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XY Stages
two linear axis movement positioning a test target.
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Plane Mirror Interferometer
10706A
The Keysight 10706A Plane Mirror Interferometer is a dual pass interferometer used for multiple axis applications such as X-Y stages where the measurement mirror may move perpendicular to the measurement axis. The unique contribution of the 10706A is its tolerance of angular misalignment of the plane mirror reflector. The 10706A can accept a range of measurement mirror angular alignment changes.
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High Stability Plane Mirror Interferometer
10706B
The Keysight 10706B High Stability Plane Mirror Interferometer is a dual pass interferometer used for multiple axis applications such as X-Y stages where the measurement mirror may move perpendicular to the measurement axis. This thermally stable optic, an exact functional replacement for the 10706A Plane Mirror Interferometer, reduces thermal measurement drift to 1/12 the value typically achieved by conventional plane mirror interferometers. The unique contribution of the 10706B is its tolerance of angular misalignment of the plane mirror reflector. The 10706A can accept a range of measurement mirror angular alignment changes.
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XRF
B Series
The B Series represents the most basic top-down measurement configuration that Bowman offers. The sample stage is a fixed base plate, requiring operators to manually position parts in the desired area for testing. This is accomplished by placing parts into the chamber and using the video image to align the desired location within the crosshairs on the screen. The sample chamber is the same as the P Series, with the slotted configuration, but without the programmable X-Y sample stage.
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Bond Tester for Wafers 2 - 12 inch
Sigma W12
Bondtester for wafers or at wafer level 2” – 12” (up to 300 mm)Precise testing and Cold Bump Pull (CBP) testingLarge X/Y stages X: 600mm, Y: 370 mmForce range from 1gf – 10 kgfBump pitch down to 20 µm
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Automated XY Stage
AT2
The Instron AT2 is a compact automated XY stage that streamlines compression, tensile, and flexural testing for both batches of specimens and single components with multiple test points. Designed for seamless integration with 6800 Series universal testing systems, the AT2 features standard bolt patterns for custom fixturing and accommodates a wide range of specimen geometries. Fully integrated with Bluehill® Universal software, it enables operators to quickly define and execute test sequences using grid, diamond, or custom layouts—boosting throughput, consistency, and testing efficiency.
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Portable Microscope With XY Stage, X150 2mm Field Of View
*Veterinary Worm Egg Counting*Counting of algae and other samples*Easy positioning of the sample*Methodically scanning of slides and counting chambers*Works with standard microscope slides and counting chambers (25x75mm or 1”x2”) and with 32mm wide counting chambers*Allows manual movement of the slide and counting chamber independently in the left-right (X) axis and front-back (Y) axis
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Rapid Automated Modular Microscope
RAMM
Applied Scientific Instrumentation
*Featuring automated high-speed XY stages, precision piezo & motorized Z focusing, and a wide range of scanning options.*Configurable with infinity-corrected optics, dichroic filter cubes, multi-wavelength excitation and emission filterwheels, shutters, and detectors including cameras and photomultipliers.*Auto-focus, focus stabilization, tracker, and robotic specimen loader available.*Arrangement provides a solid platform for high throughput screening, genetic sequencing, experimental research, and much more.*Designed for flexible cost-effective OEM development using high quality high MTBF components to reduce cost and increase customer satisfaction.
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Hot Temperature Hardness Tester
1200C
Rtec high temperature hardness tester is used to do high temperature materials testing up to 1200C. To prevent oxidation of tip and the samples the high temperature indenter comes with sealed chamber with inert gas. High resolution programmable down force control and XY stage allows to do multiple indents on same or multiple samples with ease.
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Stereoscopic Zoom Microscope Automation
SZ-2000
Applied Scientific Instrumentation
Based on ASI's proven DC servo motor technology, the SZ-2000 automates stereo zoom microscopes. The unit can be configured for motorized focus only, motorized focus with automated zoom control, or motorized focus with automated zoom control and an automated XY translation stage. The Z axis focus resolution varies slightly depending upon the model of the microscope, with 0.8 microns being the smallest step size available on a Nikon SMZ800.
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Hardness Testing Machines
Operation by dedicated software AVPAKAutomatic reading for indentationAutomatic test positioning by motor-driven XY stage
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Piezo-Z Top Plate
PZMU-2000
Applied Scientific Instrumentation
The PZMU-2000 is a precise piezo Z-axis stage that can be attached to the top of a microscope's existing XY stage or be used in stand-alone applications. On select models of microscopes, ASI can mount a PZMU-2000 to an OEM stage. We can procure a manual OEM stage for you if necessary.
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XRF
P Series
The P series offers the flexibility of measuring a wide variety of sample sizes, shapes, and quantities. It is equipped with a high precision programmable X-Y stage that offers several convenience factors over a fixed stage. Operators can use the mouse and software interface to move to desired measurement locations easily. Multi-point programs can be created to automatically measure multiple sample locations with the click of a button. Pinpoint control is achievable for testing critical areas. Larger sampling volumes are possible through multi-point programming.
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ElectroPuls® Automated XY Stage
Test the durability of your products and components in ways not possible until now, using Instron®’s ElectroPuls Automated XY Stage.
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XRF
G Series
The G Series’ two most distinctive features are precision video imaging, and “bottom-up” measurement using a motorized Z-axis with laser-based auto-focus. The latter is a feature unique to Bowman. An available manual XY stage with 1.5 X 1.5” travel facilitates easy positioning of small and large parts. The chamber is relatively small when compared to other models like the B Series. The smaller chamber and footprint is well suited for jewelry and other precious metal analysis applications, and components such as connectors and fasteners.
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XY Stage 10nm Resolution
U-723 PILine®
Physik Instrumente GmbH & Co. KG
Compact XY Stage with Ultrasonic Piezomotors. Fast positioning in 2 axes. Space-saving and light. Excellent guiding accuracy. High sensor resolution of 10 nm. Self-locking, no heat generation at rest. Low-noise operation.
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High-Precision XY Stage
V-731
Physik Instrumente GmbH & Co. KG
Reference-class XY stage. Travel range 205 mm × 205 mm (8"). Unidirectional repeatability to 0.1 μm. Velocity to 200 mm/s. Incremental encoder with 10 nm resolution.Optionally with stepper motor.
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High-Resolution Interferometer
10716A
The Keysight 10716A High Resolution Interferometer is used for single and multiple axis applications such as precision X-Y stages. The 10716A offers twice the resolution of conventional plane mirror interferometers and has the same excellent thermal stability as the 10706B High Stability Plane Mirror Interferometer. Measurement drift is typically of that exhibited by a conventional plane mirror interferometer. These features result in improved accuracy, repeatability, and thermal stability. However, slew rate is halved.
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Spectroscopic Reflectometer
– Antireflective coating (ARC) on textured (poly-) crystalline silicon solar cellMeasurement– Thickness, Reflectivity, n&kWavelength– 420 – 950 nm (1.3-3.0 eV) : expandableAccuracy (thickness measurement on specular sample)– 104.5 nm for 104.8 nm SiO₂on c-Si* Accuracy can be dependent on the quality of filmThickness range– 10 nm ~ 20 mm (depend on sample)Data acquisition time– < 1 sBeam spot size– ~ 50 mmFocusing of beam– Manual (optional auto-focus)Sample stage– Manual X-Y stage (specify sample size and travel distance)(optional automatic X-Y stage for mapping)
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Automated Testing Systems
Instron’s automated testing systems bring precision, productivity, and safety to materials testing by automating routine tensile, flexural, and compression operations. Available as full turnkey platforms or modular add-ons for existing test frames, these systems — including the AT3 three-axis, AT6 six-axis robotic, AT2 automated XY stages, CT6 cobot integration, and carousel stations — allow labs to boost throughput, reduce operator variability, and free up staff for higher-value activities. The systems are engineered to support a wide spectrum of materials (plastics, metals, films, composites, medical devices) and comply with international ASTM and ISO test standards while enhancing repeatability and workflow efficiency.
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Portable Microscope With XY Stage, X400 1mm Field Of View, 1µm High Resolution
*Counting of cells, algae and other samples*Easy positioning of the sample*Methodically scanning of slides and some counting chambers*Works with standard microscope slides (25x75mm or 1”x2”) and 32mm wide counting chambers (top cover of counting chamber needs to be <1mm thick)*Allows manual movement of the slide and counting chamber independently in the left-right (X) axis and front-back (Y) axis
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XRF
L Series
The L Series is the most versatile instrument that Bowman offers. It combines all of the features of the P Series with a larger sample chamber and greater X-Y stage travel. For samples larger than ~12 inches (300 mm) in any direction, the L Series is a must-have. The large sample stage and travel allows for both large parts, or large sample fixtures holding multiple parts, to be measured. The chamber is fully enclosed and boasts a capacity to hold samples up to 22″ (550mm) x 24″ (600mm) x 13″ (330mm) (LxWxH). The X-Y stage travel distance is 10″x10″ (254mm x 254mm). The standard configuration includes a 4-position multiple collimator assembly, and a variable focus camera allowing for measurement in recessed areas. As with other models, the collimator sizes and focal distances are customizable for different customer applications. The programmable X-Y stage is included, but can be removed to allow for the maximum sample height capacity (10″ (254mm) z-height with stage, 13″ (300mm) without). The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. The high performance SDD detector is an optional upgrade.
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High Accuracy Dimensional Metrology System
Pinnacle 250
The Pinnacle features a damped granite base and column, with passive vibration isolation. A precision compound X-Y stage with high-speed linear motor drives provides velocity of 400 mm / sec and acceleration of 1000 mm / sec2. This combination of high acceleration and high velocity enables the high throughput required for near-line process monitoring.
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Thermal Microscope Stage
TS-4MP
With our TS-4MP Thermal Stage, a specimen on a microscope slide or culture dish can be maintained at any temperature between -20°C and +60°C. Setup is easy, takes little time, and the controller will regulate the stage temperature to within +/-0.1°C
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High-Accuracy Translation Stage
M-605
Physik Instrumente GmbH & Co. KG
M-605 series translation stages are designed to meet the most demanding positioning requirements in applications where space is limited.They feature a space-saving design with the ballscrew side-by-side to the motor and an extremely flat, precision-machined base of high-density, stress-relieved aluminum providing exceptional stability and minimum weight.
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Nanopositioning Stage & Controller
PInano
Physik Instrumente GmbH & Co. KG
PInano® XY and XYZ low-profile piezo scanning stages are optimized for easy integration into high-resolution microscopes. They feature a very low profile of 20 mm (0.8") and a large aperture designed to hold Petri dishes and standard slide holders. The long travel ranges of up to 200 x 200 x 200 µm with nanometer closed-loop resolution are ideal for leading-edge microscopy and imaging applications. PInano® series piezo positioning stages are available in two versions: A) Highest Stability, Linearity and Precision with capacitive feedback sensors. B) High Precision with lower cost piezoresistive sensor feedback. Both types provide very high sensitivity and responsiveness as well as nanometer resolution. A proprietary servo controller significantly improves the motion linearity of the piezoresitive version compared to conventional piezoresistive sensor controllers.
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Smart Power Stage
Renesas Smart Power Stage (SPS) modules have integrated high accuracy current and temperature monitors that can be fed back to the controller and doubler to complete a multiphase DC/DC system. They simplify design and increase performance by eliminating the DCR sensing network and associated thermal compensation.
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Image Analysis & Stage Micrometers
The APPLIED IMAGE series of Image Analysis and Stage micrometers are ideally suited for calibrating optical, imaging, video, and reticle-based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Both types of micrometers come with NIST traceable calibration standards and are available on multiples substrates to perfectly fit your needs. The experience APPLIED IMAGE has in manufacturing precision imaged optical components makes us the trusted source for standards for magnification system microscopy and vision applications. Should you need to alter feature patterns, size, or substrate, fill out our Custom Optical Components and Standards form to start the conversation.
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High-Power Stage Monitors
MJF
Between the small footprint of the MJF-208 or the balanced but potent output of the MJF-210, your stage monitor requirements are covered.
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Measurement Technology for the Development Stage
EMC tools for relative measurements of interference emission of assemblies and devices.
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Cryo-Correlative Microscopy Stage
CMS196
Linkham Scientific Instruments
Electron microscopy (EM) provides structural information at very high resolution. However, it can give only restricted insight into biological and chemical processes due to limitations in staining and sample preparation processes. Fluorescence microscopy on the other hand is a very sensitive method to detect biological, chemical and genetic processes and events inside living cells. Cryo-CLEM brings it all together: it is a new and emerging technique to combine the individual advantages from both Fluorescence and EM by imaging the same sample location with both techniques and superimposing the complementing information.
