JEDEC
semiconductor test methods and standards setting organization, Joint Electron Device Engineering Council.
See Also: UFS
-
Product
±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A
-
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
-
Product
PLCC-to-PGA JEDEC Type 0.050 [1.27] Pitch Adaptor
Series 505
-
PLCC to PGA Adapter for JEDEC Type .050 [1.27] Pitch Devices.
-
Product
ESD & Latch-Up Test System
-
Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
-
Product
Flash SATA Disk /mSATA SATA 3 SLC,MLC
FSA 300 Series
-
*SATA III (6.0Gb/s) interface*Capacity: SLC 1 GB to 64 GB, MLC 4 GB to 128 GB*iSMART disk health monitoring*Intelligent error recovery system*Write protection security*Anti-vibration mechanical design*Excellent data transfer speed*Zero mechanical interference*JEDEC standard MO-300B dimension
-
Product
JEDEC TO Collet Socket
Series 514
-
TO Collet Sockets. Aries TO sockets feature molded chamfer lead-ins for easy device insertion. High stand-off design for heat dissipation and easy cleaning. External polarization for positive location.
-
Product
DDR4 Pro 288-Pin DIMM Adapter
INN-8686-18-PRO
-
Your best option if you need to test a large volume of memory! The RAMCHECK LX DDR4 Pro 288-pin DIMM Adapter (p/n INN-8686-18-PRO) gives RAMCHECK LX users the power to test 288-pin DDR4 modules, including unbuffered (UDIMM), load-reduced (LR-DIMM) and registered modules (RDIMM), both ECC and non-ECC, that comply with JEDEC standards. It includes the DDR4 Series adapter and DDR4 Pro DIMM test head.
-
Product
SD Card
SD Card v.3.0 / eMMC v.4.51 IP Family
-
Designed for embedded applications that require high performance, small form factor, and high storage capacity, eMMC provides the support for embedded mass storage memory on embedded host systems. The eMMC protocol simplifies the access to NAND flash memories (such as MLC) to the host by hiding the functional differences among suppliers. Compliant to the latest JEDEC eMMC specifications, Arasan’s eMMC IP supports power-on-booting without the upper level software driver. The explicit sleep mode allows the host to instruct the controller to directly enter the sleep mode. The interface supports interface voltage of either 1.8V or 3.3V.
-
Product
NAND Controller IP
ONFI
-
Arasan is the leading supplier of mobile storage IP and its products are used by most first tier memory suppliers. Arasan's deep experience with NAND flash memory interfaces and mobile storage standards began in 2001 when it joined the SD Association and shipped industry first SD card IP in 2003. Arasan is a current member of ONFI and JEDEC.
-
Product
Wafer ESD Tester lineup
-
Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
-
Product
SQFlash 153 Ball EMMC Series
SQF-MM5 M9x
-
Compliant with JEDEC eMMC 5.1 standard, Support -40~85℃ True Wide Temperature. Support HS400 High Speed Mode, Support secure erase, write Protection and trim commands. Automotive AEC-Q100 Grade3 or Grade2 product available, sTLC high endurance selection.
-
Product
Sideband Bus Protocol Analyzer
FS2700 DDR5
-
The FS27xx DDR5 Sideband Bus Protocol Analyzer is the latest DDR5 tool from FuturePlus Systems. FuturePlus has taken the complexity of 8 different JEDEC specifications and ported them into this very useful tool. DDR5 Validation Engineers and system integrators will not have to comb through complex specifications defining thousands of bits and register addresses. The tool takes care of this. Please request our data sheet for more information.
-
Product
mSAT SSD for Industrial Embedded Applications
mSATA SSD Series
-
ADLINK’s mSATA SSD Series with the SATA 6Gb/s interface is fully compliant with the standard mSATA form factor, also known as JEDEC MO300. Utilizing Toggle 2.0 MLC flash technology, capacities of up to 1TB are available with support for read/write speeds of up to 550MB/sec and 500MB/sec respectively . Additionally, the power consumption of the ADLINK’s mSATA modules is much lower than that of traditional hard drives.
-
Product
Detective Logic Analyzer
LPDDR5
-
Provides logic analyzer like deep transaction Listing and Waveform capture. Can store up to 512M of captured States at up to 6400+ MT/sContinuous, real time analysis, not post-processing 2D (voltage & time) Eye Detector guarantees valid data acquisition on each signalExtensive Triggering and Storage Qualification allows precise insightIndustry Leading Protocol Violation Detector provides hundreds of simultaneous, real time tests to JEDEC specifications, NOT post processing. No other tool can provide this!Mode Register Listing provided
-
Product
Rugged Half Slim SATA3
-
RunCore Innovation Technology Co. Ltd.
Standard Half Slim SATA SSD JEDEC MO-297.
-
Product
Memory Tester for DDR4 DIMMS
RAMCHECK LX
-
USBWith the RAMCHECK LX DDR4 memory tester package (part number INN-8686-DDR4) you can quickly test and identify DDR4 DIMMs that comply with JEDEC standards. Tests are fast, reliable and easy to do. The RAMCHECK LX DDR4 package includes the RAMCHECK LX base tester and 288-pin DDR4 DIMM adapter. (This package is also available with the DDR4 DIMM Pro adapter, featuring a very rugged test socket).
-
Product
test measurement unit
ITC59100 Rg/Qg
-
The ITC59100 Test Measurement Unit (TMU), which plugs into the ITC59000 Test Platform, performs gate charge (Qg) measurements that conform to MIL-STD-750C, Notice 2, Method 3471 and JEDEC Standard JESD24-2. In addition the ITC59100 TMU performs an internal gate resistance (Rg) test method that conforms to JEDEC Standard JESD24-11.
-
Product
Detective Logic Analyzer
LPDDR3
-
Provides logic analyzer like deep transaction Listing and Waveform captureCan store up to 1G of captured States at 1600MT/sContinuous, real time analysis, not post-processingEye Detector guarantees valid data acquisitionExtensive Triggering and Storage Qualification allows precise insightProtocol Violation Detector provides hundreds of simultaneous, real time tests to JEDEC specificationsMode Register Listing providedSupports Auto-Clock rate detect and clock stoppageConnects to the target under test with Flying Lead, BGA interposers or a midbus probeIntegrated Microsoft Charts gives quick insight into large trace capturesTrigger In & Out allows the Detective to integrate with other test tools
-
Product
ESD, Latch-up testing / design service
ESDdoctor
-
ESDdoctor consulting service can identify, diagnose, and solve any ESD/EOS problem quickly and definitively, at a surprisingly low entry cost. You can choose testing and diagnosis only, or add ESD design services to the consulting package. ESD, Latch-up testing: HBM (ANSI/ESDA and JEDEC) on packaged dies. MM (ANSI/ESDA and JEDEC) on packaged dies. Latch-up JEDEC on packaged dies TLP on packaged and bare dies.VF-TLP on bare dies.
-
-
Product
LPDDR
-
A large number of LPDDR sockets have been developed to cover the wide variety of ball I/O configurations. This catalog supports the JEDEC 209 Standard configuration.
-
Product
Post Wire and Die Bond Inspection Machine
IV-T3300
-
IV-T3300 is a post wire and die bond inspection machine with Dual JEDEC Tray Feeder System. It features a large inspection area of 600x500mm and a quick trays change of 5-7 seconds.
-
Product
High Performance Chipscale Test Sockets
SC
-
Ardent Concepts Test Sockets for ATE test deploy patented SC Contact Sets. This technology is capable of over 2 Million mechanical insertions in production environments and uses easy to replace pins with no complicated assembly procedure. It is designed to be drop-in compatible with 1mm offset and straight through footprints to ease implementation, and RC SC’s simple and robust design is extremely cost effective when compared with existing “roll” type test contactors and sockets. Designed specifically for JEDEC QFN and MLF applications, SC High Performance Test Sockets are available for most handler set-ups and offer exceptional AC performance.
-
Product
IP Solution
eMMC 5.1
-
Demand for mobile content capacity and bandwidth for video, pictures and music is ever increasing. To address this demand in the next generation of smartphones, tablets, and portable devices, the eMMC 5.1 Specification from JEDEC, improves the current HS400 speeds operating at 3.2Gbps, with "command queuing" making the data transfers highly efficient by offloading the software overhead into the controller. eMMC 5.1 further improves the reliability of operation by utilizing an "enhanced strobe" at the PHY layer. The eMMC5.1 is backward compatible with the existing eMMC 4.51 and eMMC 5.0 Devices.
-
Product
Programmable Read Only Memory (PROM)
-
Is a Static Random Access Memory. The pinout is the JEDEC 28 pin, 8-bit wide standard, which allows easy memory board layouts which accommodate a variety of industry standard ROM, PROM,EPROM, EEPROM and RAMs.
-
Product
Universal Flash Storage
UFS
-
Universal Flash Storage (UFS) is a JEDEC standard for high performance mobile storage devices suitable for next generation data storage. The UFS is also adopted by MIPI as a data transfer standard designed for mobile systems. Most UFS applications require large storage capacity for data and boot code. Applications include mobile phones, tablets, DSC, PMP, MP3, and other applications requiring mass storage, boot storage, XiP or external cards. The UFS standard is a simple, but high-performance, serial interface that efficiently moves data between a host processor and mass storage devices. USF transfers follow the SCSI model, but with a subset of SCSI commands.The Arasan UFS IP family consists of Host controller IP, Device controller IP, and MPHY.
-
Product
DDR4 Parametric Test Reference Solution
-
Keysight's DDR4 parametric test reference solution helps verify the signal integrity of DDR4 memory designs according to JEDEC specifications.
-
Product
Surface Mount-to-DIP JEDEC SOT-25, SOT-23A-6 Adaptor
1110748
-
Surface Mount to DIP Adapter for SOT-25, SOT-23A-6. Allows for breadboarding or substitution of microgate SOT-23A-6 and SOT-25 IC and transistor packages into .100 [2.54] pitch proto boards or PC boards. Solder masked top-side pads allow user to hand solder devices directly to topside of adapter with fewer problems of solder bridging. Longer male bottom pins are available at special request for easy use of probe clips. Large topside pads allow for soldering test pins, jumpers, etc. to top of adapter.
-
Product
ESD Testers
-
Hanwa Electronic Ind. Co.,Ltd.
◆Adaptable to the following international standard waveform;JEDEC, ESDA, AEC, and JEITA◆This system’s uniquely short discharge circuit is made possible by its original mechanical design.◆The short circuit minimizes the influence of inductance and capacitance on the data.◆The use of a single circuit ensures data stability for each device pin tested.
-
Product
Walk-In Climatic Test Chamber
-
WEIBER climatic test chamber is ideally suited for specimen test requiring quick changes of temperature. It covers various applications from JEDEC and IEC test standards. The climatic chamber is equipped with advanced technology such as specimen temperature control which allows linear specimen temperature rates of change during rapid thermal cycling or accurate temperaThe walk in option provides facility to test large sized, heavy weight specimen as well as the facility to test the specimen in bulk. Capacities ranging from 2000 to 10,000 Lt are available. Standard as well as customizable sizes and facilities are provided.
-
Product
DDR4 BGA Interposers, DDR4 DRAM X4/x8 Packages
N2114A
Interposer
The N2114A DDR4 BGA interposers provide signal access to the clock, strobe, data, address and command signals to the DDR4 BGA package for making electrical and timing measurements with an Infiniium oscilloscope. With the DDR4 JEDEC specification defined at the DRAM ballout, the BGA probe adapter provides direct signal access to BGA package for true compliance testing.
