Showing results: 271 - 285 of 307 items found.
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AI-CCS-UPC/EAN-E Rev S -
Applied Image, Inc.
For those who prefer a traditional vertical format calibration test card, APPLIED IMAGE offers our new Conformance Calibration Standard Enhanced for UPC/EAN Bar Code Symbol Verifiers. The new standard complies with both the ANSI X3.182 and ISO 15416 standards and is ideal for testing of verifiers, scanners, and other UPC bar reading equipment as well as a tool for training new operators to assure proper “methodology' in the use of verifiers.
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Master3DGage® -
Verisurf Software, Inc.
Master3DGage® is a complete CMM hardware and software solution for inspection and reverse engineering. The multi-axis portable CMM features absolute encoders for quick start-up and highly accurate and precise measurements. Its lightweight, wireless design and battery-powered capability enable the Master3DGage® to be placed right into your CNC machine for in-process inspection.Optional 3D scanner and hot-swappable probes make it easy to switch from scanning complex profiles to probing primitive features in seconds.
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Applied Image, Inc.
APPLIED IMAGE is a world leader in the field of IMAGE EVALUATION Test Targets and Test Charts. Some of the specialized test charts include camera image evaluation ISO, NIST, ANSI, and MIL standard image evaluation applications; photonic and optophotonic applications; test charts for copiers and scanner; DATAcapture and BARcode Scanning testing; Security & Identification Image Capture; and all other type of imaging industries that require quality evaluation of thier image capture systems.
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12-2415 -
Associated Equipment Corp.
*Shown with optional 12-2416 barcode scanner*Graphical Hand-Held Tester with Thermal Printer and USB Port*Tests 12V Flooded, AGM, Gel Cell, & EFB Batteries from 100 to 2000CCA*Graphical/Symbol Based LCD display*Tests 12/24V charging and electrical systems*Stores last 70 test series with or without power*Carrying case, printing software and USB cables included*Built-in thermal printer with thermal paper (611305)*Field-Replaceable Cables (900165)
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VERTEX 80/80v -
Bruker Optics
The VERTEX 80 and the VERTEX 80v vacuum FT-IR spectrometers are based on the actively aligned UltraScan™ interferometer, which provides PEAK spectral resolution. The precise linear air bearing scanner and PEAK quality optics guarantees the ultimate sensitivity and stability. The VERTEX 80v is an evacuated optics bench that can eliminate atmospheric moisture absorptions for ultimate sensitivity and stability; enabling demanding experiments such as high resolution, ultra fast rapidscan, step-scan, or UV spectral range measurements.
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Phoenix Aerial Systems
The RANGER-ULTRA is an airborne laser scanner with an impressive combination of weight, range, accuracy and pulse rate. It is equipped with a unique forward and rear looking FOV designed to minimize laser shadowing and provide geometry on complex vertical structures on a single pass. With its wide field of view of 100 degrees and an extremely fast pulse repetition rate of up to 1.8 MHz, the RANGER-ULTRA is perfectly suited for high point density corridor mapping applications such as power line, railway track and pipeline inspection.
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NX Pro -
Dynalab Test Systems, Inc.
The Dynalab NX Pro Wire Harness Tester is a low-cost, feature-packed, stand-alone continuity tester with a maximum capability of 512 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to "decide" which operation to perform next. The NX Pro Tester has 1.3Mb memory capacity for program storage and is compatible with Printers, Scanners, and all other Dynalab NX System accessories.
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NI
PXI DeviceNet Interface Modules have an onboard microprocessor and optically isolated physical layer to communicate with a DeviceNet network system as a master (scanner) or slave device. The modules ship with a high-level API that provides complete access to a DeviceNet network and features easy access to device data and streamlined explicit messaging. PXI DeviceNet Interface Modules are ideal for prototyping DeviceNet systems, PC-based control, embedded control systems, PC-based human machine interface (HMI), and DeviceNet network management utilities.
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HypotULTRA® Series -
Associated Research
In a world where data is king, HypotUTLRA improves traceability with on-board data storage and allows you to automate hipot testing with a variety of communication interfaces. Increase efficiency with our direct barcode scanner connection and intuitive touch screen interface. Models 7804 and 7854 are a 4-in-1 solution with the addition of 40A AC Ground Bond test capability added to HypotULTRA's already impressive feature list. HypotULTRA is a dielectric analyzer designed to take your production line to the next level.
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Anritsu Corporation
Spectrum Analyzer: 9 kHz 4 GHzInterference Analyzer with Interference MappingHigh Accuracy Power Meter, 2-port Transmission MeasurementsCoverage Mapping, Channel Scanner, GPS, AM/FM/PM Analyzer3GPP, 3GPP2, WiMAX, signal analyzersTracking Generator: 500 kHz 4 GHzDigital TV ISDB-T, DVB-T/H analyzersCPRI RF MeasurementsField-proven design: Three-hour battery life, rugged, compact, lightweight, daylight viewable displayIntuitive menu-driven touchscreen user interfacePIM Alert (a downloadable easyTest script)Standard three-year warranty (battery one-year warranty)
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SD-330AC-1402 -
Silex Technology
The Silex SD-330AC-1402 features a FIPS 140-2 wireless/wired LAN Serial Device Server and an Ethernet to Wi-Fi Bridge. Devices equipped with the RS-232C serial interfaces can join a Ethernet LAN or wireless LAN. Devices with an Ethernet port are also transformed to a wireless network devices. Medical devices, printers, scanners or virtually any other device with a serial port or an Ethernet port can now be enabled with secure and robust LAN network capability. The SD-330AC-1402 can be simply added to US government facilities to enhance device networking connectivity.
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ams AG
Linear array sensors consist of a linear array of integrating photosensing pixels which measure incident light over a user-defined exposure time and generate a voltage or digital output which represents the light exposure at each pixel. The sensors are available in a variety of lengths and pixel resolutions. The analog output may be directly interfaced to an ADC for digital processing or for comparing black/white thresholds. Applications include contact image sensing, optical character recognition, edge detection, and object measurement in products such as copiers, document scanners and spectroscopy.
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HV200/5 -
Anfatec Instruments AG
The HV200/5 is a high-precision HV-amplifier designed for the control of tube scanners. It takes three input voltages In X, In Y and In Z (-10 V to + 10 V), amplifies them separately (input gain switches: x1, x2, x5, x10, x20) and adds an offset voltage between -10 V and +10 V. In a 2nd stage, the signal is amplified by a factor of 20. This enables its use as HV amplifier in scanning image acquisition applications, such as STM or AFM, with the capability to shift the scan range in high resolution imaging.
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REA ScanCheck 3 -
REA Elektronik GmbH
The REA ScanCheck 3 is an universal, battery-operated, high-performance barcode verification device which operates in accordance with current standards. The verifications document compliance with quality goals in production and monitoring of barcodes on data storage devices and products of all kinds. The measurement principle is based on a laser scanner optimized for verifications. This makes contact-free measurement, largely independent of handling influences, possible. For mobile use on site, the device operates self-sufficiently, independent of the power network with standard, rechargeable batteries. The operating system and application software support multiple languages.
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KLA-Tencor Corp
KLA’s data analytics systems centralize and analyze the data produced by inspection, metrology and process systems. Using advanced data analysis, modeling and visualization capabilities, our comprehensive suite of data analytics products support applications such as run-time process control, defect excursion identification, wafer and reticle dispositioning, scanner and process corrections, and defect classification. By providing chip and wafer manufacturers with relevant root cause information, our data management and analysis systems accelerate yield learning rates and reduce production risk.
