Showing results: 361 - 375 of 377 items found.
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CAEN S.p.A.
- From 12 to 48 independently controllable High Voltage channels- 0 ÷ 100 V output voltage- Maximum Current: 1mA, 10 mA or 1 mA/100 μA (dual range board)- Individual Enable (A1510 only)- Either DB37, DB25 or SHV connectors- Available with either positive, negative or mixed polarity- Up to 20 nA / 100 pA current set / monitor resolution- Up to 2 / 0.2 mV voltage set / monitor resolution- Extreme Low ripple, down to < 3 mVpp- 3 different channel grounding- Common Ground (AGxxxx)- Common Floating Return (Axxxx)- Full Floating (A1510 only)- Independently programmable for each channel:- Output voltage- Current limit- Ramp up/down- TRIP parameter- Current generator operation in overcurrent condition- Specific design for double side silicon detector (A1510)
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MTI Instruments
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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id150 SERIES -
ID Quantique SA
Intended for large-volume OEM applications, the id150-1x8 is the only multichannel solid-state single photon detector on the market. It consists of a CMOS silicon chip packaged in a standard TO8-16pin header with a transparent window cap. The chip combines 8 in-line single photon avalanche diodes that can be accessed simultaneously for parallel processing. square in center-to-center A fast active quenching circuit is integrated within each pixel in order to operate each diode in photon counting regime. The chip is mounted on a printed circuit board on top of a single-stage thermoelectric cooler (TEC). A thermistor can be used to measure the temperature of the chip. Only two low power supplies of +5V and -25V are needed for operation in photon counting mode. The fast active quenching circuit leads to a dead time of less than 50ns per channel. An outstanding timing resolution of less than 60ps allows high accuracy measurements.
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SEN-36002 -
Playing With Fusion Inc
SEN-36002 is a highly integrated carrier board designed for the Si1145 UV, Ambient Light and Proximity sensor IC from Silicon Labs. This sensor has 100mLUX resolution, and has a dynamic range of 1 LUX to 128 kLUX with IR correction. This means that whether your application is indoors in poor lighting conditions or outside in full sunlight, this sensor has you covered. In addition, we added a high power LED (150mA max, 20 degree) to take full advantage of the proximity sensing capability of this IC - something you won't see on most competitive carrier boards. Integration is easy with 4 x 4-40 sized mounting holes at the corners of the PCB and signal translation to handle interface voltages from 3V to 5V. The board is interfaced via an I2C interface and function pins have been broken out to a 0.1" pin header. The INT pin is also broken out for interrupt capability.
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Dexter Research Center, Inc.
If your design challenge is to create the best motion sensor or motion detector - fire sensor or fire detector, smoke sensor or smoke detector - you've come to the right company. Dexter's sensor technologies are at multiple fronts today, reducing the threat of combat on land, sea and air. Yet the industry leading advantages of Dexter sensors - low cost, high sensitivity, low energy consumption and long life - make them the perfect motion sensor for home, office and facility applications. Dexter thin-film and silicon detectors can target precise threats, whether defined by movement, temperature or body mass. Intensive MIL-STD-883H testing performed by Trialon Corporation, an independent testing facility, confirm that Dexter Research's silicon-based temperature sensor detectors meet the same rugged requirements of 1,000G's for mechanical shock and 30G's in random vibration for which our thin-film detectors are famous. Download Dexter's report here (PDF).
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KLA-Tencor Corp
KLA’s extensive portfolio of packaging solutions accelerates the manufacturing process for outsourced semiconductor assembly and test (OSAT) providers, device manufacturers and foundries for a wide range of packaging applications. Innovations in advanced packaging, such as 2.5D/3D IC integration using through silicon vias (TSVs), wafer-level chip scale packaging (WLCSP), fan-out wafer-level packaging (FOWLP) and heterogeneous integration as well as a wide range of IC substrates create new and evolving process requirements. KLA offers systems for packaging inspection, metrology, die sorting and data analytics focused on meeting quality standards and increasing yield before and after singulation. SPTS provides a broad range of etch and deposition process solutions for advanced packaging applications. Orbotech offers a portfolio of technologies that includes automated optical inspection (AOI), automated optical shaping (AOS), direct imaging (DI), UV laser drilling, inkjet/additive printing and software solutions to ensure manufacture of the highest quality of IC substrates.
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CAEN S.p.A.
- From 12 to 48 independently controllable High Voltage channels- 0 ÷ 500 V output voltage (0 ÷ 250 V, A1519B and A1619 only)- Maximum Current 0.5, 1, 10 mA or 1 mA/100 μA (dual range boards)- Individual Enable (A151x only)- Either DB37, DB25, Radiall Multipin or SHV connectors- Available with either positive, negative or mixed polarity- Up to 20 nA, 100 pA current set / monitor resolution- Up to 10 mV / 1 mV voltage set / monitor resolution- Very Low ripple, down to < 5 mVpp- 3 different channel grounding - Common Ground (AGxxxx) - Common Floating Return (Axxxx) - Full Floating (A151x, A1612, A1619)- Independently programmable for each channel: - Output voltage - Current limit - Ramp up/down - TRIP parameter- Current generator operation in overcurrent condition- Specific design for double side silicon detector (A151x)
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Shanghai Guantu Technology Co., Ltd.
The lightning wave impulse current generator is an impulse current generator that generates a simulated lightning current waveform . Its working process is as follows: first, the transformer charges the capacitor bank through the silicon pile, when the charging voltage reaches a predetermined value, the spark gap is triggered, and the capacitor is discharged through the total inductance and total resistance of the circuit. When the resistance is greater than or equal to the critical damping value, a unidirectional impulse current wave is generated in the circuit. When the resistance is less than the critical damping value, an oscillating impulse current wave is generated. The magnitude of the impact current amplitude is related to the circuit parameters. When the capacitance value and charging voltage are the same, the smaller the inductance value, the greater the current amplitude. In order to obtain as much current as possible, a pulse capacitor with a small inductance value is usually selected, and the total length of the connecting line should be as short as possible when arranging the main capacitor, so that the total loop inductance value can be reduced as much as possible.
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EV Group
An accurate wafer bonding process is the key factor in obtaining high quality single crystalline silicon films on insulating substrates. The EVG850 SOI/Direct Wafer Bonding systems are designed to fulfill a wide range of fusion/molecular wafer bonding applications, with main focus on SOI substrates manufacturing. Ultra clean handling of wafers throughout the bonding process assures high-yield and void-free bonds. All essential steps, from cleaning and alignment to pre-bonding and IR-inspection are combined in one high volume production system. EVG850 is the only production bonding system built to operate in high throughput, high-yield environments and guarantees void-free SOI wafers up to 300 mm.The EVG300 series single wafer cleaning systems are designed for efficient removal of particles. In semiconductor processing, efficient cleaning and particles removal prior to critical process steps enables maximum yield. Wafer Bonding is a process which is strongly affected by particles: each particle on the wafer surface produces a void orders of magnitude larger than its diameter, contributing to a dramatic yield loss.
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Model 3548COD -
Jinan Testing Equipment IE Corporation
These COD gages mount on a water-cooled bracket, which is mounted on the furnace side cut-out or with optional load frame support brackets. The standard temperature version (to 1200℃) is supplied with high purity alumina rods. The high temperature option is furnished with alpha grade silicon carbide rods. Rods are made to order to the length required for your furnace. Mounting brackets may be integrated with the furnace cut-out. Epsilon can also provide optional load frame mounting brackets to fit your test frame. Contact edges on the test sample should be somewhat rounded (not sharp knife edges) for best performance with this model. The Model 3548COD extensometers are strain gaged devices, making them compatible with any electronics designed for strain gaged transducers. Most often they are connected to a test machine controller. The signal conditioning electronics for the extensometer is typically included with the test machine controller or may often be added. In this case the extensometer is shipped with the proper connector and wiring to plug directly into the electronics. For systems lacking the required electronics, Epsilon can provide a variety of solutions, allowing the extensometer output to be connected to data acquisition boards, chart recorders or other equipment.
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Model 3648 -
Jinan Testing Equipment IE Corporation
These extensometers use a high temperature capacitive sensor in combination with an innovative design to achieve high accuracy strain measurements in low measuring ranges not possible with other high temperature extensometers. They mount on a slide bracket (included) that can attach to the load frame of your test system; optional load frame mounting brackets are available. The overall design reduces any influence from common lab environment vibrations.The standard temperature version (to 1200℃) is supplied with high purity alumina rods. The high temperature option is furnished with alpha grade silicon carbide rods. Rods are made to order to the length required for your furnace. These units are made to order in many different gauge lengths and measuring ranges.The extensometer comes with a signal conditioner. The output is an analog DC voltage, factory calibrated with the extensometer to 0 to ±10 VDC typically. They are readily interfaced with most existing test controllers, and may be directly connected to data acquisition systems and chart recorders. Bringing the signal into a spare DC input channel (or external input) on the test controller allows the extensometer to be used for strain controlled tests like low cycle fatigue.
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CM22301 -
LinkedHope Intelligent Technologies Co.,Ltd.
CM22301 uses Intel® sixth-generation Skylake platform and Core M low-power SoC processors, and integrates the full functions of CPU, GPU and South/North Bridge on a single chip. The processor provides powerful computing and display performance with dual-core and four threads configuration. Its turbo frequency can boost up to 3.1GHz and the display output resolution can be up to 4K. CM22301 has an amazing thermal design power consumption of only 4.5W (TDP) and can be used for a variety of high-performance fanless designs. CM22301 supports up to 16GB dual-channel low-voltage DDR3L memory populated onboard, and up to 64GB on-board solid state disk silicon, as benefit the development of ruggedized products for harsh environment applications.As defined by VITA 59 specification, CM22301 provides up to 6 PCIe lanes, enabling flexible functionality expansions, such as NICs, DAQs, video capture and so on. Meanwhile, CM22301 also provides up to date computer interfaces like GbE, SATA3, USB3.0/2.0, HD Audio, etc. CM22301 uses the same 220pin board-to-board connector and Type10 pin out definition as COM Express.
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Model 7650 -
Jinan Testing Equipment IE Corporation
Model 7650 extensometers are primarily used on round specimens tested in bi-axial test machines capable of simultaneous axial and torsional loading. All models are capable of bi-directional displacement in both axes and may be used for strain-controlled fatigue testing under fully reversed load and strain conditions at frequencies up to 10 Hz.All 7650 models mount rigidly on the load frame and incorporate slide mounting to bring the extensometer into contact with the specimen. The gauge length is set automatically before mounting on the test specimen, which allows for hot mounting after thermal equilibrium has been reached.These units are specifically designed to minimize crosstalk between axes and to provide high accuracy, high resolution measurements. They incorporate capacitive sensors for low operating force and include electronics with programmable filtering and multi-point linearization for improved performance and accuracy. The overall design minimizes, and in many cases virtually eliminates, any influence from common lab environment vibrations.These water-cooled extensometers are equipped with high purity alumina rods with conical rod tips for specimen contact when testing to 1200℃(2200°F). Silicon carbide rods are used for the 1600℃ (2900°F) high temperature option.
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Model 7651 -
Jinan Testing Equipment IE Corporation
Model 7651 extensometers measure combined in-plane strains in flat cruciform specimens tested in machines capable of simultaneous X and Y (perpendicular) axial loading and on standard flat samples tested in pure tension. All models are capable of bi-directional displacement in both axes and may be used for strain-controlled fatigue testing under fully reversed load and strain conditions at frequencies up to 10 Hz.All 7651 models mount rigidly on the load frame and incorporate slide mounting to bring the extensometer into contact with the specimen. The gauge length is set automatically before mounting on the test specimen, which allows for hot mounting after thermal equilibrium has been reached.These units are specifically designed to eliminate crosstalk between axes and to provide high accuracy, high resolution measurements. They incorporate capacitive sensors for low operating force and include electronics with programmable filtering and multi-point linearization for improved performance and accuracy. The overall design minimizes, and in many cases virtually eliminates, any influence from common lab environment vibrations.These water-cooled extensometers are equipped with high purity alumina rods with conical rod tips for specimen contact when testing to 1200℃(2200°F). Silicon carbide rods are used for the 1600℃(2900°F) high temperature option.
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Model 7650A -
Jinan Testing Equipment IE Corporation
Model 7650A extensometers measure strains with extremely high precision due to their design features and low strain range. All models are capable of tension and compression strain measurement, and may be used for fatigue testing under fully reversed load and strain conditions at frequencies up to 10 Hz.All 7650A models mount rigidly on the load frame and incorporate slide mounting to bring the extensometer into contact with the specimen. The gauge length is set automatically before mounting on the test specimen, which allows for hot mounting after thermal equilibrium has been reached.These units are specifically designed to provide high accuracy, high resolution measurements and perform high temperature fatigue testing at the highest possible frequencies. They incorporate capacitive sensors for low operating force and include electronics with programmable filtering and multi-point linearization for improved performance and accuracy. The overall design minimizes, and in many cases virtually eliminates, any influence from common lab environment vibrations.These water-cooled extensometers are equipped with high purity alumina rods for specimen contact when testing to 1200℃ (2200°F). Silicon carbide rods are used for the 1600℃ (2900°F) high temperature option.The Model 7650A is often customized for specific test needs. Contact Epsilon for a configuration that matches your requirement.
