Showing results: 1 - 15 of 16 items found.
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ProCon X-Ray GmbH
One main component of the system is Excillum’s high performance X‑ray source NanoTube N2, a up to 110 kV X‑ray tube with latest tungsten-diamond transmission target technology, automatic e‑beam focusing and astigmatism correction, ensuring that the smallest possible, truly round X‑ray spot is achieved.
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Exact Metrology
Computed tomography (CT) is also referred to as industrial x ray and industrial imaging. It is an x-ray methodology yielding 3-dimensional (3D) results by placing an object on a rotational stage between an x-ray tube and x ray detector, rotating the object 360 degrees and capturing images at specific intervals—such as every degree or every half degree.
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ProCon X-Ray GmbH
The table system with minimum space requirement for the investigation of plastics, ceramics and new materials. The CT-MINI computer tomograph from ProCon X‑Ray GmbH impresses with excellent CT results in real time.
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ProCon X-Ray GmbH
The compact table system for high demands. In addition to plastics and ceramics, the CT-COMPACT computer topographer from ProCon X‑Ray GmbH also tests more absorbent materials such as metals and larger test parts with the best visualization quality.
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FISCHERSCOPE X-RAY/XULM -
Helmut Fischer AG
Flexible instrument for measuring coating thickness with multiple usesBoth thin and thick coatings (e.g. 50 nm Au or 100 m Sn) can be measured equally well through selectable high voltage filter combinationsThe micro-focus tube enables small measurement spot sizes at short measurement distances of just 100 mHigh count rates of a few kcps through proportional counter tubeMeasuring direction from bottom to top, this allows for quick and easy sample positioningLarge measurement chamber with a cutout (C-slot)
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FISCHERSCOPE X-RAY/XDAL -
Helmut Fischer AG
With semiconductor detector, this expands the possibilities in element analyses and for measuring thin coatings due to better signal/noise ratiosMicro-focus tube allows also for smaller measurement spots, but because lower in intensity, less well suited for smaller structures.Large and spacious measurement chamber with a cutout(C-slot)Fast, programmable XY-stage with pop-out function
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FISCHERSCOPE X-RAY/XDLM -
Helmut Fischer AG
Very universal because equipped with a micro-focus tube, 4-x aperture changer and 3 primary filtersSuitable for smaller structures such as connector contacts or printed circuit boardsLarger measuring distances are possible as well (DCM, stroke 0-80 mm)Large and spacious measurement chamber with a cutout(C-slot)A programmable stage for automated measurements is available
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FISCHERSCOPE X-RAY/XUL -
Helmut Fischer AG
For coating thickness measurements in the electroplating industryFixed aperture and fixed primary filterX-ray tube with a slightly larger primary spot, well suited for applications with measurement spot sizes starting at about 1 mmLow-energy beam components are excited with lower effectiveness, however for standard applications measuring the thickness of typical electroplated coatings such as Cr, Ni, Cu, this poses little to no problemMeasuring direction from bottom to top, this allows for quick and easy sample positioningLarge measurement chamber with a cutout (C-slot) Standard X-ray tube, proportional counter tube
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FISCHERSCOPE X-RAY 4000 -
Helmut Fischer AG
For continuous measurement of coatings on foils, strips and punched strips in ongoing productionMeasuring head may be positioned at right angles to the transport direction of the specimenEasy handling and quick start-upProportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detectorPositioning device for measurements on several measuring positionsCustomer-specific designAutomated calibrationFast conversion from one production line to anotherEasy integration into quality management systems and process controls
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FISCHERSCOPE X-RAY 5000 -
Helmut Fischer AG
Flange measuring head for continuous measurements in production linesProportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detectorQuick and easy calibration on a workpiece master directly in the production processFor use in air or vacuumAllows measurements even on very hot substrate materials up to 500 C (930 F)Design is focused on maximum robustness and serviceability
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FS2011 -
KILTER ELECTRONIC CO.,LTD
FS2011 radiation Detector is used highly senditive Geiger counter; it is mainly responsible to the radiation of X, r and hard β ray in various areas; it is featured as swift response and wide measurement range; it is able to display the equivalent dosage rate and accumulative dosage in the work area; This instrument is widely used to monitor the individual safety protection and indicate the radiation for work person in the following fields: nuclear power plant, accelerator, iron & steel industry, chemical industry, isotope application, industrial X and r non-destructive flaw detection, radioactive medical treatment, Cobalt source treatment, r radiation, radioactive laboratory and surrounding environment monitor of nuclear facilities.
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FISCHERSCOPE X-RAY/XAN 250 -
Helmut Fischer AG
Universal premium instrument with comprehensive measurement capabilitiesAperture (collimator) 4x electrically changeable, Primary filter 6x electrically changeableWith high-resolution silicon drift detector (SDD) also applicable for more complex analyses with many elementsMeasuring direction from bottom to top, this allows for quick and easy sample positioning
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FISCHERSCOPE X-RAY/XAN 500 -
Helmut Fischer AG
Mobile measurement of coatings on large parts such as housings, machine components or pipes Stationary measurement on small parts; the compact carrying case transforms the device into a complete desktop unitThree-point sample support ensures safe, and repeatable measuring, and accommodates curved surfacesTime-effective measurement even without calibration due to FISCHER's fundamental parameterEvaluation and presentation of measurement data on a tablet PC (via Bluetooth) using the proven software WinFTM
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FISCHERSCOPE X-RAY/XDV-SDD -
Helmut Fischer AG
Premium model with universal application characteristicsHighest excitation flexibility, for both the size of the measurement spot and the spectral compositionWith the silicon drift detector, even very high intensities> 100 kcps can be processed without a loss in energy resolutionVery low detection limits and excellent repeatabilityLarge and easily accessible measurement chamberAutomated series testing with fast, programmable XY-stage
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Electron Probe X-Ray Analyzer (EPXA) -
Amptek Inc.
The software runs on standard PC’s and operating systems (Windows XP and later). Complete ZAF analysis is possible, with or without standards, using an internal database of fundamental parameters (FP) such as absorption coefficients, fluorescence yields, transition probabilities, etc. There is also an integrated spectrum display.
