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Hydrostatic Test Chambers
Test chambers are available to protect personnel during proof or burst testing. A few samples are pictured below. Chambers are manufactured in polished stainless steel with a clear polycarbonate door(s) for visibility during testing. Fluid port(s) are provided inside the enclosure, while all controls remain outside the enclosure for operator safety. In a hurry? Choose from our selection of Quick Ship Test Systems. basic units can ship within 24 hours or less and chamber systems within 2-3 days...show more -
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Hardness Testing Devices
NewSonic’s hardness testing devices test hardness in a nondestructive way using the UCI method (ultrasonic contact impedance). The testing procedure enables quick and mobile measurements (1-second type) to supplement traditional hardness testing. The devices feature compact measurement probes which can also be used in difficult testing positions and component geometries. The areas of application include incoming goods inspection, mix-up checks, production controls, quality assurance, weld seam inspection, cut edge checks, maintenance of built-in components, as well as the replacement of dynamic hardness testing devices in the case of thin materials (below 50mm, e.g. boilers, pipes)
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PXI 3A Power MUX BRIC, 6-Channel, 24-Pole
40-571-103
The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.
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PXIe-4147, 4-Channel, ±8 V, 3 A Precision PXIe Source Measure Unit
786888-01
PXIe, 4-Channel, ±8 V, 3 A Precision PXI Source Measure Unit - The PXIe-4147 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote four-wire sensing for accurate measurements. The sample rate of the PXIe-4147 can reduce measurement times, capture transient device characteristics, and help you perform current-voltage (I-V) characterization of devices-under-test (DUTs). With a high-speed sequencing e...show more -
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Clock Generation Devices
Analog Devices offers ultralow jitter clock generation products for wireless infrastructure, instrumentation, broadband, automatic test equipment, and other applications demanding subpicosecond performance. Our clock products are ideal for generating the high speed, low noise clock signals required to clock high performance analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). ADI clock ICs integrate PLL cores, dividers, phase offset, skew adjust, and clock drivers in small chip scale packages.
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FunTester PlugIn for Robotium
FunTester plugin for Robotium - allows to generate test scripts for Android applications.
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DC Power Supply
A DC power supply is an instrument that produces a pure, stable DC power supply. There are several important parameters when choosing a DC power supply, including the number of channels, total power, output specifications per channel, resolution, and so on. Each indicator is related to the needs and applications we actually test.
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Ultra-high Performance Solution for Memory Device Test
Magnum EPIC
Teradyne’s Magnum EPIC is a high-performance test solution for latest generation DRAM devices. These devices are key enablers for technologies like 5G, AI, cloud computing, autonomous vehicles, AR/VR and applications with high definition graphics.
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Single, Dual Or Quad Stream MIL-STD-1553A/BTest And Simulation Modules For XMC
AXC1553-x
MIL-STD-1553 Test and Simulation modules for XMC with 1, 2 or 4 dual redundant streams plus 8 Discrete I/O’s (on Rear-I/O).*Concurrent BC, MRT (31) & Chronological/Mailbox Bus Monitor*Full Error Injection/Detection (AS4112)*Complex Triggering, Data Capture/Filtering and 100% Bus Recording*Physical Bus Replay*IRIG-B Time Encoder/Decoder*Full Function, Single Function and Simulator Only versions available*Drivers for Linux and Windows*Drivers for other embedded applications are available on request*Optional Databus Test and Analysis Software and RT Production Test Plan
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Benchtop Environmental Test Chambers
Benchtop Test Chambers provide superior performance over a wide range of applications. Ideal for testing smaller products such as computer components, these chambers combine superior performance with compact design that is perfect for research and development or personal point-of-use testing.
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IQ Mixers
The new MMIC IQ mixers from Fairview (also known as IQ modulators) utilize a highly reliable GaAs MESFET semiconductor process which integrates a pair of matched double balanced mixer cells, a 90-degree hybrid and a 0-degree splitter/combiner that produces exceptional amplitude and phase balance performance. This level of integration offers size and performance advantages in comparison to discrete module assemblies. With the addition of an external 90-degree IF hybrid module, these IQ mixers can...show more -
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PXI MultiComputing Remote Control Module
PXI MultiComputing Remote Control Modules enable PXI systems to transfer data at multigigabytes per second with only a few microseconds of latency. You can use these models in applications such as real-time tests, hardware-in-the-loop (HIL) tests, and structural tests that need a large number of distributed PXI systems to share data with low latency.
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150 A, 5 MHz Current Probe - AC/DC, 150 A rms, 500 A Peak Pulse, 6 Meter Cable
CP150-6M
Teledyne LeCroy current probes are available in a variety of models for a wide range of applications. The full range of Teledyne LeCroy current probes includes models with bandwidths up to 100 MHz, peak currents up to 700 A and sensitivities to 1 mA/div. Teledyne LeCroy current probes are often used in applications such as the design and test of switching power supplies, motor drives, electric vehicles, and uninterruptible power supplies.
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PXI 3A Power MUX BRIC, 3-Channel, 48-Pole
40-571-003
The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.
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Application Performance Testing
An important part of application performance testing is to conduct such tests in conditions that realistically reflect the environment in which the application is ultimately expected to operate.
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Automation Testing
If you want to test all the major features of your application just before release, but you are short of time for complete testing, opt for Automation Testing.
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Ethernet/LXI hybridNETBOX 14 Bit Digitizer and 16 Bit AWG - 500 MS/s Digitizer on 2 Channels, 1.25 GS/s AWG on 2 Channels
DN2.825-02
The hybridNETBOX DN2.82x series internally consists of a Digitizer and an AWG that can run together or independently. That allows simultaneous data generation and data acquisition for stimulus-response tests, ATE applications, MIMO applications or closed-loop applications. Used independently, the digitizer can acquire test data in the field and the AWG can replay this test data in lab. The hybridNETBOX offers 14/16 bit resolution and is available with digitizer sampling rates of up to 500 MS/s and AWG sampling rates of up to 1.25 GS/s. The hybridNETBOX can be installed anywhere in the company LAN and can be remotely controlled from a host PC.
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Multiport Calibration Assistant
S95552B
The S95552B software application flexibly creates and manages calibration sets for multiport measurements. This software enables you to combine multiple calibration sets with independent test ports as one calibration set with a greater number of test ports. The software also offers a way to re-calibrate using a certain set of test ports to refresh the calibration set.
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New Car Battery Tester
Hangzhou Xun Anda Electrical Co., Ltd.
1. Test application: 12V/6V batteries test and 12V Starting /Charging system test.2. Test battery type: regular liquid, AGM battery, GEL battery.3. CCA test range: 40~2000CCA (SAE).4. Voltage test range: 1.5-15V.5. Display SOH (state of health), SOC(state of charge).6. Test for multiple battery standards: SAE, DIN, EN, IEC, CA.7. Graphic LCD display with back light, LCD brightness adjustable.8. Multigle language operation: English, Chinese, Germany, French, Spanish.9. Intergrated thermal printer to print test reports.10. Thermal printer paper roll is 58mm width and 7.5m long.
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PXI 10W Programmable Resistor Module, 1-Channel, 1Ω to 62.1Ω
40-253-111
The 40-253-111 is a programmable resistor module with 1 channel which can be set between 1Ω and 62.1Ω with 0.25Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Test Contactor/Probe HEad
cRacer
The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
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PCI Programmable Resistor Card 4-Channel 2 Ohm To 255 Ohm
50-294-013
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Powered VME430 Crates
9U VME430 6023
The WIENER VME 6023 crate series is the newest generation CERN VME430 compliant VME crates for large size 9Ux400mm cards. Designed for applications in nuclear and high-energy physics data acquisition, beam line control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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PXI-6224, 32 AI (16-Bit, 250 kS/s), 48 DIO, PXI Hybrid, Multifunction I/O Module
779114-01
32 AI (16-Bit, 250 kS/s), 48 DIO, PXI Multifunction I/O Module—The PXI‑6224 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Spectroradiometer
Designed to have a capability of producing any visible spectral distribution, mimicking various light sources in the visible region by feedback control of the radiant power emitted by individual LEDs. This LED test system will be used as a transfer standard for photometric, colorimetric and radiometric applications.
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PXI Voltage Amplifier 10K Ohm, D Type
41-650-011
A 5 channel voltage amplifier ideal for increasing the output voltage from other PXI modules, enabling users to easily generate the signal voltages commonly required in applications such as automotive test.
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Offline Signal Processing & Analysis Software
Signal Processing - DX
APEX Turbine Testing Technologies
DX is an easy to use, graphical, signal processing environment that simplifies analysis and reporting of dynamic data. DX includes everything needed to process data for a variety of applications and industries in a very intuitive, drag-and-drop user interface. Generate fully-interactive engineering plots from one or more tests and create reports in just a few mouse clicks.
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PXI High Density Precision Resistor Module, 9-Channel, 2Ω to 470Ω
40-298-114
The 40-298-114 is a high density programmable resistor module with 9 channels which can be set between 2Ω and 470Ω with 2Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Fiber Optic Loopback
LC/SC/MTRJ
Fiber Loopbacks is designed to provide a media of return patch for a fiber optic signal; typically it is used for fiber optic testing applications or network restorations. For the testing applications, the loopback signal is used for diagnosing a problem. Sending a loopback test to network equipment, one at a time, is a technique for isolating a problem.
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Preamplifiers
Com-Power broadband high gain preamplifiers were designed for electromagnetic interference (EMI) testing and certification. EMC test labs use preamplifiers to improve sensitivity of the test system during EMI radiated emissions measurements. Without a high gain preamplifier, signals picked by the antenna that have amplitudes below the noise floor of the test system cannot be measured. The preamplifier gain has minimum variations for the entire operating frequency range for accurate emissions measurements. The Com-Power preamplifiers were primarily intended for EMC applications. However, it can be used for other applications that require signal amplification.
