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Product
Modular Laser Diode Test System (PXI/PXIe)
LTS8620
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The LTS8620 test system is a modular PXI test system for testing and qualifying laser diodes. The system is able to generate extremely short current pulses. This minimizes the effects of heat on the laser diode.
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Product
Laser Diode Life Test
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Life-tests consist of the highly accelerated ageing, under controlled conditions, of a group of lasers taken as a representative sample. Optical degradation of the laser diodes is observed and recorded by precisely measuring changes in the laser's operating characteristics during the test. Life-tests are used for vendor qualification of the laser diodes during product development and can be conducted throughout the production life of the laser.
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Product
PRO8 Modular Laser Diode Platform
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Thorlabs offers the PRO8 modular test and measurement platform in 2-slot and 8-slot configurations. These customizable bench top chassis let users build a compact fiber or laser diode testing platforms for their lab or factory floor. Modules include lasers, TEC controllers, optical switches, and current controllers.
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Product
Laser Diode Characterization System
58620
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The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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Product
Laser Head
5517EL
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The Keysight 5517EL is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Please contact Keysight for custom requirements.
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Product
SpikeSafe DC / Continuous Pulsed Current Sources
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The Vektrex SpikeSafe™ DC / Continuous Pulse (DCP) Current Sources provide reliable DC or pulsed drive for LED or laser diode reliability testing, IESNA LM-80 maintenance testing, and other test applications requiring DC or continuous pulse current. Models support currents from 500mA to 60A and compliance voltages from 50V to 400V. All models feature individual channel control, accurate pulsing over long output cables, precise current, precision pulsing for improved measurement repeatability, and high power density — typically 6.4kW-8kW.
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Product
Step-Tunable Laser Source, High Power and Low SSE, Basic Line
N7779C
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The new N7779C basic line step-tunable laser source is ideal for cost-effective testing of broadband optical devices. It can also serve as a highly stable, tunable local oscillator for receiver testing or transmission experiments.
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Product
Laser Head
5517GL
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The Keysight 5517GL is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Please contact Keysight for custom requirements.
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Product
Laser Head
5517FL
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The Keysight 5517FL is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Please contact Keysight for custom requirements.
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Product
Test Workflow Standard
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
Four-Port Tunable Laser System Source
N7714A
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The Keysight N7711A and N7714A tunable lasers are single-port and four-port sources, available with C-band or L-band wavelength coverage. The narrow linewidth and offset grid fine-tuning capability make them ideal sources for realistic loading of the latest transmission systems. All models can reach any wavelength point within their specified wavelength range just like all other Keysight tunable lasers. In this mode, code compatibility with existing test setups based on Keysight's range of full-size and compact tunable lasers is a great asset. In system loading applications, it may be preferable to grid-tune the lasers like system transmitters, simply by changing the channel index. The channel grid is adjustable to standard ITU-T grid spacing like 50 GHz, and to arbitrary grids. Likewise, the zero frequency (base channel) of the chosen grid is adjustable. A 12 GHz fine-tuning range allows de-tuning the frequency.
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Product
EFT Module for Teststand
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The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
Interactive Benchtop Test
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Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
Laser Head Cable, 7 m
10881B
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Provide reliable power with this five-pin female DIN that connects the laser head to multiple laser boards.
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Product
Compact Tunable Laser Source with Continuous Sweep Mode, 1520nm to 1630nm
81940A
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Keysight's 81940A high power compact tunable lasers enables optical device characterization at high power levels and measurement of nonlinear effects. It's improves the testing of all types of optical amplifiers and other active components as well as broadband passive optical components. As single slot plug-in modules for Keysight's 8163A/B, 8164A/B and 8166A/B mainframes, they are a flexible and cost effective stimulus for single channel and DWDM test applications. Each module covers a total wavelength range of 110 nm in the C+L-band.
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Product
Laser Head
5517DL
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The Keysight 5517DL is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Please contact Keysight for custom requirements.
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Product
Cable Free ATE
CABLEFREEATE
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Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
Planar-Doped Barrier Diode Detector, 10 MHz to 33 GHz
8473D
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The Keysight 8473D is a high-performance detector using a gallium arsenide, planar-doped barrier detecting element. It features extremely flat frequency response over its entire band of operation and very good frequency response stability versus temperature. The Keysight 8473D is also very rugged with high resistance to ESD damage. An optimum square-law load and positive polarity output are available as special options (consult your local Keysight representative).
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Product
Design for Testability (DFT Test)
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Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
Laser Head
5517B
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The Keysight 5517B is used primarily in VME and PC based laser interferometer systems where the velocity of motion is slower, such as machine tool applications. Please contact Keysight for custom requirements.
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Product
Laser Head Cable, 20 m
10882C
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The 10882C 20-meter Laser Head Cable is used to connect the 5519A/B Laser Head to the E1735A USB Axis Module for the 5530 Laser Calibration System.
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Product
Open Test Platform for High Performance Automotive Applications
TSVP
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The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
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Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Product
Wireless Device Test
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New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
Semiconductor Test System
TS-960e
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The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
Functional Test Fixtures
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Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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Product
Active Alignment Assembly & Test Platform
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Quickly deliver flawless camera & LiDAR modules, MEMS devices, die based sensors, LED and laser-based headlights and other high-end products with a supremely accurate standardized platform.
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Product
NI HIL and Real-Time Test Software Suite
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Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
Scienlab Battery Test System — Cell Level
SL1002A
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Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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Product
Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
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Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
