Parametric Test

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  • Parametric Test System Professional Services Our Professional Services provide you with expert consulting and training in the areas of applications, test system relocation, and customer education. Our team members work directly with you to develop and implement programs aimed at helping you achieve your specific business objectives.
    Keysight Technologies
  • 4220 - CHAMBER FOR PARAMETRIC TESTING Chamber cover removed exposing rotating fixture.
    Saunders & Associates
  • 4072A - Agilent 4072A Advanced Parametric Tester with Agilent SPECS Advanced Parametric Tester with Agilent SPECS
    Keysight Technologies
  • Cellular Parametric Test Aeroflex, through its IFR and Racal Instruments Wireless Solutions brands, is able to offer a wide selection of cellular test sets addressing both mobile and base station test applications.
    Aeroflex
  • 4083A - DC/RF Parametric Test System Supporting all of the parametric test capabilities of the 4082A and 4082F, the Agilent 4083A is designed to meet RF device testing needs. The 4083A supports an Agilent PNA for S-parameter measurements and also offers an 8 x 10 RF matrix with 20 GHZ bandwidth.
    Keysight Technologies
  • Sagittarius - Intelligent Parametric Test System STAr Sagittarius revolutionizes the era in semiconductor parametric test and measurement solutions spanning across all semiconductor test needs: Si/GaAs ICs, flat-panel display (FPD), wired/wireless communications components, smart high-power ICs, RFICs, etc. Sagittarius enbles flexible configuration by integrating most parametric instruments and probe stations.
    STAr Technologies
  • 4082A - Parametric Test System Standard low-current and ultra low-current matrix card configurations (12 to 48 pins) Standard low-current version supports up to 2 x HPSMUs and up to 8 total SMUs Ultra low-current version supports up to 2 x HRSMUs, up to 2 x HPSMUs and up to 8 total SMUs 8 auxiliary inputs and 48 extended path inputs for support of external instrument
    Keysight Technologies
  • ITC5730 - Dynamic Parametric Test System The ITC5730 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices. Included in the mainframe are all test equipment and software necessary to analyze and perform switching time, switching loses, gate charge, Trr/Qrr, and other transient tests. 
    Integrated Technology
  • 4071A - Agilent 4071A Semiconductor Parametric Tester Semiconductor Parametric Tester
    Keysight Technologies
  • S530 - Parametric Test systems High-speed semiconductor parametric testing with low cost of ownership Designed for production and lab environments managing a broad range of devices and product wafers Proven SMU instrumentation technology ensures high measurement accuracy and repeatability
    Keithley Instruments
  • 4075 - Advanced DC/RF/Pulse Parametric Tester Modern semiconductor wafer fabrication facilities face a variety of new parametric measurement challenges that require additional measurement capabilities in the production environment. 
    Keysight Technologies
  • Parametric Test System Support Ensuring your Parametric Test systems remain up and running at peak performance is a critical part of your operations. Agilent System Support focuses on your unique Parametric Test hardware and software needs. 
    Keysight Technologies
  • 6103 GSM/GPRS - Cellular Parametric Test The Aeroflex Digital Radio Test Set model 6103 has set new industry standards in cellular radio testing. It is a high performance, portable, fully integrated instrument for production and maintenance of modern digital telephones. The 6103 addresses GSM 850, 900, 1800 and 1900 and has been selected by most of the world's mobile manufacturers for field service operations.
    Aeroflex
  • 4072B - Advanced Parametric Tester The 4072B Ultra Advanced Parametric Tester enables semiconductor manufacturers to dramatically reduce test time for capacitance measurements and DC measurements in high-volume semiconductor wafer manufacturing processes.
    Keysight Technologies
  • IST-8800 - Programmable Parametric Tester for Discrete Semiconductors The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
    IST Information Scan
  • N9201A - Array Structure Parametric Test System The Agilent N9201A provides a parametric test solution for the yield ramp-up phase by allowing users to test more structures in less time and with greater throughput. With the new Agilent N9201A, Agilent?s 4070 production parametric testers now offer a per-channel SMU (source/monitor unit) architecture that supports up to 40 total SMUs, five times more SMUs than previously available in a single tester, for extremely fast characterization of in-line array test structures.
    Keysight Technologies
  • VersaCore - Parametric Test Probe Cards VersaCore™ is the industry's new price and performance leader for parametric test probe cards. The VersaCore™ provides a temperature range of -65°C to 200°C, and has two available core types for low leakage of <5fA/V and AttoFast™ settling to sub-1fA/V ultra high performance. This new ceramic probe technology delivers long lifetime and infinite rebuilds.
    Celadon Systems
  • 6413A - Cellular Parametric Test Comprehensive on-site testing of Node Bs using real-world scenarios, both at initial installation and then during ongoing maintenance, plays a vital role in preventing and solving performance problems before they impact subscribers. Thorough testing also gives network operators greater confidence in the quality of the deployed network.
    Aeroflex
  • 4073A - Ultra Advanced Parametric Tester The choice for advanced process and characterization needs. The Agilent 4073A ultra advanced parametric tester with Agilent SPECS is designed to perform highly precise DC measurement, capacitance measurement, flash memory cell testing, and testing of other high-frequency applications.
    Keysight Technologies
  • 4073B - Ultra Advanced Parametric Tester The 4073B Ultra Advanced Parametric Tester enables semiconductor manufacturers to dramatically reduce test time for capacitance measurements and DC measurements in high-volume semiconductor wafer manufacturing processes. 
    Keysight Technologies
  • OPTIMUM Series Model 200-CT - Parametric Measurement System, Memories The OPTIMUM 200-CT burn-in system has been designed to specifically address parametric and functional testing in a burn-in environment. By utilizing an PMU through an IEEE interface, we can measure a wide variety of parametric measurements.
    Advanced Microtechnology
  • ELA 10 - DATA LINE ANALYSER Comprehensive parametric testing in the frequency range 20 Hz to 20 kHz
    Elektronika
  • IST-7500 - Linear Device Tester THE IST-7500 is a programmable parametric tester that provides parameter measurements or parametric Go/No Go tests for a wide variety of Operational Amplifiers, Voltage Comparators, Voltage Regulators, Digital-to-Analog and Analog-to-Digital Converters. The IST-7500 can be interfaced to an automatic handler for high speed production testing and is also equipped with a RS-232 port for PC interface.
    IST Information Scan
  • RI-40 - Test System Delivering precision measurements at production speeds, the RI-40 modular dc parametric test system is the smallest footprint full-featured tester on the market.
    Reedholm Instruments

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Parametric Test - determine whether a DUT's electrical characteristics meet specification.