- Pickering Interfaces Inc.
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Modular Breakout System 78-Pin D-type Plugin Module for 40-525A
95-525A-001
The 95-525A-001 Plugin Breakout Module is designed to be fitted to a PXI 40-525A Signal Insertion & Monitor Matrix Module as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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PXI Integration Platform
ATS-3100
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Quadruple Function Tester with Shielded HF Test Chambers
UTP 9011 RF
Circuit boards are the heart of all electronic devices. To ensure the reliable function of these boards, detailed tests are essential.Our board-level tester UTP 9011 RF works safely, quickly and cost-optimized at circuit board level. Our interchangeable adapters are particularly efficient in this system, with which you can even test different test items at the same time. The shielded NOFFZ HF test chamber always ensures consistently good results.
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Fibre Channel Modules
AIM’s Fibre Channel test, simulation and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with one dual core RISC processor per port, massive and scalable DDR3 memory and IRIG-B time encoder/decoder functions are standard. The new ultra high performance intelligent 4-lane PCIe 2.0 interface modules offer 2 ports with full function...show more -
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PXIe-6545, 200 MHz, 32-Channel PXI Digital Waveform Instrument
780993-03
200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6545 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6545 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
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Low PIM Coaxial Switch, DC to 26.5 GHz, SP4T
87104R
Low passive intermodulation (PIM) is crucial for applications where two or more transmitted signals share a common antenna or whenever the transmitter signal is too high or the receiver is sensitive to high intermodulation. The Keysight 87104R is a low PIM SP4T coaxial switch, operating from DC to 26.5 GHz, which can help to keep the system PIM level low. A guaranteed 0.03 dB insertion loss repeatability and 3 million cycles of operating life ensures signal integrity, improves testing efficiency, and ultimately maximizes test throughput.
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PXIe-6547 , 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument
81011-03
PXIe, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument—The PXIe‑6547 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 100 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6547 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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68 Pin VHDCI Connector & Cable Accessories
These 68 Way VHDCI connectors & cables provide a high-density 0.5A solution that is suitable for use to 30Vac. We have developed this range of standard connection solutions to simplify the task of integrating products into a test system, the high density and skill levels involved in terminating this connector mean that we strongly recommend that you use our connection solutions. This category of connectors are not compatible with our products, however, are offered for developing a connection solution for use with other vendor’s products. You can also try our Cable Design Tool to graphically design a customized cable assembly.
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Tri-Temp Strip Level Test Instrument
Apollon
APOLLON is a tri-temperature strip-level test system for motion sensors. It is especially designed for high-end Automotive and Industrial applications. APOLLON offers extremely good testing conditions: high stimulus and temperature accuracy and low noise level.
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Battery Extra Load Units
BXL Series
BXL is an extra load unit designed to be used with DV Power’s BLU series battery testers. However, this unit is a universal add-on device. Because of that, it is compatible, as an additional load, with any other discharge/capacity tester in the market.In case when discharge current exceeds the capacity of a single BLU device, BXL can increase the discharge capacity. There are no limitations on the number of extra load units that can be connected in parallel to the main battery tester.A system o...show more -
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Temperature Forcing System
Wewon Environmental Chambers Co, Ltd.
Wewon Technology specializes in the research, development, production and sales of laboratory testing equipment system services. Through more than ten years of accumulation in the field of equipment, the business of wewon Tech is mainly divided into three fields, namely optical communication, automobile and new energy industry.Specialized equipment from Wewon Environmental Chambers Co., Ltd. includes thermal stream instrument, environmental chambers, walk in chamber, salt fog test chamber, vibra...show more -
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PXIe-6544, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument
780992-03
PXIe, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument—The PXIe‑6544 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXIe‑6544 can sample digital waveforms at up to 100 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6544 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.
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Radio Test Set
CMA180
With its frequency range from 100 kHz to 3 GHz, the R&S®CMA180 is ideal for testing all common analog and digital radio systems. Input levels up to 150 W are no problem for the R&S®CMA180. The flexible internal switching capabilities for the audio and RF paths make the R&S®CMA180 suitable for a wide range of test requirements. Users can configure the internal generators, external audio sources, filters and measurements according to the given application. In the predefined test scenarios for receiver, transmitter and duplex tests, the RF and audio paths are preconfigured. This saves time and eliminates configuration errors for standard test cases.
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RF Bias Burn-In System
These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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ESD Generators
The ESD Simulators ESD suitable for performing EMC tests of systems and equipment according to the standards IEC / EN 61000-4-2 and ISO / TR 10605. It can far beyond the standard boundaries higher test levels are adjusted. Depending on the device under test and the test setup are two test method shall be: Air discharge (AIR) and contact discharge (CON).
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Asynchronous System Level Test Platform
Titan
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Digital Display Auto Circuit Tester
1676
Peaceful Thriving Enterprise Co Ltd
This is a DC voltage tester with smart over-voltage protection and warning for vehicle repair. As electrical system for vehicle becomes more complex, the tester is able to test voltage value, identify DC polarity from different background light color, positive / negative sign, and over-voltage level indication. Moreover, the special designed probe is able to help user to hook, piercing, and probing the wires.
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Micro Ohm Meter 200A
Micro Centurion II
Raytech Digital Micro ohm meter, Micro-Centurion II, was designed for high degree of accuracy to measure very low resistances. This technology was then packed into a portable test system to be used by apparatus manufacturers, rebuild shops, and electrical maintenance crews. This intelligent system has an easy to use operation screen, which allows quick selection of the current level and resistance level to be measured.
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Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V a...show more -
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Load Testing vs. Stress Testing
A load test is a planned test to perform a specified number of requests to a system in order to test the functionality of the system under specific levels of simultaneous requests. A load test ensures that a web system is capable of handling an expected volume of traffic, and therefore is sometimes referred to as volume testing. The goal of a load test is to prove that a system can handle the expected volume with minimal to acceptable performance degradation. The threshold of acceptable performance degradation must be defined by the testers as some value considered acceptable to the end user so that users will not bounce from the site.
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JTAG External Modules for Cluster Test
JEMIO
The JTAG External Modules JEMIO™ for Cluster test are intended to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system. For many designs, Boundary-Scan has adequate access to on-board signals, but signals that go off the board often cannot be tested by a JTAG tester. By adding JTAG access to these off-board signals, JEMIO™ modules can increase the board's JTAG test coverage, possibly reducing the need for implementing another test method or for developing alternative tests to reach the required level of test coverage.
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High-Power Filters
Beehive Electronics designs custom high power RF filters used in vacuum coating systems. Our experience spans from kilohertz to gigahertz and power levels up to 50 kilowatts. We provide a turnkey solution: we design, build, and test the filters to the customer's specification.
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Immunity Testing Systems
CIS Series
The CIS series test systems are configured to perform conducted immunity testing according to IEC 61000-4-6. The system includes an ACS series power amplifier, coupling/decoupling Network (CDN), directional coupler, 150Ω to 50Ω adapters, power attenuators, cables and [optional] CSAT software. These systems, when properly configured, are capable of testing your products to all levels given in IEC 61000-4-6 up to 230 MHz. You can choose from three systems. Follow the links below for detailed information, including a comprehensive datasheet listing system specs.
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Reference Thermapen®
Until now you would have spent hundreds more to get this level of accuracy in a NIST-Traceable standards thermometer. Our Reference Thermapen takes lab accuracy into the field. Each unit is factory calibrated at 5 test points and includes a UKAS accredited calibration certificate with test data. A true "system calibration" is performed matching its Platinum RTD sensor and the built-in electronics so all errors are included in the spec.
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RWR ATE MKII
MS 1111
Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out LRU and card level testing for TARANG systems of all platforms. The purpose of ATE is to provide a user-friendly environment to test the LRUs and sub-systems (individually) for their functionality, perform specific tests of each LRU / sub-system and Card Level Testing. The card level testing facilitates troubleshooting down to a faulty signal flow path. The UUT tests are carried out by injection of the stimuli generated by the computer or the programmable test equipments and the responses from UUT / test equipments are feedback to the computer for evaluation and generation of reports.
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PXIe-6570, 100 MVector/s, PXI Digital Pattern Instrument
785283-01
100 MVector/s, PXI Digital Pattern Instrument—The PXIe‑6570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe‑6570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.
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Single-phase Relay Test Set
Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations. It is further necessary that these expanding testing capabilities be met with a similar improvement in the simplification of a test instrument’s user interface and software control.
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ESD & Latch-Up Test Service
MASER Engineering has automatic test equipment for the most common ESD test pulse models. MIL - JEDEC - ESDA - IEC standards. IC level Human Body Model. IC level Machine Model. IC level Charged Device Model. System level IEC 61000 HBM. AEC-Q100 Field Induced Gate Leakage test. Static Latch-Up test. Dynamic Latch-Up test.
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System Level Test and Burn-in Solutions
System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Board Fault Locator
SYSTEM 8 (BFL)
The SYSTEM 8 Board Fault Locator provides the user with the ability to functionally test all common digital ICs in and out-of-circuit. A combination of industry recognised test techniques provides a high level of fault coverage. Additional tools are provided by the SYSTEM 8 Premier software to further enhance the unit\'s wide range of applications.
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Backplane Test System
402LV
Very High Pin Count Level IV Backplane Test System. To ensure that Testronics maintains its leadership position as the premier supplier of backplane testers, we will be introducing our solution to testing high pin count / very large backplanes, the Model 402.
