MPI SiPH Probe Systems

MPI Advanced Semiconductor Test (MPI AST)

MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:

*Various options of high-precision fiber alignment systems for ultra-fast scanning routines
*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration
*Integrated Z-sensing for detecting the fiber to wafer contact point
*Crash protection when using two optical fiber arms
*Wide temperature range from -50°C to 200°C
*Optional dark box for testing in light tight environment
*Extensive software package for supporting easy integration to operator’s test executive
*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE