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Analyzers

examine data methodically by separating into parts and studying their interrelations. AKA: Analysers

See Also: Analyze, Analytics, Analysis


Showing results: 3691 - 3705 of 3937 items found.

  • Near-Field Probes 100 kHz up to 50 MHz

    LF1 set - Langer EMV-Technik GmbH

    The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.

  • Near Field Probes 30 MHz up to 3 GHz

    RF6 set - Langer EMV-Technik GmbH

    The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.

  • High-performance multifunctional AC Power Supplies (CV/CF)

    PCR-LE Series - Kikusui Electronics Corp.

    The PCR-LE Series is a new line of advanced multifunctional AC power supply that has been developed from our PCR-L/LA Series (linear amplifier type). The PCR-LE Series provides high reliability and can be applied to various applications, by taking advantage of the features that can control broadband waveform freely. Moreover, the PCR-LE Series can be configured as a core device of a test system combined with E-loads and Power Analyzers for “Grid Connection Testing” in regard to dispersed power generation, such as Solar Power, Wind Power, Fuel Cell, and Gas Engine referred to as “New Energy Field”. With various options, the low frequency immunity test and various power enviroment tests are supported. The options for parallel operation and three-phase operation enable you to expand a single-phase system up-to 27kVA, single-phase three wires up-to 54kVA, and a three-phase system up to 81kVA. The system can be applied to a large-scale EMC site for testing of industrial high-capacity air conditioners.

  • POLAR ENERGY

    4BAAA - Elcontrol Energy Net S.r.l.

    Polar Energy (the successor of the Elcontrol VIP 396 energy analyzer) is a multifunctional panel (96 x 96 mm) mounted tool, ideal for remote measurement, display and remote monitoring of electrical quantities.It features a 128×128 graphic display of great visibility and comfortable frontal buttons for direct consultation and setup. It has a wide range of electrical measurements.Compared to the predecessor VIP396, it adds many functionalities that make Polar Energy a modern and user-friendly tool for the user such as the introduction of cyclic connection verification to make installation easy and secure.The connections to the power cables and to the cables of the voltages and currents are carried out via the 2.5 mm2 terminals in the back of the instrument.For the calibration of the currents, it is necessary to use three TAs with a secondary 5 A.It can be used on single-phase, two-phase, three-phase low and medium voltage networks. Advanced features and included analysis software make it an ideal tool for the most demanding professional needs.

  • Infrared, Near Infrared and Raman Spectroscopy

    Bruker Corporation

    rom the very compact FTIR spectrometer to the world’s highest resolution: Bruker offers the industry's largest selection for demanding routine and High End FTIR research application including the new and unique verTera cw THz functionality.Process monitoring with FTIR / FT-NIR process spectrometers.A complete line of Near Infrared Spectrometers to fit all your needs, including Process Monitoring.FTIR Microscopy and Raman Microscopy and Spectral Imaging for high sensitivity at high spatial resolution.High spectral resolution, high performance Raman and FT-Raman spectrometers for advanced routine solutions.FTIR Gas Analyzers for the fully automated and high precision real-time monitoring of gas compoundsImaging Remote Sensing systems for analysis of gases, liquids and solids.CryoSAS semiconductor material quality control for photovoltaic and electronics industry.OPUS, the "all-in-one" IR and Raman spectroscopy software consists of a suite of software packages that cover both standard and specialized applications.ONET, software for the setup, administration and control of large FT-NIR spectrometer networks.

  • IP Video Stream Analysis And Monitoring

    TSM100 - Mividi, Inc.

    The Mividi TSM100 is an MEPG transport stream analyzer and IP video monitoring system for monitoring the quality of digital video services (QoS) delivered via IP or ASI interfaces. It can simultaneously monitor up to 300 services and perform deep MPEG analysis and video quality check 24 x 7. The system can be used for analyzing MPEG-2, H.264 and HEVC programs delivered over the Internet, as well as head-end equipment that uses IP for video transmission. The TSM100 provides IP layer analysis, MPEG transport layer analysis, key frame decoding, audio loudness measurement and service profiling. The system receives IP encapsulated digital audio and video data via 1 Gbits or 10Gbits Network adaptor. It will monitor all media flows in the network, perform extensive tests on standard compliance and user profile matching, and generate alarms when TS, video or audio errors occur.

  • Semi-Rigid Assemblies

    Teledyne Defense Electronics Storm Microwave

    Storm Products has been producing high performance semi-rigid interconnects for over 20 years for a variety of markets, including: defense, telecom, wireless and test & measurement. Experienced in:- Cable sizes from 0.034" to 0.500"- Solid PTFE dielectric and high performance tape wrapped products- Wide variety of standard connector styles: MCX, SMA, SMB, SMC, TNC, N, 7/16, SC, and HN- Years of experience on blindmate connector styles: OSP GPO, GPPO, and GMSSpecialized experience in:- Applications where phase stability is critical- low intermod interconnects- High power designsManufacturing equipment:- Automated bending equipment and optical comparators - Programmable thermal chambers for pre-conditioning formed cables- Specialized assembly and soldering equipment for high volume applications- Automated network analyzers through 50GhzDue to the custom nature of formed semi-rigid cable assemblies, additional information is required before providing a quotation for your requirement.

  • PXIe-5841, 6 GHz, 1 GHz Bandwidth, RF PXI Vector Signal Transceiver

    785832-01 - NI

    6 GHz, 1 GHz Bandwidth, RF PXI Vector Signal Transceiver - The PXIe-5841 is a vector signal transceiver (VST) with 1 GHz of instantaneous bandwidth. It combines vector signal generator, vector signal analyzer and high-speed serial interface capabilities with FPGA-based real-time signal processing and control. The PXIe-5841 features the flexibility of a software defined radio architecture with RF instrument class performance. This VST delivers the fast measurement speed and small form factor of a production test box with the flexibility and high performance of R&D-grade box instruments. The PXIe-5841 is available with an optional high-performance local oscillator module for improved phase noise, measurement time, and EVM performance. You can use the VST to test a variety of cellular and wireless standards such as Wi-Fi 6 and 5G NR. In addition, you can expand the small, two slot 2U PXI Express form factor to support multiple input, multiple output (MIMO) configurations.

  • PXIe-5841, 6 GHz, 1 GHz Bandwidth, RF PXI Vector Signal Transceiver

    786982-01 - NI

    6 GHz, 1 GHz Bandwidth, RF PXI Vector Signal Transceiver - The PXIe-5841 is a vector signal transceiver (VST) with 1 GHz of instantaneous bandwidth. It combines vector signal generator, vector signal analyzer and high-speed serial interface capabilities with FPGA-based real-time signal processing and control. The PXIe-5841 features the flexibility of a software defined radio architecture with RF instrument class performance. This VST delivers the fast measurement speed and small form factor of a production test box with the flexibility and high performance of R&D-grade box instruments. The PXIe-5841 is available with an optional high-performance local oscillator module for improved phase noise, measurement time, and EVM performance. You can use the VST to test a variety of cellular and wireless standards such as Wi-Fi 6 and 5G NR. In addition, you can expand the small, two slot 2U PXI Express form factor to support multiple input, multiple output (MIMO) configurations.

  • Near Field Probes 30 MHz up to 6 GHz

    XF1 set - Langer EMV-Technik GmbH

    The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.

  • IEC61850 Digital Substation Testing

    Ponovo Power Co., Ltd.

    With the development of power system, more and more digital substation based on IEC61850 has been built in the world. IEC61850 is the new communication protocol which is adopted by power system so as to change the analog complicated wiring connection and protocol conversion. Based on IEC61850, all Messages, such as GOOSE, SV, MMS, PTP, etc, could be communicated on the Ethernet via fiber optical cable connection. In China, the digital substation have started since 2003, until now there are already more than 6000 digital substation put on operation, China Power Grid is planning to build 5000 more new digital substations. PONOVO, as the leading power system testing solution provider, have launched plenty of IEC61850 digital testing tools, not only digital relay test set, but also MU test set, multi-functional analyzer, 24 hours online monitoring and analyzing system, etc so that users could have suitable testing equipment for the digital substation commissioning and testings.

  • LED Power Driver ATS

    8491 - Chroma ATE Inc.

    1. DC Electronic Load : Chroma 6310A/6330A Series2. Transducer Unit/Module*1 : Chroma A849101/A849102, A849103, A8491043. Time/Noise Analyzer : Chroma 80611 & 80611N card4. Sytem Controller*2 : Industrial PC5. DC Source: Chroma 62000P Series6. Digital Power Meter : Chroma 66200 Series7. OVP/Short Circuit Tester : Chroma 806128. ON/OFF Controller : Chroma 80613*1 : A849101 transfers UUT output signal to voltage signal, and measure by 84911 LED power driver measurement card (200kHz). The optional 80611N Noise card is required for 20MHz ripplecurrent measurement.*2 : The controller includes both 84911 LED Power Driver measurement card and 84903 control card.- 84911: Measure rms current, dimming current/frequency/duty, timing, power & ripple current (200kHz)- 84903 : Provide BL control signal(DC level, PWM, SM bus), and enable ON/OFF signal.C Source : Chroma 6500/61500/61600 Series

  • Low-leakage Switch Matrix Family

    Keysight Technologies

    Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test.  Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution.  Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested.  This reduces both test time and cost.  Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.

  • Portable Test Platform

    FTB-4 Pro - EXFO Inc.

    The FTB-4 Pro is the latest addition to EXFO’s test orchestration portfolio which transforms business as usual into smarter, scalable network testing that significantly increases operational efficiency and provides vital insights into field operations, network performance and service delivery. The 4 slot modular FTB-4 Pro platform enables a unique combination for 100G commissioning, turn-up and troubleshooting which includes the FTBx-88200NGE 100G Multiservice tester (with iOptics transceiver validation software) and the FTB-5240S-P optical spectrum analyzer. There is no need to carry additional platforms or swap modules for unmatched transport and spectral testing on a single platform that no one in the industry can offer. The versatile FTB-4 Pro platform supports a wide range of modules for field testing, data center interconnect, submarine testing, and lab applications for maximum flexibility and ROI across all phases of the service delivery chain: development, deployment, maintenance and troubleshooting. Module combinations on the FTB-4 Pro can also include iOLM/OTDRs, market leading OLTS for fiber characterization, dispersion solutions and other transport modules all with compatibility with EXFO’s market leading fiber inspection probes.

  • TestCentre

    ARC Technology Solutions

    ARC has experience with complex, commercially available test executives that are available for high volume production needs. Often times, when you don’t need the horsepower of a full featured executive, you are left with creating a specifically defined test program or crafting your own test sequencer. Rather than go down this path and spending your time on architecture, TestCentre brings a simple, yet elegant solution to this all-common problem. Used in many of ARC’s standard test stations, the robust, sequence based architecture of TestCentre, allows you to focus on the testing task at hand. While having some of the more advanced features found in high-end test executives, TestCentre, when mixed with RF analyzers and PXI based test solutions are a great, low cost solution to help solve your everyday testing requirements. Along with TestCentre and an ARC supplied rack-based test platform, your test challenges can be solved in doing circuit card testing, assembly/module level testing, or depot repair troubleshooting tasks.

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