Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Signal Splitters
Becker Nachrichtentechnik GmbH
Becker Nachrichtentechnik GmbH offers a comprehensive portfolio of active multicouplers and bi-directional signal splitters for duplicating RF signals from common sources. The multi-couplers are designed in 50 ohm technology and are available as a 19 ", 1 U devices as well as slot-in modules for our 'Modular RF Systems' platform. With help of the slot-in modules, larger scale distribution structures can be realized in a space-saving and cost-effective manner. Some devices are available in v...show more -
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Life Cycle & Fatigue Testers
Switches can use all these operations. Membrane switches, keyboards and keypads will all require a push with a known force. On/Off switches will combine a push and a pull or possibly push on, push off. A rocker switch and toggle switches will require a push in two different places. Rotary switches (and volume controls, potentiometers) need to be rotated clockwise and counter clockwise The standard life cycle and fatigue tester the B886 Simon System has been designed for life cycle and fatigue te...show more -
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Physical Layer Test System
N19301B
The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
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Hand-Held Optical Power Meter
HOPM-3208
Hangzhou Huatai Optic Tech. Co., Ltd.
With six wavelength calibrating spots (980nm, 1310nm, 1490nm, 1550nm, 1590nm and 1610nm), refined design, easy operation, linearity or non-linearity display, unique FC/SC/ST all-purpose connector, HOPM-3208/HOPM-2650A is the earliest self-developed hand-held optical power meter of Huatai, which can be used for direct optical power measurement as well as relative measurement of optical link loss. It’s an essential test instrument in Optical Communication, CATV system construction and maintenance.
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Cellular Base Station Factory Test Systems
*Factory Test System*Designed and Built by BCO*100% Functional Testing*Environmental Stress Screening Testing
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High Voltage Isolation Test Systems
HT 9460 and 9464
Accurate and non-destructive production testing of ac Isolation Voltage and Partial Discharge. With over 450 systems installed worldwide the 946X series of test systems are the standard and system of choice used by the majority of semiconductor manufacturers that produce optically isolated devices.
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Microwave Power Amplifier 10W 100 MHz to 20 GHz
GT-1000B
The Spanawave GT-1000B Microwave Power Amplifier offers linear high-power amplification across multi-octave bands. It is ideal for testing in EMC, wireless communications applications and Defense EW systems. For EMI/EMC and standards laboratories, the GT-1000B with 100 MHz to 20 GHz frequency range allows broadband testing without band switching or swapping narrow band amplifiers resulting in faster and more accurate testing.
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SIMRC - RS232 to I2C Converter PCB
1080-001
Pickering Interfaces Series 1000 SIM Reed Relay Cards offer a choice of switching configurations using low cost industry standard SIM connectors. They are ideal for placing switching systems in fixtures close to the unit under test.
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UL94 Horizontal & Vertical Flammability Tester
TF328
TESTEX Testing Equipment Systems Ltd.
UL94 Horizontal &Vertical Flammability Tester, used to determine the flammability of plastic materials for parts in devices and appliances. The apparatus is supplied as a complete system incorporating all the features necessary for ease of use safety. It conforms to all five UL 94 horizontal and vertical burner tests and associated ASTM international standards.
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Test House Services
Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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BSD (Test Diagnostics)
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Dual Bus 75-Channel 2A PCI Fault Insertion Switch
50-190-002
This PCI fault insertion switch range is available with 75, 64 or 36 channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. The Stimulus/Measurement to UUT path is suitable for supporting CAN and FlexRay bus systems.
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X-ray Non-Destructive Testing (NDT) System
DynamIx HR / Series 5
High precision 12-bit 50µm reading allows inspection of minute image details. Wide dynamic range resulting in wide allowance of X-ray exposure value.
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Ionic Contamination Test Systems
CM+ Series
The Contaminometer (CM+ Series) system was originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s. Historically, International Standard IPC-J-STD001 stated that assemblies be cleaned to a value of <1.5µg/cm2 of NaCl equivalence. However, the new design is linked to the introduction of the new process control metric i...show more -
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PXI/PXIe MEMS RF Multiplexer, Dual 4-Channel, 4GHz, 50Ω, SMB
42-878-221
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Test Automation Services
Paragon Systems has experienced mechanical designers on staff who have developed many custom automated test equipment in SolidWorks. We will work with the customers in very close relationship from the beginning of the project to the end.
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Brake Testing
Vehicle Brake Test and ABS TestingWe offer an easy-to-use measurement system for brake testing and ABS testing according to ECE, ISO, FMSSV, and SAE international standards. Our test system offers automated workflow, is flexible and robust and used for brake R&D, brake comfort and vehicle testing with regenerative braking. High-accuracy GPS and IMU hardware are available to achieve the highest possible velocity and distance accuracy.
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Test System
LB302
Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.
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Non-destructive Eddy Current Testing of Long Products such as Tubes, Rods, Wire, and Profiles
DEFECTOMAT® Product Familiy
Foerster Instruments, Incorporated
The DEFECTOMAT systems by FOERSTER were specially developed for quality testing and process monitoring of long products. From hot testing to all bright steel processing steps, the surfaces of semi-finished products made from austenitic, (non) ferromagnetic metals can be tested for defects. The DEFECTOMAT systems operate in a contactless and non-destructive manner in accordance with the eddy current method and are used for detecting short defects, such as holes or localized defects and transverse...show more -
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802.11ad & ay (WiGig) Test System
IQgig-IF
When used in conjunction with IQgig-RF, it supports over-the-air (OTA) testing of WiGig RF modules and end-products. The IQgig family products provide total test solution for R&D characterization and high volume manufacturing.
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Electronic Safe & Arm Devices
Excelitas Technologies specializes in the design, manufacture, and testing of MIL-STD-1316 compliant Electronic Safe and Arm Devices (ESAD), Electronic Safe, Arm and Fire Devices (ESAF), and Firing Modules (FM) for safe fuzing requirements of both legacy and next-generation missiles and munitions. Our dedicated staff of research and design experts use the latest advances in technology to design smaller, lighter, and more cost effective ESAFs and FMs to meet evolving requirements of newer more sophisticated weapon systems. Capabilities include a line of components and subsystems that have been qualified for hard target penetration environments and next-generation smaller-class munitions.
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Pump, Hydrostatic Test, 10,000 psi
9901-100L
Hydrostatic test pump may be utilized as a standalone unit or combined with any of our reservoirs, safety test chambers, test fittings or other optional equipment to achieve a complete hydrostatic test system. with integral safety test chamber.
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3 Phase Voltage Extension To Turns Ratio Meter Rack
T-REX R
The Raytech three phase voltage system option T-Rex R is an optional system accessory for 3- Phase transformer ratio meter test sets designed by Raytech (i.e. TR-MARK III R). T-Rex R was designed to give Engineers and Test Technicians the ability to test the phase relationships and actual voltage ratios of transformer windings while applying three phase voltage.
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Sapphire/SIC Wafer Flatness and Surface Appearance System
FM200
Sapphire/SIC wafer flatness and surface appearance system provide a previous surface flatness testing solution, though non-contract lighting testing to record the whole information of the surface, rapid and fast measurement for various of surfaces, line and all kinds of surface information.
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Current Transformer Analyzer/Tester
GF1061
Beijing GFUVE Electronics Co.,Ltd.
Portable CT PT analyzer is mainly used for field or lab testing, it can finish the measurements (M) and protection (P) class CT, PT and TYP class CT. Adopt 7 inch touch TFT LCD, self-equipped mini type printer supporting field printing; supporting to use USB flash disk to download data or RS232 port to PC control. This model GF1061 CT PT analyzer is the most complete and easy-to-use testing system for protection and metering CTs according to IEEE C57.13 and IEC60044 & IEC61869 standards.
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PXI Waveform Generator
PXI Waveform Generators can produce precise waveforms including sine, square, triangle, and ramp as well as arbitrary, user-defined waveforms using sequences of data or streaming continuously from a host or peer-to-peer instrument within the PXI system. These instruments are ideal for tightly synchronized, mixed-signal test systems in scientific research or test of semiconductor devices, consumer electronics, automotive, and aerospace/defense.
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Powered VXS Crates
6U VXS 6023-JL
The WIENER VXS 6023 crate series adds high performance Switch Fabrics according to VITA 41 specification to VME based systems. Designed primarily for high speed applications in data acquisition, as well as military / aerospace test and instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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High Power, Low PIM Switch Unit
LPSU series
LPSU series high power, low PIM switch units combine 65 low PIM ports or 14 low PIM ports. These switch matrices are designed in testing situations that require multi-band PIM sources, components or antennas. Combinations of multi-band PIMtesting are now easily possible, improving workflow significantly. LPSUs can be integrated in existing production control systems. Frequency range 698-2700 MHz.
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EQE/Photon-Electron Conversion Testing
Enlitech offers different solutions for incident photon-electron conversion testing systems. The available systems include IPCE, PV External quantum efficiency (PV-EQE), Internal Quantum Efficiency, Spectral Response (SR), Highly-sensitive EL-EQE. There are over 1,000 SCI papers cited Enlitech‘s systems to provide reliable experimental data for significant scientific publication. The Highest PV-EQE sensitivity and EL-EQE both reach 10-5 % (7 orders). They can be utilized to PV conversion efficiency, HJT/ PERC/TOP-CON current-loss analysis, Organic PV charge-transfer-state and Perovskite PV trap state measuring, and Organic PV and Perovskite PV Voc loss analysis.
