Showing results: 2941 - 2955 of 5277 items found.
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WA2670 -
Wuhan Sangao Electrical Test Installations Limit Co.
WA2670 series insulation resistance testing instrument is special use for internal water cooling generator's measurement test. Meanwhile, can also be used in laboratory or field insulation test.20mA.5000V. The output current is greater than 20mA,Maximum output voltage is 5000V.With high precision micro current measurement system, digital boost system.Only need a high-voltage line and a signal line connecting the sample can be measured.Only need a high-voltage line and a signal line connecting the sample can be measured.Automatic measurement, the results from the large screen liquid crystal display, and the results are stored.
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JW3327 -
Shanghai Joinwit optoelectronic Tech,co.,Ltd
JW3327 Insertion/Return Loss Test Station is a Joinwit precise instrument, which be adopted advantages from current abroad instrument brand and improved to the application from clients, developed by Joinwit. It is a technological breakthrough in the domestic market and greatly improves the efficiency of IL test of optical devices to the MM with two wavelengths testing result in one station. It has extensive applications in the fiber cable, fiber passive device, fiber active device and optical communication system. It is suitable to perform the WIP testing and sample character testing for fiber device manufacturer research institutes.
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TW / CW series -
Clima Temperatur Systeme
Walk or drive-in temperature and climatic test chambers can be designed from CTS by a standardized grid system affordable in all sizes. The refrigeration performance data are adjusted here by our experienced sales and project engineers on your testing out. The walk / drive-chambers are ideal for larger components and finished products. CTS as a medium sized company attaches great importance to the detail quality of the equipment components, with only the best supplier products such as compressor and solenoid valves are used. Your resulting advantages are trouble-free long-term operation and thus no loss of valuable test time.
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Innovasys Pty Ltd
If you are responsible for maintaining a system where faulty electronic modules are not readily replaceable. Innovasys can assist by providing cost effective repair services or by developing support tools to allow in-house repair.Our IPC J-STD-001 certified technicians provide test and repair of electronic modules and are backed by a team of electronics engineers. This gives us the capability to diagnose and repair complex circuitry.Innovasys provides test and repair services to the Defence Materiel Organisation. Our technicians are experienced in effecting repairs to meet strict quality requirements on complex multi-layered circuit card assemblies.
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bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
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Kharkovenergopribor Ltd.
Operational safety and reliability of electrical equipment and cables directly depend on the dielectric strength of the insulation. Portable and mobile high-voltage testers from KharkovenErgoPribor Ltd. are used for acceptance and operational testing of substation equipment and cable lines, as well as for checking the reliability of personal electrical safety equipment. Our testers range is represented by test systems that allow conducting high-voltage tests with DC and AC voltage, testing polymer insulated cables with very low frequency, testing and locating faults in cable sheath, as well as performing the initial burning of insulation on damaged sections of cable lines.
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780159-02 -
NI
300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module - The NI‑9225 performs differential analog input. The wide measurement range is well suited for high-voltage measurement applications such as power metering, power quality monitoring, motor test, battery stack testing, and fuel cell tests. You can perform transient and harmonic analysis with high-speed simultaneous sampling. In addition, you can prevent ground loops and add safety to a system with 600 Vrms channel‑to‑channel isolation between the three NI‑9225 channels.
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780159-01 -
NI
300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module - The NI‑9225 performs differential analog input. The wide measurement range is well suited for high-voltage measurement applications such as power metering, power quality monitoring, motor test, battery stack testing, and fuel cell tests. You can perform transient and harmonic analysis with high-speed simultaneous sampling. In addition, you can prevent ground loops and add safety to a system with 600 Vrms channel‑to‑channel isolation between the three NI‑9225 channels.
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Cincinnati Sub-Zero Products
Our vibration test chambers offer a variety of solutions for vibration testing. AV-Series and CV-Series vibration chambers offer rapid temperature change rates with combined temperature, humidity, and/or vibration environments. These chambers are designed for compatibility with your choice of electrodynamic or mechanical vibration systems. The Benchtop Vibration Table, ideal for vibration testing of small components or electronics and is designed for stand-alone testing or may be placed in an environmental chamber for combined temperature and vibration testing. HALT/HASS Test Chambers provide extreme vibration and temperature capabilities in order to identify design and product weaknesses.
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7751TG2-HD -
Evertz Microsystems Ltd.
The 7751TG2-HD Test Signal Generator provides a cost-effective method of generating 1.5Gb/s HDTV 4:2:2 and 4:4:4 test signals. The 7751TG2-HD is ideal for checking signal path integrity, or to determine system performance over varying cable lengths. The 7751TG2-HD generates test signals in a wide variety of SMPTE 292M video formats.
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GPIB -
Test Electronics
Test Electronics will customize the TE3000 GPIB signal routing box for your test application. Then, you simply rack and stack all the equipment, cable all the switched signals to the back of this GPIB box, add a rack mount computer, plug in the National Instruments GPIB board and software. Then run your customized GPIB based test system.
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Di-Series™ -
Teradyne, Inc.
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
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M9380A -
Keysight Technologies
Save floor space with a compact, modular analog signal generator Provides Keysight quality and performance for local oscillator (LO) substitution, interference and component test Minimize need for external amplification with output power of +18 dBm across the frequency range Reduce test time with easy integration into your high-speed automated test system
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OptiSpheric® & Spherometer -
Trioptics GmbH
TRIOPTICS' OptiSpheric® and Spherometer are the classic optical test systems for spherical lenses that can be found in virtually any optical manufacturing process. While the Spherometer is used for the tactile determination of lens radii, OptiSpheric® systems provide contactless measurement of effective focal length, back focal length, flange focal length, MTF on axis and the radius of lenses. Specific upgrades allow determining centration errors and angles on plane surfaces. Systems for testing IOLs in compliance with EN/ISO 11979 form a class of their own. OptiSpheric® IOL R&D is preferably used for measuring single lenses while OptiSpheric® IOL PRO 2 is designed for the fully automated IOL measurement in serial production.
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MPI Advanced Semiconductor Test
MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE
