- Pickering Interfaces Inc.
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100 Pin 1.27mm Pitch Micro-D Cables - 100 Pin To 100 Pin For Pickering Products
The connector to connector cable assemblies below are suitable to use with Pickering cards and modules that utilize a 100-pin Micro-D connector.
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Spring Contact Probes
FEINMETALL offers a wide range of contact probe:ICT / FCT probes, short travel probes, double plunger probes, fine pitch probes, interface probes, wire harness probes, threaded probes, high current probes, switch probes, twist proof probes, push back probes, koaxial probes, radio frequency probes.
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100-Pin Micro-D Connector, Male, Discrete Wire, 2-56 UNC Screwlocks, Metal Shell
C100SMR-1CW-6A
This accessory is designed to allow users to directly terminate a cable to the connector. It is difficult to terminate cable to the 100-Pin SCSI Style Micro-D connector because of the high density and fine pitch. Pickering Interfaces recommends the use of purchased cable assemblies for applications where most or all of the contacts are in use.
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In-Circuit Tester Integration
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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Contact Probes
Rika Denshi Group Contact Probes - specialty probes including fine pitch testing, high frequency testing, high temperature testing, kelvin test, and high current test, as well as standard probes for 0.4mm-, 0.5mm-, 0.65mm-, 0.8mm-, and 1.0mm pitch.
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Probe Cards
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
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Test Contactor/Probe HEad
cRacer
The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
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Narrow (Fine) Pitch Connectors
Panasonic Industrial Devices Sales Company of America
Panasonic’s industry leading “tough contact” design provides customers with the reliability that is required when developing the latest computer or wearable device. Our Narrow (Fine) Pitch Connectors line-up includes both Board-to-Board and Board-to-FPC options. Backed by our staff of technical engineers, Panasonic offers a full “hands on” solution from designing-in assistance to manufacturing. Discover how Panasonic Narrow Pitch Connectors can elevate your applications.
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Fine Pitch Stencil Printer
MC110
MC110 SMT stencil printer offers quick and easy setup via tooling hole or edge mounting for both single and double-sided boards. Exceptional build quality, with a heavy-duty cast aluminum base, ensures stability and repeatability.
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Fine Pitch Connector Test
C.C.P. Contact Probes Co., LTD.
Our Ceramic/Aluminum sockets have a lifetime of up to 30,000 cycles.
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Fine Pitch Test Probes
Micro probes allow very fine pitch testing ranging from 0.13mm to 0.35mm pitchLow Resistance, Low inductance, High FrequencyWide selection of plating options to optimize contact challenges and maximize probe lifeTri-temp applications – 55°C to 155°C
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Semicon Test Probes
Fine pitch, 0.20 mm [8 Mil] - single & double ended - non-rotating - kelvin - RF - high performance.
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100-Pin Micro-D Connector, Male, Ribbon Cable, 2-56 UNC Screwlocks, Metal Shell
C100SMR-1CR-6A
This accessory is designed to allow users to directly terminate a cable to the connector. It is difficult to terminate cable to the 100-Pin SCSI Style Micro-D connector because of the high density and fine pitch. Pickering Interfaces recommends the use of purchased cable assemblies for applications where most or all of the contacts are in use.
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68-Pin VHDCI Connector, Slimline - Male, Solder
C068VMR-6SB-6A
This slimline version of the VHDCI connector is designed to allow users to directly terminate a cable with soldered connections to the 68 Way VHDCI connector. It is difficult to terminate cable to the 68 pin VHDCI because of the high density and fine pitch. Pickering Interfaces recommends the use of purchased cable assemblies for applications where most or all of the contacts are in use.
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CAM/TRAC Test Kits
The Camtrac (registered trademark) series test fixtures provides ‘Z’ axis motion that reduces probe side loading typically seen with Clamshell type test fixtures. This not only extend the life of the probes, but additionally, provide better probing accuracy, especially on fine pitch test centers. Camtrac fixtures are available with the most widely used interfaces in the test industry.
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Fine Pitch Spring Probes
For MARATHON series, we have ultra-fine spring probes with high quality for small lot order and in short lead time. We have product range from probe outer diameter 0.11mm.
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Fine Pitch Probes
Fine pitch probes are spring contact probes with pitches between 0.10 / 4mil and 1.00mm / 40mil.In this pitch, direct soldering and the use of mounting receptacles is usually no longer possible. Therefore, almost all fine pitch probes are designed as double-sided spring-loaded contact probes. Fine pitch probes are installed in corresponding test sockets, which enable exact contacting of the test points. Feinmetall fine pitch probes are suitable for common components such as BGA, LGA, QFP, QFN or WLCSP. Precision and 100% quality control characterize these probes.In smaller pitches of 60 – 300µm, carrier needles (beams) are also used.
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CMOS Image Sensor
CIS
CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment S...show more -
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Semiconductor
With ultra-multi pin count and fine pitch, our general-purpose IC socket lineup corresponds to every need. For semiconductor burn-in sockets for thermal acceleration tests, and test sockets for semiconductor electrical testing, we continue to hold a high market share all over the world.
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Probe Pins
Cobra-Series
Cobra-series probe pins offer long lifetime and low particle contamination for high-density probing applications. We can produce them using different materials and fine pitch geometries.
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5 KN Grips For Fine Wire
These grips offer a suitable method for tensile testing soft metal wires, ropes, and strings, all with a diameter of 3 mm (0.12 in) or less. The upper and lower grips include an articulated joint to maintain alignment of the specimen with the testing axis during testing.
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Ultra Fine Flexible Microprobe
IT-24P
IT-24P Ultra Fine Flexible Microprobe - Tiny, 24 gauge polyurethane coated wire with polyester insulated thermocouple bead. For research applications to measure temperature in animal brains and other tissue. Fairly fragile, but very fast responding.
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NanoLattice Pitch Standard (NLSM)
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
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Flexible Pitch GND Fixture Clamps
GF-A
High Power Pulse Instruments GmbH
*Compatible with GGB picoprobe model 10 replacement probe tips*<1 ns rise time (200 ps possible with 5 mm GND wire length)*Custom selectable GND wire length 5-15 mm*Gold-coated spring-steel clamp with micro-machined groove for locking of the clamps on the probe tip*High conductivity and low inductance copper HF litz wire with 200 x Ø 0.02 mm strands*Easy to use clamping*Tungsten carbide probe needle with 1 inch length, 15° taper and 7.5 µm tip radius
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96 Pin 1.27mm Pitch Micro-D Connector Blocks for Pickering
The connector blocks below are suitable to use with Pickering cards and modules that utilize a 96-pin micro-D connector.
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K100 Series For 2.54mm [100mil] Pitch
Total length of spring probes for high force is longer than standard type and is more optimized to use for testing PCB. We have 1mm to 2.54mm pitch and you can choose not only tip type but also spring force for each pitch. This makes it possible for you to choose spring probe suits the best for your use.
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Cable, 25 Pin 1.27mm Pitch Micro-D, Female to Female, 2m
A025CFR-025CFR-5A200
This 2m long female to female 25-Pin Micro-D Cable Assembly is constructed from 18/0.1 (26 AWG) copper wiring with PVC insulation and screening to minimise crosstalk. Screwlocks are provided to secure the connectors to their associated products.
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0.35° Accuracy Roll & Pitch Surface Dynamic Motion Sensor
DMS-535RP
The DMS range of motion sensors is designed specifically for the motion measurement needs of the marine industry. Whether it is achieving IHO standard survey from any size of vessel, or providing safety critical monitoring of offshore platforms, large vessels, helicopter landing decks, cranes and positioning systems, the DMS provides accurate motion measurement in all sea conditions. Incorporating an enhanced external velocity and heading aiding algorithm for improved accuracy during dynamic manoeuvres, the solid state angular rate sensors offer reliability in the highest performing vertical reference units ever produced by TSS.