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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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USB Interface for 1-2 MIL-STD-1553 Channels
NLINE-U1553
The NLINE-U1553 implements the latest USB 3 SuperSpeed technology for 1-2 dual redundant, independent 1553 channels. Full function capability for Bus Controller (BC), multi-RT (mRT), and Bus Monitor (BM). Also, o-scope signal capture on the first channel to troubleshoot bus signals. All built-in a small, rugged cable assembly that allows the customer to easily connect with standard 1553 jack connectors, or make their own custom cable with a Lemo break-away standard. USB 2 backward compatible (but not recommended – USB 3 offers superior throughput performance).
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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6TL08 Benchtop Test Platform
H710008
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
Stopper kit includedYAVCANCON2 for fixture identification not included
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In-Circuit Test Systems For Sale
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements ...show more -
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Regenerative Battery Pack Test System
17020
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced b...show more -
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USB 1553 and ARINC Appliance
USB-MA4
The industry’s first USB 3.0 SuperSpeed Multi-channel MIL-STD-1553 and/or ARINC-429 appliance!1-2 1553 Dual Redundant Channelsand/or 8 ARINC-429 Channels (4 RX/TX and 4 RX)Supports ARINC-717 (shared with 429 channels)
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Iridium Physical Layer Test Systems
PLTS
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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VR/AR/MR Calibration Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
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USB-6361, 16 AI (16-Bit, 2 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device
781442-01
16 AI (16-Bit, 2 MS/s), 2 AO (2.86 MS/s), 24 DIO USB Multifunction I/O Device - The USB-6361 offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI-STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB-6361 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Functional Test Fixtures
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. ...show more -
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Environmental Control System Test Platform
The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Digital Rockwell Hardness Tester Tallboy
900-366
This digital Rockwell hardness tester with fully automated load/unload procedures affords highly sensitive and accurate readings. Micro computer controlled with USB output to built-in mini printer or PC. The 900-366 digital Rockwell hardness tester offers programmable scale conversions, dwell times, statistical capabilities and test counter. Capable of testing in all of the regular Rockwell® scales.
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Communications Test System for Frontline Diagnostics
CTS-2750
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Avionics Test & Simulation Interfaces
Connect your PC laptop, desktop and tablet computers to avionics databuses with pocket-sized Ballard USB interfaces. Ease of use, versatility and comprehensive databus functionality have made these rugged adapters the industry favorite for avionics test, analysis and simulation in the lab and in the field. Avionics labs routinely integrate Ballard interface cards and full-featured network appliances into their test setups for powerful and reliable databus connection.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Digital Test Instruments
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Battery Management (BMS) Environmental Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Precision LCR Meter, 20 Hz to 2 MHz
E4980A
The E4980A precision LCR meter provides the best combination of accuracy, speed, and versatility for a wide range of component measurements. Offering fast measurement speed and outstanding performance at both low and high impedance ranges, the E4980A is the ultimate tool for general R&D and manufacturing test of components and materials. LAN, USB and GPIB PC connectivity enhances your design and test productivity.
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Transformer Turns Ratio Meter
TTRM 101
SCOPE introduces state of the art precision single phase Transformer Turns Ratio Meter (TTRM ) designed for field testing as well as factory testing of power transformers, instrument transformers and distribution transformers of all types. TTRM 101 measures only turns ratio where as TTRM 102 along with turns ratio, measures ratio deviation, phase angle deviation, magnetizing current and detects tap-position of single phase transformer in charged switchyard condition. The range of AC voltage sele...show more -
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Professional Handheld
ST5S
*Built-in high-precision LCR probe*Convenient one-hand operation*Ideal for Surface Mount Devices*Automated component identification*Automated test range selection*Manual C, R, L, Z and ESR modes*Test signal levels 0.5 and 1.0Vrms*Swiss-made precise test leads*Diode Polarity/Short Testing*Secondary D, Q, ESR parameters*Portable and ergonomic design*Built-in Li-Ion battery*Universal Micro USB charger*High visibility OLED display
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Saluki S87234 Series USB Peak and Average Power Sensor (max. 67GHz)
S87234D/E/F/L USB peak and average power sensor is a diode-detection broadband power measurement instrument based on the USB 2.0 interface, which can realize accurate average power measurement, pulse power measurement with large dynamic range and CCDF statistical measurement analysis. The frequency range covers 50MHz to 67GHz, the highest power accuracy can reach 0.2dB, the video bandwidth is ≥30MHz, and the rise/fall time is ≤13ns.S87234 series can flexibly expand the power measurement function of electronic measuring instruments and test systems, and is mainly used for field testing, production line testing and system integration.
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USB Modular Data Acquisition
The Keysight USB Data Acquisition (DAQ) family gives you the choice and flexibility to create standalone or modular solutions that expand and evolve according to your test requirement needs. Whatever your configuration, setup is easy with high-speed USB 2.0 connectivity: just plug the device into your PC and launch the bundled software.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
