Showing product results. 151 - 165 of 357 products found.
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CF2000 - Postnova Analytics GmbH
The new advanced Postnova CF2000 Series was developed to become the first professional modular Centrifugal FFF system available. It is completely controled by the NovaFFF single software platform which runs the entire system from autosampler to detectors. The CF2000 Centrifugal FFF incorporates the combined proven know-how and the technologies from three decades of leadership in FFF. Due to its unique design, the CF2000 Centrifugal FFF system offers more flexibility, higher robustness and better performance than traditional particle sizer systems. The CF2000 allows high resolution particle separation and sizing at the same time and consequently sets a complete new standard and offers a real alternative to traditional particle characterization techniques.
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OBS-ONE SPN10 Unit - HORIBA, Ltd.
The OBS-ONE SPN10 unit is an on-board emissions measurement system for analyzing the SPN10 (solid particle number emissions >10 nm) under real-world driving conditions. It meets the latest trends in particle number regulations in the future.The SPN10 unit combines with the GAS unit and the NH3/N2O unit to measure the specified exhaust gas components, along with the exhaust gas flow rate, the GPS position, and the atmospheric conditions (temperature, humidity, pressure).
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Bertin Instruments
Coriolis Air samplers are dedicated to the collect of biological particles in the air which bring new perspectives for the control of airborne contamination thanks to its liquid sample.
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nanoPartica SZ-100V2 Series - HORIBA, Ltd.
A highly advanced analyzer solves the mysteries of the nano-world. A single device analyzes the three parameters that characterize nanoparticles: particle size, zeta potential, and molecular weight.
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KANOMAX USA, Inc.
A Laser Doppler Velocimeter (LDV) measures fluid velocity by utilizing coherence of laser light. It detects the Doppler shift frequency of the scattering light of particles in the fluid and calculates the velocity of the particles (fluid). With a LDV system, non-intrusive measurements without disturbing the measuring object, liquid or gas flow, are achieved. No calibration is necessary and reverse flow measurements at a high resolution is also possible. The LDV system provides the absolute value of the flow velocity with accuracy.
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Atomtex
Small-sized devices for measuring the ambient dose equivalent rate and the ambient dose equivalent of X-ray and gamma radiation, as well as measuring the flux density of beta particles (AT6130).
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Parker Kittiwake - Parker Hannifin Corp
Parker Ferrous Wear Meter (FWM) detects abrasive ware metal iron particles in an oil samples taken from lubricated engine, liner and cylinder machinery.
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Atomtex
Small-sized devices for measuring the ambient dose equivalent rate and the ambient dose equivalent of X-ray and gamma radiation, as well as measuring the flux density of beta particles (AT6130).
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Group3 Technology
The Group3 distributed control system is used in many universities and research institutes around the world and in the latest prototypes from a number of manufacturers of medical and industrial particle accelerators.
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EV Group
An accurate wafer bonding process is the key factor in obtaining high quality single crystalline silicon films on insulating substrates. The EVG850 SOI/Direct Wafer Bonding systems are designed to fulfill a wide range of fusion/molecular wafer bonding applications, with main focus on SOI substrates manufacturing. Ultra clean handling of wafers throughout the bonding process assures high-yield and void-free bonds. All essential steps, from cleaning and alignment to pre-bonding and IR-inspection are combined in one high volume production system. EVG850 is the only production bonding system built to operate in high throughput, high-yield environments and guarantees void-free SOI wafers up to 300 mm.The EVG300 series single wafer cleaning systems are designed for efficient removal of particles. In semiconductor processing, efficient cleaning and particles removal prior to critical process steps enables maximum yield. Wafer Bonding is a process which is strongly affected by particles: each particle on the wafer surface produces a void orders of magnitude larger than its diameter, contributing to a dramatic yield loss.
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ALPHASPEC - 1K - CSpark Research
The AlphaSpec-1K is a compact and robust solution for studying the nature of Alpha particles by measuring energy spectra. Energies up to 10MeV are sorted into 1024 bins by the built-in multi channel analyzer.
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NANOPIX mini - Rigaku Corp.
Non-destructive measurement of particle size and size distribution.Rigaku NANOPIX mini is the world’s first benchtop small angle X-ray scattering (SAXS) system that is engineered to deliver automatic nanoparticle size distribution analysis for both quality control (QC) and research and development (R&D) applications. Nanoparticle size, size distribution, and particle shape are the key pieces of information obtained from SAXS. Samples may range from solutions, suspensions or slurries to solid plastics, rubbers or polymers.
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Test Products International, Inc.
TPI's wide range of IAQ instruments provides the capability to measure air velocity, humidity, temperature, carbon monoxide (CO), carbon dioxide (CO2), percent outside air, and particles.
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2020 - Elcometer Limited
The Elcometer 2020 Fineness of Grind Gauges is used to determine the particle size and fineness of grind of many materials including paints, pigments, inks, coatings, chocolates and other similar products.
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21-27 - Testing Machines, Inc.
Bulk density apparatus is testing equipment used to measure the bulk density property of powder, granules and other “divided” solids, especially used in reference to mineral components (soil, gravel, sand), chemical substances, (pharmaceutical), plastics like polyethylene (hdpe or mdpe) pvc, polystyrene etc, or foodstuff and any other masses of granular or particulate matter. Bulk density is defined as the mass of many particles of the material divided by the total volume they occupy. The total volume includes particle volume, inter-particle void volume and internal pore volume.
