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Thermal Platforms
Thermal Platforms are perfect for using conductive transfer to test components hot and cold, they work best for parts with a low or flat physical profile. They transfer heat outstandingly for programmed or very rapid heating and cooling transition times (that’s why they’re called hot plates or cold plates as well), and have a precise temperature control every time from cryogenic temperatures to extremely hot
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Direct Reading (Lenker Style) Grade Rods
GR Series
Laser or optical. These grade rods are the number one seller in the USA, and there's a reason — Tremendous Quality. Tough, lightweight, and versatile, our direct reading (lenker style) rods bear the true test of quality in the field, and hold up exceptionally well. Choose from our large selection of lengths and increments in tenths, metric, and inches.
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Dielectric Test Fixture
16451B
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
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3U Rackmount Appliance for PCI Express® Gen4
R300-G4
Is a robust, versatile test system designed to test and debug solid state drives (SSDs) of all popular storage interfaces and protocols, such as PCIe, SAS, and SATA.
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Multi-Test Resistivity Measurement System
Sheet resistance mapping of thin films with a collinear 4-point probe, Temperature co-efficient of resistance (TCR) of thin films with collinear 4-point probe, Precision temperature co-efficient of resistance (TCR) with 2-point Kelvin probes and precision surface temperature probe, resistor testing with 2-point Kelvin probes,Precision resistor testing with a Kelvin probe card, temperature co-efficient of resistance resistor test (TCR), and Standard TCR test of multiple resistors with Kelvin probes or a probe card.
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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USB-6343, 32 AI (16-Bit, 500 kS/s), 4 AO (900 kS/s), 48 DIO USB Multifunction I/O Device
782253-01
32 AI (16-Bit, 500 kS/s), 4 AO (900 kS/s), 48 DIO USB Multifunction I/O Device - The USB‑6343 offers analog I/O, digital I/O, and four 32‑bit counters/timers for PWM, encoder, frequency, event counting, and more. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The USB‑6343 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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SMD Array Type LCR Test Fixture
16034H
The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
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1x4 Optical Switch Module
81595B
The plug-in module for Keysight's Lightwave Solution Platform 8163B, 8164B, 8166B is ideal for flexible system configuration in applications such as transceiver/receiver test with small foot-print or multiple passive component test with complex cascade.
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Battery Pack BMS Test Equipment
WA-BMS-3NE
Xiamen WinAck Battery Technology Co., Ltd.
The battery BMS test system can be applied to the integrated test of 1S~100S power lithium-ionbattery pack BMS with LMU and BMCU modules, such as the BMS performance andHILL test.
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Moisture Resistance/ Humidity Test
This test is performed for evaluating the resistance of component parts and constituent materials to the deteriorative effects of the high-humidity and heat conditions typical of tropical environments. Most tropical degradation results directly or indirectly from absorption of moisture vapor, and from surface wetting. These phenomena produce many types of deterioration, including corrosion of metals; physical distortion and decomposition of organic materials; leaching out of constituent components of materials, and detrimental changes in electrical properties.
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PON Optical Power Meter
HOPM-3213
Hangzhou Huatai Optic Tech. Co., Ltd.
PON Optical Power Meter target at the FTTx application and maintenance. This power meter is able to simultaneously test and estimate the signals of the voice, data and video. It is an essential and ideal tool for the construction and maintenance of the PON projects.
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Test Cell Controller
RAPID
The Rapid II Test Cell Controller is an integrated, multi-loop control and data acquisition system for test cell applications, designed to provide maximum performance at an affordable price. Rapid II combines the latest in digital control technology with off-the-shelf hardware to produce one of the industry's most powerful, flexible and advanced controllers at a cost-effective price. This high-speed, 4-channel PID controller includes ample I/O to act both as a system controller and a data acquis...show more -
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Common Metallic Pendulum Impact Testing Machine
JB-(C/D)
Jinan Testing Equipment IE Corporation
KB- (C/D) common type metallic pendulum impact testing system is the basic model for impact tester. The metallic pendulum impact tester is used to determine the impact resistance of metal materials under dynamic load and capable of doing a large number of impact tests continuously. The display method for the models is different, respectively there are analog dial display, touch screen digital display and computer display. For the later two models, it can display the impact power, impact toughnes...show more -
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Impulse-Calibration-System
KAL1000 Series
The impulse calibration system KAL1000 is a modular system to perform tests on complete impulse voltage measuring systems and on digital recorders for the measurement of high impulse voltages and impulse currents. The modular design allows an optimal KAL-configuration depending on the actual application.Additional, this modularity allows to up-grade or modify and existing KAL1000 system in case of changing or additional requirements
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PCI Precision Resistor Card 9-Channel, 1.5Ω To 1.81kΩ
50-297-022
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI 5W Programmable Resistor Module, 1-Channel, 2.5Ω to 201kΩ
40-252-041
The 40-252-041 is a programmable resistor module with 1 channel which can be set between 2.5Ω and 201kΩ with 0.25Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Keysight Streamline Series USB Vector Network Analyzer, 14 GHz
P9373A
Compact, faceless, USB vector network analyzer (VNA). Affordable full two-port VNA which dramatically reduces your size of test. Up to 14 GHz.
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Measuring Microscopes, Image Processing + Optics Test Equipment
Development And Production Services
Optik Elektronik Gerätetechnik GmbH
Development and assembly of opto-mechanical building groups, including software development.
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Multiplexers
Capable of performing the necessary switching between test points of the device under test, to give access to low frequency measuring instruments, in electronic test systems based on tool receivers.
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PXI RF Analog Signal Generator
PXI RF Analog Signal Generators deliver the functionality of RF signal generators to the modular, compact PXI form factor. These modules support frequency ranges from 250 kHz to 20 GHz. You can combine PXI RF Analog Signal Generators with other PXI modular instrumentation to design automated test systems for radar, RF integrated circuits (RFICs), and automotive test applications.
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PXI Waveform Generator
PXI Waveform Generators can produce precise waveforms including sine, square, triangle, and ramp as well as arbitrary, user-defined waveforms using sequences of data or streaming continuously from a host or peer-to-peer instrument within the PXI system. These instruments are ideal for tightly synchronized, mixed-signal test systems in scientific research or test of semiconductor devices, consumer electronics, automotive, and aerospace/defense.
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Integrated Development Environment for the Creation and Execution of IEEE1641 Test Programs
SigBase
SigBase is an Integrated Development Environment for the creation and execution of IEEE 1641 test programs. It supports the development of tests using flow-charting techniques and the graphical design of signals using newWaveX. It includes fully integrated compilation and signal path allocation software that determines the appropriate instrument and switch path for each signal and test. The run-time system, which is also available as a separate product for use on multiple test stations, controls the operation of the ATS and can provide test results in ATML format.
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Test Fixture, Shielding Effectiveness
EM-2108 | 1.5 GHz – 10 GHz
The EM-2108 is a standard test fixture for evaluation of the electromagnetic shielding effectiveness (SE) of planar materials. The fixture is a section of coaxial transmission line broken to allow the insertion of planar test materials. Although ASTM D4935-10 is currently limited to an upper frequency of 1.5 GHz, the EM-2108 meets and complies fully with both the impedance and SE requirements called out in ASTM test method D4935-10 up to 10 GHz. These results are shown in Figures 1 & 2. The measured data relates to the shielding effectiveness due to a plane wave (far field EM wave) from which near field values for magnetic and electric fields may be inferred.
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Dial Wrenches
A dial torque wrench is an essential tool in torque measurement, as it provides quality control in regards to monitoring and verifying torque. This tool is commonly used to test, audit, and verify torque applied to joints. Using the memory pointer, the dial torque wrench will capture finishing torque that is applied to any fastener.
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Automatic Test Equipment
Wewon Environmental Chambers Co, Ltd.
Automated Test Equipment (ATE) adopts PID+PWM principle VRF (Refrigerant flow control) technology to realize low temperature and energy saving operation (servo control technology of refrigerant flow based on thermal condition of electronic expansion valve). Realize the automatic constant temperature of the studio.https://www.wewontech.com/automatic-test-equipment/
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Incircuit and Functional Test Systems
REINHARDT System- und Messelectronic GmbH
We offer test systems which vary in their expansion and can be used for different ranges of automatic testing.
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Oscillators
Precision Test Systems is increasingly becoming a world leader in ultra low phase noise (ULN) crystal and rubidium oscillators. We also have recently launached a new range of low G sensitive oscillators. For more information on our Low G range.
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PD (Partial Discharge) Tester
Weshine Electric Manufacturing Co., Ltd
Using the Windows system operating platform, you can freely choose ellipse, straight line, sine wave display, two-dimensional, three-dimensional graphic analysis mode, spectrum window, Q-V-F three-dimensional characteristic window, and static detailed measurement, observation and analysis of partial discharge pulse of one-cycle test voltage .
