Showing results: 1591 - 1605 of 1682 items found.
-
EDM Modal -
Crystal instruments
Engineering Data Management (EDM) is a PC-based software program designed for real-time data management and processing. This easy-to-use, Windows-native software manages the communication between the PC and all Crystal Instruments hardware platforms. EDM Modal is a complete Modal Testing and Modal Analysis suite for Experimental Modal Analysis (EMA). EDM Modal was developed based upon the sophisticated technologies of modern modal analysis theory and technique. With its intuitive controls and powerful features, EDM Modal is the ultimate tool for modal analysis applications. An intuitive interface allows users to manage highly complicated tests that can involve hundreds of measurement points and multiple excitations. This interface also allows for simple tests to be conducted quickly and with little effort. Regardless of how complicated the modal test is, EDM Modal provides the exact and precise tools required to achieve your goal.
-
Guangzhou Amittari Instruments Co.Ltd
The Basic Type Coating Thickness Gauge AC-110 Series have two types: Type C ( Integral Type ), Type CS ( Separate Type ); Suitable for automotive, paint layer coating thickness measurement; Integral Type suitable for single-hand operation, large probe with large contact surface have better stability, users can get continuous, good repetitive and precise measurements. Separate Type can provide several type probe, measure can be more flexibility. It is a kind of portable measuring instrument, it can quickly, no damage and precise coating, coating thickness measurement. Not only can be usedin the laboratory, also can be used in the engineering field. Through the use of different measuring head, but also can meet the needs of a variety of measurement. Widely used in manufacturing, metal processing industry, chemical industry, commodityinspection and testing field. Is the material protection professional.
-
TP121-TH -
Gigahertz-Optik GmbH
The photometric specifications of LEDs must meet very high tolerance requirements regardless of whether they are to be used in general, automotive or other specialist lighting applications. This is often a problem since the manufacturing tolerances of LEDs can be higher than those permitted in the end-use applications. Also, LED binning by LED manufacturers in order to classify LEDs based on their tolerances is performed with flash mode testing using pulsed current flow. However, end-use applications of the LEDs often operate in constant current mode and with significant thermal effects. The sophisticated LED processing industry therefore requires measurement devices that can be used for both manufacturer-compliant pulsed mode, as well as constant current operation mode. When the LEDs are run in constant current mode, the junction temperature has significant influence on the performance and lifetime of the LED. Therefore, test systems should be able to test the LEDs at specific junction temperatures.
-
RC-088 -
Rinch Industrial Co.,Limited
This instrument is a special equipment for measuring the reflectivity of rearview mirror (or similar product) of motor vehicle. The product composes intelligent measuring instruments, optical integrating sphere, parallel lamp, standard light source, constant current source etc. It is easy to operate，it can measure the reflectivity quickly and accurately. On instrument structure, it adopts standardized modulation design. It takes latest single chip as its digital central processing element. After the measuring signal is converted by modulus, CPU will do some computation and compensation. The instrument can display the reflectivity of device which is measured in rear time. It operates simply and quickly, the indication is direct and accurate. It’s good for quality examination &control in the production scene as well as laboratories. This product has the convenience &quick demarcation way, can meet requirement of different occasion. It is applicable for measuring light reflection on mirror and not mirror parts.
-
IST Engineering, INC.
With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.
-
MECS-7211 -
ADLINK Technology Inc.
The MECS-7211 Edge Server focuses on the edge of 5G networks to provide an open, white box platform for 5G Open RAN, private 5G networks, and a wide range of 5G MEC applications including smart cities, retail, manufacturing, autonomous vehicles, Argument Reality(AR), virtual reality(VR) and healthcare. The MECS-7211 is designed to meet stringent requirements by delivering a high level of deployment flexibility, reliability, scalability, and carrier-grade processing performance further augmented by hardware expansion. With a 450mm system depth in a small footprint 2U chassis, all I/O front access, wide operating temperature support (-5°C to +55°C), and PCIe expansion slots reserved for access to acceleration hardware such as GPU, FGPA and QAT adapters, ADLINK’s MECS-7211 is a high performance COTS platform that meets varying application and deployment requirements, and enables customers to focus on differentiating their end solutions.
-
SampleProtect -
Oxford Instruments plc
The SampleProtect measurement system is ready to go, and comes complete with Oxford Instruments’ Cryofree bottom loading cryostat – the OptistatDry BLV, Zurich Instruments’ MFLI Lock-in Amplifier, a specially designed ESD break-out box and high quality measurement grade cables. The patent-pending puck style mounting from Oxford Instruments provides safe installation of your samples. The MFLI 500 kHz Lock-in Amplifier (capable of 500 kHz demodulation as standard) with MF-MD multi-demodulator capability brings the benefits of high performance signal processing at low and medium frequencies. The differential voltage and current inputs of the MFLI are optimised for low noise operation and the high oversampling rate ensures an even better signal to noise ratio. Zurich Instruments’ unique LabOne® control software provides a toolset including an integrated oscilloscope, a spectrum analyser, a plotter and a parameter sweeper.
-
id150 SERIES -
ID Quantique SA
Intended for large-volume OEM applications, the id150-1x8 is the only multichannel solid-state single photon detector on the market. It consists of a CMOS silicon chip packaged in a standard TO8-16pin header with a transparent window cap. The chip combines 8 in-line single photon avalanche diodes that can be accessed simultaneously for parallel processing. square in center-to-center A fast active quenching circuit is integrated within each pixel in order to operate each diode in photon counting regime. The chip is mounted on a printed circuit board on top of a single-stage thermoelectric cooler (TEC). A thermistor can be used to measure the temperature of the chip. Only two low power supplies of +5V and -25V are needed for operation in photon counting mode. The fast active quenching circuit leads to a dead time of less than 50ns per channel. An outstanding timing resolution of less than 60ps allows high accuracy measurements.
-
FX-942 -
YesTech, Inc.
Nordson YESTECH’s advanced multiple camera imagingtechnology offers high-speed PCB inspection with exceptionaldefect coverage. With dual sided top down viewing camera, fourside viewing cameras and 3D inspection, the FX-942 inspectssolder joints and verifies correct part assembly in pre wave orpost wave applications enabling users to improve quality andenhance yield. Advanced Fusion Lighting and newly available image processing technology integrate several techniques, including 3D inspection, color inspection, normalized correlation and rule-based algorithms, to provide complete inspection coverage with an unmatched low false failure rate. Configurable for all line positions, the FX-942 is equally effective for paste, pre/post-wave and final assembly inspection. Off-line programming maximizes machine utilization and real-time SPC monitoring provides a valuable yield enhancement solution.
-
VP62003 -
LinkedHope Intelligent Technologies Co.,Ltd.
VP62003 is a 6U VPX board based on Intel® Xeon® D-15xx processors, with more than 7-year lifecycle. Supporting up to Intel® Xeon® D-1577 (16x 1.3GHz) processor, VP62003 is able to perform vector operation and floating point arithmetic that require high throughput. Besides, VP62003 supports Intel® Turbo Boost, with the processing speed of CPU up to 2.7GHz. The high-performance CPU and the Turbo Boost technology leave no worries for extra cost and complexity of system settings.VP62003 provides 4x Rapid I/O (SRIO) x4 for VPX Data Plane communication, 2x 8 PCIe for VPX Expansion Plane communication, 4x GbE for VPX Control Plane communication, and 2x 10Gb SFP+ in front I/O for remote data transmission and communication. Rich data exchange interfaces on VP62003 make it easy to build box-level or system-level solutions.
-
Dione 640 CAM Series -
Xenics
The Dione 640 CAM series is based on the Dione 640 OEM thermal imaging core with 640 x 480 pixels and 12 μm pixel pitch. The NETD is less than 40 mK (available upon request) or 50 mK. The maximum frame rate is 60 Hz.The camera cores are optimized for low SWaP (Size, Weight and Power). The Dione 640 CAM is both lightweight and small. It utilizes Xenics image enhancement for advanced image processing while keeping power consumption low.All Dione 640 CAM versions have the same SAMTEC ST5 connector and are GenICam compliant. Dione 640 CAM is a LWIR uncooled thermal imaging SWAP module with housing supporting M24/M34 lens (optional). The ultra-compact Dione 640 CAM series find application in safety and security systems, as well as in industrial thermal imaging systems.
-
783485-01 -
NI
Kintex 7 160T FPGA, 128 DIO, 512 MB DRAM, PXI Digital Reconfigurable I/O Module—The PXIe‑7821 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PXIe‑7821 supports peer‑to‑peer streaming for direct data transfer between PXI Express modules. The PXIe‑7821 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in-‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.
-
783484-01 -
NI
Kintex 7 160T FPGA, 128 DIO, PXI Digital Reconfigurable I/O Module—The PXIe‑7820 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PXIe‑7820 supports peer‑to‑peer streaming for direct data transfer between PXI Express modules. The PXIe‑7820 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.
-
785624-01 -
NI
1.30 GHz Dual-Core CPU, 2 GB DRAM, 4 GB Storage, -20 °C to 55 °C, Kintex-7 70T FPGA, 4-Slot CompactRIO Controller - The cRIO-9040 is a rugged, high-performance, customizable embedded controller that offers Intel Atom dual-core processing, NI-DAQmx support, and an SD card slot for … data-logging, embedded monitoring, and control. It includes a Kintex-7 70T FPGA with LabVIEW FPGA Module support for advanced control and coprocessing. The controller provides precise, synchronized timing and deterministic communications using Time Sensitive Networking (TSN), which is ideal for highly distributed measurements. This controller offers several connectivity ports, including Gigabit Ethernet, USB 3.1, USB 2.0, RS232, and RS485 ports. You can use the USB 3.1 ports to add a local human machine interface and program, deploy, and debug software, which simplifies application development.
-
S95090B -
Keysight Technologies
The S95090B spectrum analyzer (SA) measurement software adds high-performance microwave spectrum analysis to PXI VNAs. With fast stepped-FFT sweeps resulting from optimized data processing, the SA software application provides quick spurious searches over broad frequency ranges. The S95090B software uses the PXI network analyzer's test and reference receivers to complete simultaneous spectrum measurements. Multi-channel SA measurements leverage the PXI VNA's internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The S95090B spectrum analyzer software application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy. Optional external attenuators should be connected with the VNA’s test ports to avoid receiver compression when measuring large signals.
