small image to enlarge the picture. The System Under Test (SUT) denotes the object to be tested.
XJEase - Test System Building an XJEase test system requires no knowledge of the underlying JTAG technology. All device tests written in XJEase are independent of the specific circuit under test. Tests are written from the device's perspective; they specify the pin levels required to run the test and any pin states expected as a result.
Test System Software The software shipped with every Analyst system includes the VisualMDA Test Executive that runs under Windows XP (and Windows 2000).
Oriel - Fading Test System The Oriel® Fading Test System is the result of scientists at Carnegie Mellon University developing a method for testing light - induced fading of museum artifacts, with an Oriel Light Source and Components. This testing method was then replicated by other Conservationists. Here we describe the application, which we offer as a complete system under model 80190 Fading Test System.
DTS270 - Unit Level Test System The Phillips DTS270 Unit Level Test Sytem is a low cost comprehensive, automated test system capable of powering, fixturing, stimulating, and monitoring a wide range of electronic units under test (UUTs). The various pieces of test equipment are controlled and monitored from a single test environment software application operating on a Windows NT PC.
BCT-2000 - Battery Capacity Test System The best proven method for determining whether a battery will perform is to test it under load conditions. Proper load testing is the only way to determine where the battery resides on its expected life curve. The Albér BCT-2000 capacity test system will test any battery in service today.
HCTT - AC Dielectric Test System Himalayal AC test system is based on more than 20 years experiance. The AC test transformer are especially designed for medium capacitance test object, e.g. power transformer, power cable, motor, generator, GIS switchgear. HCTT serial test transformer's output voltage and power rating can meet the requirement of stable voltage and load changed under voltage. The modules designation enable the system reach ultra high voltage requirement. Himalayal has successful supplied the 2250kV 4500kVA (Three modules) test transformer
ANGULAR VELOCITY TEST SYSTEM It proves powerful in measuring and verifying characteristics of an angular sensor such as gyro sensor. It also permits to perform measurements under combined environmental conditions by combining with a temperature chamber.
HTTS - AC Test System Himalayal Tank type AC test system is based on more than 20 years experiance. The AC test transformer are especially designed for medium capacitance test object, e.g. power transformer, power cable, motor, generator, GIS switchgear. HCTT serial AC test transformer’s output voltage and power rating can meet the requirement of stable voltage and load changed under voltage. The tank structure enable the system suitable for long duration test.
303 Series - Relay Test System The SemiTek 303-Relay Test System is PC-based and designed to test the integrity of electromechanical or coax relay devices. The system may be configured for multi-terminal testing right from the main station and the PC.
With production and final test in mind, the 303-Relay Test System can perform an array of tests and control device output binning in a fraction of the time of any other tester on the market.
Under program control, the test system can test:
* Pull In/Drop Out
* Contact Voltage Drop
* Insulation Leakage
* Variable AC Coil Frequency
* Coil Resistance
* Contact Resistance
* Dielectric Withstanding.
To maximize the system’s resources, multiple switching cards can be configured for additional test terminals (subject to space) allowing an operator to test at one site while prepping another. This helps to maximize the use of the system. In this configuration, each terminal may test the same or a different relay part.
BRAT 67 - PXI Test System PXI Test Systems are capable of replacing a wide assortment of analog and digital hand-held and desktop instrumentation. These test instruments are packaged in a small chassis that will fit on most technicians' desktops. The instruments may be used either manually with software panels or under program control with support for several modern programming languages.
IST-TH - Reliability Test System IST - TH is an innovative and proven PCB reliability test system. IST relies on a patented coupon design. Coupons are specially designed with inbuilt heater and test traces, the coupon takes into account the areas of the actual board under test which are most susceptible to early failure. The benefits of adopting IST for reliability test are savings of time and increased ability to analyze the PCB at the point of failure. All this is delivered in an economic, environmentally sound way with significant economies over traditional oven or Liquid / liquid shock methods.
IST 8900 - DISCRETE SEMICONDUCTOR TEST SYSTEM WITH CURVE TRACER As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device's lifecycle. The IST Model 8900 Discrete Semiconductor Test System allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
SMS - Signal Measurement System The Signal Measurement System (SMS) provides real-time RF monitoring and analysis for hardware-in-the-loop, installed system, and open-air range applications. It validates the test environment by verifying threat simulator signals, measures SUT (System Under Test) response to this environment in real-time, allows correlation of Electronic Countermeasures (ECM) with threat activity, and monitors test progress to indicate failures or anomalies.
Torrent 6200 LTS - LTE Test System » The Torrent 6200 LTS The Torrent 6200 LTS (LTE Test System) is designed to comprehensively test enhanced Node Bs (eNBs) as well as mobile stations in a complete, turnkey LTE esystem. It builds on the architecutre established by the the Torrent 7200 WiMAX and like it promises to allow thousands of emulated mobiles to stress test the eNB or eNBs under test. The Torrent 6200 will be available in two varients; one which actually tests the airlink and one which bypasses it entirely for cases in which MAC rather than MAC/PHY testing is of interest. Availability: 1H11.
201 Series - Discrete Semiconductor Test System The SemiTek 201.net Discrete Semiconductor Test System is PC-based using a CPU-based hardware controller to control the electrical tests it performs. In its sixth generation, the 201.net has served the semiconductor test industry for over twenty-five years in manufacturing and inspection. As a general-purpose tester, the 201.net is ideal for inspection and production applications where precision measurements and versatility are required.
Under program control, the 201.net tests a growing number of devices including:
* Diodes / Zeners
* Bipolar Transistors
* Field Effect Transistors
* MOSFET Depletion
* JFet / JFet NO
* Mechanical Relays
* Triac / SCRs
KC-1500 - Current Transformer Test System The test system shall be able to check the accuracy of instrument transformers having primary ranges from 5 to 1500 amperes. The test system shall include a built-in, microprocessor-controlled, automatic, autoranging comparator. The test system shall incorporate protective circuitry to ensure the safety of the operator, the test system, and the transformer-under-test.
Cable Test System The cable test system comprises a single Cable Test System (CTS) device, multiple Cable Connector Box (CCB) devices and the accompanying Cable Test Application software. The diagram above depicts an abstract representation of all components involved in a cable test setup. On the left side, among the multiple FireSpy engines shown, two are connected to CCBs. In the middle one can see that a CCB contains several PHY chips to form an active network switch that regenerates the signals close to the extension cables. Each extension cable is fed into a LEMO socket on the front panel of the CCB. The cable under test is connected in-between two CCBs using adapter cables to mate the connectors.
Multi-Axial (Simultaneous or Sequential) Vibration Test System If your unit under test has been mounted on a shaker once, it can be tested in any combination of vertical and horizontal direction. We can offer a most suited system to your specific application such as transportation tests of packaged freights, electric home appliances and OA equipment based on a test standard. The digital vibration control system allows you to perform a shock test as well as a sine and random vibration test.
Thermoelectric Test System Electromechanica, Inc. developed a custom functional test system to verify the performance of a thermoelectric heat pump device for a major analytic instrumentation company. Electromechanica, Inc. designed this test system capable of verifying the key performance characteristics of the device-under-test (DUT).
CVCT-S20 - Computerized LCR TZ Test System Ideal for fast and fool proof testing of COILS AND SMALL TRANSFORMERS like SMPS transformers, Telecom transformers (HYBRID, POT CORE, RM-CORE), Pulse transformers etc. The systems scans at one stroke, all the windings of a transformer and tests as per definition of test procedure. The test procedure can be pre-programmed and stored under User friendly menu driven software
TestModules - Circuit-Traq PRO TEST SYSTEM COMPONENTS TestModules plug into the TestStation and provide the interface between the TestWare test control software running on the PC and the individual signals going to and from the Unit Under Test (UUT). The Automatiq TestSystem owes much of its flexibility to the ability to add various TestModules to the TestStation as needed. A total of twenty TestModules may be installed in the TestStation.
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