Parametric Test

TestExpress is a customizable production test platform for testing sub assemblies or fully integrated antenna solutions. TestExpress is an customizable production test version of LabExpress (go/no go or more complex tests). Product is a integrated sensor and transparent path for Tx/Rx parametric throughput tests (eg BERT). Product is a complete mea ...more

Transistor (HCI) Test System. Reliability system capable of testing up to 144 DUTs (276 TDDB) at once. This is not a typical HCI system. Instead of one or a few measurements, practically the full line of Reedholm dc parametric tests can be run, such as Vt, gm, peak Isub, Ids at Vgs, etc. In other words, dozens or even hundreds of tests, includ ...more

TR6010 IC Tester is designed specially for testing 10MHz Logic IC. The system is capable of conducting functional tests and DC parametric tests. TR6010 is designed with a user-friendly test program developing environment, rich debugging and analytic tools, compact size, and highly integration for IC Design House. ...more

The TS-345 is an intermediate-level tester for the Target Acquisition and Designation Sight (TADS). It provides full parametric test of electronics and lasers with built-in diagnostics to the circuit card level. ...more

Modular Test System - Modular dc test system with very small footprint, but full parametric capabilities. System can be easily moved and expanded, making it ideal for lab or production environment where needs change over time. ...more

We have partnered with Accel-RF Corporation to provide accelerated life and burn-in testing on a variety of RF and microwave components. The in-house Accel-RF systems provide fully automated temperature, DC, and RF bias conditions to each device under test, along with parametric measurements, limits monitoring, datalogging, and analysis. Components ...more

Small Signal and Power Discrete Semiconductor Tester. Parametric Measurements of Leakage Current, Breakdown Voltage, Gain, Saturation Voltage, On-State, Off-State, AC , Impedance, Transconductance, Capacitance. Transistors, Diodes, IGBTs, Hybrids, FETs, Jfets, Zeners, IGBTs, SCRs, Triacs, Optos  ...more

TR6050 IC Tester is designed specially for testing 66MHz Logic IC. The system is capable of conducting functional tests and DC parametric tests. TR6050 is designed with a GUI test program developing environment, rich debugging and analytic tools, compact size, and highly integration for IC Design House. ...more

Integrated Test System - DC test system mounted in left-side bay of RI-EG 2001 class prober. This configuration saves on valuable floor space while still providing full parametric capabilities. Once prober no longer meets wafer size or resolution needs, the tester can be easily moved to an RI-35 cabinet. ...more

The SM2044 is best suited for applications demanding precision sources with simultaneous measurements such as in Parametric testing, while the SM2040 is best suited where basic DMM functions are required. ...more

TR6020 IC Tester is designed specially for testing 20MHz Logic IC. The system is capable of conducting functional tests and DC parametric tests. TR6020 is designed with a user-friendly test program developing environment, rich debugging and analyctic tools, compact size, and highly integration for IC Design House. ...more

High pin count dc test system in one cabinet with 48 to 600 pins, with full parametric capabilities. Can be expanded in the field as pin count needs increase. ...more

The TS-383 is a full parametric test set for the Bradley Fighting vehicle program. This system supports production and intermediate-level test of RYJ and additional Bradley Line Replaceable Units (LRUs). ...more

The LA Series help minimize your project risk by providing the most reliable, accurate data capture and the most complete view of system behavior. These products are ideally suited for you on hardware/software debug, parametric and mixed signal testing and complex debugging. Moreover, their compact size and ability to connect to a PC makes them an ...more

Small Signal and Power Discrete Semiconductor Tester. Parametric Measurements of Leakage Current, Breakdown Voltage, Gain, Saturation Voltage, On-State, Off-State, AC , Impedance, Transconductance, Capacitance  ...more

NTS600 Series Multi Site Flash Memory Test System. The NTS600 Series is a low cost 1 site to 64 site flash memory production wafersort and post- assembly test system. The system performs DC and functional tests on non-volatile memory devices. Novtek's unique architecture incorporates two pattern generators. The system consists of a software base ...more

The XP10 is a combination electrical interface and scanner front end for ICX instruments. The XP10 scanner features a 160 x 8 multiplexer; any of 160 channels can be placed on any of 8 analog busses. Up to 12 XP10s can be controlled by one 32 channel ICX connector interface in a single VXI chassis. By combining the high density ICX instruments with ...more

Performs DC parametrics and functional tests. 10MHz pattern generator. Characterize flash memory cell current and MRAM magnetoresistive properties. Algorithmic Pattern Generator Packaged devices or wafer test. ...more

The TF100 provides a pneumatically actuated Kelvin connection to custom manufactured device inserts either to complement ART's wide range of precision parametric test equipment or for use with third party measurement hardware. ...more

Whether used with an external PC or in conjunction with ART?s own parametric relay test system (RT290) the RT900 HV test system offers high speed AC and DC dielectric testing of relays or other multi-pin passive devices. ...more

The Reflex 910 MIL spec relay test system combines the features of the Reflex 10 parametric relay test system with the RT900 HV test system offers high speed AC and DC dielectric testing of relays or other multi-pin passive devices. ...more

low noise -  high isolation - parametric test. for all fully-automatic wafer prober. high performance - durability   ...more

low noise -  high isolation - parametric test. for all fully-automatic wafer prober. high performance - durability   ...more

The TF10 is a low cost customisable device fixture to complement ART's wide range of precision parametric test equipment or for use with third party measurement hardware. The unit can be supplied either in kit form or ready assembled to suit a specific component footprint requirement.  ...more

The RT290 is the latest in a line of a dedicated parametric test systems for monostable and bistable relay devices with up to 8 changeover contact sets. By noting the various limitations and drawbacks of existing relay test equipment the RT290 has been equipped with many advanced features  ...more