Showing results: 136 - 150 of 695 items found.
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OPTI-Sense Series -
Teledyne Advanced Pollution Instrumentation
The OPTI-Sense series of sensors is based on Non-Dispersive Infrared (NDIR) technology. They are designed to precisely measure the absorbance in the infrared spectrum of specialty gases typically found in semiconductor applications. They are very compact and designed with no moving parts, making the OPTI-Sense robust and ideal for continuous in-situ gas monitoring of semiconductor processes.
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SiliconAid Solutions, Inc.
SiliconAid Solutions provides expert consulting services for all aspects of semiconductor Design-for-Test (DFT) development and implementation. Staffed by experts with proven track records from major semiconductor manufacturers, SiliconAid focused expertise provides you resources when and where you need them the most.
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UNIVANS Co., Ltd.
The semiconductor manufacturing process is divided into a front process (WAFER) and a post process (PACKAGE). The LOAD BOARD is an INTERFACE device for inspecting the function and performance of a package state IC, which is a post process, It is an INTERFACE key device for inspection. In particular, LOAD BOARD is widely used in non-memory semiconductor inspection equipment.
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ASE Industrial Holding Co., Ltd.
ASE provides a complete range of semiconductor testing services to our customers, including front-end engineering testing, wafer probing, final testing of logic, mixed signal, and memory semiconductors, and other test-related services. Our testing services employ technology and expertise that are among the most advanced in the semiconductor industry.
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bsw TestSystems & Consulting AG
Semiconductor manufacturers need accurate data on the exact electrical characteristics of their components as a basis for further optimization.
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P-1000 -
Axic Inc.
The Precision P-1000 readily analyzes compound thin films utilized in semiconductor, superconductor, magnetic and applications.
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U-UVF248 -
Olympus Corp.
Model Capable of High-magnification/High-contrast Deep Ultraviolet (DUV) Observation. A Semiconductor / FPD Inspection Microscopes.
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3950 -
KANOMAX USA, Inc.
This revolutionary 0.1-0.3 micron 2-channel semiconductor particle counter comes in one of the lightest form-factors available today; clocking in at only 7.5lbs (3.4kg). It is designed for high-end contamination control environments, such as semiconductor manufacturing facilities and cleanrooms, and can be used for standalone operation or integrated into an existing monitoring system to accommodate a vast array of applications.
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Micromatter
MICROMATTER provides custom coating services (single or multi-layer) on customer supplied glass, metal and semiconductor substrates.
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Hamamatsu Photonics K.K.
Plasma process monitors to monitor plasma emissions during semiconductor manufacturing processes such as etching, sputtering and CVD.
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YieldStar -
ASML
Our YieldStar optical metrology solutions for the semiconductor industry can quickly and accurately measure the quality of patterns on a wafer.
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Advantech Co. Ltd.
Advantech is a key provider in the CompactPCI and VPX market for mission critical applications in the railway, semiconductor, and healthcare markets.
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AMC-Monitor T-1000 -
Ionicon Analytik Ges.m.b.H.
The all-in-one analyzer for FOUP, fab and clean-room environment AMC monitoring in the semiconductor industry. The AMC-Monitor is a modular and flexible platform for airborne molecular contaminations (AMC) monitoring in semiconductor applications such as: FOUP analysis with a focus on VOC and condensables incl. full integration with Pfeiffer Vacuum APA 302 pod analyzer. Clean-room monitoring in fabrication plants.
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Cohu, Inc.
The Diamondx DxV semiconductor test system provides full ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor tester solutions that is no mainframe, separate workstation or support cabinets needed. The Diamondx DxV is completely stand-alone, so it can be placed on a bench or desktop: