- Scientific Test, Inc.
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Semiconductor Tester
5000E
Current Ranges:Standard: 2.0nA – 50AUp to 100A with Mainframe ExtensionVoltage Ranges:Standard (anode): 10mV – 1000V2000V with 2kV Anode OptionStandard (gate): 10mv – 20V80V with 80V Gate Option
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Fault Simulation
Concurrent Fault Simulator
TurboFault combines high performance, versatility and accuracy. It is highly competitive with hardware accelerators for classical test fault grading. It supports synchronous and asynchronous designs at the gate level, including tri-state gates, latches, flip-flops, single and multi-port RAMs, complex bus resolution functions, and User Defined Primitives (UDPs).
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Electric Testing
Our Capabilities*Dielectric Withstand*Hi-Potential Testing*Voltage Drop*Contact Resistance*Gate Leakage*Insulation Integrity*Dielectric Integrity
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0.1Hz-3.7GHz Frequency Counter
FC-3000
Features:*Frequency measuring range: 0.1Hz to 100MHz in A input, 80 MHz to 3.0GHz in C input.*Period,Total and RPM measurement for input A*9 Digit display with 0.01mHz resolution in 1 Sec (By Ext.Reference signal).*RS-232C serial interface function for communication with computer.*High sensitivity Extemal reference input function(>=1.5Vrms).*Peciprocal technique for high resolution at low counting frequencies .*Self check function executed to perform a automatic self diagnosis of various coun...show more -
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MicroSemi-SiC-Module / Evaluation Board
EV-MS4135PL1Z-U1 Pre-Release
High power evaluation board, up to 1200V & 50A @ 200kHz switching frequency featuring the combo ADI ADuM4135 isolated gate driver + LT3999 isolated power supply controller + Microsemi SiC power module in half bridge configuration.
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Eddy Current Flaw Detector
US-525M
United Western Technologies Corp
The US-525M multi-channel eddy current testing instrument is a rugged industrial rack-mounted instrument offering multi-channel testing, integral digital strip chart, as well as Ethernet control and data transfer to meet your in process testing requirements. This instrument offers up to eight channels, with a frequency range of 20 Hz to 10 Mz, a high signal-to-noise ratio, a bright 12-inch diagonal color LCD flat-panel screen, and data storage of 32 Gig. It offers input/output (I/O) capability, USB and Ethernet connectivity, as well as three discrete alarm gates with independent outputs per channel. for your on-line bar, tube, wire and specialty component testing needs.
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Duty Cycle Meter
Displays ON or OFF period as a percentage of total period over a programmed gate time from 10 ms to 199.99 s. A resolution of 1%, 0.1% or 0.01% is user-selectable. Applications include monitoring modulated proportional control systems and pulse-modulated systems, such as radar, lasers or packet radio.
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Brushless DC Drivers (BLDC)
Covering a wide range of power systems, our integrated MOSFET and gate driver ICs thrive in automotive, industrial, and consumer applications, ranging from 3.5 to 100 V operating voltage.
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Mini Receiver
FB7-NX
In about 1935, the National Radio Company of Malden, Mass., brought out a “hot” high frequency receiver, called the FB7, and the subsequent FB-7X. It featured a super-hetrodyne design with plug-in coils that gave it a broad frequency range. The “X” model also incorporated a crystal filter in the intermediate frequency section, thus giving it additional selectivity. The receiver was viewed by radio amateurs as a technological breakthrough, and it was also used commercially for point to point ...show more -
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Slide Gate & Shaft Position
All six Shaft Angle Position Feedback Monitors in the SG1000 Series utilize absolute rotary encoders to provide independent and accurate feedback of a slide gate's or a valve's position to an external device such as a PLC or optional PM500 Process Meter Display Unit. Models are housed in a rugged, Explosion-Proof/Dust-Ignition Proof cast aluminum enclosure that is dirt, dust, grease-proof, and water resistant. In the case of a power failure, all SG1000s are designed to retain accurate gate position.
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test measurement unit
ITC59100 Rg/Qg
The ITC59100 Test Measurement Unit (TMU), which plugs into the ITC59000 Test Platform, performs gate charge (Qg) measurements that conform to MIL-STD-750C, Notice 2, Method 3471 and JEDEC Standard JESD24-2. In addition the ITC59100 TMU performs an internal gate resistance (Rg) test method that conforms to JEDEC Standard JESD24-11.
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Boolean Logic Gates
Advanced Science and Novel Technology, Co., Inc.
High speed broadband Exclusive-OR (XOR) Boolean logic gateExhibits low jitter and limited temperature variation over industrial temperature rangeIdeal for high speed proof-of-concept prototypingFully differential CML input interfacesFully differential CML output interface with 400mV single-ended swingSingle +3.3V or -3.3V power supplyPower consumption: 415mWFabricated in SiGe for high performance, yield, and reliabilityCustom CQFP 24-pin package
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Gated Integrator, 2 ns Minimum Gate Width
SR250
Stanford Research Systems, Inc.
The SR250 Gated Integrator is a versatile, high-speed, NIM module designed to recover fast analog signals from noisy backgrounds
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CAMGATE Test Kits
Series 453
LThe GR Series 453 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 453 provides interface compatibility using the GR2270 Style, 12 block interface. This interface accepts the industry standard I/O, power, and coax blocks. The CAM/GATE utilizes a cam roller system...show more -
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CompuScope GPU CUDA Processing
Performing real-time digital signal processing (DSP) routines such as Fast Fourier Transform (FFT), Signal Averaging, Finite Impulse Response (FIR) Filtering, Digital Down Conversion (DDC) and more have traditionally required the use of dedicated DSP processors, Field Programmable Gate Arrays (FPGAs), or Application Specific Integrated Circuits (ASICs).
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Airlock Control System
The system is built on the basis of a panel computer with a touch screen, performing the functions of a user interface and recording the measured parameters. The stand is equipped with gate drives and a set of sensors (pressure, flow rate, force). Real-time gate control is implemented on the basis of the R-series board; for input and conversion of analog signals from the sensors, an expansion cage of the cRIO-9151 R-series boards is used.
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Rad Hard GaN Drivers
The space market has been driving towards more efficient power management solutions. Part of the drive includes the use of Gallium Nitride Field Effect Transistors (GaN FETs) for power conversion. GaN FETs have higher power conversion efficiency and have more natural immunity to radiation, due to them being wide-bandgap semiconductors. Equally important is the use of the correct driver that will allow reliable operation and maximize the benefits of the GaN FETs. Some of the key driver requirements are: a well-regulated gate drive voltage; high source/sink current capability and a split driver output stage.
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Dual Gate LCU
Abaco Systems’ Dual Gate local control unit (LCU) provides an ideal user interface for the ADEPT line of automatic video trackers and can be used in a prototyping, development or production project phase.
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eXpert FPGA DSP Features for Data Acquisition
GaGe provides several eXpert FPGA processing firmware options for use with CompuScope Digitizers. All standard default CompuScope Digitizer model configurations can store raw acquired waveform data to onboard sample memory and then transfer them quickly to the user for analysis, display and/or storage. The addition of optional eXpert FPGA processing firmware features allow for some signal processing analysis, or other specific functionality, to be performed on the digitizer hardware itself within its onboard Field Programmable Gate Array (FPGA).
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Ku-Band Antenna Systems
A complete line of Ku-Band and Ka-Band SATCOM antenna systems featuring TECOM technology for non-stop gate to gate in-flight connectivity for commercial large Air Transport, Business Jet and various military applications.
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Precision SOT-23 FGA™ Voltage References
X60003
The X60003 FGA™ voltage references is a very high precision analog voltage reference fabricated in Renesas' proprietary Floating Gate Analog technology, which achieves superior levels of performance when compared to conventional band gap, buried zener or XFET™ technologies.
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40-67 GHz Power Amplifier
1GG6-8070
The 1GG6-8070 is a high gain, medium power mmwave amplifier. It can be used as part of a banded solution to achieve respectable mmwave power. Input and output ports are matched to 50W. The amplifier is biased with a single positive drain supply (VDD) and a single negative gate supply (VG1).
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Laureate Time Interval Meter
Model FRI
Configured to time periodic events which produce start and stop pulses from 1 s to 199.99 s over a programmed gate time up to 199.99 s. Timing resolution to 0.2 s. Optional data I/O and relays for alarm or control. Six 0.56" (14.2 mm) high digits, 1/8 DIN case.
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P-Series Single Channel Power Meter
N1911A
30 MHz video bandwidth Single shot real time capture at 100 M sample/s per second Key Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc. One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc. Internal Zeroing and Calibration while connecting to the DUT Bench Vue software enabled
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P-Series Dual Channel Power Meter
N1912A
30 MHz video bandwidth Single shot real time capture at 100 M sample/s per second Key Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc. One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc. Internal Zeroing and Calibration while connecting to the DUT Bench Vue software enabled
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ESD & Latch-Up Test Service
MASER Engineering has automatic test equipment for the most common ESD test pulse models. MIL - JEDEC - ESDA - IEC standards. IC level Human Body Model. IC level Machine Model. IC level Charged Device Model. System level IEC 61000 HBM. AEC-Q100 Field Induced Gate Leakage test. Static Latch-Up test. Dynamic Latch-Up test.
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Half, Full Bridge & Three Phase Drivers
Renesas' half-bridge (h-bridge), full-bridge and three-phase drivers handle voltages up to 100V, with industry-leading gate rise and fall times and exceptional input-to-output propagation delay performance.
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Load Cell Simulators / Testers
A load cell simulator is a handy tool during initial setup, particularly of a batching by weight scale. It replaces the load cell(s) in the system allowing the scale technician to simulate various weights that will trigger the outputs setpoints for activating valves, gates, and mixers. These products are a must for anyone involved in scale installations and repairs.
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Laureate Duty Cycle Meter
Model FRD
Configured display ON or OFF period as a percentage of total period over a gate time from 10 ms to 199.99 s. A resolution of 1%, 0.1% or 0.01% is selectable. Ideal for repetitive short pulses with a pulse width down to less than 1 s.
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Multi Functional VME Logic Module
MDGG-16
The MDGG-16 is a single wide 6U VME multi functional FPGA based delay logic and timing module which provides often needed functions as gate generator & pulse generator, logic fan in - fan out, coincidence register and scaler / pre-scaler. The module has 16 LVDS/ECL inputs and 16 ECL outputs on pin headers and 2 NIM inputs as well as 4 NIM outputs (Lemo), which are free configurable in regards to their functionality.