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- Valhalla Scientific Inc.
product
KVS Rugged Igniter Tester With Current Monitor
4314
The Valhalla Scientific Model 4314 KVS Digital Igniter Tester is designed to provide extremely safe and reliable resistance testing of explosive or volatile devices. Proven uses include fuses, squibs, igniters, explosive bolts, automobile airbag initiators and many others.
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Solderability Tester
LBT210
Microtronic Microelectronic Vertriebs GmbH
Microtronic's LBT-210 solderability tester has software that offers statistical information such as mean value, standard deviation, etc. A camera option offers video of the test cycle and storage in memory with the appropriate test measurements and data. Additionally, it has the feature to test under nitrogen. This function can be switched on in the software. An enclosure that is flooded with nitrogen lowers and rises with the device under test.
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Memory Tester for DDR4 DIMMS
RAMCHECK LX
USBWith the RAMCHECK LX DDR4 memory tester package (part number INN-8686-DDR4) you can quickly test and identify DDR4 DIMMs that comply with JEDEC standards. Tests are fast, reliable and easy to do. The RAMCHECK LX DDR4 package includes the RAMCHECK LX base tester and 288-pin DDR4 DIMM adapter. (This package is also available with the DDR4 DIMM Pro adapter, featuring a very rugged test socket).
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Network Cable Tester
AudioJoG Pro 8 Power
Audio/Lighting/Network cable tester with SINGLE & DOUBLE ended testing with memory and intermittent fault detection.
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Cable Testers
CableJoG 64
CableJoG 64 can test up to 64 individual connections of all manufacturers of connectors. This simple test instrument stores up to 55 separate connection configurations. Each cable that is tested is compared with the configuration stored in the cable testers memory to produce a pass/fail indication of each pin connection.
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Flash Memory Test System
T5830
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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RAMCHECK LX DDR4 Memory Tester
INN-8686-DDR4
The RAMCHECK LX DDR4 quickly and accurately tests and identifies DDR4 DIMMs for servers and desktops, as well as laptop SODIMMs.
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Portable Force/Displacement Tester
The FSA-MSL Mini Material Tester is a portable force/displacment tester. The FSA-MSL is ideal for tests requiring very small movement, like switch tests. The tester also features a reversible base plate, allowing the tester to be used on uneven or obstructed surfaces. The highly visible EL display and plain language menus in eight languages make programming fast and easy. Both force and displacement values are displayed plus user-selectable data; high/low setpoints, peak, memory data, etc.
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Network Cable Tester
LightingJoG Rack 8
Sensational 19 inch 2U rack mount Lighting/Network cable tester with SINGLE & DOUBLE ended testing, memory and intermittent fault detection.
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D-SUB (Male)
QSPI
The QSPI represents a multi-function of performance and capabilities for PXI-based digital instrumentation. The QSPI offers high performance pin electronics and 4 I2C masters and 4 32bit counter 4 clock generator in a compact, 3U PXI form factor. Each card can function as a quad sites I2C/SPI device tester, multiple cards can be interconnected, supporting up to 64 sites. The QSPI also supports deep pattern memory by offering 32M of onboard vector memory with dynamic per pin direction control and with test rates up to 10 MHz.
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Leeb Hardness Tester
THL500
It is the highest brightness display in China showing all functions and parameters, easy read Largest screen Oled screen and operate,also can save lots of energy .the largest screen of Leeb hardness tester in China. Two hardness scale dual-display in the screen. Measuring direction in 360 and add the auto measure direction to make test easy and precision. Add four new hardness scales, HRA, HB for D impact device of alloy tool steel; HV for cast aluminum alloy. Add New user material function, to meet the need of user can test the special material. Test at any angle, even upside down. Wide measuring range. It can measure the hardness of all metallic materials. Direct display of hardness scales HRB, HRC, HV, HB, HS, HL and three types of strength values immediately. Seven impact devices are available for special application. Automatically identify the type of impact devices. Large capacity memory could store 600 groups (Relative to average times321 ) information including single measured value, mean value, testing data, impact direction, impact times, material and hardness scale etc. Upper and lower limit can be preset. It will alarm automatically when the result value exceeding the limit. Battery information indicates the rest capacity of the battery and the charge status. User calibration function. USB port with the PC humanity multi-functions data proceeding software. Original imported high speed thermal printer support the immediate printing function. It can save data permanently. Li rechargeable battery as the power source. Charge circuit integrated inside the instrument. Continuous working period of no less than 200 hours (EL off and no printing). Auto power off to save energy. Excellent after-sale service system for high quality products---3 years guarantee and all life maintenance. Easy to buy and comfortable to use.
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Test Adapter
Ramcheck 72 Pro
Our latest addition to the RAMCHECK memory tester provides needed support for testing 72-pin SO DIMM modules used in older laptop computers. The RAMCHECK memory tester automatically detects the presence of the RC 72 Pro adapter
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Auditor Torque Cube
ATC Series
The Auditor Torque Cube (ATC) is a compact, versatile desktop tester and provides a multitude of capabilities. The ATC is designed to test hand or power tools with the following: Peak, first peak and track modes. Multiple engineering units. Manual and auto clear function. Multiple frequency response settings. Bi-directional use and accuracy. Accuracy is better than 1% of indicated reading top 90% of range. Serial data output. Memory 999 data samples. Battery and/or mains powered.
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Hi-Pot Tester
DU3315A/3316A
Delta United Instrument Co., Ltd.
Real-time Open Check of the alarm and signal output of no contact signal3 in 1 tester with AC, DC, IR functions ( IR function is optional for DU3316 only)ARC Detction:DU3315A /DU3316A Standard function40 x 4 LCD text displayFast cut-off time : 0.4ms5 sets of memory, 3 steps for each memory
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Compact Full Automatic Vibrating Sample Magnetometer
VSM-C7
Small size and light weight system 1/5 in weight and about 1/3 in occupied floor space upon heretofore measurement tester Type VSM P7-15. This equipment is capable of measuring all merchandized memory media and low in price.
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PC Crush Tester
DRK113E
Shandong Drick Instruments Co., Ltd.
DRK113E Crush Tester PC is a high accuracy and intelligent instrument, designed according relevant standards. The advanced components, mating parts and micro-computer are logical structured, to ensure the property and appearance.The instrument has parameter testing, adjusting, computer screen display, memory, printing function.
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Test Adapter
Ramcheck 100
This addition to the RAMCHECK memory tester provides needed support for testing of SDRAM and standard EDO/FPM DRAM 100-pin SO DIMM modules at an affordable price.
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Downloading Multifunction Tester
ET4500
The new ET4500 tester carries out all the tests needed to verify the safety of electrical installations in domestic, commercial and industrial wiring installations in accordance with the latest regulations.
can be used to carry out 3 wire earth testing and has on board memory to store and download all installation test results for documentation.
Everything about the new ET Series has been designed to save time and make testing easier.Fast, reliable high current and non-trip loop testing comes as standard together with a high level of input protection and a CAT IV safety rating .Supplied with a full range of accessories.
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Memory Tester
SP3000
CST is proud to offer a portable stand alone and affordable memory tester, combining DIMM and SODIMM testing capability all on the same universal base unit with optional easy plug-on test adapters.
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Memory Burn-In Test
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Digital Leeb Hardness Tester
TIME®5310
Beijing TIME High Technology Ltd.
TIME5310 is an advanced digital Leeb hardness tester developed with advanced micro electronic technology. It is loaded with all the features for metal hardness testing, such as probe auto recognition, large memory, USB output, removable printer, software, etc. The improved display makes it is much easier to read the values. TIME5310 digital hardness meter is a must have for testing in the field or in the lab. By the way, there are newly designed probes for this hardness meter now.
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Turns Ratio Testers
TRT Standard Series
When it comes to choosing a transformer turns ratio tester, TRT Standard series offers some of the most advanced instruments with LCD display out in the market. Each model measures transformer excitation current and phase shift performs automatic vector group detection and magnetic balance on three-phase transformers and three-phase autotransformers. Furthermore, they have a built-in true three-phase power source. Because of that, TRT Standard instruments can test transformers with special configurations, such as phase-shifting, rectifier, arc-furnace, traction transformers, etc.The instruments can output test voltages from 1 V AC to 250 V AC, depending on the chosen model. High test voltage of 250 V AC provides more accurate turns ratio testing compared to other turns ratio testers on the market and extremely low test voltage of 1 V AC enables turns ratio verification of current transformers.TRT Standard series consists of:TRT03 Models (TRT03A, TRT03B, TRT03C) – single-phase voltage up to 100 VTRT3x Models (TRT30A, TRT30B, TRT30C, TRT33A, TRT33B, TRT33C) – single and true three-phase voltage up to 100 VTRT63 Models (TRT63A, TRT63B, TRT63C) – single and true three-phase voltage up to 250 VMore about models differences can be found under the downloads tab, in brochures and comparison sheets.A user can create test templates using the DV Win software and store them in the PC’s memory for later use when in the field.TRT Standard series models have a built-in tap changer control unit. Consequently, it enables remote control of an on-load tap changer (OLTC) directly from the tester. In order to make the most out of this feature, the DV-Win software can be programmed to do everything automatically – running turns ratio tests, changing OLTC tap positions and saving results. This option, especially in combination with test templates, significantly facilitates and shortens the turns ratio testing time.
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Protective Bonding Testers
RMO-E Series
The RMO-E instruments are designed and ideal for testing protective bonding (grounding) of equipment following the standard IEC 61010-1. Also, they can measure the resistance of high, middle and low voltage circuit breakers, high-current bus bar joints, cable splices, and welding joints. The instruments accurately measure not only in factory environments but also in high-induction fields and substations.Both models generate a true DC ripple-free (less than 1 %) current with automatically regulated test ramps. During a test, the protective bonding testers automatically generate increasing current before measuring and decreasing current after the measurement. Consequently, this significantly decreases magnetic transients and ensures great accuracy.These instruments can store up to 500 measurements in the internal memory and have a built-in thermal printer available as an option.DV Win software communicates with the RMO-E earth resistance meter via USB or RS232 interface. It allows a user to run the test remotely from PC, as well as to download test results, analyze and generate fully configurable test reports.The RMO-E series contains two models, RMO60E and RMO100E. The main difference between these two models is in the maximal test current:60 A DC for RMO60E100 A DC for RMO100E
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Memory Tester
RAMCHECK
RAMCHECK is our most advanced memory tester and is the latest in our product line. Highly modular and user friendly, it redefines the capabilities of an affordable and portable ram checker.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Test Adapter
RAMCHECK® SIMM
The RAMCHECK SIMM Adapter is another addition to the RAMCHECK memory tester. It provides a needed solution for testing older 72-pin EDO/FPM DRAM SIMM modules. An optional adapter for 30 and 72-pin SIMMs is also available
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Audio Cable Testers
AudioJog Pro 3
Audio cable tester with SINGLE & DOUBLE ended testing, memory and intermittent fault detection .
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Memory Test Systems
T5503HS2
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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0-5KV Digital Hi-pot Tester 0-5KV
7110
Shenzhen Chuangxin Instruments Co., Ltd.
Programmable AC/DC withstand voltage tester Feature: Small volume, light weight Easy to operate, has keyboard lock function Provide 5 groups memory setting, each group has four kinds of work mode
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Optical Power Meter & VFL & RJ45 Network Test
TM263N
◇ Added Network Cable Test ◇ Accurately test whether a single network cable transmits signals normally ◇ Self Calibration ◇ Set the Auto Off ◇ Wavelength Memory function after turn off the tester ◇ High Accuracy, high ,High sensitivity, high linearity ◇ Stable VFL Output ◇ USB Charge port ◇ FC,SC Connector ◇ 18650Li-ion Battery ◇ Lower power consumption design, long standby time ◇ Rubber Out shell, increased the protective properties for field work
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
