Burn-In

Supervise the operation of your product, electronic device, circuit board, or medical device while they are stress screened, burned-in, or temperature cycled inside a Bemco Kardburn or Koldburn glass front chamber. With a huge amount of testing or storage space within instant reach, KD Chambers provide a compact and attractive alternative to a ...more

The Bemco KDL series is designed for production testing of electronic circuit boards and completed electronic systems. They accept Bemco KDLC Carts that have a working area of 42 wide by 60 high by 48 deep suspended on insulated runners and casters 11 inches above the test area floor. ...more

TetraTek chambers include high volume air circulation systems to maintain inside air temperature uniformity, assure test to test repeatability, and maximize testing effects. These chambers are available with large cooling systems to allow rapid temperature cycling or to handle huge product live loads. All can be mechanically or liquid nitrogen ...more

The BIBTEST 55 system is a fast, accurate, repeatable, test system specially designed for test and fault identification on burn-in boards. The system provides 256 programmable test channels upgradeable to 1024. Each channel is user definable as BIB edge or device pins. Sophisticated menu-driven software provides many features to assist in test ...more

Forty channel burn-in screening system for standard QA and production screening. Memory applications for all current technologies. ...more

Model 2010 is a versatile manually operated, burn-in / life test system for multiple lots of devices. All test parameters are set by the operator via front panel controls. This system is ideally suited to those test situations where tests are started and not monitored until the required test time has elapsed. ...more

The Model 2061 is a versatile Humid Environment Burn-in or Life Test system for discrete components. Although commonly used for a variety of ceramic capacitors other discrete components may also be tested by using appropriate DUT test cards. Multiple bias supplies allow simultaneous tests of different voltage levels. ...more

# IDRC CDSP-Series DC power supply has 35V ~ 150V , 100A ~ 2000A , 5KW ~100KW , available. # Sustainable inrush current 2 to 4 times of rated current, suitable for ATE, Burn-in and Motor Test applications # 85% high efficiency and compact design; 5KW in 4U case. ...more

Model 2110 is a versatile, manually operated, burn-in and life test system ideal for multiple lots of devices. All test parameters are set by the operator via front panel controls. This system is ideally suited to those test situations where tests are started and not monitored until the required test time has elapsed. ...more

The Series 200 FPGA-HW is designed to provide case temperature controlled burn-in for parts with power dissipations ranging from 5 thru 30 watts. Patented thermal tower control provides individual temperature adjustment of case temperatures from 110 thru 140 C. Both case temperature and internal device temperature monitoring of the system ca ...more

New features of leading cutting-edge techniques associatedto the PCB O/S testing structure. Multi-Steps of power energy configuration option to the set-up function of releasing energy. Energy power applied to wires and PTH on PCB for assuring its durability and reliability. Reporting pint-out generated after breaking activity taking place t ...more

We have partnered with Accel-RF Corporation to provide accelerated life and burn-in testing on a variety of RF and microwave components. The in-house Accel-RF systems provide fully automated temperature, DC, and RF bias conditions to each device under test, along with parametric measurements, limits monitoring, datalogging, and analysis. Components ...more

Model 2210 is a versatile, manually operated, burn-in or life test system for multiple lots of devices. All test parameters are set by the operator via front panel controls. This system is ideally suited to those test situations where tests are started and not monitored until the required test time has elapsed. ...more

The OPTIMUM 200-VLSI currently has the highest number of independent test channels available in a monitored burn-in system. The system has up to 512 independent I/O. Each test tray incorporates "distributed test architecture". This means that each test position operates completely independent of any other tray in the system. This is accomplished th ...more

The OPTIMUM 200-SEM is one of the most sophisticated burn-in systems developed for both engineering and production test applications. With a high speed timing generator and local processor at each burn-in board location, it represents the state-of-the-art in Test During Burn-In (TDBI) for semiconductor memory products. The system has been develop ...more

AMT burn-in boards meet commercial and military requirements for high temperature burn-in and reliability testing of electrical components, including 85 degrees C/85% RH testing. Computer aided design ensures high reliability and maximum density. AMT burn-in board designs are optimized for power bus current , minimum cross talk, and highest freque ...more

The HPC-512/1028 Automated Burn-In Board Test and Inventory Control System performs test, record keeping, data retrieval, and maintenance scheduling functions on burn-in boards and interconnect cables. Test system hardware will operate in a PC-compatible environment without additional control cables or hardware. Parametric test boards plug directly ...more

The Model 7804 is a burn-in or life test system for high voltage ceramic capacitors. The eight board system fixtures up to 480 chip or leaded devices. 5,000 Volt DC Bias Supply. ...more

The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing. ...more

Assessment services - HALT, thermal cycling/shock, temp/humidity, humidity bias/HAST, heat soak/burn-in, 3-axis random vibration, ESD testing, IPC650/GR-78-CORE/J-STD resistance testing and custom software. ...more

Advanced Microtechnology has introduce burn-in process services. Burn-in screening using the latest technologies featuring real time logging and web access for immediate status of lot screening progress. # Optimum Burn-in Services provides compatibility for a wide range of standard test interfaces. # Applications available for digital, linear, and ...more

The OPTIMUM 200-LCM burn-in system is a fully monitored test burn-in system for production screening of memory products. The system has been developed for high density memory testing in an integrated burn-in environment. The system provides functional verification of DRAMs, SRAMs, EPROMs, etc. The design goal for this system was to provide a fun ...more

Model 2030 is an ideal system for mil-spec burn-in and voltage conditioning. It is designed to meet test circuit requirements of voltage monitoring and interruption. Timekeeping and LED displays monitor elapsed time and failures. Device fixturing for 14,400 ceramic chip capacitors is standard. ...more

The OPTIMUM 200-CT burn-in system has been designed to specifically address parametric and functional testing in a burn-in environment. By utilizing an PMU through an IEEE interface, we can measure a wide variety of parametric measurements. The main emphasis of this system is for functional and Iddq measurements. The parallel nature of burn-in syst ...more

The UPstream™ wafer-level burn-in test solution supports the higher reliability requirements for mobile devices and known good die (KGD) applications. With high thermal stability, low probe impact, large-area planarity and high parallelism, UPstream helps maximize test cell productivity and reduces the total cost of test. ...more