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Product
Main Air Data Test Fixture for ADC's
TA-245
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This is the Main Air Data Test Fixture as shown in the AZ-241 repair manuals and will allow by the book testing of the units.
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Product
Air Data Test Set System
B511
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The BRAT Option B511 is an option to the BRAT Test System utilizing Commercial-Off-The-Shelf (COTS) equipment. The system is used to augment the existing BRAT capabilities to test rate of change of altitude or pressure.
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Product
Air Data Test Sets
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For calibrating altimeters, airspeed indicators, rate-of-climbindicators and other avionic instruments.
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Product
Laboratory Air Data Test Sets
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DMA is a leading manufacturer of Air Data Test Set models for laboratory use achieving the highest accuracy and resolution. The MPS46 is digitally controlled through a keyboard, it uses very high accuracy pressure sensors, with a special characterisation for maximum accuracy (for static channel < 2 feet at sea level). Pressure resolution of 0.2 Pa. is also achievable. The intuitive user interface with touchscreen display ensures that all the functions are controlled with a minimum of key presses . The ADTS can be used in avionics ATE systems (rack height only 2U) for automated pitot-static testing through RS232, USB, Ethernet or GPIB/IEEE488. An internal pump or external rack mounted pump unit can be supplied as an option.
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Product
Rapid PSE And Chained Data Test Of 4-Pair And 2-Pair PSE's
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The optional PSL-3424-QT feature license opens up two important productivity tools in the PSL-3424 platform. PSL-3424 Quick Test is a fully automated PSE functional test covering between 2 and 8 PSE ports in a test cycle with average test times on the order of 10 seconds per port tested. The Chained Data Test user interface allows rapid construction and verification of test setups used in “snaked data path” testing of PSE’s with user specified loads and optional LLDP power negotiation on each test port.
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Product
Rapid PSE And Chained Data Test Of 4-Pair And 2-Pair PSE's
Chained Data Test Support for 802.3at and 802.3bt PSE's
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Intuitive graphical user interface. Configures up to 24 2-Pair or 4-Pair ports for "snaked data path" testing. Verifies all PSE connections in the defined data path. Sequences user-defined PD emulations and PSE powering.Verifies powering to user-defined loading on all selected ports. Configures looped data paths across the selected ports. Support of 802.3at / 802.3bt LLDP power negotiations (PSL-3424L).
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Product
Telecom & Data Test
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Electro Standards Laboratories
iagnostic tools such as Breakout Boxes/Interface Analyzers designed for use at the data interfaces of modems, multiplexers, terminals, and computers. Electro Standards Laboratories' Series of Breakout Boxes/Interface Analyzers are virtually indestructible and compatible with RS232, HSSI(SCSI-2), EIA/TIA RS530 interfaces.
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Product
Rapid PSE And Chained Data Test Of 4-Pair And 2-Pair PSE's
PSL-3424 Quick Test for 802.at and 802.3bt PSE's
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Accessible from PSA Interactive or PowerShell PSA. Scans 2 to 8 PSE ports per test cycle. Automatically determines and adapts to PSE maximum assigned class. Tests PSE’s that grant full power via PD Classification or through PoE LLDP. Validates PoE Detection Acceptance and Rejection Range. Measures PSE Port Voltage at both minimum (DC MPS) and maximum (Pclass) load conditions. Reports PSE type (AT vs BT), maximum assigned class capability, and Pclass power capacity. Assesses Disconnect Power Removal response. Assesses Overload Power Removal response. Assesses LLDP Power Protocol and Allocations (PSL-3424L).
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Product
Air Data Adapter Test Panel
TA-241
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AZ-241 Adapter Panel is designed to meet manufacturer's requirements. This panel will allow by the book testing of the air data computer when interfaced with the main air data test fixture. The Scott-T transformer is optional or can be customer supplied. Without the Scott-T your API can read the altimeter resolver directly.
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Product
Tactical Data Link Test & Training
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Curtiss-Wright Defense Solutions
Curtiss Wright has an experienced staff with a rich history in tactical data links (TDLs). From system software engineers and architects to joint Interface Control Officers (JICO), Curtiss-Wright has the capability to provide your organization with expertise in TDLs.
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Product
200/400 MHz Data Converter Test Solution
ATX7006A
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The ATX7006A is a fully integrated solution for testing ADCs, DACs and other Analog functions. It combines very high accuracy, low noise and fast sampling with an exceptional ease of use. Traditionally data converters are tested using a whole stack of bench instruments, filters, switch matrices and user made software. Many engineering hours are needed to get reliable results. The ATX7006A is a single instrument for all your data converter testing and test methods.
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Product
Fully-Automated CTIA-Compliant OTA Test System
TS8991
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The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Product
PXI Data Storage Module
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Offered in several sizes and options, the PXI Data Storage Module is ideal for applications that need to record high-speed data, easily move data between multiple test setups, or supplement the PXI system controller’s storage capacity.
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Product
Low-Cost 16-Bit Multi-Function DAQ Card with 2-CH Encoder Input
PCI-9221
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The ADLINK PCI-9221 is a 16-bit high-resolution and low-cost multi-function DAQ card, with 16-CH singleended or 8-CH differential input capable of up to 250 kS/s sampling rate. In addition, the PCI-9221 comes with a 2-CH 16-bit static analog output and programmable function I/O. The software-programmable function I/O supports a variety of applications, including TTL digital I/O, general-purpose timer/counter, encoder input, and PWM output. The flexible function I/O makes the PCI-9221 the best single-board solution for combined data acquisition and simple motion control functionalities. Ideal for manufacturing, laboratory research, and factory automation, the PCI-9221 comes with all the functions you need at an affordable price.
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Product
Test Workflow Standard
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
EFT Module for Teststand
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The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Product
Testing
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Apogee Labs offers a wide variety of modular chassis types used for test applications with various Data Link Test Modules.
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Product
Interactive Benchtop Test
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Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
Powered VME64x Crates
6U VME64x 554-x Mini
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The VME554-x mini crate is the perfect choice for data acquisition, test and debugging applications.
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Product
Oscilloscopes
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Our oscilloscopes offer a powerful combination of large and informative displays combined with advanced waveshape analysis capabilities - typically tailored to enhance the productivity of engineers in specific applications areas such as serial data test, disk drive test and automotive bus analysis.
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Product
1435 Series Signal Generator (9kHz to 40GHz)
1435
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1435 series signal generator achieves balance in terms of performance, economy and volumetric weight. It responds fast and switches to another frequency in only 1ms, which shortens the test time and improves test efficiency, meeting the needs of massive data testing.
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Product
PXIe-8267, 4 TB, M.2, PXI Data Storage Module
785308-01
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PXIe, 4 TB, M.2, PXI Data Storage Module - The PXIe-8267 PXI Express high-speed data storage module features large-capacity, high-throughput storage in a single PXI Express slot. With M.2 solid-state drives, the PXIe-8267 is ideal for stream-to-disk or stream-from-disk applications requiring sustained, reliable data throughput such as high-speed signal intelligence, RF record and playback, and multi-sensor data acquisitions systems.
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Product
Cable Free ATE
CABLEFREEATE
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Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Product
Test Data Management
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When testing your products, the measurement and test data produced is invaluable in helping your improve your product quality. Most companies do nothing with their test data apart from storing on a hard drive somewhere. Accessing it and using this data is the most valuable way of gaining insights into your manufacturing performance and enabling you to make immediate improvements to help increase product quality whilst reducing the likelihood of unwelcome field failures and expensive product recall events.
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Product
Design for Testability (DFT Test)
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Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
64-CH 16-Bit 250kS/s Multi-Function DAQ Card
cPCI-9116
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- PICMG 2.0 Rev 2.1- 16-bit A/D and sampling rate up to 250kS/s- 64-CH single-ended or 32-CH differential input- On-board 1k-sample A/D FIFO
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Product
Cryogenics Testing Lab
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DPACI Cryogenics Test Laboratory has been operational for over a decade providing test data, temperature cycling, simulation, and analysis for our customer’s rigid deep space component qualification requirements. Our firm provides our customers with most accurate test data taken at temperatures ranging from 10°Kelvin to 400°Kelvin.
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Product
Sample Preparation
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Careful attention to specimen preparation is critical to obtaining top quality test data. Pacific Testing Laboratories has, what it believes to be, the most extensively equipped machine shop in any commercial laboratory. Its function is dedicated to fabricating test specimens and fixturing. Principal equipment includes diamond coated tooling, surface grinders, milling machines, lathes, a 30 ton precision press, laboratory presses, and a 4-axisCNC milling machine.
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Product
4-CH 16-Bit 2MS/s Simultaneous-Sampling USB DAQ Module
USB-1210
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The USB-1210 is a 16-bit high-speed USB 2.0-based DAQ module equipped with 4 analog input channels providing simultaneous sampling at up to 2MS/s per channel. The USB-1210 delivers high accuracy and excellent dynamic performance at maximum sampling rates, and flexible trigger functions. In addition, onboard 64M samples FIFO ensures no data loss during acquisition even when CPU or system loading is heavy.The USB-1210 is USB bus-powered and equipped with removable screw-down terminals for easy device connectivity. The attached multifunctional stand can be used for desktop, rail, or wall mounting. Suitable for high-speed data acquisition, laboratory and medical research, the USB-1210 provides a reliable measurement solution at an affordable price.
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Product
In-Circuit Testing and Test Engineering
GenRad 2287
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3560 Hybrid Test NodesWindows InterfaceTotal GenRad 227X Migration Capability20 Mhz Clock, Sync, and Trigger, 5 Mhz data ratesVector Test for VLSI, PLCC’s & ASICSTest Express Vectorless TestingMultiple Chain Boundary ScanAnalog Functional Test Module
