Burn-In

The XLN6024 programmable DC power supply delivers up to 1440 watts of clean power on a single output. The compact 1U high 19 inch wide supply was designed to meet the needs of both system integrators and bench top users. Cost effective USB & RS485 interfaces combined with fast average command processing times of less than 50 ms make the XLN series ...more

The XLN3640 programmable DC power supply delivers up to 1440 watts of clean power on a single output. The compact 1U high 19 inch wide supply was designed to meet the needs of both system integrators and bench top users. Cost effective USB & RS485 interfaces combined with fast average command processing times of less than 50 ms make the XLN series ...more

The XLN10014 programmable DC power supply delivers up to 1440 watts of clean power on a single output. The compact 1U high 19 inch wide supply was designed to meet the needs of both system integrators and bench top users. Cost effective USB & RS485 interfaces combined with fast average command processing times of less than 50 ms make the XLN series ...more

The XLN8018 programmable DC power supply delivers up to 1440 watts of clean power on a single output. The compact 1U high 19 inch wide supply was designed to meet the needs of both system integrators and bench top users. Cost effective USB & RS485 interfaces combined with fast average command processing times of less than 50 ms make the XLN series ...more

The Bemco KDL series is designed for production testing of electronic circuit boards and completed electronic systems. They accept Bemco KDLC Carts that have a working area of 42 wide by 60 high by 48 deep suspended on insulated runners and casters 11 inches above the test area floor. ...more

Supervise the operation of your product, electronic device, circuit board, or medical device while they are stress screened, burned-in, or temperature cycled inside a Bemco Kardburn or Koldburn glass front chamber. With a huge amount of testing or storage space within instant reach, KD Chambers provide a compact and attractive alternative to a ...more

TetraTek chambers include high volume air circulation systems to maintain inside air temperature uniformity, assure test to test repeatability, and maximize testing effects. These chambers are available with large cooling systems to allow rapid temperature cycling or to handle huge product live loads. All can be mechanically or liquid nitrogen ...more

The BIBTEST 55 system is a fast, accurate, repeatable, test system specially designed for test and fault identification on burn-in boards. The system provides 256 programmable test channels upgradeable to 1024. Each channel is user definable as BIB edge or device pins. Sophisticated menu-driven software provides many features to assist in test ...more

The Model 2061 is a versatile Humid Environment Burn-in or Life Test system for discrete components. Although commonly used for a variety of ceramic capacitors other discrete components may also be tested by using appropriate DUT test cards. Multiple bias supplies allow simultaneous tests of different voltage levels. ...more

The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing. ...more

The Model 7804 is a burn-in or life test system for high voltage ceramic capacitors. The eight board system fixtures up to 480 chip or leaded devices. 5,000 Volt DC Bias Supply. ...more

Model 2110 is a versatile, manually operated, burn-in and life test system ideal for multiple lots of devices. All test parameters are set by the operator via front panel controls. This system is ideally suited to those test situations where tests are started and not monitored until the required test time has elapsed. ...more

New features of leading cutting-edge techniques associatedto the PCB O/S testing structure. Multi-Steps of power energy configuration option to the set-up function of releasing energy. Energy power applied to wires and PTH on PCB for assuring its durability and reliability. Reporting pint-out generated after breaking activity taking place t ...more

Model 2030 is an ideal system for mil-spec burn-in and voltage conditioning. It is designed to meet test circuit requirements of voltage monitoring and interruption. Timekeeping and LED displays monitor elapsed time and failures. Device fixturing for 14,400 ceramic chip capacitors is standard. ...more

The UPstream™ wafer-level burn-in test solution supports the higher reliability requirements for mobile devices and known good die (KGD) applications. With high thermal stability, low probe impact, large-area planarity and high parallelism, UPstream helps maximize test cell productivity and reduces the total cost of test. ...more

Model 2010 is a versatile manually operated, burn-in / life test system for multiple lots of devices. All test parameters are set by the operator via front panel controls. This system is ideally suited to those test situations where tests are started and not monitored until the required test time has elapsed. ...more

# IDRC CDSP-Series DC power supply has 35V ~ 150V , 100A ~ 2000A , 5KW ~100KW , available. # Sustainable inrush current 2 to 4 times of rated current, suitable for ATE, Burn-in and Motor Test applications # 85% high efficiency and compact design; 5KW in 4U case. ...more

Assessment services - HALT, thermal cycling/shock, temp/humidity, humidity bias/HAST, heat soak/burn-in, 3-axis random vibration, ESD testing, IPC650/GR-78-CORE/J-STD resistance testing and custom software. ...more

Model 2210 is a versatile, manually operated, burn-in or life test system for multiple lots of devices. All test parameters are set by the operator via front panel controls. This system is ideally suited to those test situations where tests are started and not monitored until the required test time has elapsed. ...more

We have partnered with Accel-RF Corporation to provide accelerated life and burn-in testing on a variety of RF and microwave components. The in-house Accel-RF systems provide fully automated temperature, DC, and RF bias conditions to each device under test, along with parametric measurements, limits monitoring, datalogging, and analysis. Components ...more

Temperature control included with HPB-2, HPB-4, HPB-5, HPB-5A, HPB-5B. Screens burn-in boards prior to extended environmental burn-in. For use with any Micro Control Company memory or logic burn-in system. Single-board testing& ...more

The SPEA H3000 BLU is innovative burn-in board loader unloader specifically conceived to pick & place electronic components from tray to PCB board and viceverse. The SPEA innovative concept allow to significally increase the throughput while ensuring a reduced cost of ownership. The Handler architecture is based on high speed axis moving o ...more

With decades of experience on the market, 3M Textool SOIC Sockets provide a proven, reliable test and burn-in interface for JEDEC SO style packages in pin counts of 8 to 28. ...more

Meets burn-in requirements, including extreme temperatures or continual handling. 2 or more layers of polyimide. 200° C maximum temperature. Gold-plated connectors. ...more

High-Power Burn-In Up to 150 Watts. Individual temperature control for each device under test up to 150-watts. Programmable temperature control up to 150° C. 800 amps of DUT power available per burn-in board. ASIC architecture for per-pin timing, testing, and formatting of pattern data. ...more