Showing results: 61 - 74 of 74 items found.
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Elcometer Limited
Visual appearance can determine a person’s perception of a product. Colour and Gloss are two key parameters that are used to define a product’s overall quality. Perception is subjective, but Elcometer’s range of gloss meters, DOI meters and colour assessment equipment can quantify appearance measurement. The ability of a surface to reflect light without scattering is known as gloss. Using a gloss meter, gloss is measured by directing a constant intensity light beam at a fixed angle to the test surface and then by monitoring the amount of reflected light at the same angle. Different surfaces require different reflective angles.
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FVMPE-RS -
Olympus Corp.
The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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HFA5000 -
Hangzhou Huatai Optic Tech. Co., Ltd.
1. Erbium-doped Fiber Amplifier, due to multiple cascades and the accumulation of noise caused by spontaneous emission, will reduce the system CNR greatly and thus it will limit the transmission capacity and distance of the system. Raman Fiber Amplifier (RFA) is a newly designed fiber amplifier based on Stimulated Raman Scattering (SRS) effect. It is considered as the core technology of new generation DWDM fiber over-long communication. Compared with Erbium-Doped Fiber Amplifier, Raman amplifier has the advantage of low Noise Figure (NF), wider gain bandwidth, flexible gain spectral region and stable temperature. It is the only device that can operate in 1300~1600nm.
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Efield AB
Efield® offers a complete and unique integrated modelling and simulation environment for 3D analysis of a wide range of electromagnetic applications such as: Antenna design All kind of antennas including horn, reflector, wire and microstrip antennas as well as broadband antennas and antenna arrays. Antenna integration Radiation pattern of installed antennas on large platforms such as aircraft or ships. Coupling between installed antennas. Microwave design Typical applications includes design of filters, connectors and couplers. EMI/EMC interaction Analysis of a wide range of EMC/EMI problems including shielding and coupling. Scattering & radar cross-section RCS analysis of structures such as aircraft, ships, air-intakes, exhausts, and antennas.
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RFA5000 -
Hangzhou Huatai Optic Tech. Co., Ltd.
1. Erbium-doped Fiber Amplifier, due to the multiple cascades and the accumulation of noise caused by spontaneous emission, will reduce the system CNR greatly and thus it will limit the transmission capacity and distance of the system. Raman Fiber Amplifier (RFA) is a newly designed fiber amplifier based on Stimulated Raman Scattering (SRS) effect. It is considered as the core technology of new generation DWDM fiber over-long communication. Compared with Erbium-Doped Fiber Amplifier, Raman amplifier has the advantage of low Noise Figure (NF), wider gain bandwidth, flexible gain spectral region and stable temperature. It is the only device that can operate in 1300~1600 nm.
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RFA6000 -
Hangzhou Huatai Optic Tech. Co., Ltd.
1. Erbium-doped Fiber Amplifier, due to the multiple cascades and the accumulation of noise caused by spontaneous emission, will reduce the system CNR greatly and thus it will limit the transmission capacity and distance of the system. Raman Fiber Amplifier (RFA) is a newly designed fiber amplifier based on Stimulated Raman Scattering (SRS) effect. It is considered as the core technology of new generation DWDM fiber over-long communication. Compared with Erbium-Doped Fiber Amplifier, Raman amplifier has the advantage of low Noise Figure (NF), wider gain bandwidth, flexible gain spectral region and stable temperature. It is the only device that can operate in 1300~1600 nm.
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RFA7000 -
Hangzhou Huatai Optic Tech. Co., Ltd.
1. Erbium-doped Fiber Amplifier, due to the multiple cascades and the accumulation of noise caused by spontaneous emission, will reduce the system CNR greatly and thus it will limit the transmission capacity and distance of the system. Raman Fiber Amplifier (RFA) is a newly designed fiber amplifier based on Stimulated Raman Scattering (SRS) effect. It is considered as the core technology of new generation DWDM fiber over-long communication. Compared with Erbium-Doped Fiber Amplifier, Raman amplifier has the advantage of low Noise Figure (NF), wider gain bandwidth, flexible gain spectral region and stable temperature. It is the only device that can operate in 1300~1600 nm.
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RFA4000 -
Hangzhou Huatai Optic Tech. Co., Ltd.
1. Erbium-doped Fiber Amplifier, due to the multiple cascades and the accumulation of noise caused by spontaneous emission, will reduce the system CNR greatly and thus it will limit the transmission capacity and distance of the system. Raman Amplifier is a newly designed fiber amplifier based on Stimulated Raman Scattering (SRS) effect. Raman amplifier is considered as the core technology of new generation DWDM fiber over-long communication. Compared with Erbium-Doped Fiber Amplifier, Raman amplifier has the advantage of low Noise Figure (NF), wider gain bandwidth, flexible gain spectral region and stable temperature. It is the only device that can operate in 1300~1600 nm.
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LISST-Deep -
Sequoia Scientific, Inc.
The LISST-DEEP instrument obtains in-situmeasurements of particle size distribution,optical transmission, and the opticalvolume scattering function (VSF). Using ared 670nm diode laser and a customsilicon detector, small-angle scatteringfrom suspended particles is sensed at 32specific log-spaced angle ranges. Thismeasurement is post-processed to obtainsediment size distribution, volumeconcentration, optical transmission, andVSF. The electronics and opticalconfiguration in the LISST-DEEP are verysimilar to Sequoia’s workhorse, the LISST-100X. However, because of the extremedifficulty associated with keepingalignment under high pressure, the LISSTDEEPhardware design is radically differentfrom the LISST-100X. This allows theLISST-DEEP to be deployed down to 3000m and obtain reliable measurements ofthe in situ particle size distribution andvolume concentration in waters withoptical transmission up to 98.5%.
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SNA5000A -
SIGLENT Technologies
The SIGLENT SNA5000A series of Vector Network Analyzers have a frequency range of 9 kHz to 8.5 GHz, with 2 and 4 port models available. Designed to give you instant insight into scattering, differential, and time-domain measurements. They are effective instrumentation for determining the Q-factor, bandwidth, and insertion loss filters and feature impedance conversion, movement of measurement plane, limit testing, ripple test, fixture simulation, and adapter removal/insertion adjustments. There are five sweep types: Linear-Frequency, Log-Frequency, Power-Sweep, CW-Time, and Segment-Sweep mode. The SNA5000A series VNAs also support scattering-parameter correction of SOLT, SOLR, TRL, Response, and Enhanced Response for increased flexibility in R&D and manufacturing applications.
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TE Connectivity Ltd.
Our broad portfolio of antennas includes products designed for cellular, broadcast, navigation, RFID, IoT, DAS, mmWave, and more. Our antennas are available in standard and custom designs and engineered for use in cars, heavy-transport vehicles including rail, and a wide variety of personal electronics, including mobile device and wearable technology. Our antennas offer high-quality transmission for a wide variety of frequencies including, but not limited to Bluetooth, WLAN, and ZigBee. We manufacture our antennas in facilities worldwide, which include testing capabilities in near and far field patterns, scattering parameters, SAR, vibration, humidity, temperature shock, salt fog, throughput, and acoustic. We also manufacture antenna assemblies.
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ViewSizer 3000 -
HORIBA, Ltd.
Exosomes? Virus? Nanoparticle? Use multiple lasers for complete, detailed analysis of all the particles in your sample.Exosomes, viruses, and nanoparticles all have wide size distributions which defeat traditional Nanoparticle Tracking Analysis (NTA) analyzers. The ViewSizer 3000 features simultaneous measurement with three lasers to collect the most accurate distribution and concentration information over a wide range of sizes within the same sample. Where the signal from a particle is too bright and saturates the detector from one laser, the software automatically uses data from a lower power laser to ensure the most accurate size and concentration information. On the other hand, when scattering from one laser is too weak for detection, the software uses data from a higher power laser to accurately track the particle.
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Shimadzu Corp.
After tensile testing, flexural tests are the most common strength tests for plastics and other resins. The main standards for plastic flexural (bend) tests are ISO 178, JIS K 7171, and ASTM D790, which require very accurate test systems. These standards include flexural strain measurements using a deflectometer, ranging from micro-strain measurements in the elastic region, the reversible elongation at the beginning of tests, to larger strain measurements in the plastic region. Shimadzu's deflectometers integrate easily into AG-X plus series, AGS-X series, and EZ-X test frames and Trapezium X testing software. Since these deflectometers push up against the specimen from below, the specimen color is not a limiting factor, as can be for laser type non-contact deflectometers. Furthermore, these deflectometers can partially absorb the shock during specimen failure, preventing specimen fragments from scattering.
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CVS Trevista X4 -
STEMMER IMAGING Ltd.
The fourth generation of CVS Trevista Surface, Cylinder and Multiline surface inspection systems from Stemmer Imaging features brighter illumination to enable faster image acquisition and have a larger measuring field. The new Trevista X4 models utilize a 2.5-D process, called "Shape from Shading," and are especially suited to the examination of components with shiny and diffusely scattering surfaces. Surface defects such as scratches, burrs, dents, discoloration or grinding marks, even if only a few micrometers deep, can be detected with significantly greater certainty with this process than with conventional image processing systems, according to the manufacturer. The X4 generation offers structured, diffuse dome illumination that is brighter by a factor of 2.5 compared with the previous models, enabling faster image acquisition. For a typical image size of four megapixels, evaluation using the Trevista algorithm takes place around 20% faster than before, which results in potentially lower cycle times.
