Burn-In

The Bemco KDL series is designed for production testing of electronic circuit boards and completed electronic systems. They accept Bemco KDLC Carts that have a working area of 42 wide by 60 high by 48 deep suspended on insulated runners and casters 11 inches above the test area floor. ...more

Supervise the operation of your product, electronic device, circuit board, or medical device while they are stress screened, burned-in, or temperature cycled inside a Bemco Kardburn or Koldburn glass front chamber. With a huge amount of testing or storage space within instant reach, KD Chambers provide a compact and attractive alternative to a ...more

TetraTek chambers include high volume air circulation systems to maintain inside air temperature uniformity, assure test to test repeatability, and maximize testing effects. These chambers are available with large cooling systems to allow rapid temperature cycling or to handle huge product live loads. All can be mechanically or liquid nitrogen ...more

The BIBTEST 55 system is a fast, accurate, repeatable, test system specially designed for test and fault identification on burn-in boards. The system provides 256 programmable test channels upgradeable to 1024. Each channel is user definable as BIB edge or device pins. Sophisticated menu-driven software provides many features to assist in test ...more

Assessment services - HALT, thermal cycling/shock, temp/humidity, humidity bias/HAST, heat soak/burn-in, 3-axis random vibration, ESD testing, IPC650/GR-78-CORE/J-STD resistance testing and custom software. ...more

As compared to traditional burn in, TDI's typical three hour HASS cycle is equivalent to 125 hours of static burn-in at +50 C. HASS has the benefits of utilizing: Continuous thermal expansion and contraction stresses to precipitate mechanical flaws such as die cracks, poor wire bonds and cold solder joints. Dynamic output loading and input power ...more

We have partnered with Accel-RF Corporation to provide accelerated life and burn-in testing on a variety of RF and microwave components. The in-house Accel-RF systems provide fully automated temperature, DC, and RF bias conditions to each device under test, along with parametric measurements, limits monitoring, datalogging, and analysis. Components ...more

As compared to traditional burn in, TDI's typical three hour HASS cycle is equivalent to 125 hours of static burn-in at +50 C. HASS has the benefits of utilizing: Continuous thermal expansion and contraction stresses to precipitate mechanical flaws such as die cracks, poor wire bonds and cold solder joints. Dynamic output loading and input power c ...more

FineTest Power Supply Testers FineTest offers automated power supply testers using Agilent lab quality test equipment for the Military, Aerospace, Medical, and Telecom industries. FineTest also offers Fixturing and Test Program Development, UPS Testers, Burn-In Carts, and Burn-In Monitoring. ...more

Finally, a system for true thermal stress screening that doesn't require batch loading. Introducing the new RPI patented ESS Inline System, that allows testing at different temperatures while powering up your product throughout the system. ...more

Available in 0.50 and 0.65 mm Pitches. The worlds only Pressure Mount QFP sockets! Save time and money with maintenance on burn-in boards. Meets Jedec spec MS-026 ...more

The AirSwitch represents state-of-the-art engineering design in a computer controllable switch. It offers superior testing reliability and easier operation compared to plug-in, manual units. It affords low contact resistance and high current carrying capabilities.  ...more

True Zero Insertion Force (ZIF) Socket. Design simplicity. Optimal airflow during burn-in. Automated or manual loading Timely delivery. Device probing and testing through open top design. Trapped contacts Compact size  ...more

Symtx provides burn in systems to meet a wide range of requirements, from the precision needs of quality assurance and design verification to the low cost, high volume needs of production. Our systems accommo-date most form factors, from ASICs and other individual components to circuit boards or to complete assemblies and LRUs. ...more

The LRS-9424B Laser Reliability and Burn-In Test System is the second generation of ILX Lightwave?s successful 9424 platform and offers precision and flexibility at an affordable price. With up to 1024 devices in the LRS-9424B?s compact chamber, you?ll be able to increase throughput and lower your overall cost of test. The LRS-9424B?s proven l ...more

The most important features of this simple power supply is its ability to hold a constant output for each channel even in the event that one channel may short and fail. ...more

Plastronics LCC sockets have been in use for test and burn-in since 1982 providing a low-cost, reliable test solution for manual and automatic loading. Offering the widest selection of LCC sockets in the world, Plastronics offers 3 new socket options specifically designed for Amkors VisionPak" packages. These sockets are designed for ...more

High-Power Burn-In System. This system is for burn-in of devices up to 20 watts is available with ABES-IV or ABES-V electronics and test capability. Individual temperature control for each device under test up to 20 Watts.Tests high-pin-count devices to IEEE Standard 1149 specifications. Optional per-socket temperature control on up to 24 devi ...more

Meets burn-in requirements, including extreme temperatures or continual handling. 2 or more layers of polyimide. 200° C maximum temperature. Gold-plated connectors. ...more

With decades of experience on the market, 3M Textool SOIC Sockets provide a proven, reliable test and burn-in interface for JEDEC SO style packages in pin counts of 8 to 28. ...more

Engineering and hardware capabilities, all you need for your test: Burn-in test program development. Boards design. Board assembly. Board test and calibration (3S system). Burn-in boards (different configuration), hast boards, ESD fixtures and other customized boards. ...more

High-Power Burn-In. Individual temperature control for each device under test up to 35 watts. Tests devices at a maximum temperature of 150° C. System capacity with individual temperature control is up to 384 devices. When individual temperature control is not a requirement, capacity increases based on the size of the devices. ...more

Automatic Burn-In\Environmental Systems for Logic and Memory Devices ...more

Automatic Burn-In/Environmental System for Logic and Memory Devices. Up to 256 digital I/O channels per burn-in board. Up to 130 amps of programmable power to the devices under test (5 separate voltages). Large system capacity of up to 32 burn-in boards; Large burn-in boards with 20.25 inches x 21.5 inches of socket space. ...more

XDC provides clean, reliable power for benchtop, ATE systems, burn-in, production test and OEM applications. ...more