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Spread Resistance For Slanting Polished Sample Of Semiconductor By Tow Kinematically-mounted Probe Contacting .
SRS-2010
*Resitivity map along with depth direction, thickness of epitaxial , depth of PN junctin and carier density profiles
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Analysis
External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacit...show more -
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Semiconductor Equipment Manufacturers
Integrated Dynamics Engineering
With shrinking process geometries, new structural elements and a major increase in substrate size, the challenges to improving process yield and overall throughput have increased exponentially. These demands drive a stringent requirement for system stability and overall immunity from internal and external forces.
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PXI-5670, 2.7 GHz RF Vector Signal Generators
PXI-5670 / 778768-03
2.7 GHz PXI Vector Signal Generator—The PXI‑5670 has the power and flexibility you need for product development applications from design through manufacturing. It can generate custom and standard modulation formats such as AM, FM, PM, ASK, FSK, PSK, MSK, and QAM. The PXI‑5670 delivers a highly flexible and powerful solution for scientific research, consumer electronics, communications, aerospace/defense, and semiconductor test applications as well as for emerging areas including software defined radio, radio frequency identification (RFID), and wireless sensor networks.
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Capacitance Manometer
VG-200S
Absolute pressure measurement is crucial for most of vacuum processes in various industries including Semiconductor, FPD, HDD, PV and Coating. A capacitance manometer determines the total pressure from the deformation of the diaphragm that occurs when a pressure difference is applied to both side of the diaphragm.
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High Resolution Inline AXI Platform
AXI XS Series
The XS-platform series is a small-footprint high-resolution automated X-ray inspection system concept designed for sophisticated high-speed inspection of semiconductor samples, wire bonds and PCB-assembly boards for single/multipanels or samples in trays. The inspectable applications range from component level inspection to mid-sized SMT boards.
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Laser Head
5517EL
The Keysight 5517EL is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Please contact Keysight for custom requirements.
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Test Software
American Probe & Technologies, Inc.
This new series of software allows you to analyze materials or semiconductor leakage with all of the capabilities of your HP 4140B to resolutions of 1 fA @ 100VDC. Completely rewritten in Visual Basic for Windows XP operating system, it offers Virtual Front Panel Operation of 4140B for I-V & CV Analysis and allows operator to virtually control the 4140B for any instrument operation. I-V Plots with options of displaying current over time. CV Plots with high resolution plotting capability.
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Semiconductor Tester
5000E
Current Ranges:Standard: 2.0nA – 50AUp to 100A with Mainframe ExtensionVoltage Ranges:Standard (anode): 10mV – 1000V2000V with 2kV Anode OptionStandard (gate): 10mv – 20V80V with 80V Gate Option
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PCM Test
We make DC test systems used by semiconductor manufacturers to make measurements on electrical test structures and simple devices. Because of the broad application of test structures, our test systems help assure quality and reliability in process development, wafer acceptance testing, reliability evaluation, and dc final test.
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Automated Test Equipment
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Automatic Concentration Monitoring
ACS is an on-line chemical concentration monitoring system that can provide for keeping an uniform chemical condition by an real time measurement of chemical concentration monitoring in the manufacturing process of display and semiconductor as well as in the control industry of high-quality chemical solution control industry. The close examination and measurement of manufacturing process is an essential to produce an integrated, high quality semiconductor and FPD. The uniform and safety of input chemical on the process of cleaning and etching are directly influence on the product quality.
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PXIe-6570, 100 MVector/s, PXI Digital Pattern Instrument
785283-01
100 MVector/s, PXI Digital Pattern Instrument—The PXIe‑6570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe‑6570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.
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Transmission Line Pulse Testing
Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
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Field-installation Type Simplified Fluoride Ion Concentration Meter(Four-Wire Transmission)
HC-200F
HC-200F is connected to a fluoride ion electrode (1009) to detect free fluoride ions in the sample water.(Total fluorine is not detected.) It is suitable for fluoride ion monitoring in effluent from factories, e.g., those of semiconductor FPD and glass manufacturers.
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USB 3.0 Stereo Vision Camera
Tara
Tara is a UVC- compliant 3D Stereo camera based on MT9V024 stereo sensor from ON Semiconductor which supports WVGA((2*752)x480) at 60fps over USB 3.0 in uncompressed format. This Stereo camera provides two synchronized sensor frame data interleaved side by side to the host machine over USB 3.0 interface.
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Patented DPEM Process for Die Removal
DPEM (Decapsulate Plastic Encapsulated Module) is DPACI’s patented Turn-Key Solution to replacement of obsolete high reliability devices in legacy systems. From dissolving the plastic encapsulation of a semiconductor device to re-bonding new wires onto a chip or package lead frame, complete solutions are offered. DPACI retains reliability test data as well as customer testimonials for the process and can share this information on a need-to-know basis.
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32-Axis PCIe EtherCAT MainDevice Motion Controller
PCIe-8334
ADLINK PCIe-8334 is a hardware-based EtherCAT motion controller able to support up to 32 synchronized axes and over 10,000 points simultaneously. The PCIe-8332 features dedicated isolated emergency stop input (EMG), and configurable isolated high-speed digital input as not only generic sensor input but also pulsar input, with up to 1MHz input frequency. Optimum jitter control is provided in minimal cycles of 250µs to optimize synchronous I/O performance for vertical automation applications in se...show more -
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Test Service Offerings
ASE Industrial Holding Co., Ltd.
ASE provides a complete range of semiconductor testing services to our customers, including front-end engineering testing, wafer probing, final testing of logic, mixed signal, and memory semiconductors, and other test-related services. Our testing services employ technology and expertise that are among the most advanced in the semiconductor industry.
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Semiconductor Test Equipment
Wewon Environmental Chambers Co, Ltd.
Probe card manufacturing need the semiconductor test equipment. When we designed the thermal testing equipment, Only some commonly used test items are packaged into the IC tester, and the logic function of the verification chip is implemented in a fixed test mode. But as chip products diversify, Some thermal inducing system can no longer do it alonehttps://www.wewontech.com/semiconductor-test-equipment/
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Atomic Force Microscope
AFM
Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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LXI High Voltage Matrix 2-Pole 100x2
60-310-102
The 60-310 is a 2-pole Matrix Module available in 300x2, 200x2 and 100x2 formats. It is capable of cold switching 1000VDC and has a maximum carry current of 1A. It is designed for high voltage applications including circuit board isolation testing, relay testing, semiconductor breakdown monitoring and cable harness insulation testing. The 60-310 is designed in accordance with the LXI Standard 1.4 and is supplied in a 2U high, full rack width case with 500mm depth.
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OSI Optoelectronics Photodiodes
Semiconductor devices used for the detection of light from the ultra-violet to the near-IR regions (200nm – 1100nm).
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Semiconductor
With ultra-multi pin count and fine pitch, our general-purpose IC socket lineup corresponds to every need. For semiconductor burn-in sockets for thermal acceleration tests, and test sockets for semiconductor electrical testing, we continue to hold a high market share all over the world.
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High-resolution, SWIR InGaAs camera
Wildcat+ 640 Series
The Wildcat+ 640 series is based upon a state-of-the-art InGaAs detector with 640×512 pixels and 20 μm pixel pitch. The camera offers superior, high resolution SWIR imaging capabilities, comes in a versatile and industry-proven Wildcat camera package (GenICam compliant) and offers advanced on-board image processing.The Wildcat+ 640 camera outputs full frame images up to 300 Hz via either a CameraLink or USB3 Vision interface.The Wildcat+ 640 is suitable for semiconductor inspection, display insp...show more -
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Fully Integrated Modular Ozone Delivery System
SEMOZON® AX8580
The SEMOZON® AX8580 Ozone Delivery System generates and delivers high flow, high concentration, ultra-clean ozone for advanced thin film applications. The SEMOZON AX8580 is specifically designed for use with an increasing number of semiconductor process applications such as ALD, CVD and TEOS/Ozone CVD.
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ULTRA Test Cells
The ULTRA Series of high performance MEMS handling, stimulus and test cells provides unparalled flexibility and capability for engineering development, characterization or high volume production test of inertial MEMS (accelerometer, gyroscope) semiconductor devices.
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Semiconductor Memory Tester
T5851
Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well a...show more -
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Turret Test And Scan Handlers
Turret platforms for semiconductor test, inspection and packaging.
