Showing results: 121 - 135 of 377 items found.
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Trek5 -
Breker Verification Systems
Breker’s solutions enable test reuse across simulation, emulation, prototyping and actual silicon, eliminating redundant effort across the development flow. The Breker “Trek” suite solves challenges across the functional verification process for large, complex semiconductors.
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SURFTENS HL Automatic -
Optik Elektronik Gerätetechnik GmbH
Fully automatic contact angle meter for silicon wafers up to 12 inch The contact angle measuring system SURFTENS HL automatic is designed for use in semiconductor industry and research, in particular for process control of wafer coating and in the photolithographic process.
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DSI -
Arasan Chip Systems, Inc.
The Arasan MIPI Display Serial Interface (DSI) Controller IP provides both device and host functionality. Additionally, the DSI Controller provides a high-speed serial interface between an application processor and display and follows a rigorous verification methodology to ensure interoperability of our DSI digital controller with our D-PHY analog IP. Arasan’s DSI solutions are MIPI standards-compliant and are designed to accelerate integration, lower risk and accelerate time to market for developers of display applications. Arasan’s expertise is backed by our unique silicon proven design discipline and product development process that ensures fast silicon success with our analog and digital IP.
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MWR-2S-3 -
HenergySolar
The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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Model MOCVD-500-A -
TEK-VAC INDUSTRIES Inc.
For Experimental growth of quality epitaxial layers III-V, II-VI compounds. Multi-Layer structures. Directly heated silicon carbide coated, high purity graphite or PBN susceptor. Low mass thermocouple probe immersed into susceptor. Broad temperature and pressure application. Highest quality materials utilized throughout.
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DPW -
Chuan Sheng Electronics Co., Ltd.
•Wide range power supply•Measure by diffusion silicon sensor , advanced membrane isolation•Connection reverse protect ,OVP、OCP•Design for anti-interfere, anti-lightning strike•Compact and easy to install•2mS response time ,high accuracy ,high stability
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UNH IOL
The UNH-IOL is taking the lead on providing testing solutions for silicon vendors and Tier 1 automotive suppliers in an environment where connectivity is of growing importance to end users. Our testing helps customers ensure their products work seamlessly with other products in the marketplace.
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UltraSort200 -
HenergySolar
The UltraSort continues our 25 year tradition of providing metrology solutions to semiconductor wafer manufacturers. Designed for volume wafer production, this automated system offers superior performance in rapid, repeatable, accurate, noncontact qualification of silicon and alternative substrate wafers.
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SLIM -
El-Mul Technologies
SLIM™ is an innovative design for under-the-column BSE detection.SLIM™ puts El-Mul’s ScintiFast™ together with a segmented, shaped light guide and Silicon Photomultipliers (SiPM) to create a fast, sensitive, segmented and compact BSE detector for e-beam tools.
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323 -
Ballentine Laboratories, Inc.
The Ballantine 323 True RMS analog ac voltmeter uses advanced true rms circuitry to achieve square law response from rugged, fast responding silicon diode detectors with no thermal lag and overload vulnerability inherent in thermocouple devices.
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TouchXpress -
Silicon Labs
Silicon Labs' TouchXpress devices are highly optimized solutions that enable designers to easily design and integrate capacitive sensing into applications. These devices quickly replace mechanical buttons and switches with modern capacitive touch buttons by eliminating the firmware complexity and reducing development time.
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FISCHERSCOPE X-RAY 4000 -
Helmut Fischer AG
For continuous measurement of coatings on foils, strips and punched strips in ongoing productionMeasuring head may be positioned at right angles to the transport direction of the specimenEasy handling and quick start-upProportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detectorPositioning device for measurements on several measuring positionsCustomer-specific designAutomated calibrationFast conversion from one production line to anotherEasy integration into quality management systems and process controls
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Renesas Electronics Corp.
High collector-to-emitter voltage photocouplers (optocouplers) are optically coupled isolators containing a GaAs infrared light emitting diode and an NPN silicon Darlington connected phototransistor. The isolation voltage during input and output and the voltage between the collector and the emitter of the transistor are both high.
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Thread -
Silicon Labs
Thread is an IPv6-based mesh networking protocol designed as a reliable, low-power, secure, and scalable networking solution for connecting Things to the IoT. As a founding board member of the Thread Group, Silicon Labs helps accelerate time to market with proven mesh networking hardware and software solutions.
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AFM Workshop
SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.