Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Medical System
Sentinel II
Chroma Systems Solutions, Inc.
The Sentinel II system provides fully automatic Electrical safety testing to IEC/EN/UL/CSA 60601-1. Sentinel II saves time by scanning patient connections for leakage current without powering down the medical device.
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Variable Optical Attenuator
CARY-VA3301B
The CARY-VA3301B handhold variable optical attenuator is used for continuously variableoptical signal attenuation. Since the variable optical attenuator is used in the laser system for the on-line testing, CARY-VA3301B can be used in the digital system of communicationdevices (such as: PHD, SDH) and also can be used in the CATV system testing.
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Stationary Circuit Breaker Test System
ACTAS C160
Stationary test system for carrying out fully automatic final factory tests, type and function tests on all kinds of switchgear devices, such as circuit breakers, disconnectors or earthing switches, regardless of the type of drive unit. All the electrical and mechanical parameters needed for the assessment of switching performance are measured in real time and evaluated without either the main contact chambers or the drive unit having to be opened. The system has analog and incremental input channels for the acquisition of analog quantities.
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Circuit Breaker Analyzer
CBA 2000
CBA 2000 diagnostic system is designed to grant the highest accuracy while testing circuit breaker. It can perform static and dynamic contact resistance measurement and it’s a precise timing speed and motion analyzer. Circuit breaker timing test set CBA 2000 is the perfect solution when a complete and reliable diagnostics has to be performed on circuit breakers.
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HDMI / 3G Reference Media Player
VQS-300
Versatile destop/rackmount unit, loaded with unique sophisticated set of static and dynamic test patterns - see more details in separate VQL for VQS Presentation Multi-format HDMI and 3G-SDI outputs, digital and analog AV outputs 2.5 ppm accurate system clock to meet full 3G-SDI broadcast specs Front side bay for detachable SATA HDD – up to 2 TB of content VQL - Library of unique sophisticated dynamic test patterns and sequences LIve clips and 3D Video Tests, 5.1 Surround Sound and LR Stereo Audio Tests All commonly used resolutions, aspect ratios, frame rates and interlace modes Easy expansion with any external USB storage device: BD/DVD, HDD, FD.
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Load Testing vs. Stress Testing
A load test is a planned test to perform a specified number of requests to a system in order to test the functionality of the system under specific levels of simultaneous requests. A load test ensures that a web system is capable of handling an expected volume of traffic, and therefore is sometimes referred to as volume testing. The goal of a load test is to prove that a system can handle the expected volume with minimal to acceptable performance degradation. The threshold of acceptable performance degradation must be defined by the testers as some value considered acceptable to the end user so that users will not bounce from the site.
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FPGA PXI Digital I/O Card
GX3500
The GX3500 is a user configurable 3U FPGA PXI card which offers 160 digital I/O signals for specific application needs. The card employs the Altera Cyclone III FPGA which can support clock rates up to 150 MHz and features over 55,000 logic elements and 2.34 Mb of memory. The 3U PXI FPGA card GX3500 can also accept an expansion card assembly which can be used to customize the interface to the UUT – eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system.
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Pneumatic Horizontal Shock Test System
KRD12 series
The KRD12 series shock test system is used to measure and determine the horizontal impact resistance of a product or package, and to evaluate the reliability and structural integrity of the test unit in a horizontal impact environment. The system can perform conventional half-sine wave, post-peak sawtooth wave, or trapezoid wave shock test to realize the shock energy that the product is subjected to in the actual environment, thereby improving the product or packaging structure.
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Harmonic/Flicker Analyzer for IEC61000-3-2/3/11/12, IEC61000-4/7/15
KHA3000
KHA3000, in addition to the complied standards and features of the KHA1000 (dedicated for single phase), is equipped for the harmonic and flicker compliance test exceeding 16A of the single-phase and three-phase equipment. With this unit alone, you can take highly accurate simultaneous three-phase measurements up to 40A/phase*. Furthermore, the KHA series is compliant with two measurement technique standards, the existing and the latest versions, so you can simply select to take measurements for...show more -
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CAD/CAM Software
C-LINK DTM
C-LINK DTM is the interface between CAD, test and repair, and combines these into one platform. Our CAD/CAM software has since its introduction in 1985 developed into the leading standard tool. C-LINK supports virtually every test system on the market.
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Fiber Shaker
MPX-SR3
Arden’s MPX Modal Explorer makes measurement of Encircled Flux easy, and accurate, and it complies with international standards. But if you are measuring laser-based transmission light sources for multimode systems you may need to use a test jumper assembly and fiber shaker in order to avoid “speckle”. Industry standards (for example IEEE 802.3aq and FOTP– 203) call for the use of a mechanical fiber shaker.
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Time Domain Reflectometer (TDR) Card
PCI-3127
The PCI-3127 is a PCMCIA-form factor TDR that can be used to identify and locate failures in installed wiring and cable systems. The instrument can make high resolution TDR measurements on circuits up to 96,000 feet (~30km) from your Windows XP notebook computer or PC using a low-voltage non-destructive test signal.
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Axe Auditor®
Axe Auditor is a step-by-step manual accessibility testing tool. Bring efficient and on-demand auditing capabilities to your in-house testing teams. Built on axe-core, axe Auditor offers detailed issue descriptions, remediation and expected behavior advice. Use axe Auditor as your system of record for all issues and details.
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Entry Level Loss Tester
Model：OLT-20
OLT-20 Optical Loss Tester integrates laser source module and power meter module in one set, which can perform power testing and link loss testing in optic fiber network conveniently. The typical applications include fiber identification, attenuation and loss measurement, continuity verification and fiber link transmission quality evaluation for installation, routine inspection and daily maintenance of MAN, WAN and CATV systems as well as for lab test and research work.
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Noise Sources
WGNS
The system allows the user to extend the frequency range of the NFA to allow for accurate noise figure measurements to be performed on a device operating in the 26.5 – 170GHz range on wafer as well as in benchtop applications. Farran offers the WGNS series of noise sources to be used in conjunction with the FBC down converters for use as frequency extenders for noise figure measurement test system.
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Electro-Optical System Test Bench
IRCOL
Optical collimators and universal electro-optical test benches.
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Optical Variable Attenuator
TW3303
Techwin(China) Industry Co., Ltd
The Perfect Handhold Tester Series Optical Variable Attenuator TW3303 TW3303 handhold optical variable attenuator is used for continuously variable optical signal attenuation. As the attenuator is used in the laser system for the on-line testing, there, thereforeTW3303 can be used in the digital system of communication devices (such as: PHD, SDH) and also in the system of adopting analog modulation (CATV
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Broadband Coaxial Noise Sources
Our integrated noise modules contain all the required biasing circuitry and only need a positive voltage to activate for an easy installation. Since they typically do not contain amplification, the raw noise output from the diode is seen at the output of the module resulting in a maximum ENR of approximately 35dB. Primary applications include system built-in test and laboratory use.
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High-Speed Memory Test Solution
UltraFLEX-M
The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
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ADAS and Allignment
Is the precise physical alignment, testing, and electronic aiming of sensors that collect data to inform your vehicle’s advanced driver assistance systems (ADAS).
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PXIe-7856, Kintex-7 160T FPGA, 1 MS/s PXI Multifunction Reconfigurable I/O Module
784145-01
Kintex-7 160T FPGA, 1 MS/s PXI Multifunction Reconfigurable I/O Module—The PXIe‑7856 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. Th...show more -
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Circuit Breaker Test Systems
Crest has over a decade of experience of designing and manufacturing test systems for testing all the different kinds of switchgear and controlgear.
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STANAG3910/EFEX Test And Simulation Module for Standard Ethernet
ANET3910
STANAG3910/EFEX Test and Simulation module for Standard Ethernet. The ANET embedded Linux Operating System gives the unique capability to run the optional PBA.pro Engine right in the box. Another option is the ANET-ADK onboard software development kit where users create run-time applications (e.g. STANAG3910/EFEX to Ethernet Converter, STANAG3910/EFEX to Ethernet Gateway) to execute right in the box. For wireless applications, an ANET compatible USB Wifi dongle is optionally available.The capability to execute Python scripts in the ANET is a standard feature. For applications with multiple ANET devices AIM offers the ADock ANET Docking Station to host up to 4 ANET modules.
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BMS Manufacturing Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Modulation Distortion For E5081A Up To 20 GHz
S960704B
The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear...show more -
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Integrated Thermal Control System
The Vektrex Integrated Thermal Control System (ITCS) uses proprietary water-based thermal control to maintain consistent LED and laser device temperatures during high power testing applications. LED/VCSEL manufacturers and third-party test facilities standardize on ITCS chambers for their testing needs.
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Sequence Application Manager
AMFAX SAM
We have been building test systems for many years, as a result we find that many of the requirements our customers are looking for are very similar. This may be how a user logs in to the test system or the generation of test reports for example.
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IOLITE
IOLITE - Data Acquisition and Real-time Control SystemData acquisition and real-time control front-end system with dual EtherCAT buses for industrial testing applications. All-in-one solution for real-time control and feedback monitoring.
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Dual Channel Universal Power Meter
8652A
The Spanawave/Giga-tronics 8652A Dual Channel Universal Power Meter has the extensive measurement capabilities and features you need to test today's sophisticated communications systems faster, easier and more accurately.
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Exchangeable Test Fixture
MA 2112/D/H/S-7/HG/KT-ITA-21
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 16,30 kg
