Showing results: 526 - 540 of 5294 items found.
-
UI2000-ET -
Lisun Electronics Inc.
• Input characteristics analysis 1) Measure Vrms (10-300V) Lrms (0.04-4A) W, PF, Hz, total harmonic and 0-50 component of harmonic 2) Accuracy: ± (0.4%reading + 0.1%range + 1digit) • Output characteristics analysis 1) Measure lamp voltage (1-60V) lamp current (03-20A) lamp power, crest factor and oscillatory frequency 2) Accuracy: Class 2 • It can print without compute, and provide the communication port for PC
-
DC-series -
IMV Corporation
Depending on the reference PSD or other operating conditions such as the specimen, one part of the controlled response may deviate from the reference PSD
-
CV-series -
IMV Corporation
CV-series is suitable for transportation tests. The lateral support stiffness and maximum displacement of the CV-series are large enough to be accommodate vibration tests of the specimens with high center of gravity.
-
DU-7211 -
Delta United Instrument Co., Ltd.
Inductance, Q factor, Leakage Inductance, AC Resistance, Capacitance, DC Resistance, Balance,Turn ratio, Open/Short check
-
-
FRANKONIA GmbH
Conducted RF immunity tests acc. to IEC/EN61000-4-6 and BCI tests acc. to ISO 11452-4 and MIL-STD 461 CS 114 Signal generator,RF-power amplifier, RF-power meter and directional coupler (optional) in one 19”-caseStand-alone operation possible with optional available netbookControl-software includedMost important parameters are shown on an integrated displayAutomatic EUT-monitoringOperation via USB port of a PC or NotebookComplete range of CDNs available
-
MTO -
Flynn Systems Corp.
The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
-
IP750 -
Teradyne, Inc.
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
-
3650 -
Chroma ATE Inc.
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
-
MT Series -
Qualitest International Inc.
In the past, film extruders, paper producers, converters, and woven/non-woven fabric producers have had the choice of test stands and universal test machines which are either value-priced peak-force-only machines, or expensive computer-operated integral-load cell machines. Now you can have the best of both worlds in a single instrument. The series MT-1500, a simple to use computer operated tester, with Quality Control software for automatic calculation and graphical display of break, elongation, yield, modulus, and other, tension and compression force information.
-
UFTS-CM_20Ch/ 20Ch -
Misum Systech Co., Ltd.
All of the lithium batteries need protection circuit module to prevent any loss of battery function capacity and explosion during over charge , over current or short to cause increased temperatures. This equipment is used to test and inspect a battery's voltage, current, charge, discharge PCM status, IR, and others.
-
T4010S -
Keysight Technologies
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
-
U9403A -
Keysight Technologies
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
-
Megger Group Ltd.
Our multifunction systems and van solutions are intuitive with all of the ease of working with individual, dedicated instruments. We deliver this experience through our design philosophy. Rather than producing a single, complex system with afterthought towards rendering it friendly, we uniquely combine several intelligent instruments packaged as a single system. This approach provides all the efficiencies that one would expect from a multifunction solution with all the comfortability and feel of working with a manageable single function instrument. For the user, this translates to a positive and unintimidating testing experience in spite of the comprehensive range of the system’s testing capability.
-
KRD51 series -
CME Technology Co. Ltd.
Bounce testing simulates the constant loose cargo state during truck transport. Often times, containers carrying military and civilian hardware (such as: medical supplies, electronics, weaponry, communication devices) travel for extended periods of time and must be transported off-road. All of these items must maintain functionality upon arrival at their destinations.