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Imaging Gauge Software Test System
The IMAGING GAUGETM quality analysis system was developed by APPLIED IMAGE to address the growing need to standardize the evaluation of camera image quality. The system includes a Test Chart manufactured using our ACCUedge® technology, along with unique Image Analysis Software, used together to analyze the quality of the imaging system, and then provide a summary report on the various image quality metrics. Our goal is to provide a simple to use, unique image analysis system, that can be utilized by R&D, scientists, system integrators, technicians and field operators to evaluate the camera quality or imaging system.
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MXI Computerized Tomography (CT) Option
The Nordson TEST & INSPECTION µCT inspection option provides Computerized Tomography (CT) functionality to compliment the 2D X-ray investigations on Nordson TEST & INSPECTION X-ray inspection systems. It uses the superior, sub-micron feature recognition 2D x-ray images, that Nordson TEST & INSPECTION X-ray systems always provide, to produce the best CT models for 3D sample analysis, virtual micro-sectioning and internal dimensional measurements. It reduces the number of time-consumin...show more -
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Embedded Motherboard supporting MXM Graphics Module with 8th/9th Generation Intel® Core™ i7/i5/i3 in LGA1151 Socket
AMSTX-CF Series
Embedded graphics enables system developers to boost the performance of a wide range of workloads, including medical imaging, image analysis, compute acceleration, and artificial intelligence (AI). Leveraging graphics processing units (GPUs), embedded graphics can be used to increase application speed and accuracy, as well as decrease latency. Many embedded system developers are using embedded graphics solutions in real-world applications, such as medical, manufacturing, and traffic management, along with other embedded segments.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Semiconductor & Flat Panel Display Inspection Microscopes
MX63 / MX63L
The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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Universal Offline AXI Systems
AXI XT-6 Series
The XT-series provides the advanced inspection capability of Nordson TEST & INSPECTION's inline system in a smaller footprint manual load/island of automation system. The platforms are designed for flexibility and ease of use for a wide variety of products requiring 2D and 2.5D automated X-ray inspection. The XT-6/XT-6A platform is a highly flexible automated X-ray inspection system with minimum footprint and a parallel-kinematic Hexaglide manipulation unit for extreme-angle off-axis image acq...show more -
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Custom Testing Solutions
Test and MeasurementEnable increases the robustness of your test and measurement solutions, thereby reducing errors and associated costs. Data Acquisition (DAQ)Enable defines and builds custom DAQ systems for automated measurements of any process or manufactured part. Control and AutomationEngineeringEnable ensures that your processes are programmed to be safe, effective and optimized for both speed and quality. Real-Time and Mission CriticalSystemsEnable develops dependable real-time systems an...show more -
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Counterfeit Analysis / Screening Services
DPACI perform counterfeit part analysis on all types of electrical, electronic, and electromechanical (EEE) components. Our suspect counterfeit analysis task groups include source identification, manufacturer validation, external visual inspection, mechanical inspection, electrical test, X-Ray, in-depth internal visual and materials analysis. With one of the largest databases of test reports for EEE components, we can offer similar historical data for correlation with images, test data, certifications and reports.
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SparkFun MicroMod Machine Learning Carrier Board
The MicroMod Machine Learning Carrier Board combines some of the features of our SparkFun Edge Board and SparkFun Artemis boards, but allows you the freedom to explore with any processor in the MicroMod lineup without the need for a central computer or web connection. Voice recognition, always-on voice commands, gesture, or image recognition are possible with TensorFlow applications. The cloud is impressively powerful but all-the-time connection requires power and connectivity that may not be av...show more -
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Image Analysis & Stage Micrometers
The APPLIED IMAGE series of Image Analysis and Stage micrometers are ideally suited for calibrating optical, imaging, video, and reticle-based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Both types of micrometers come with NIST traceable calibration standards and are available on multiples substrates to perfectly fit your needs. The experience APPLIED IMAGE has in manufacturing ...show more -
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High Content Screening Instruments
Get the sensitivity and throughput you need to image more samples and analyze more parameters with high content screening. Our high content screening instruments help you answer the most complex biological questions. With powerful yet simple imaging and analysis capabilities for a wide range of applications -- from basic research to assay development and screening -- these powerful high content screening microscope systems produce the highest possible image quality to take your research further, in less time than ever before, especially when combined with PerkinElmer's robotic systems and advanced data analytics.
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EDX-FTIR Contaminant Finder/Material Inspector
EDXIR-Analysis Contaminant Finder/Material Inspector
EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (FTIR). This software is used to perform an integrated analysis of data from FTIR, which is excellent at the identification and qualification of organic compounds, and from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content. It then pursues...show more -
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Particle Analysis for Liquids
With our partner Pamas we have developed the microscopic image analysis system PAMAS FastPatch 2 GO for automatic membrane filter analysis.
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EDXIR-Analysis Contaminant Finder/Material Inspector
EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (FTIR). This software is used to perform an integrated analysis of data from FTIR, which is excellent at the identification and qualification of organic compounds, and from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content. It then pursues...show more -
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Metallographic Analyzer
MDS-5000D
Wuxi Tianmu Instrument Technology Co., Ltd.
1) the Integrated T -shaped Mirror Design, PROVIDING Superior Stability 2) Low-position Front Operation, Ergonomic requirements . 3) 6V / 30W Adjustable Halogen LAMP, PROVIDING Ample Bright Lighting System . 4) 3/8 splitting of Tube The trinocular , Observation and photography can be carried out simultaneous 5) Low-position mechanical moving platform to quickly locate the image 6) Professional flat-field metallographic objective lens, providing good resolution and clear image 7) Polarization Det...show more -
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Pattern Region of Interest Analysis System
PRIAS
PRIAS is a synergistic new imaging technique to visualize microstructure and provide exciting new views of your materials. PRIAS enables users to quickly characterize materials without requiring full EBSD pattern indexing. Through a novel use of the EBSD camera, PRIAS provides as many as 25 positional electron detectors to allow unprecedented flexibility in image collection and visualization. Applications of PRIAS include traditional EBSD materials such as metals, ceramics, semiconductors, and minerals as well as new analysis of plastics and glasses.
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MountainsSPIP™ 8
We are currently working hard on a new development, together with our colleagues at Digital Surf *), to bring you the next generation of SPM image analysis software, based on the industry-standard Mountains platform and all the best SPIP interactivity and analytical tools.Our new product, called MountainsSPIP 8, will be unveiled at the MRS Fall Exhibit in Boston November 2018 and available for customers early 2019.
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Equipment & Vision Systems for Surveillance & Defense Applications
Photonis equipment systems are designed with Photonis sensors and cameras, while providing ease-of-use for in-depth image capture and analysis. These low light imaging systems are specifically developed with Night Vision, Observation & surveillance, Situation Awareness in mind.Two main equipments are proposed: the TacFusion is a handheld binocular combining low light camera core and thermal imaging sensor and the SR750 is a long range surveillance camera with powerful zoom and adapted ergonomics for rapid deployment. Both devices can be used for surveillance applications (police law-enforcement, borders and infrastructure surveillance) as well as SAR operations.
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Translating process images into significant tool-defect reduction
Trans-Imager
Real-time, tool-specific defectivity data. Now there is a way to monitor defectivity on individual processing tools – automatically – in real-time. Microtronic’s new Trans-Imager software module is able to take high-resolution images directly from your processing equipment and immediately detect and displaymacro wafer defects – transferring all of that information into our powerful and long-proven ProcessGuard software which provides a wealth of defect management and analysis. This new capabili...show more -
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Analyze, Monitor and Control
Analysis Pack
Blue Cat's Peak Meter Pro plug-in will tell you everything about your audio levels. Blue Cat's FreqAnalyst Pro and FreqAnalyst Multi plug-ins provide extremely smooth spectrum and frequency content analysis. Finally, the StereoScope plug-ins series let you visualize the stereo image of your audio content in details.
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Handheld Audio Analyzer
PAA3X
The PAA3X is a highly accurate handheld audio analyzer that gives sound engineers a rich array of sound analysis tools. The system features both 61-band and 31-band real time spectrum analysis, RT60 reverb time measurement, SPL and line meter, internal signal generator, EQ setting program, microphone calibration and speaker phase checking abilities. All functions and menus can be accessed through a central jog dial, leaving your other hand free to adjust audio settings. The large color LCD scree...show more -
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Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
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UV Cameras
Solar blind UV cameras are imaging devices optimized to detect ultraviolet light of wavelengths below about 280nm. Such cameras are insensitive against sunlight due to negligible sensitivity to visible and long wavelength UV light. Solar blind UV cameras are used in a series of applications like corona detection, fire detection, combustion analysis, plasma research, testing UV lamps, etc. However, highly sensitive corona detection is the main mass application and these devices are of crucial im...show more -
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Space-Magnetic Field Visualization System
EPS-02EMF System
The system detects position of the magnetic field sensor on the basis of the image on the camera first of all and then, recognizes strength of the signal that is measured by the sensor upon frequency analysis of the signal almost simultaneously. Finally, visualization of the strength dispersion in composition with the real image of the measured object can be realized on screen of PC.
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Radiometric Drone Thermal Camera
FLIR Vue Pro R
The Vue Pro R gives drone operators and certified thermographers the power to gather accurate, non-contact temperature measurements from an aerial perspective. Every still image the Vue Pro R saves contains accurate, calibrated temperature data embedded in every pixel, adding even more value to your sUAS operations and services than ever. Vue Pro R adds fully radiometric data-gathering to sUAS applications like building and roof inspections, power grid inspections, infrastructure analysis, precision agriculture, and public safety.
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MultiBeam System
FIB
An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering ...show more -
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FerruleMaster Ferrule Auto Test Instruments
CA3003
FerruleMaster could feed, focus, measure and classify the ferrules automatically. It could test over 1000 PCS ferrules in one hour, no laborer required. Ferrule Master has the high performance and accuracy and high repeatablility with the superior image processing. It is intelligent and easy to operate and maintain. Clear user interface, easy to operate, stable performance and powerful analysis capability make the Ferrule Master is the best instrument in material inspection and mass production.
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Micro XRF
W Series
The W Series Micro XRF uses poly-capillary optics to focus the X-ray beam to 7.5 µm FWHM, the world’s smallest beam size for coating thickness analysis using XRF technology. A 150X magnification camera is used to measure features on that scale; it is accompanied by a secondary, low-magnification camera for live-viewing samples and birds-eye macro-view imaging. Bowman’s dual-camera system lets operators see the entire part, click the image to zoom with the high-mag camera, and pinpoint the feature to be programmed and measured.
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Coverage Analysis
VerOCode
VerOCode can use the same requirements-based tests that were used in functional testing to automate the capture and analysis of structural coverage testing without instrumenting the code under test. This is part of the process used at Verocel. It then records and displays the instructions executed in a program under test, and for conditional instructions, records and displays the state of the condition code at each execution of the instruction. Structural coverage is obtained at the machine code level using the integrated image, with results reported through an annotated program listing containing the source and machine code level expansion
