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- InterWorking Labs, Inc.
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UDP Test Suite
The UDP Test Suite is used by design engineers, quality assurance engineers and testers to find and fix bugs in their UDP implementation. The tests help ensure that the UDP implementation is sufficiently robust so that it is not vulnerable to the wide range of attacks in today's Internet. The tests make use of the Maxwell Pro network emulation environment, so that each test sequence can intelligently impair all aspects of the UDP protocol.
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Wafer Level Multi-Die Test System
ITC55WLMD
The ITC55WLMD series of test systems has been developed by ITC to be stand-alone UIL test systems configured specifically to test on wafer. The systems include an ITC55series UIL tester and inductor box, a current limiter module and a system controller
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GSM RF Interference Test System
Guangzhou Jumho Electric Co., Ltd.
Cell phones and other wireless devices radiate powerful electromagnetic fields that can cause interference and noise in microphone signals. The interference and noise is called RF interference, which is an unwanted “signal” that occurs at the same time and frequency as a data signal. The RF interference disrupts the flow of data and degrades quality-of-service. Jumho Electric provides a cost-effective RF interference test system for GSM interference level measurement of wireless microphone.
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Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Test Program Sets & Custom System Level Software
WesTest Engineering Corporation
WesTest Engineering Corporation offers turnkey test solutions for the military and aerospace sectors. Our engineering capabilities present an unmatched ability to take customer test requirements and design, developand integrate Test Program Sets (TPS) with diagnostics to the component level. This is further supported by a full complement of documentation, from Test Requirements Documents, to TPS Flowcharts, to Test Reports.With 36 years’ experience and 1000+ TPSs in our history, the WesTest Engineering Staff remains as one of the top notch senior staff’s in the TPS sector today. Our leadership and program management have the historicalexperience to lead WesTest capability to meet the customer’s requirement.
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Satellite ATE
MS 1123
Configurable Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out card level testing for satellite systems (12 different types of boards). The purpose of ATE is to provide a user-friendly environment to test the boards for their functionality, perform specific tests of each card. The card level testing facilitates troubleshooting down to a faulty signal flow path. Both hardware and software designed such a way that each Input / Output is configurable and user can dynamically script the test procedure using standard ‘C’ Language.
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High Elongation Extensometers
Model 3800
Jinan Testing Equipment IE Corporation
The main body of this unique extensometer remains stationary during testing, held in position by the adjustable magnetic base included. Only the very light, small traveling heads move as the sample elongates during a test. These attach to the sample with small spring clips. Each head pulls a cord out from the extensometer as the head moves. These models use high precision, low friction potentiometers, and, as a result, have a wide range of factory selectable outputs. The extensometer is driven by an excitation voltage and has output proportional to the input. They can be provided with high level outputs (approximately 2-8 VDC) or ones that mimic strain gaged devices (2-4 mV/V). When set to mimic strain gaged extensometers, the Model 3800 can be used with virtually any signal conditioning electronics designed for strain gaged sensors. The potentiometers employ a hybrid wire wound around conductive plastic, which provides excellent long term stability. The output from the extensometer is readily interfaced with most existing test controllers, and may be directly input to data acquisition systems and chart recorders. Please let us know at the time of order what type of output and connector you require.
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Test Automation Platform Deployment System
KS8000A
TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher level test executive software environments. The Keysight KS8000A Test Automation Platform (TAP) Deployment System provides a lower cost, scaled down alternative to the full KS8400A TAP Developers System without the graphical user interface, results viewer and timing analyzer. Deploy your existing test software and TAP plugins into manufacturing environments using the KS8000A command line interface or your own interfaces.
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Offline MPEG Analyzer
MSight
Instantly jump to any stream location with fast seeking which makes navigation simple and easy. MSight Analyzer will jump to the exact location of any error identified in a compliance test to allow full inspection of all the stream data at that location. Complete coverage with support for VC-1, H.264/AVC, MPEG-4 part 2, MPEG-2, MPEG-1, and system level (program and transport stream analyzer features) in a single tool.
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Track-Signal Test Meter
Model TRSIG-1
Aplab Track-Signal Test Meter incorporates Digital Signal Processing based design to provide high accuracy and stability. It is designed for level measurement of selected frequencies. It also provides functionality of AC and DC voltage measurements.The purpose of Track-Signal Test Meter is to make adjustments, control measurements and inspections on both audio frequency track circuits of types FTGS 46, FTGS 917 and also for TI21M type track circuits (now known as BI track 300) for the measurement of eight frequencies from 5700Hz to 8500Hz for metro applications. Its compactness and battery operation render the unit particularly suitable for portable applications in maintenance and for level measurement in communication systems.
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Kjeldahl Analyzer
LD-LKA-A10
Kjeldahl AnalyzerLD-LKA-A10is a complete microcomputer controlled user-friendly automatic device integrating distillation and titration functions. It is compatible with 42 mm digestion tubes and has features such as automatic waste discharge and cleaning of digestion tubes and titration cups, control steam flow and real time detection of distillation temperature. Along with High-accuracy Charging Pump and Titration system, it is also equipped with large LCD touch screen panel, faster ARM system and multiple fluid level detection system to ensure smooth test process.
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Advanced Diagnostics for ScanExpress™ JET JTAG Embedded Test Solutions
ScanExpress JET Advanced Solutions
ScanExpress JET advanced diagnostics add additional diagnostic resolution with fully automated analysis translating functional test results to down to the net and pin level, even with BGA packages.The seamless integration with ScanExpress JET and ScanExpress Runner as well as the ability to output ScanExpress Viewer fault reports for PCB visualization make ScanExpress JET Advanced Diagnostics a must-have tool for any JTAG test system.
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Multiple Module Serial Bus Test Instrument
Bi4-Series
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
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Mechanical Design
In support of system, test and our tooling business, our mechanical engineering team is second to none in offering innovative, yet cost effective solutions for your needs.Whether it is a scalable test fixture solution or a complex, high accuracy torque tooling solution, our team of dedicated mechanical engineers can offer the right solution, with the right level of innovation to give your solution a competitive edge.
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Universal Cable/Harness Tester
LX-686
Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface,．·Up to 1500Vdc/1000Vac Test Voltage ,．·256 Max. Test Points , (Max of all series)．·500 Max Files Memory,support USB or PC unlimited expansion,．·Arc detection level 0-9 ,auto prompt．·Adopted high resolution colour 640*480 TFT LCD ,．·Providing Single-End ,Multi-segment ,Standard ,and Spot test of wire.．·Auto Scan and Auto Pin Search ,．·The system provides advanced instant open-circuit, short-circuit, continuity test,．·Intermittent Conductance Test,．·Intermittent Open/Short Test ,．·Full Programming Sequence Test ,．·Versatile I/O Ports for application ,．·Statistics and Print Function,．·Provide REMOTE interface, communicate with PLD auto test fixture,．·Provide personalized customization according to different requirements,
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Backplane Test System
402LV
Very High Pin Count Level IV Backplane Test System. To ensure that Testronics maintains its leadership position as the premier supplier of backplane testers, we will be introducing our solution to testing high pin count / very large backplanes, the Model 402.
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Fibre Channel Modules
AIM’s Fibre Channel test, simulation and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with one dual core RISC processor per port, massive and scalable DDR3 memory and IRIG-B time encoder/decoder functions are standard. The new ultra high performance intelligent 4-lane PCIe 2.0 interface modules offer 2 ports with full function test, simulation, monitoring and analyzer functions for Fibre Channel networks. The dual core processor provides onboard processing and data transfer capabilities for the most demanding Fibre Channel applications including upper layer protocol support done on board level. Large and high data throughput DDR3 RAM is accessible for the onboard processor as is a high performance FPGA implementing the customized Fibre Channel interfaces enabling the board to analyze incoming and modify outgoing data in real time. Each module provides 2 Fibre Channel compliant full duplex ports, implementing the full link level services. SFP cages make it suitable for different media types as optical or electrical network technologies. Ports operate either in Traffic Simulator or Analyzer/Monitor mode with support for port related Frame Statistics. Sophisticated packet capturing mechanism and monitoring features are complimented with powerful triggering and filtering capabilities.
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2.4 MHz Level Test Meter
ET91
*Level Meter, for selective and wideband level measurements with auto ranging*Generator, for the generation of measuring voltage for the test of FDM systems*Bridge, for the measurement of input and output parameter*Spectrum Analyser, for the test of output PSD, cross-talk and other interference signals
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Low PIM Coaxial Switch, DC to 20 GHz, SP4T
87104Q
Low passive intermodulation (PIM) is crucial for applications where two or more transmitted signals share a common antenna or whenever the transmitter signal is too high or the receiver is sensitive to high intermodulation. The Keysight 87104Q is a low PIM SP4T coaxial switch, operating from DC to 20 GHz, which can help to keep the system PIM level low. A guaranteed 0.03 dB insertion loss repeatability and 3 million cycles of operating life ensures signal integrity, improves testing efficiency and ultimately maximizes test throughput.
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Millimeter Wave Continuously Variable Waveguide Attenuators
Our millimeter wave variable waveguide attenuators allow designers and engineers to test their systems at various signal strengths and attenuation values to determine the optimum signal performance of the system. The key feature of these waveguide attenuators is that the attenuation level is adjusted using a built-in micrometer which enables repeatable and rapid re-setting to different attenuation levels without the need for additional external components. Our waveguide attenuators handle varying attenuation levels from 0 to 30 dB over the specified band allowing the designer to tune the attenuation level needed for the application. These continuously variable waveguide attenuators cover a broad frequency range of 33 to 110 GHz in five bands and also display flat performance across a wide band with low insertion loss.
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Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
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PXI-6541, 50 MHz, 32-Channel PXI Digital Waveform Instrument
778952-02
50 MHz, 32-Channel PXI Digital Waveform Instrument—The PXI‑6541 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXI‑6541 can sample digital waveforms at up to 50 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6541 also features advanced synchronization capabilities for building integrated mixed-signal test systems.
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Digital I/O with Per Channel Timing, Programmable Logic Levels and PMU PXI Card
GX5296
The GX5296 offers the most performance and features of any 3U PXI dynamic digital I/O board on the market today. The 32-channel, GX5296 offers timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability emulate and test complex digital busses for system, board or device test applications. Offering 1 ns edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level).
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RWR ATE MKII
MS 1111
Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out LRU and card level testing for TARANG systems of all platforms. The purpose of ATE is to provide a user-friendly environment to test the LRUs and sub-systems (individually) for their functionality, perform specific tests of each LRU / sub-system and Card Level Testing. The card level testing facilitates troubleshooting down to a faulty signal flow path. The UUT tests are carried out by injection of the stimuli generated by the computer or the programmable test equipments and the responses from UUT / test equipments are feedback to the computer for evaluation and generation of reports.
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HMM+™ Tester
Model 4702
The Model 4702 HMM+™ is a completely new tester primarily intended for device level testing and produces a current waveform as specified in the IEC-61000-4-2, from a 50 ohm source impedance system.*This tester provides device level test data that allows users to evaluate the IEC current waveform protection level of their devices. We included failure identification by leakage current increases in the 4702 tester so precise pass/failure levels can be closely measured.*The 4702 HMM+™ provides a new and improved test connection method for making quantifiable and repeatable device level HMM measurements.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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Electromechanical Transfer Switches up to 40 GHz
Fairview Microwave’s line of electromechanical relay transfer switches can be utilized for numerous applications to increase system level capabilities and can help simplify the overall design approach. With two input and two output ports, transfer switches can connect two different instruments with two devices under test. Additionally, they can be used as drop-out switches, for signal reversal or to bypass a component under test. These products are typically used in military communications and broadcast systems, SATCOM, test & measurement, instrumentation applications and are suitable for aircraft use.
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Low PIM Coaxial Switch, DC to 26.5 GHz, Transfer
87222R
Low passive intermodulation (PIM) is crucial for applications where two or more transmitted signals share a common antenna or whenever the transmitter signal is too high or the receiver is sensitive to high intermodulation. The Keysight 87222R is a low PIM transfer coaxial switch, operating from DC to 26.5 GHz, which can help to keep the system PIM level low. A guaranteed 0.03 dB insertion loss repeatability and 3 million cycles of operating life ensures signal integrity, improves testing efficiency, and ultimately maximizes test throughput.
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Portable Telemetry Systems
Lumistar’s portable receivers and test transmitters take the state of the art technology found in the PCI receivers and simulators and install it into a hand held units. Our luggable Telemetry Systems can be configured using our card level products into unique custom solutions.
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AMIDA 3001XP Tester
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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AIM System Solutions
AIM can provide a wide range of customized solutions:*Special-to Type Test Equipment (STTE)*High Level Bus Analysers (HLBA)*Data Acquisition Recording & Simulation Systems*Aircraft Ground Equipment (AGE)*MIL-STD-1760 Weapon Test Sets*Fibre optic MIL-STD-1553 Stub/ARINC429 Link Extension System (FoMIS/FoL)
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Crank Angle Measurement System
CP-5110B Detector/CA-6000B Amplifier
CP / CA series are systems that detect the rotation angle of the engine crankshaft composed of CP-5110B Fiber Optic Crank Angle Detector, CA-6000B Crank Angle Amplifier and CP-5120 / 5130 Slit disk.CP-5110B Fiber Optic Crank Angle Detector makes it possible to detect the crank angle required for various engine performance tests such as combustion analysis with high accuracy and high response. As it has a light projecting and receiving method with an optical fiber, it provides outstanding vibration and noise resistance without a built-in electric circuit in the detector.CA-6000B Crank Angle Amplifier inputs a signal of crank angle detector and outputs a TTL level angle signal and a 1P / R pulse signal.
