VersaCore™ is the industry's new price and performance leader for parametric test probe cards. The VersaCore™ provides a temperature range of -65°C to 200°C, and has two available core types for low leakage of <5fA/V and AttoFast™ settling to sub-1fA/V ultra high performance. This new ceramic probe technology delivers long lifetime and infinite rebuilds.
High-speed semiconductor parametric testing with low cost of ownership Designed for production and lab environments managing a broad range of devices and product wafers Proven SMU instrumentation technology ensures high measurement accuracy and repeatability
Comprehensive on-site testing of Node Bs using real-world scenarios, both at initial installation and then during ongoing maintenance, plays a vital role in preventing and solving performance problems before they impact subscribers. Thorough testing also gives network operators greater confidence in the quality of the deployed network.
STAr Sagittarius revolutionizes the era in semiconductor parametric test and measurement solutions spanning across all semiconductor test needs: Si/GaAs ICs, flat-panel display (FPD), wired/wireless communications components, smart high-power ICs, RFICs, etc. Sagittarius enbles flexible configuration by integrating most parametric instruments and probe stations.
The Aeroflex Digital Radio Test Set model 6103 has set new industry standards in cellular radio testing. It is a high performance, portable, fully integrated instrument for production and maintenance of modern digital telephones. The 6103 addresses GSM 850, 900, 1800 and 1900 and has been selected by most of the world's mobile manufacturers for field service operations.
Existing and new wafer fabs face ever-greater parametric testing challenges. Out of necessity, parametric test has expanded beyond pure DC measurement and now spans a variety of different measurement types, including parallel test, Flash cell write/erase testing. Anticipating these needs, Keysight has developed the versatile and flexible 4080 parametric test platform.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
The ITC5730 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices. Included in the mainframe are all test equipment and software necessary to analyze and perform switching time, switching loses, gate charge, Trr/Qrr, and other transient tests.
The OPTIMUM 200-CT burn-in system has been designed to specifically address parametric and functional testing in a burn-in environment. By utilizing an PMU through an IEEE interface, we can measure a wide variety of parametric measurements.
THE IST-7500 is a programmable parametric tester that provides parameter measurements or parametric Go/No Go tests for a wide variety of Operational Amplifiers, Voltage Comparators, Voltage Regulators, Digital-to-Analog and Analog-to-Digital Converters. The IST-7500 can be interfaced to an automatic handler for high speed production testing and is also equipped with a RS-232 port for PC interface.
The Keysight T4010S LTE RF tester is the most comprehensive tool for LTE UE RF parametric verification and characterization. This top-of-the-line test system meets the needs of early development, R&D, conformance and certification testing.
Parametric Relay Test System that combine a flexible hardware architecture with advanced test software. The system is ideal for low-cost production applications. See also Reflex 10M, RT290 and Reflex 510 Parametric Relay Test Systems.
Keithley's Parametric Curve Trace configurations are complete characterization solutions for power device characterization, including high quality instruments, cables, test fixturing, and software. Seven configurations are available, each providing both real-time trace mode for quickly checking fundamental device parameters like breakdown voltage and full parametric mode for extracting precise device parameters. The building block approach of the Parametric Curve Tracer configurations provides t...
Agilent 41000 Integrated Parametric Analysis and Characterization Environment (iPACE), enables integrated system performance to parametric test environment. iPACE enables users to realize the full 1-femtoamp measurement potential of semiconductor parameter analyzer through a switching matrix, wafer prober interface, and probe card without any loss in measurement performance.