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Showing results: 241 - 255 of 257 items found.

  • Pulse Function Arbitrary Noise Generator

    81160A - Keysight Technologies

    Generation of 330-MHz pulses and 500-MHz function/arbitrary waveforms with a 2.5-GSa/s sample rate and 14-bit vertical resolution; Selectable crest factors for white Gaussian noise lets engineers determine how much distortion to apply to a device during stress testing to meet various serial bus standards; Glitch-free timing parameter changes allow engineers to change the frequency without drop-outs or glitches and enable continuous operation without rebooting or resetting the device under test; and Arbitrary bit patterns show capacitive load of the channels using simple pattern settings. Complex measurement setups are no longer necessary to test designs to their limits. Pulses 330 MHz, 500 MHz sine waves, 660 Mbit pattern

  • Qualification and Quality Control Tests

    Techsquare - Techimp HQ S.r.L

    New IEC standards, IEC 60034-18-41 and IEC 60034-18-42, have been issued to define the procedures for testing partial discharge inception voltage and the long-term performance (endurance) of Type I and Type II insulation systems used in rotating machines fed from voltage converters. Voltage impulse generators are required at least to test turn insulation, but they would be recommended for any testing under power electronics supply because of their capability to simulate the real electrical stress conditions. More generally, any type of electrical insulation system when subject to impulsive voltage waveform during life should be carefully evaluated in terms of partial discharge and endurance behaviour. This is why voltage impulse generators able to provide impulses with controlled amplitude and frequency are needed to face this new testing challenge.

  • Resilient Modulus and Asphalt Testing System

    Atico Export

    The Resilient Modulus software features built and test sequences, and the capability to specify user defined sequences. Contact stress is automatically adjusted according to the above procedures as selected. Available waveforms include haver sine, sine, square and triangular, along with a user defined waveform selection. Optional peak & valley compensation ensures proper and quick matching of the load parameters. Real time displays of the prescribed versus actual dynamic load or the dynamic deformation measurements by each sensor are always present. Deformation ratio of the two sensors, Rv (to ensure that the two deformation sensors are in agreement) and  Mr are also calculated in real time. During export, curve fitting is done to fit the results to models that predict Mr as a function of σm, σd, and CP (cell pressure). Four different functions are calculated automatically

  • Mechanical Creep and Rupture Testing Machine

    MRC Series - Jinan Testing Equipment IE Corporation

    MRC series mechanical creep and rupture testing machine with single-lever structure is designed for long-term creep and stress rupture test applications. The series mechanical creep and rupture testing system is mainly for the metallic materials under room or elevated temperature according to GB/T2039, GB/T 20120, EN ISO 204-2009 and ASTM E139. The creep and rupture testing machine can also maintain constant loads for extended periods of time. Through the mechanical advantage of the lever arm loading system, constant loads can be maintained with a high degree of accuracy for long duration. This creep and rupture tester uses dead weights without continuous operation and the dependency of a mechanically powered drive. The creep and rupture testing system is an ideal equipment for metallurgy manufacturer, research institute, colleges and other relevant factories and mines.

  • Ultrasonic Bolt Meter - Bolting System

    Mini-MAX-Series - Qualitest International Inc.

    The MINI-MAX, Ultrasonic Bolt Tension Monitor, defines the state of the art in the measurement of the actual elongation produced by tightening a threaded fastener. The MINI-MAX can measure the elongation very accurately in fasteners of virtually any material from 1/2 inch to 4 feet in length. The measurement is achieved by determining the change in the transit time, of an ultrasonic shock wave along the length of the fastener as the fastener is tightened by any method. The on-board microcomputer automatically interprets this time measurement to display the time(nanoseconds), elongation, load, stress, or %strain from stretching a fastener. Through the use of high speed digital signal processing and automated diagnostics, the MINI-MAX minimizes the requirement for extensive operator training. With built in data recordation and reporting through an RS232 interface, the MNI-MAX offers an easy to use and reliable solution to the most difficult bolting problem.

  • Dielectric Breakdown Voltage and Dielectric Strength

    ASTM D149 - National Technical Systems

    This test method covers procedures for the determination of dielectric strength of solid insulating materials at commercial power frequencies, under specified conditions. Unless otherwise specified, the tests shall be made at 60 Hz. However, this test method is suitable for use at any frequency from 25 to 800 Hz. At frequencies above 800 Hz, dielectric heating is a potential problem. This test method is intended to be used in conjunction with any ASTM standard or other document that refers to this test method. References to this document need to specify the particular options to be used. It is suitable for use at various temperatures, and in any suitable gaseous or liquid surrounding medium. This test method is not intended for measuring the dielectric strength of materials that are fluid under the conditions of test. This test method is not intended for use in determining intrinsic dielectric strength, direct-voltage dielectric strength, or thermal failure under electrical stress (see Test Method ASTM D3151). This test method is most commonly used to determine the dielectric breakdown voltage through the thickness of a test specimen (puncture). It is also suitable for use to determine dielectric breakdown voltage along the interface between a solid specimen and a gaseous or liquid surrounding medium (flashover). This test method is similar to IEC Publication 243-1. All procedures in this method are included in IEC 243-1. Differences between this method and IEC 243-1 are largely editorial. Note: The above information is taken directly from the test method Scope published in ASTM D149.

  • Non-Destructive Testing (NDT)

    Marposs S.p.A.

    Marposs complements its geometric measurement solutions with solutions for non-destructive testing using eddy current technology.The testing options can be divided in three large groups:Material integrity test, to check for the presence of defects (cracks, porosity, blow holes, inclusions) on the surface and in the layer just below the surface.Material properties test, to check if the thermal cycles (hardening, hardening and tempering, annealing, stress relieving, etc.) have been performed correctly. Material identification checks are done to sort parts with the same geometry but made with different materials.Thread inspection to check if the treading has been carried out and its quality.In addition to the non-destructive checks performed with the eddy currents, we have developed a durometer for the conventional measurement of surface hardness, according to the Rockwell scale (HRC or HRA); which uses a diamond penetrator to measure the hardness of the sample being tested.

  • Mechanical Tester

    Nanovea Inc.

    NANOVEA Mechanical Tester is the most versatile nanoindenter and scratch tester capable of precisely measuring the micro- to nanomechanical properties of wide ranges of materials from thin films, coatings, ceramics and composites to polymers and bio materials via Indentation, Scratch and Friction testing. All NANOVEA Mechanical Tester models come with true feedback load control from independent load and depth sensors that provide unmatched accuracy and the highest repeatability available on the market. This technology allows a user to perform Nanoindentation and Microindentation for Hardness and Elastic Modulus Testing, Stress vs Strain Analysis, Creep and Relaxation, Loss and Storage Modulus, Yield Strength and Fatigue, Fracture Toughness and Nano-scratch & Micro-scratch for Scratch Hardness Testing, Multi-pass Wear Test, Cohesive and Adhesive Failure Testing as well as Coefficient of Friction testing, all available on one system.

  • Wire Damaged Tester

    WDT-1 - Lisun Electronics Inc.

    This equipment is designed and manufactured according to corresponding regulation in standard IEC884-1, GB299.1-96, GB16915.1-97 and other electronic accessories relevant standard. Mainly used to test damage degree of fixed connection components lead wire of with thread clamping type and no screw terminals, so as to inspect whether it can withstand mechanical stress during normal use.Specification: • Power supply: AC220V 50Hz • Test rate: 10±2r/min (GB16915.1-97: 12 ±1r/min) • Rotating radius: 100mm • Test distance: 250~500mm adjustable • Test numbers (Number of rotating): 0~999999 any set • Mass: 0.3KG, 0.4KG, 0.7KG, 0.9KG, 1.4KG, and 2.0KG (GB16915.1-97: 30N, 40N, 50N, 60N each of 2 pcs) • Stations: 2 • Dimension: 1200×1400×400 (mm) • Remarks: The mass and rotating radius can be optional as per customer requirements.

  • High Voltage Tester For Hair Dryer & Hair Straightner

    SCR ELEKTRONIKS

    Every electrical apparatus or machine consists of two distinct sections - one which carries the electricity, and other which is isolated (insulated) from the electric currents. The former may be called the `Live' side whiles the latter `Earth’ side. A person near about the apparatus or handling it can safely touch the Earth side, but not the live side, for obvious reasons. To ensure that the isolation of the two sections is effected properly, the apparatus is tested by subjecting it to a Voltage much higher than the normal working Voltage. If the insulation is good, it stands the test without breakdown otherwise high electrical stress punctures the insulation at its weakest spot foretelling a later calamity to unwary user. Government Department- when buying electrical equipments- and all reputable manufacturers test every piece of equipment by this test called HIGH VOLTAGE TEST. It weeds out poorly insulate apparatus.

  • Low Temperature Chamber

    ACMAS Technologies Pvt. Ltd.

    The Ultra Low Temperature Test Chamber from Weiber are specially designed equipments that provide specific low temperature environments for testing a wide variety of products and their performance under non-ambient testing conditions. They are engineered and configured to meet the exacting low temperature requirements of various research applications and often find their use for evaluation of material properties at extreme temperatures. These versatile test chambers offer the capabilities of measuring temperature extremes, allowing both freeze tolerance studies as well as the effect of heat stress on the sample specimen within the same equipment. They combine advanced technological features with an energy efficient design for highly accurate test conditions and repeatability of results. These test chambers provide a cost-effective solution to expensive laboratory tests and are available at economical prices for increased affordability. They are designed for safe and reliable operation and find widespread usage in chemical and pharmaceutical industries, biotechnology and medicine industry, petroleum industry, food industries and other industrial and manufacturing units.

  • Walk-In Solar Spectrum Test Chamber

    ACMAS Technologies Pvt. Ltd.

    WEIBER walk in Solar Spectrum Test Chambers are one of solutions to be utilized in large scale PV testing program. We offer customized as well as standard multidimensional test program for PV modules in reasonable prices. This system delivers the weathering stress representative of long term outdoor exposure.Our flexible system can be designed according to our test requirements, to suit environmental test conditions like volume, temperature, humidity solar radiation intensity and other measuring instruments. It is also called Walk in Solar Radiation Test Chamber.WEIBER solar test system are recognized for superior solar simulation environmental Testing, evaluating outdoor use product reliability, quality & safety. This technology allows for very high concentrations of UV energy without excessive heating of test samples. Custom mounting and cooling can be added depending upon specific material exposure requirements. MHGs (metal halide global lamps) are used as radiation source. Solar spectrum chamber also known as Walk in Solar Simulation Test Chamber

  • Solar Spectrum Test Chamber / Solar Radiation Test Chamber

    ACMAS Technologies Pvt. Ltd.

    WEIBER Solar Spectrum Test Chambers are one of solutions to be utilized in large scale PV testing program. We offer customized as well as standard multidimensional test program for PV modules in reasonable prices. This system delivers the weathering stress representative of long term outdoor exposure.Our flexible system can be designed according to our test requirements, to suit environmental test conditions like volume, temperature, humidity solar radiation intensity and other measuring instruments. Weiber provide Solar Radiation Test Chamber.WEIBER solar test system are recognized for superior solar simulation environmental Testing, evaluating outdoor use product reliability, quality & safety. This technology allows for very high concentrations of UV energy without excessive heating of test samples. Custom mounting and cooling can be added depending upon specific material exposure requirements. MHGs (metal halide global lamps) are used as radiation source. Weiber provide Solar Simulation Test Chamber.

  • SMARC Short Size Module with NXP i.MX 6 Multicore Arm® Cortex®-A9

    LEC-iMX6R2 - ADLINK Technology Inc.

    The SMARC ("Smart Mobility ARChitecture") is a versatile small form factor computer Module definition targeting applications that require low power, low costs, and high performance. The Modules will typically use ARM SOCs similar or the same as those used in many familiar devices such as tablet computers and smart phones. Alternative low power SOCs and CPUs, such as tablet oriented X86 devices and other RISC CPUs may be used as well. The Module power envelope is typically under 6W. The Modules are used as building blocks for portable and stationary embedded systems. The core CPU and support circuits, including DRAM, boot flash, power sequencing, CPU power supplies, GBE and a single channel LVDS display transmitter are concentrated on the Module. The Modules are used with application specific Carrier Boards that implement other features such as audio CODECs, touch controllers, wireless devices, etc. The modular approach allows scalability, fast time to market and upgradability while still maintaining low costs, low power and small physical size. To stress on its low power consumption feature, ADLINK has named SMARC products as LEC (Low Energy Computer on module) series.

  • Optical Fiber Cable Testing Equipment

    Torontech Group

    Optical fiber consists of a core and a cladding layer, selected for total internal reflection due to the difference in the refractive index between the two. In practical fibers, the cladding is usually coated with a layer of acrylate polymer or polyimide. This coating protects the fiber from damage but does not contribute to its optical waveguide properties. Individual coated fibers then have a tough resin buffer layer and/or core tube(s) extruded around them to form the cable core. Several layers of protective sheathing, depending on the application, are added to form the cable. Rigid fiber assemblies sometimes put light-absorbing ("dark") glass between the fibers, to prevent light that leaks out of one fiber from entering another. This reduces cross-talk between the fibers, or reduces flare in fiber bundle imaging applications Optical fibers are very strong, but the strength is drastically reduced by unavoidable microscopic surface flaws inherent in the manufacturing process. The initial fiber strength, as well as its change with time, must be considered relative to the stress imposed on the fiber during handling, cabling, and installation for a given set of environmental conditions. There are three basic scenarios that can lead to strength degradation and failure by inducing flaw growth: dynamic fatigue, static fatigues, and zero-stress aging.

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