Showing results: 1 - 5 of 5 items found.
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PGY-UFS3.X-PA -
Prodigy Technovations Pvt. Ltd.
UFS Protocol Analyzer (PGY-UFS3.X-PA) is the Protocol Analyzer with multiple features to capture and debug communication between host and design under test. PGY-UFS3.X-PA, UFS Protocol Analyzer, value based analyzer in its class, offers capture and debug of data across MPHY, UniPro and UFS protocol layers. It allows for instantaneous decoding of UFS layer, UniPro layer and MPHY layer with flexibility to correlate decoded data across these protocol layers.
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UFS -
Arasan Chip Systems, Inc.
Universal Flash Storage (UFS) is a JEDEC standard for high performance mobile storage devices suitable for next generation data storage. The UFS is also adopted by MIPI as a data transfer standard designed for mobile systems. Most UFS applications require large storage capacity for data and boot code. Applications include mobile phones, tablets, DSC, PMP, MP3, and other applications requiring mass storage, boot storage, XiP or external cards. The UFS standard is a simple, but high-performance, serial interface that efficiently moves data between a host processor and mass storage devices. USF transfers follow the SCSI model, but with a subset of SCSI commands.The Arasan UFS IP family consists of Host controller IP, Device controller IP, and MPHY.
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Magnum VUx -
Teradyne, Inc.
Teradyne’s Magnum VUx system is a flexible, superset test platform for all NAND and MCP products, both cutting edge UFS 3.0, uMCP, and PCIe Gen 4 mobile and automotive devices, as well as SSD NAND ONFI and Toggle, and legacy NAND products such as UFS 2.1, PCIe Gen 3, e.MMC, and eMCP.
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Frequency Electronics, Inc.
Elcom’s UFS family of microwave synthesizers meets today’s most demanding testing needs found in the laboratory, on production lines, and in system development and maintenance.
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T5851 -
Advantest Corp.
Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
