Showing results: 61 - 75 of 267 items found.
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Bandmaster IV -
Array Solutions
Using USB (RS232) or band data (BCD) information, the Bandmaster IV converts that frequency/band data to allow meaningful automated control of your station that incorporates Array Solutions / Hamation devices.
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Z-Tron IV -
AMETEK Drexelbrook
The Z-Tron IV level switch is one of our most popular on/off level switches offering an effective, low-cost material level detection in a wide variety of applications. It is widely used as an alternative to electromechanical level switches.
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NanoSync IV & NanoSync IV Low Profile -
FEI-Zyfer Inc.
The NanoSync IV is a small form factor GPS Position, Navigation, Time (PNT) and Frequency reference system that provides multiple reference outputs and includes support for NTP & PTPv2 IEEE 1588-2008. The NanoSync IV has a Rubidium oscillator and is available with a civilian C/A GPS receiver or SAASM (Rockwell-Collins MPE-S GB-GRAM or Trimble Force 22E MRU GPS receiver) for military users. The NanoSync IV is packaged in a small, rugged enclosure ideally suited for embedded electronic warfare applications.The NanoSync IV-SA-Rb has been demonstrated to be compliant to the Joint Airborne SIGINT Architecture (JASA) Version 3.0, Annex 1, for Time, Frequency, Navigation and Geodesy (TFNG), making it suitable for Electronic Warfare (EW) COMINT and ELINT applications in fixed site, airborne and shipboard environments.
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Frequency Master IV -
ROM-Elektronik GmbH
Based on a completely new method of signal analysis, ROM-Electronics measuring devices enable high-frequency and EMC measurements at a spectacular price.Finding sources of interference and their causes, determining power flux density, measuring and evaluating even the most complex signal forms - all this is easily possible with ROM-Electronics measuring devices.And by using our professional PC evaluation software you can increase the performance and functionality of your Frequency-Master IV even more!
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ZSX Primus IV -
Rigaku Corp.
As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Guidance supports you in all aspects of measurement and data analysis. Can accurate analysis only be performed by experts ? No — that is in the past. ZSX Guidance software, with the built-in XRF expertise and know-how of skilled experts, takes care of sophisticated settings. Operators simply input basic information about samples, analysis components and standard composition. Measured lines with the least overlap, optimum backgrounds and correction parameters (including line overlaps) are automatically set with aid of qualitative spectra.
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GEOSCOPE MKIV -
3d-Radar AS
The 3d-Radar GeoScope Mk IV Ground Penetrating Radar (GPR) raises the standard for high speed, high-density three-dimensional sub-surface imaging. The Mk IV is the fourth generation 3d-Radar GeoScope and further exploits the application of step-frequency technology to Ground Penetrating Radar. The Geoscope Mk IV enables high-density high speed 3D data capture with unique combination of deep subsurface penetration coupled to high resolution.
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ADC Corporation
High-speed and high-accuracy measurement of solar cell I-V characteristics in three modes
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B1500A -
Keysight Technologies
Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 V - 200 VAC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilitiesAdvanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
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B2901B -
Keysight Technologies
The Keysight B2901B precision source / measure unit (SMU) is a 1-channel, compact, and cost-effective benchtop SMU with the capability to source and measure both voltage and current. It easily measures current versus voltage (I/V) with high accuracy. The 4-quadrant source and measurement capabilities enable taking I/V measurements without configuring multiple instruments.
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B2912B -
Keysight Technologies
The Keysight B2912B precision source / measure unit (SMU) is a 2-channel, compact, and cost-effective benchtop SMU with the capability to source and measure both voltage and current. It easily measures current versus voltage (I/V) with high accuracy. The 4-quadrant source and measurement capabilities enable taking I/V measurements without configuring multiple instruments.
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B2902B -
Keysight Technologies
The Keysight B2902B precision source / measure unit (SMU) is a 2-channel, compact, and cost-effective benchtop SMU with the capability to source and measure both voltage and current. It easily measures current versus voltage (I/V) with high accuracy. The 4-quadrant source and measurement capabilities enable taking I/V measurements without configuring multiple instruments.
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U5404A -
Keysight Technologies
This 18 mm test probe is highly recommended for CAT IV environment and is compatible with the U1281A/82A handheld DMMs
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QuickSun® 130E -
Endeas Oy
QuickSun 130E exceeds the ordinary Class A criterions of IEC904-9 ed. 2 with clear margin providing enhanced IV characteristics accuracy. The applicable test methods and procedures are inspected by SGS Fimko Ltd in order to guarantee the compliance and traceability not only with the above standard but also with IEC904-1 ed. 2 which specifies the IV measurement conditions.
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SlarIV -
ZOLIX
SolarIV IntroductionOne of the key measurements needed for photovoltaic devices in the measurement of their I-V characteristics. Through measuring the I-V curves the user can determine physical performances of devices such as photo-electric conversion efficiency, fill factors and so on. Such data is important for reliable work in research and quality inspection. ZOLIX supply the SolarIV system and the most perfect, professional technical support.
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King Design Industrial Co., Ltd.
The multi-light source measurement system is capable of execute I-V measurements by Real-Time One-Sweep Method (RTOSM), which not only removes the capacity effect but also meets the requirements of SEMI PV57-1214. The measurement process is controlled by designed program, thus the measured I-V curve, Pmax/Isc/Voc/… etc, could be exported automatically.This system is applicable to DSSC/OPV/Perovskite measurements.