Showing results: 286 - 300 of 695 items found.
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Intevac Imaging
Intevac's EBAPS technology is based on a III-V semiconductor photocathode in proximity-focus with a high resolution, backside-thinned, CMOS chip anode. The electrons emitted by the photocathode are directly injected in the electron bombarded mode into the CMOS anode, where the electrons are collected, amplified and read-out to produce digital video directly out of the sensor.
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iSYSTEM ag
With some of the more advanced 32-bit microcontrollers and SoCs, the full program and data trace capabilities of the device are not made available on production silicon. Instead, semiconductor vendors provide special 'emulation devices'. These typically feature more pins than the production device, thereby providing the interface to the trace interface.
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Lattice Nexus Platform -
Lattice Semiconductor
The Lattice Nexus FPGA platform combines Lattice’s long-standing low power FPGA expertise with leading 28nm FD-SOI semiconductor manufacturing technology. With this platform, Lattice enables the rapid development of multiple device families that deliver low power, high performance, high reliability and small form factor.
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Kuhne electronic GmbH
In this product category you find highly linear power amplifiers for digital and analog data transmission, power amplifiers for CW applications and for laboratory use, which stand out due to its liability, robustness and long-term availability and which are based on the semiconductor technologies which are actually available on the market.
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HORIBA, Ltd.
For years, HORIBA Scientific’s OEM team has been the preferred, reliable and consistent supplier of OEM spectroscopy components. Our know-how in Raman (We are Number #1!) has made it into our miniature spectrometers and systems for portable Raman applications (Process control, Security, Pharmaceutical, Medical, Semiconductor…).
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Grinding and Dicing Services, Inc.
GDSI delivers complete backgrinding solutions to the semiconductor, MEMS and biomedical industries. Backgrinding is a necessary process step to reduce wafer thickness prior to dicing and final assembly. By utilizing fully automated grinders staffed by highly qualified engineers, GDSI’s grinding procedures produce unsurpassed precision and repeatability.
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Neon-CLB -
BitFlow, Inc.
Simplify your industrial, medical, or semiconductor imaging application with BitFlow's Neon-CLB, the easiest to use and most reliable Base/PoCL Camera Link frame grabber available anywhere. The Neon-CLB captures images at up to the camera's highest frame/data rate, with precision image acquisition suitable for the most demanding applications.
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Physical Sciences Inc.
QCL sensors use mid-infrared semiconductor laser sources, either intraband Quantum Cascade Lasers or Interband Cascade Lasers to enable high precision, high accuracy, and selective detection of trace gases such as greenhouse gases and chemical agents with application to a variety of commercial, industrial, defense and environmental problems.
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PB3600 -
Integrated Technology Corp.
The PB3600 provides the latest techniques in testing and maintaining probe cards. Designed through joint development with many of the world’s largest semiconductor and probe card manufacturers, ITC has produced an ergonomic analyzer with the greatest measurement resolution, highest throughput, most flexibility and still made it easy to use.
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ECOPIA
As one of the most important module in Probe_Station, manipulator is an accurate system that probe micro distance() and contact on the electrode of semiconductor wafer, device. ECOPIA's Manipulator is very easy to use and probe arm's elastic plate is good to protect sample's surface, from being damaged by Z direction movement.
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VIEW Micro-Metrology
VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.
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U2941A -
Keysight Technologies
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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CWTMini50HF -
Power Electronic Measurments Ltd
For high-speed and high power-density power electronic applications. This higher bandwidth probe is ideal for measuring the faster current transients in today’s new semiconductor technologies where faster turn on and turn off times, higher blocking voltages and smaller circuits demand, smaller, higher temperature, faster current probes.
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Onto Innovation
In the race to digitize semiconductor manufacturing operations, Onto Innovation’s productivity software delivers the competitive advantage you need to capture market share. Our software connects information on a tool, within a factory, or across an entire global supply chain to capitalize on the potential of your biggest asset: your data.
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PM2000 -
Applied Test Resources
The PM2000 is a high voltage power source capable of supplying up to 2000 V and sourcing 10mA to a load. The high potential at 2 kV fulfills coverage for mostly all semiconductor devices where leakage and breakdown measurements are involved. The module has been incorporated with interlock feature to ensure safety.