Showing results: 3361 - 3375 of 3577 items found.
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ams AG
NFC and UHF RFID sensor tags offer a highly integrated solution for remote sensor data logging. The tags conform to the specifications of the NFC/ISO15693 as well as the UHF RFID standards. Featuring on-chip temperature sensing and the exclusive cool-Log™ technology, these sensor tags enable innovative and cost-sensitive solutions in food and pharmaceutical cold-chain management, industrial process control, remote monitoring and healthcare applications. NFiC™ ICs from ams lower the barriers to NFC integration in electronic devices thanks to their small footprint, high data rate, flexible data transfer modes, fully passive NFC tag emulation and advanced energy harvesting. NFC/HF interface tags are best suited to demanding consumer and industrial applications such as zero-power device configuration and set-up, feature-rich contactless cards for payment and authentication, smart toys and connected cars.
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62000P series -
Chroma ATE Inc.
Chroma's new 62000P Series of programmable DC power supplies offer many unique advantages for ATE integration and testing. These advantage include a constant power operating envelope, precision readback of output current and voltage, output trigger signals as well as the ability to create complex DC transients waveforms to test device behavior to spikes, drops, and other voltage deviations.Designed for automated testing DC-DC converters and similar products, the 62000P sets a new standard for high accuracy programmable DC supplies. The 62000P Series includes 12 different models ranging from 600W to 5000W, up to 120A and up to 600V. Due to their constant power operating envelope a single instrument can provide both high voltage/low current AND low voltage/high current thereby reducing the number of supplies needed in typical ATE applications.
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Celadon
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe card as well as DUT probing solutions. These custom cryogenic probe card solutions are widely used to test Space, Military, Medical and Quantum Computing products. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovative custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cableout designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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NOVOTEST TP-1 -
NovoTest
Portable Coating Thickness Gauge NOVOTEST TP-1 – device for operative non-destructive testing of coating thickness in compliance with ISO 2808 with high measurement accuracy.Coating thickness gauge is designed to test:thickness of various thick protective coatings on various metals and alloys;thickness of paint and other dielectrics – radioabsorbing, mastic, teflon, plastic, electroplating coatings on steel;thickness of electroplating and paint coatings on non-ferromagnetic alloys and non-ferrous metals;thickness of bitumen and other thick coatings on various metals and alloys;as well as relative humidity, air temperature, surface temperature, dew point temperature and difference between surface and dew point temperatures, estimate the depth of grooves and the surface roughnessElectronic thickness gauge – device which widely used in shipbuilding and automotive industries for measuring of the thickness of paint, in order to test the quality of products, also it used for determining technical condition of the tested objects.
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Celadon
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe cards as well as DUT probing solutions. These Cryogenic probe cards have all the benefits of Celadon’s Crash Resistant™ probe technology but with the ability to probe as cold as humanly possible. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovate custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cable-out designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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Amida Technology, Inc.
AMIDA 2020XP CIS tester is the latest generation of CMOS image sensor-specific measuring instruments from Metatech. In addition to the original true and accurate measurement, the high-throughput mass production solution designed for the high-throughput inspection of image lens modules and camera lenses has been well received after nearly 20 years of mass production experience. First-class factories at home and abroad import production. AMIDA 2020XP CIS testing machine not only meets the customer's testing time and high output and accuracy requirements. Within the range of functional flexibility, users can customize their measurement requirements according to the definition of various sensors. AMIDA 2020XP CIS tester is a new generation of CMOS Image Sensor dedicated tester, which integrates DC open/short/leakage test, AC Pattern test and image test. It uses 180 Pin high-speed cable to connect to the test end
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TA-3320 -
Tech-Aid Products
This NAV test fixture is specific to the requirements for testing Becker Avionics NAV, RMI and RMU products. The panel incorporates specific functionality required for testing these Becker products by the book including special requirements for the RMU 5000 and the IN 3300 series of nav indicators. This BAEE NAV test fixture also facilitates resolver alignment and discrete meter testing through the PG 3300 interface connector. The RM 3300 portion of the panel tests the Becker RMI indicators and allows for sourcing the composite signal from the paired radio or from an external generator. The DME channeling outputs are monitored with discrete LED's as well as the ILS, V/LOC, Glideslope and NAV TEST valids. Discrete test jacks are provided for all the meters and the resolver of the NAV indicator and a dimming source is also provided. When testing the RMU 5000 computer access is through a dedicated connector.
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63110A/ 63113A/63115A -
Chroma ATE Inc.
As shown on the V-I curve in figure 1, the LED has a forward voltage VF and a operating resistance (Rd). When using a resistor as loading, the V-I curve of the resistor is not able to simulate the V-I curve of the LED as shown in blue on figure 1. This may cause the LED driver to not start up due to the difference in V-I characteristic between the resistors and the LEDs. When using Electronic Loads, the CR and CV mode settings are set for when the LED is under stable operation and therefore, is unable to simulate turn on or PWM brightness control characteristics. This may cause the LED driver to function improperly or trigger it’s protection circuits. These testing requirements can be achieved when using a LEDs as a load; however, issues regarding the LED aging as well as different LED drivers may require different types of LEDs or a number of LEDs. This makes it inconvenient for mass production testing.
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TP121-TH -
Gigahertz-Optik GmbH
The photometric specifications of LEDs must meet very high tolerance requirements regardless of whether they are to be used in general, automotive or other specialist lighting applications. This is often a problem since the manufacturing tolerances of LEDs can be higher than those permitted in the end-use applications. Also, LED binning by LED manufacturers in order to classify LEDs based on their tolerances is performed with flash mode testing using pulsed current flow. However, end-use applications of the LEDs often operate in constant current mode and with significant thermal effects. The sophisticated LED processing industry therefore requires measurement devices that can be used for both manufacturer-compliant pulsed mode, as well as constant current operation mode. When the LEDs are run in constant current mode, the junction temperature has significant influence on the performance and lifetime of the LED. Therefore, test systems should be able to test the LEDs at specific junction temperatures.
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imc Test & Measurement GmbH
Electric drives such as DC and EC motors are more and more extensively deployed in the automotive industry. At the same time there is an increasing requirement for a 100% analysis of motors for fault detection and error analysis as well as statistics on quality, without increasing production cycles times. The model-based Parameter Identification method (PI method) from imc allows testing to be performed under load, yet without an “explicit” separate load machine. Instead, the motor is loaded dynamically by exploiting its own inherent inertia. This allows motor parameters such as resistance, inductivity and friction to be determined within a few seconds. A mathematical model and its parameters reflect motor behaviour in its completeness and make it possible to monitor motor production based on limit values and trend statistics. The identified parameters of the model equation can then be used to calculate derived key performance indicators of the motor characteristic curve.
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TTRM 102 -
Scope T&M Pvt, Ltd.
SCOPE introduces state of the art precision single phase Transformer Turns Ratio Meter (TTRM ) designed for field testing as well as factory testing of power transformers, instrument transformers and distribution transformers of all types. TTRM 102 along with turns ratio, measures ratio deviation, phase angle deviation, magnetizing current and detects tap-position of single phase transformer in charged switchyard condition. The range of AC voltage selection offers high accuracy in measurement.Both the instrument have in-built TFT display with touch screen and thermal printer. The user friendly, simple instrument makes the testing more easy. With the touch keypad it is possible to enter required DUT information.The ratio results are displayed with % error. Internal non-volatile memory gives the provision of storing test results.Further data can be downloaded to PC or copied to memory stick through USB port provided.
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Analog Devices Inc.
Analog Devices offers RF Front-End ICs for phased array antenna solutions. These RF Front-End ICsare placed right at the antenna element and can quickly switch between transmit and receive functions in radar applications. The power amplifier on the transmit side is highly efficient operating in short pulse durations. The low noise amplifier on the receive side has a low noise figure with high linearity so that it won’t distort the incoming return signal. The RF Front-End IC also incorporates a high performance switch to toggle between the transmit and receive paths. Highly integrated planar phased array antennae need small form factor solutions, and Analog Devices has integrated the switch, low noise amplifier, and power amplifier into a small surface mount package as well as the decoupling capacitors, providing an optimal solution.
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RC-088 -
Rinch Industrial Co.,Limited
This instrument is a special equipment for measuring the reflectivity of rearview mirror (or similar product) of motor vehicle. The product composes intelligent measuring instruments, optical integrating sphere, parallel lamp, standard light source, constant current source etc. It is easy to operate，it can measure the reflectivity quickly and accurately. On instrument structure, it adopts standardized modulation design. It takes latest single chip as its digital central processing element. After the measuring signal is converted by modulus, CPU will do some computation and compensation. The instrument can display the reflectivity of device which is measured in rear time. It operates simply and quickly, the indication is direct and accurate. It’s good for quality examination &control in the production scene as well as laboratories. This product has the convenience &quick demarcation way, can meet requirement of different occasion. It is applicable for measuring light reflection on mirror and not mirror parts.
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Nanovea Inc.
NANOVEA Mechanical Tester is the most versatile nanoindenter and scratch tester capable of precisely measuring the micro- to nanomechanical properties of wide ranges of materials from thin films, coatings, ceramics and composites to polymers and bio materials via Indentation, Scratch and Friction testing. All NANOVEA Mechanical Tester models come with true feedback load control from independent load and depth sensors that provide unmatched accuracy and the highest repeatability available on the market. This technology allows a user to perform Nanoindentation and Microindentation for Hardness and Elastic Modulus Testing, Stress vs Strain Analysis, Creep and Relaxation, Loss and Storage Modulus, Yield Strength and Fatigue, Fracture Toughness and Nano-scratch & Micro-scratch for Scratch Hardness Testing, Multi-pass Wear Test, Cohesive and Adhesive Failure Testing as well as Coefficient of Friction testing, all available on one system.
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Omnicor
Ethernet switches, routers and gateways have their distinct purposes and it is important to test their performance well. During R&D and DVT products are usually tested on L2/L7 while in production basic L2/L3 tests are usually sufficient. For those who follow testing methodology RFC 2544 and RFC 2889 are also available.IP traffic packet generators/analyzers for 10/100/1000 Mbps, gigabit and 10 gigabit with PoE options are the most important test instruments to ensure Ethernet switch or router product quality is verified. Gigabit TAP analyzers, media convertors, production test software suites and Ethernet cable emulators are additional tools used in conjunction with stream generators to help ensure fast development cycle and high quality. Our IP performance test systems are economic and known worldwide for excellence in quality and service support.
