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Soil Mechanics
INSITU
The INSITU program interprets statical and dynamical geotechnical in situ tests. In order to interpret the SPT tests, the program utilises the main correlations that are normally used to determine the geotechnical parameters of a soil. One should enter the geometrical and geotechnical parameters pertaining to the stratigraphy surveyed trough drilling and the number of blows relative to each test; some corrective parameters can be entered that enable one to limit the perturbations in the interpretation of the data caused by the way the test is performed and the type of instrument that is used.
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Programmable Low-Ohm Meter
DU5210/5211
Delta United Instrument Co., Ltd.
20m ~ 2Mtest range, 0.1% accuracy Provided Level and Pulse measurement modes, can be lower temperature influence in Pulse Mode Provided HI/LOW limit and BIN Sorting comparator function, to meet your needed 100 sets of memory, can be saved test parameter and comparator setting, easy to use. Auto Calibration Program Function, to easier your calibration procedure. (Specificity calibrator needed) Cover up free, system firmware upgrade can be update via RS-232, easy to maintenance High speed FADC, ...show more -
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Electronic Ballast Automatic Test Equipment
ATE-1
Test series connection, parallel connection and series/parallel connections of the electronic ballast (about 15 kinds of connections), available for various electronic ballast. • With a precise resistance box, tube is substituted for the resistance, can act as many as 6 tubes. Resistance value: 1-4095Ω adjustable. • Measure input parameters (vrms, irms, w, pf, harmonics, etc), output parameters (on-circuit voltage, lamp voltage, filament voltage, lamp current, lamp power, oscillatory frequency),...show more -
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JTAGulator 24-Channel Hardware Hacking Tool
32115
On-chip debug (OCD) interfaces can provide chip-level control of a target device and are a primary vector used by engineers, researchers, and hackers to extract program code or data, modify memory contents, or affect device operation on-the-fly. JTAGulator is an open source hardware tool that assists in identifying OCD connections from test points, vias, or component pads on a target device.
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OM Thermal Stress System
Conductor Analysis Technologies, Inc
The OM Thermal Stress System is a cost-effective performance based reliability test methodology which performs convection reflow assembly simulation and air-to-air thermal cycling. The methodology is utilized by both the IPC PCQR and the IPC 6012-QLM programs. OM systems are available for sale or lease, and test services are provided from both CAT and our service partners.
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Climate Test Control
The visibility and intuitive clarity of the created interface ensures the simplicity of creating climate testing programs and significantly reduces the possibility of operator error. Monitoring of the climate chamber parameters can be carried out both in manual mode and automatically. The program for measuring the electrical parameters of the tested product can also be configured. The data saved during the test can be presented in a graphical format and converted into Excel format.
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Test Management Software
ActivATE™
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Continuous Real-Time Data Feeds
Application and Threat Intelligence (Subscription)
Keysight Network Applications and Security
Test and simulation conditions must reflect the latest security threats and applications so that you can ensure your equipment and systems will perform reliably and protect networks from the most advanced and malicious traffic. With Ixia's BreakingPoint Application and Threat Intelligence (ATI) program, we do the research for you by identifying and generating security attacks and application protocols that keep you current.
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Multi Channel Linear Vibration Motor Aging Tester
BK8018B
The BK8018B is our biggest Aging Tester for linear vibration motors. Connect up to 20 DUT's and the system will automatically test them all simultaneously. As well as evaluating current, it can also connect to accelerometers to test vibration characteristics. You can see information on the monitor in real time, and also store it to analyze later so you can keep track of the accuracy and stability of your manufacturing process. In addition, we will modify BaKo’s BS1123-BS8018 program to fit your needs so that the testing you do is a custom fit.
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Test Software
ATI
The ATI Test System Software and its utilities are built on a core of mature, object-oriented software components that have been thoroughly field tested and refined over many years. All of ATI's systems share a common core functionality and an easy to use program interface. Our highly skilled software and engineering experts are able to integrate nearly any OEM test or embedded systems equipment into the test system's design whether it's standard or proprietary.
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Microelectronic Services
Services for ASIC houses and Integrated Device Manufacturers are IC Wafer / Final Test, IC assembly, Test Program development, product engineering, Flash / EEPROM programming, characterisation / capability studies, yield enhancement, design verification and failure / yield analysis. Das Test Haus are specialists for wafer test, low power, mixed signal and eeprom test.
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Semiconductor Test Software Solutions
The test engineering staff at Test Spectrum has developed hundreds of test software projects on all major ATE platforms for numerous product technologies.Whether you need to optimize a current test platform, convert to a lower cost test platform, or design a brand new program for a cutting edge product within incredible time constraints, the Test Spectrum team will exceed your program expectations with quality products and excellent results.
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Function Test and In-Circuit Test
CT350
ICT test points: max 2736 CAD Data import Automatic program generator Powerful debugging tools Test coverage analysis Paperless repair station Logging- and statistic functions Full graphical functions Panel and multisite tests Fast adapter exchange High Pin Count-Interface On table optional usable shelf part.
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Benchtop & VXI Instruments
NAI offers a wide range of Benchtop and VXI card-based motion simulation and measurement instruments specifically designed for defense, commercial aerospace and industrial applications. Noted for their best-of-breed performance, these innovative and highly reliable instruments are used in a broad range of programs by customers world-wide. Typical applications include design; simulation; production test; and calibration of airborne, ground-based, and shipboard systems such as navigation control, signal retransmission, fire control, LVDT/RVDT simulation, and test.
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Prodution Testers
Effitest E50
Effitest e50 is a flexible and cost efficient solution with easy programming, debugging of test programs and life-cycle support.
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Climatic Chamber
Wewon Environmental Chambers Co, Ltd.
Climatic chamber is designed to do high temperature & high humidity, high and low temperature, or temperature cycling test, Climatic chamber mainly used for quality checking and assessing their quality reliability and life test. ● The climatic chamber simulate a full range of temperature testing and humidity testing conditions.These chambers are designed for ease-of-use, reliability and performance and include many user-friendly features standard with your purchase for the best value in the ...show more -
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Universal Tester Software Platform
APG (Automatic Program Generator) is a user-friendly 32-bit programming system aimed at providing fast and easy test program creation. It is a powerful Windows Application with all of the features of the Windows® environment enhanced by Autotest’s own Multi-Tasking Windows control.
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Pulse Adapter
CV30 P300
Frothingham Electronics Corporation
The CV30 P300 test station is the highest current 30KW pulser in a series of exponential pulse generators that can be connected to our FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of high power exponential pulses. For exponential pulses up to the 10/1000, the station can produce 30KW, 1000A, or 300V whichever is the most limiting. The station can also include all of the usual FEC200 tests in the same test program.
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Stack Analysis
VerOStack
VerOStack examines the binary executable to statically determine the actual worst-case stack size. This is a precise measurement technique not influenced by particular dynamic test runs and their variance based on a particular execution path. Furthermore, it can take into account not only the current program but also other programs that will run on the target at the same time, such as other applications running on a real-time operating system (RTOS) or in combination with the RTOS itself. It can thus provide truly meaningful data on target memory requirements.
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Pulse Adapter
CV5P350
Frothingham Electronics Corporation
The CV5 P350 station is the first mid power pulser in a series of exponential pulse generators that can be connected to an FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of high power exponential pulses. For exponential pulses up to the 10/1000, the CV5 P350 can produce up to 5KW, 500A, or 350V whichever is most limiting. It can also test all of the usual FEC200 tests in the same test program.
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Tecap Automated Test Suite
Control of Automated Test Equipment (ATE) for functional test and in-circuit testOperation of test facilities with adapters and PLCssemi- and fully automatic testing of electronic components and assembliesFinal Test in ProductionTest of pre-series and sample seriesStandardized test program developmentAdaptable to your own system environment (customizing) – 100% usable after installation with standard elements
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Tester & Programmer
TP-TACT
TP-TACT is designed to test the efficiency and program the operating range of electronic turbocharger controllers.
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FD-11603, 8-Channel, ±10 V Voltage Input Device for FieldDAQ
785639-01
The FD-11603 can measure up to eight channels with a voltage input range of ±10 V. It features 24-bit resolution with simultaneous sample rates up to 100 kS/s. The FD-11603 offers channel-to-channel isolation, which eliminates noise from ground loops and protects instrumentation circuitry from high-transient voltages. The FD-11603 has an ingress protection rating up to IP67 (dust- and water-resistant), can operate in -40 °C to 85 °C environments, and can sustain 100 g shock and 10 g vibration. T...show more -
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VXI Video Processor System
65VP1
NAI’s 65VP1 is a Video Processor System (VPS) on a VXI board. Capable of highly accurate video stimulus and measurements, this state-of-the-art instrument is the culmination of over three generations of Automatic Test Equipment (ATE) development programs. It provides increased functional density, and it reduces power consumption, size, and cost of the overall system. The 65VP1 is ideally suited for defense and commercial ATE programs, including television applications.
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Test & Programming Software
ScanExpress
The ScanExpress Family of boundary-scan software offers a fully integrated development environment that includes boundary-scan and at-speed functional test program generation, test program execution with advanced pin level diagnostics, interactive boundary-scan debugging, and in-System Programming (ISP) of devices such as Flash memory, serial EEPROMs, CPLDd, and FPGAs.
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Pump Test System
This automated test system evaluates a wide range of performance metrics for a cooling pump assembly. The LabVIEW based system programs the DUT then initiates a series of tests to check:Serial communication verificationMotor voltage & currentImpeller speed and flowAir and water temperaturesLeak and level sensor functions
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Erbium Doped Fiber Amplifier
S-102
The EDFA slot module of FOTS system with built-in power booster EDFA module offers a special function that is able to change the optical signal amplification feature variously, which is followed by user’s driving embedded pump LD freely. The output power of eash pump LD can be controlled separately by the program that is set up by user. When an optimum optical signal amplification particularity is needed, it is made up so that it can be materialized by choosing the Default mode provided along wi...show more -
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Metallic Pendulum Impact Testing Machine
JB-S Series
Jinan Testing Equipment IE Corporation
JB-S series superior metallic pendulum impact testing system is strictly designed according to international standards ISO148, ASTM E23 and EN10045. The pendulum impact testing system is mainly used to determine the anti-impact capability of metal materials under dynamic load and is capable of doing a large number of of impact tests continuously. Adopting the important intelligent programmable logic controller (PLC) system, the pendulum impact testing system can realize the test process control ...show more -
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SD Express
SCHILLER AUTOMATION GmbH & Co. KG
The Standard SD Express Memory Card Test Adapters support PCIe® 16 GT/s (Gen4) and PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD8.0 and SD7.1. Minimal crosstalk, short trace lengths. The Micro SD Express Memory Card Test Adapters supports PCIe® 8 GT/s (Gen3) Interface Compliance Program testing for SD7.1. Minimal crosstalk, short trace lengths. They all support SDHC, SDXC, and SDUC operation modes Data collection via Lab Standard SSMP Test Cables and hard gold mating surface allow for high cycle count insertions and reliable performance.
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Protection Accessories
Testing programs can vary from team to team and company to company.That's why Doble offers a comprehensive series of accessories so you can maximize the capabilities of your Doble power system simulators.Options include amplifiers, communication devices, transducer/metering test options, distribution accessories and more.This way you can choose the accessories that make sense for your budget and business requirements.
