- Pickering Interfaces Inc.
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PXI/PXIe MEMS Optical MUX, 4-Channel, Multi-Mode, 50/125 Fiber, SC/PC Connectors
42-850A-214-M50
The 40/42-850A-214-M50 is a PXI/PXIe 4-channel multiplexer with SC/PC connectors and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules.
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Ultrafast Nearfield Optical Microscope
Femtosecond NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.
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Near-field Scanning Optical Microscope
NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Near-Field Scanning Optical Microscope Platform
MoScan-F
MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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Optical to Electrical Converters
High bandwidth, broadband optical to electrical converters available in a range of configurations. Choose from 1 or 2 channels, AC or DC coupling and various conversion gain and operating wavelength ranges.
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Automated Optical Switch - PXI
Add optical switching capability to your test system with Quantifi Photonics’ automated optical switches. The fast and reliable optical switch will enable automated sequential testing, saving time and streamlining your test procedures.
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Optical-Electrical Converter - MATRIQ
The O2E is a high bandwidth, broadband optical to electrical converter.Available in a range of configurations; choose from 1 or 2 channels, AC or DC coupling and various conversion gain and operating wavelength ranges.
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Optical-Electrical Converter - PXI
O2E 1000 – 1400 Series
The O2E is a high bandwidth, broadband optical to electrical converter.Available in a range of configurations; choose from 1 or 2 channels, AC or DC coupling and various conversion gain and operating wavelength ranges.
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Automated Optical Switch - MATRIQ
Add optical switching capability to your test system with Quantifi Photonics’ automated optical switches. The fast and reliable optical switch will enable automated sequential testing, saving time and streamlining your test procedures.
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Broadband Optical Source - MATRIQ
Our SLED MATRIQ instrument is a compact super-luminescent LED light source with high output power, large bandwidth and low spectral ripple.The SLED comes in various wavelength models to address various key applications across telecom and datacom, and is ideal for building a customized optical testing platform that delivers reliable and repeatable results.
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Scanning Electron Microscope
E5620
The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Scanning Near Field Optical Microscope
SNOM
SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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Laser Scanning Microscopes
The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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Scanning Electro-chemical Microscope
920D
The scanning electrochemical microscope (SECM) was introduced in 19891 as an instrument that could examine chemistry at high resolution near interfaces. By detecting reactions that occur at a small electrode (the tip) as it is scanned in close proximity to a surface, the SECM can be employed to obtain chemical reactivity images of surfaces and quantitative measurements of reaction rates.
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Broadband Optical Source - PXI
SLED 1000 Series
The SLED 1000 Series is a super-luminescent LED light source with high output power, large bandwidth and low spectral ripple. It comes in various wavelength models to address applications in the telecom and datacom markets.The SLED is a single-slot PXIe module and is ideal for building a customized optical testing platform that delivers reliable and repeatable results in manufacturing or R&D environments.
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Laser Scanning Microscopes
A confocal laser scanning microscope scans a sample sequentially point by point, or multiple points at once. The pixel information is assembled into an image. As a result you acquire optical sections with high contrast and high resolution in x, y and z .
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Ultraschallmikroskop And Scanning Acoustic Microscopes
Microtronic Microelectronic Vertriebs GmbH
mage quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.Sonix has been the innovation leader since 1986. Today, the ECHO line of scanning acoustic microscopes sets the standard for package inspection speed and image quality, to help you keep pace with new packaging materials and difficult form factors. The ECHO platform will remain at the forefront as we continue to add features and enhance performance for years to come.
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Scanning Acoustic Microscope
Echo
The ECHO scanning acoustic microscope is a nondestructive ultrasonic flaw detector designed to simplify testing, increase yield and maximize productivity in the lab or on the production floor.
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High-Resolution Scanning Probe Microscope (SPM)
High-Resolution Scanning Probe Microscope (SPM)
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Optical Fiber Microscope
Connector-end face contamination is a problem that shouldn’t be ignored when it comes to fiber optic cables and patch cords. Allowing contamination to take place or fester will lead to network issues and down-time which you don’t need. For any fiber optic cable network, a high quality fiber microscope is a necessary tool to identify where contamination may be presenting.
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Laser Scanning Microscope
OLS4100
The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
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Custom Microscopes and Optical Systems
OpenStand
Whether developing new automation techniques and software or developing new imaging methods, you can quickly find that you need a microscope system tailored to your application and business needs. Prior Scientific has developed OpenStand® to offer a working platform to build OEM solutions and one-off customizations with excellent value for money and reduced development time.
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Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Near-Field Detection Module for Spectroscopy
nanoFTIR
Reflective AFM-tip illuminationDetection optimized for high-performance near-field spectroscopyPatented background-free detection technologyBased on optimized Fourier-Transform spectrometerUp to 3 spectra per secondStandard spectral resolution: 6.4/cmUpgrade to 3 cm-1 spectral resolution availableSuited for visible & infrared detection (0.5 20 m)Exchangeable beam-splitter mount includedNEW: Suited for IR synchrotron sources
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Near-field Chambers
Most antenna measurements need to be carried out in the far field; that is, the test antenna should be illuminated by a plane wave. Typically this is carried out by providing sufficient separation between the source and the AUT so the spherical wave approaches a plane-wave character.
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Xineos Scanning
Teledyne DALSA's leadership in CMOS innovation lets our Xineos scanning products deliver three times more sensitivity and five times more signal-to-noise performance than other standard technologies at equal X-ray dose conditions. CMOS image detectors offer numerous advantages including the ability to record smaller image details with higher resolutions – allowing for the diagnostics of medical anomalies at earlier stages, and significantly increasing the probability of early intervention, patient recovery, and reduced treatment costs.
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Scanning Receivers
PCTEL® scanning receivers are precision network testing tools. Designed for drive testing, walk testing, troubleshooting, and monitoring of cellular, WiFi, IoT, and critical communications networks worldwide, they provide the insights you need to improve coverage and quality of service throughout the wireless network lifecycle.
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Near-field Goniophotometer
RiGO801
TechnoTeam Bildverarbeitung GmbH
Correct determination of the luminous intensity distributions (lid) of lamps and luminaires far within their photometric near-field range. Capture of ray data.
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Microscope
Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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Scanning Electron Microscopes
Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
