Showing results: 676 - 683 of 683 items found.
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DRK6618 -
Shandong Drick Instruments Co., Ltd.
DRK6618 digital V prism refractometer is a high precision multi domestic first growth range digital refractometer, to refractive index of transparent or translucent solid or liquid material ratio, average dispersion, dispersion (i.e.can refraction determination of 706.5nm, 656.3nm, 589.3 nm, 546.1 nm, 486.1 nm, 435.8 nm, 434.1 nm, and 404.7 nm of eight commonly used wavelengths rate) and the mass fraction of sugar solution (Brix) instrument forfast and accurate determination of. A friendly operation interface, high testing speed, good repeatability, temperature correction, data storage, U disk storage, and USB communication interface function. Because the index of refraction is one of the most important optical constants of material, can in order to understand the optical properties of the material, such as purity, so it is one of the scientific research units, universities and the optical glass industry the necessary equipment, but also widely used in petroleum, chemical, pharmaceutical, sugar, food industry, and other industries.
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Thorlabs, Inc.
Thorlabs' Scientific-Grade Cameras are specifically designed for microscopy and other demanding applications. The Zelux™ CMOS cameras have small footprints and provide cost-effective solutions for general-purpose imaging applications. Kiralux® cameras have CMOS sensors with high quantum efficiency in a compact housing and are offered in monochrome, color, NIR-enhanced, and polarization-sensitive versions. Our polarization-sensitive CMOS camera is ideal for materials inspection, flaw detection, and other advanced techniques using polarization. The Quantalux® monochrome sCMOS cameras are fast frame rate imagers that combine high dynamic range with extremely low read noise for low-light applications. They are available in either a passively cooled compact housing or a hermetically sealed TE-cooled housing. We also offer scientific CCD cameras with a variety of features, including versions optimized for operation at UV, visible, or NIR wavelengths; fast-frame-rate cameras; TE-cooled or non-cooled housings; and versions with the sensor face plate removed. An intuitive software package, API and SDK for developers, and third-party software support provide options for custom system control and image acquisition.
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Enlitech
From the review of the scientific development history, reliable and stable artificial light sources have played a very important role in the past century. For example, the artificial solar simulator is an important part of simulating sunlight to ensure accurate performance of PV characterization. With the growth of light sensor applications, more and more requirement of light simulators (or artificial light sources) explored. One of the core technologies of Enlitech is the artificial light sources. We can manipulate different lamp types (short arc lamps, LEDs, filament lamps et. al.) to generate different spectrum-form in different light intensity levels, beam sizes, and wavelength ranges. We have launched different artificial light source products for different applications fields. For instance, SS-X series solar simulators and ILS-30 ambient light simulator are for the PV field, HAAS is highly accurate star light simulator for the space field, and ALS-300 is a general-purpose light source in science research field. These products can not only meet the needs of your application, but also speed up the process of your research or mass-production.
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EXFO-100 -
Hangzhou Softel Optic Co., Ltd.
* Top user-friendliness: one-button testing, combined with EXFO’s proprietary FTTx software package (macrobend/fault finder, pass/fail indicators)*Multiple options, including power meter, visual fault locator (VFL), fiber inspection probe, printer and IP testing*Fault Finder mode, for quick identification/location of a fiber break*Complete connectivity flexibility: USB stick compatibility and USB cable data download via ActiveSync**Advanced TFT transflective color display, for assured legibility under direct sunlight or in other demanding outside conditions*Handheld, small, lightweight unit: 1 kg (2.2 lb)*Built-in ruggedness for outside-plant usage*Troubleshooting option, enabling in-service, out-of-band network testing *EXFO’s AXS-100 Access OTDR combines the industry’s leading OTDR technology with power meter functiona lities in one powerful handheld unit.Optimized for testing passive optical networks (PON) within FTTx architectures, it offers several wavelength configurations and a wide range of options, for first-class flexibility. Use it at the optical network terminal(ONT), drop terminal or fiber distribution hub (FDH) for FTTH distribution(F2) fiber characterization, troubleshooting and fault locating.
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Eye-BERT MicroX -
Spectronix
The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions. The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps. Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information. Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability). With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
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Klocke Nanotechnik
In light microscopy it is natural to use toolsets like tweezers, knives, probes and several different measurement tools. Without this many present-day products and methods would not exist. The operators of SEM/FIB-Systems generally work without toolsets, although the wavelength limit of light is no physical boundary. It can be imagined how technology would be pushed when a SEM/FIB Workbench reaches the same degree of practicability and utilization as toolsets for light microscopes. The Nanoworkbench is the first system substituting the eye-hand coordination effectively with nm precision in a SEM/FIB-system. The Nanoworkbench features a set of applications including TEM lamella preparation, nano probing, nano cutting, nano cleaning, force distance measurement, particle sorting and material preparation. Every application supports automated processes so almost no user interaction is needed. Even complex processes can be done within seconds and even by untrained users. Applications can be combined to create new and more complex processes. Expanding the SEM/FIB to a material processing system and a nano-analytical workbench by utilizing the Klocke Nanoworkbench enables new applications in research and production of material research, live sciences, tribology, environmental & forensic research and semiconductor technology.
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Maury Microwave Corporation
Maury manual tuners are based on precision slide screw technology that utilizes broadband slab line transmission structure and passive probes to create impedances for devices. The probes are designed to be very close to onequarter wavelength in the linear dimension at the mid-band of each range. Since each tuner has two probes, this results in improved matching characteristics for each unit. Another key feature of this series of tuners is the inclusion of a LCD position readout of the carriage position on those units operating below 18 GHz. Higher frequency tuners utilize a micrometer carriage drive. The positional repeatability and high matching range of these tuners make them ideally suited for use as a variable impedance source in applications like device characterization. Such measurements depend upon the ability of the tuner to establish impedances out near the edge of the Smith chart and to reproduce the electrical characteristics as a function of mechanical position. The tuners in this series are also easy to use due to the nearly independent electrical results of the mechanical motions. The depth of penetration of the probe into the transmission line determines the magnitude of the reflection, while the position of the probe along the line determines the phase. While there is some interaction, the effects are almost independent of each other. https://www.maurymw.com/images/mw-rf/mst982e35.jpg
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EL Imaging Tester -
OAI
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
