Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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BNC To BNC Cable, 50 Ohm, 0.9 M
781887-01
Connects measurement and signal generation devices. Model options include industry-standard coaxial connector types including BNC, SMA, SMB, and MCX. Long cables can act as antennae picking up extra noise that can affect measurements, so ensure you select only the length required for your test system. Also look at the impedance of your test system and consider buying a cable with the same impedance. Matched impedance can maximize the power transfer or minimize signal reflection from the load of your system.
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IC Tester
ICE1
The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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ICE 3000 Series
ICE3009
The ICE3009 subsystem is an agile filter for the VHF-L, VHF-H and UHF frequency bands. It allows operation of a number of transceivers in a cosite environment. The VHF/UHF Filter provides multiple poles of RF selectivity to reduce broadband noise in transmit mode of operation and to reduce interfering signals at the transceiver’s RF input in receive mode at Have Quick II/IIa and SATURN tuning speeds. This design incorporates a flexible control scheme that can be configured at the factory for var...show more -
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Function Modules
NAI offers over 70 smart, field-proven function modules covering a wide variety of I/O, Measurement and Simulation, Communications, Ethernet switch and SBC functions. With Off-the-shelf development and quick integration speed, NAI's function modules provide the ability to reconfigure and respond to changing design specifications reducing NRE charges and offering obsolescence protection all with unmatched flexibility with countless hardware & software combinations. Each smart function module ...show more -
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Data Reduction
Data reduction systems with or without time history recording to throughput disc are frequently used in critical aerospace testing applications where complete measurements of a high number of channels are required for post-test and possible failure analysis. The m+p VibControl data reduction system configurations are tailored to the specific needs of high-performance measurement applications requiring hundreds or thousands of input channels.
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Tracker for Testing CPV Module Systems
The tracking precision of our biaxial tracker is better than ±1° on each axis, with an option for ±0.1° precision. This makes the tracker ideal for testing concentrating PV modules. The software runs all required tests for angle-dependent testing of PV modules according to IEC 62108.
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PC Based High Current Test Set for Circuit Breakers and Temperature Rise Test Equipment
This equipment comprises of high current source for testing of circuit breakers with additional facility for temperature rise testing (thus incorporating testing for moulded case, vacuum & air circuit breakers as per IEC 60947-2). The system integrates a servo controlled source with closed loop current feedback to maintain the current constant. It has the necessary instrumentation for maintaining current at full load & other conditions arising in testing at high current. The bench has a PC based control system with temperature data logger (24 channel with ch-ch isolation amplifiers). The data logger displays as well as stores a set of temperature values with time.
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Micro Ohm Meter 200A
Micro Centurion II
Raytech Digital Micro ohm meter, Micro-Centurion II, was designed for high degree of accuracy to measure very low resistances. This technology was then packed into a portable test system to be used by apparatus manufacturers, rebuild shops, and electrical maintenance crews. This intelligent system has an easy to use operation screen, which allows quick selection of the current level and resistance level to be measured.
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Analog
Create complete systems while streamlining your development process and reducing your design risk. We design our mixed-signal, linear, interface and power products for seamless integration with our extensive portfolio of microcontrollers, digital signal controllers, microprocessors and FPGAs. Well-known for our thorough documentation, we provide parts that work on the bench the same way they’re described on paper. We also provide evaluation boards to demonstrate functionality, an intuitive Integrated Development Environment (IDE), simulation software and other design resources to create a rapid design, prototype and test environment for all aspects of your system design.
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PCI Programmable Resistor Card 4-Channel 2 Ohm To 127 Ohm - SPST
50-294-112
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXIe Vector Network Analyzer, 300 kHz to 6.5 GHz
M9371A
Pay for only the frequency range you need with a choice of six frequency ranges up to 26.5 GHz Improve accuracy, yield and margins with the best PXI VNA speed, dynamic range, trace noise and stability Add functionality to your test system with a full 2-port VNA that fits in a single PXI slot Address your multiport applications needs by cascading multiple models Increase throughput and lower costs by adding modules in a multi-site configuration
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Vibration Test Chambers
Our vibration test chambers offer a variety of solutions for vibration testing. AV-Series and CV-Series vibration chambers offer rapid temperature change rates with combined temperature, humidity, and/or vibration environments. These chambers are designed for compatibility with your choice of electrodynamic or mechanical vibration systems. The Benchtop Vibration Table, ideal for vibration testing of small components or electronics and is designed for stand-alone testing or may be placed in an environmental chamber for combined temperature and vibration testing. HALT/HASS Test Chambers provide extreme vibration and temperature capabilities in order to identify design and product weaknesses.
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Infiniium S-Series High-Definition Oscilloscope: 4 GHz, 4 Analog Channels
DSOS404A
4 GHz bandwidth (upgradable)4 analog channels Capture a longer signal trace with 20 GSa/s max sample rate and 100 Mpts/channel of standard memory Get superior signal integrity with system ENOB of 7.2 bits and 10-bit analog-to-digital converter (ADC)Gain increased usability with the multi-touch supported 15 inch capacitive touch screen and solid state drive for fast boot and reliability Improve your testing with a wide range of protocol, compliance, and analysis software
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PXI-2559, 2.5 GHz, 75 Ω, Dual-Terminated SPDT PXI RF Relay Module
778572-59
2.5 GHz, 75 Ω, Dual-Terminated SPDT PXI RF Relay Module - The PXI‑2559 is a general-purpose switch module featuring two independently terminated single‑pole double‑throw (SPDT) relays. You can use it to add flexibility to your video switch network or to maintain uniform signal paths across multiple channels when building high-channel-count multiplexers. The PXI‑2559 termination resistors minimize reflections on open channels and protect your source or device under test from damage. The module al...show more -
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PXI Resistor Module 2-Channel 1.5R to 2.04k
40-293-022
The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Meter Test Board
WECO 2150
Model 2150 automated test system is a fully ANSI compliant testboard that uses a single voltage and three independently controlled isolated current sources to test all electromechanical and solid state meters up to 50 Amps. Utilizing a precision laser optics system, the Model 2150 can test meters through the most grime-coated covers with unfailing accuracy. This same laser technology makes it possible to test using the disk’s edge without wasting time with the tricky optics adjustments found with other test systems.
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Automated Test Systems
Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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Single-phase Relay Test Set
Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations. It is further necessary that these expanding testing capabilities be met with a similar improvement in the simplification of a test instrument’s user interface and software control.
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Bolt Extensometers for Proof Load Testing
Model 3565
Jinan Testing Equipment IE Corporation
The Model 3565 uses hard conical points to contact the bolt at the center of the head and at the bottom. It is fully adjustable for different length bolts ranging from 25 mm (1 inch) in length to 150 mm (6 inches) standard. Extension beams are available for longer bolts. The standard maximum measuring range is 1.25 mm (0.05 inches). Generally, on longer bolts this extensometer will be self-supported without requiring any centering marks or punch marks on the bolt. For shorter bolts these marks m...show more -
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Optical Test Instruments
OptiSpheric® & Spherometer
TRIOPTICS' OptiSpheric® and Spherometer are the classic optical test systems for spherical lenses that can be found in virtually any optical manufacturing process. While the Spherometer is used for the tactile determination of lens radii, OptiSpheric® systems provide contactless measurement of effective focal length, back focal length, flange focal length, MTF on axis and the radius of lenses. Specific upgrades allow determining centration errors and angles on plane surfaces. Systems for testing...show more -
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MXG X-Series Microwave Analog Signal Generator, 9 kHz to 40 GHz
N5183B
Get a fast, compact (2U) alternative to the PSG in the lab, depot or fieldAddress demanding tests of radar modules & systems with near-PSG levels of spectral purityCompensate for system loss & drive high-power amplifiers: +19 dBm output power, -55 dBc harmonics & -68 dBc spurious @ 20 GHzReduce calibration time with switching speed 600 sSimulate narrowband chirps & radar antenna scans with up to five internal function generators that can be used with AM, FM, OM pulse modulation
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Packaging Engineers Test Kit
PET-160
The PET-160 Packaging Engineers Test Kit is a complete system designed to help engineers develop and test packaging materials.
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Three-phase Fully Automatic Test System
TS33
Calmet Smart Calibration Devices
The Calmet TS33 portable test system consists of a three-phase reference meter of accuracy class 0.02%, 0.04% or 0.1% and an integrated three-phase current and voltage source up to 3x120A/600V. The TS33 is designed for analysis of complete metering installations and local mains conditions.
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Fibolocator
Fibolocator is an innovative device for measuring and characterizing breaks and other backscattering-causing faults in optical fibers. Time-resolved correlation reflectometry is the principle on which the device is based. It analyzes the backscattered light like a pulse OTDR, but unlike such OTDRs, cw laser diodes are used. The requirements for the test signal and the complexity of the system are low, which leads to very low costs for OEM subsystems.
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Circular Locus Tester
TF225
TESTEX Testing Equipment Systems Ltd.
Circular Locus Tester, to determine surface deterioration and quality of fabrics (wool, chemical fiber, mixed, kitted and woven fabrics). Using an active friction system, fabric is rubbed against a nylon brush and abrasive or an abrasive only under controlled conditions. Results of the test are achieved in minutes. The relative motion of the locus specimen grip and the abrasive platform is a circle with a relative speed of 60+/-1 r/min. The grip offers pressure to the specimen which is adjustable with a tolerance of +/-1%. For added control and safety, the machine is equipped with a self-stop switch.
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Modular Walk-In Chamber
CSZ''s Modular Walk-In Chambers offers flexibility in designing interior work space with pre-engineered conditioning systems and prefabricated panels that can be assembled to meet virtually any test or size requirement. CSZ uses modular conditioning systems which include refrigeration, air circulation, electrical components, optional humidification needed to control your chamber environment. These conditioning systems are designed for easy installation without taking up valuable workspace in your chamber by utilizing removable panels for easy access to all systems. Each conditioning system is tested at the factory to meet your test specifications.
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Diagnostic Solution
SYSTEM 8 Diagnostic Solution PLUS
The SYSTEM 8 Diagnostic Solution PLUS is the solution to board fault-finding problems. Equally at home with analogue and digital PCBs, the systems 64 digital and 24 analogue test channels provide a variety of test and measurement techniques to track down the most elusive faults.
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Exerciser with SMBus Support
Summit Z3-16
The Summit Z3-16 with SMBus Support is a critical test and verification tool intended to assist engineers in developing and improving the reliability of their systems. The Summit Z3-16 with SMBus Support can emulate PCI Express root complexes or device endpoints, allowing new designs to be tested against corner case issues. In addition, it can emulate SMBus traffic as a master or slave.
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Test Capabilities
Eltek International Laboratories
ELTEK Labs has conducted more Electrical Insulation Systems (EIS) and Component Compatibility Testing (CCT) than all other laboratories worldwide combined. ELTEK Labs is proud to be a Third-Party Testing Laboratory for internationally recognized certifying bodies.
