Showing product results. 136 - 150 of 338 products found.
-
AJ-1000 - Rtec Instruments
The state of the art Rtec Air jet erosion tester AJ-5000 allows to test repeated impact erosion test that delivers a stream gas with abrasive particles. The tester comes with close loop temperature control upto 900C. The tester is used to rank erosion of various materials, coatings etc. across a wide range of abrasive particle materials, shape, size at various temperature and impact speed.
-
PCE Instruments
A radiation detector is a device for measuring nuclear, electromagnetic or light radiation. A nuclear radiation detector identifies nuclear radiation by measuring the emission of ionizing radiation of alpha particles, beta particles and gamma rays. Also referred to as a geiger counter, a nuclear radiation detector consists of two main elements: the processing electronics and the geiger tube. The geiger tube is filled with low-pressure inert gas like helium, argon or neon. If radioactive radiation occurs, the inert gas is ionized. An anode within the geiger tube registers the quantity of ionized particles numerically correlating with the strength of the radioactive radiation. The radioactivity measurement is then displayed on the LCD screen of the geiger counter or nuclear radiation detector.
-
DEM Solutions Ltd.
Whether you want to deploy Discrete Element Method in your research or want to expand your curriculum with a DEM-related subject, EDEM software can add another dimension to your research and help expand horizons for your students. * Combine DEM simulation with experimental investigation to understand processes involving particles, * Develop new equipment and methods for bulk solids handling and processing, * Investigate fundamental characteristics of particle systems
-
3140 - TSI Inc.
Automated Filter Tester 3140 utilizes the same, proven, oil-aerosol generator technology found in Models 8127 and 8130. It produces oil aerosol without heat, so a variety of oils can be used. Two Condensation Particle Counters (CPCs) simultaneously count upstream and downstream particles. This enables quick, accurate, and repeatable measurements of filters with efficiencies as high as 99.999999% (eight 9’s), or penetrations down to 0.000001%.
-
Electrogrip Company
Lightweighted and low-expansion chucks with 10nm active-area flatness are required in EUV lithographic tools. These chucks also have low outgassing and low particle generation.
-
CF2000 - Postnova Analytics GmbH
The new advanced Postnova CF2000 Series was developed to become the first professional modular Centrifugal FFF system available. It is completely controled by the NovaFFF single software platform which runs the entire system from autosampler to detectors. The CF2000 Centrifugal FFF incorporates the combined proven know-how and the technologies from three decades of leadership in FFF. Due to its unique design, the CF2000 Centrifugal FFF system offers more flexibility, higher robustness and better performance than traditional particle sizer systems. The CF2000 allows high resolution particle separation and sizing at the same time and consequently sets a complete new standard and offers a real alternative to traditional particle characterization techniques.
-
OBS-ONE SPN10 Unit - HORIBA, Ltd.
The OBS-ONE SPN10 unit is an on-board emissions measurement system for analyzing the SPN10 (solid particle number emissions >10 nm) under real-world driving conditions. It meets the latest trends in particle number regulations in the future.The SPN10 unit combines with the GAS unit and the NH3/N2O unit to measure the specified exhaust gas components, along with the exhaust gas flow rate, the GPS position, and the atmospheric conditions (temperature, humidity, pressure).
-
Bertin Instruments
Coriolis Air samplers are dedicated to the collect of biological particles in the air which bring new perspectives for the control of airborne contamination thanks to its liquid sample.
-
nanoPartica SZ-100V2 Series - HORIBA, Ltd.
A highly advanced analyzer solves the mysteries of the nano-world. A single device analyzes the three parameters that characterize nanoparticles: particle size, zeta potential, and molecular weight.
-
KANOMAX USA, Inc.
A Laser Doppler Velocimeter (LDV) measures fluid velocity by utilizing coherence of laser light. It detects the Doppler shift frequency of the scattering light of particles in the fluid and calculates the velocity of the particles (fluid). With a LDV system, non-intrusive measurements without disturbing the measuring object, liquid or gas flow, are achieved. No calibration is necessary and reverse flow measurements at a high resolution is also possible. The LDV system provides the absolute value of the flow velocity with accuracy.
-
Atomtex
Small-sized devices for measuring the ambient dose equivalent rate and the ambient dose equivalent of X-ray and gamma radiation, as well as measuring the flux density of beta particles (AT6130).
-
Parker Kittiwake - Parker Hannifin Corp
Parker Ferrous Wear Meter (FWM) detects abrasive ware metal iron particles in an oil samples taken from lubricated engine, liner and cylinder machinery.
-
Atomtex
Small-sized devices for measuring the ambient dose equivalent rate and the ambient dose equivalent of X-ray and gamma radiation, as well as measuring the flux density of beta particles (AT6130).
-
Group3 Technology
The Group3 distributed control system is used in many universities and research institutes around the world and in the latest prototypes from a number of manufacturers of medical and industrial particle accelerators.
-
EV Group
An accurate wafer bonding process is the key factor in obtaining high quality single crystalline silicon films on insulating substrates. The EVG850 SOI/Direct Wafer Bonding systems are designed to fulfill a wide range of fusion/molecular wafer bonding applications, with main focus on SOI substrates manufacturing. Ultra clean handling of wafers throughout the bonding process assures high-yield and void-free bonds. All essential steps, from cleaning and alignment to pre-bonding and IR-inspection are combined in one high volume production system. EVG850 is the only production bonding system built to operate in high throughput, high-yield environments and guarantees void-free SOI wafers up to 300 mm.The EVG300 series single wafer cleaning systems are designed for efficient removal of particles. In semiconductor processing, efficient cleaning and particles removal prior to critical process steps enables maximum yield. Wafer Bonding is a process which is strongly affected by particles: each particle on the wafer surface produces a void orders of magnitude larger than its diameter, contributing to a dramatic yield loss.
