Showing results: 676 - 690 of 724 items found.
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781426-01 -
NI
Up to 14 GHz PXI Vector Signal Analyzer - The PXIe‑5665 is a modular, three‑stage superheterodyne analyzer that you can use as either a spectrum analyzer or vector signal analyzer. It supports RF list mode, which increases multiband measurement speed with fast and deterministic changes in configuration. In addition, you can use the PXIe‑5665 with the Modulation Toolkit to analyze custom and standard modulation formats. The PXIe‑5665 can perform measurements for a broad range of communications standards such as GSM, EDGE, WCDMA, WiMAX, LTE, Bluetooth, WLAN, DVB‑C/H/T, ATSC, and MediaFLO. Because all measurements are software defined, you can reconfigure the measurements using standard-specific toolkits. With these toolkits, the PXIe‑5665 provides a low-cost solution to high-performance RF measurements.
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781774-01 -
NI
Up to 14 GHz PXI Vector Signal Analyzer - The PXIe‑5665 is a modular, three‑stage superheterodyne analyzer that you can use as either a spectrum analyzer or vector signal analyzer. It supports RF list mode, which increases multiband measurement speed with fast and deterministic changes in configuration. In addition, you can use the PXIe‑5665 with the Modulation Toolkit to analyze custom and standard modulation formats. The PXIe‑5665 can perform measurements for a broad range of communications standards such as GSM, EDGE, WCDMA, WiMAX, LTE, Bluetooth, WLAN, DVB‑C/H/T, ATSC, and MediaFLO. Because all measurements are software defined, you can reconfigure the measurements using standard-specific toolkits. With these toolkits, the PXIe‑5665 provides a low-cost solution to high-performance RF measurements.
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781774-03 -
NI
Up to 14 GHz PXI Vector Signal Analyzer - The PXIe‑5665 is a modular, three‑stage superheterodyne analyzer that you can use as either a spectrum analyzer or vector signal analyzer. It supports RF list mode, which increases multiband measurement speed with fast and deterministic changes in configuration. In addition, you can use the PXIe‑5665 with the Modulation Toolkit to analyze custom and standard modulation formats. The PXIe‑5665 can perform measurements for a broad range of communications standards such as GSM, EDGE, WCDMA, WiMAX, LTE, Bluetooth, WLAN, DVB‑C/H/T, ATSC, and MediaFLO. Because all measurements are software defined, you can reconfigure the measurements using standard-specific toolkits. With these toolkits, the PXIe‑5665 provides a low-cost solution to high-performance RF measurements.
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781426-03 -
NI
Up to 14 GHz PXI Vector Signal Analyzer - The PXIe‑5665 is a modular, three‑stage superheterodyne analyzer that you can use as either a spectrum analyzer or vector signal analyzer. It supports RF list mode, which increases multiband measurement speed with fast and deterministic changes in configuration. In addition, you can use the PXIe‑5665 with the Modulation Toolkit to analyze custom and standard modulation formats. The PXIe‑5665 can perform measurements for a broad range of communications standards such as GSM, EDGE, WCDMA, WiMAX, LTE, Bluetooth, WLAN, DVB‑C/H/T, ATSC, and MediaFLO. Because all measurements are software defined, you can reconfigure the measurements using standard-specific toolkits. With these toolkits, the PXIe‑5665 provides a low-cost solution to high-performance RF measurements.
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781774-02 -
NI
Up to 14 GHz PXI Vector Signal Analyzer - The PXIe‑5665 is a modular, three‑stage superheterodyne analyzer that you can use as either a spectrum analyzer or vector signal analyzer. It supports RF list mode, which increases multiband measurement speed with fast and deterministic changes in configuration. In addition, you can use the PXIe‑5665 with the Modulation Toolkit to analyze custom and standard modulation formats. The PXIe‑5665 can perform measurements for a broad range of communications standards such as GSM, EDGE, WCDMA, WiMAX, LTE, Bluetooth, WLAN, DVB‑C/H/T, ATSC, and MediaFLO. Because all measurements are software defined, you can reconfigure the measurements using standard-specific toolkits. With these toolkits, the PXIe‑5665 provides a low-cost solution to high-performance RF measurements.
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781426-02 -
NI
Up to 14 GHz PXI Vector Signal Analyzer - The PXIe‑5665 is a modular, three‑stage superheterodyne analyzer that you can use as either a spectrum analyzer or vector signal analyzer. It supports RF list mode, which increases multiband measurement speed with fast and deterministic changes in configuration. In addition, you can use the PXIe‑5665 with the Modulation Toolkit to analyze custom and standard modulation formats. The PXIe‑5665 can perform measurements for a broad range of communications standards such as GSM, EDGE, WCDMA, WiMAX, LTE, Bluetooth, WLAN, DVB‑C/H/T, ATSC, and MediaFLO. Because all measurements are software defined, you can reconfigure the measurements using standard-specific toolkits. With these toolkits, the PXIe‑5665 provides a low-cost solution to high-performance RF measurements.
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781775-03 -
NI
Up to 14 GHz PXI Vector Signal Analyzer - The PXIe‑5665 is a modular, three‑stage superheterodyne analyzer that you can use as either a spectrum analyzer or vector signal analyzer. It supports RF list mode, which increases multiband measurement speed with fast and deterministic changes in configuration. In addition, you can use the PXIe‑5665 with the Modulation Toolkit to analyze custom and standard modulation formats. The PXIe‑5665 can perform measurements for a broad range of communications standards such as GSM, EDGE, WCDMA, WiMAX, LTE, Bluetooth, WLAN, DVB‑C/H/T, ATSC, and MediaFLO. Because all measurements are software defined, you can reconfigure the measurements using standard-specific toolkits. With these toolkits, the PXIe‑5665 provides a low-cost solution to high-performance RF measurements.
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781775-01 -
NI
Up to 14 GHz PXI Vector Signal Analyzer - The PXIe‑5665 is a modular, three‑stage superheterodyne analyzer that you can use as either a spectrum analyzer or vector signal analyzer. It supports RF list mode, which increases multiband measurement speed with fast and deterministic changes in configuration. In addition, you can use the PXIe‑5665 with the Modulation Toolkit to analyze custom and standard modulation formats. The PXIe‑5665 can perform measurements for a broad range of communications standards such as GSM, EDGE, WCDMA, WiMAX, LTE, Bluetooth, WLAN, DVB‑C/H/T, ATSC, and MediaFLO. Because all measurements are software defined, you can reconfigure the measurements using standard-specific toolkits. With these toolkits, the PXIe‑5665 provides a low-cost solution to high-performance RF measurements.
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64211 -
Parallax Inc.
Parallax speeds the process of Propeller 2 development through our partnership with MikroE, who has created a family of 850+ Clicks for most I/O functions you may envision. For each of the Click boards stocked by Parallax, you will find a documented Spin 2 code example on our Propeller GitHub Object Exchange. Connect your Click boards to the Propeller 2 Evaluation Board or P2-EC Edge Breakout Breadboard using the #64008 P2 to MikroBus Click Adapter. Proximity 3 click is an intelligent proximity and light sensing device, which features the VCNL4200 sensor from Vishay – high sensitivity long distance proximity sensor (PS), ambient light sensor (ALS) and 940 nm IRED, all in one small package.
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MT302-201 -
ALTINEX, Inc.
As the foundation for as many as 20 Digital MultiTasker cards, this innovative enclosure has several cutting edge cards available for use with the system. These include the MT312-104 Control Card, the MT305-804 8×4 HDMI® Matrix Switcher, the MT315-101 HDMI Over Anywire™ Transmit Card, the MT315-102 HDMI Over Anywire Receive Card, the MT317-101 HDMI Over Fiber Optic Transmit Card, the MT317-102 HDMI Over Fiber Optic Receive Card, and the MT310-104 16×16 Stereo Audio Matrix Switcher. Additional options for the system include the MT399-101 Enclosure Rack-Mount Bracket Kit and the MT399-105 5-Piece Multitasker Card Slot Blanks for creating a clean, streamlined appearance over unused / open slots. Click the image below for your own copy of the MultiTasker Design Guide as a PDF.
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ADXL372 -
Analog Devices Inc.
The ADXL372 is an ultralow power, 3-axis, ±200 g MEMS accelerometer that consumes 22 μA at a 3200 Hz output data rate (ODR). The ADXL372 does not power cycle its front end to achieve its low power operation and therefore does not run the risk of aliasing the output of the sensor. In addition to its ultralow power consumption, the ADXL372 has many features to enable impact detection while providing system level power reduction. The device includes a deep multimode output first in, first out (FIFO), several activity detection modes, and a method for capturing only the peak acceleration of over threshold events. Applications: Impact and shock detection. Asset health assessment. Portable Internet of Things (IoT) edge nodes. Concussion and head trauma detection.
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LAP GmbH
For the manufacturing of a perfect cold strip, many factors are crucial. Our measuring frames specifically check the thickness-related quality parameters of the strip steel or steel sheet. Free of radioactive radiation, laser sensors are used in the cold strip areas that do not require protection measures with laser class 2, or only low precautions when using laser class 3B sensors. The installation of our measurement systems is quick and uncomplicated for our customers. The CALIX is integrated into the line with its C-shaped frame across the material flow. Our solutions with and without traversing determine all important parameters for quality assurance, including strip thickness, edge thickness, wedge or cambering, and measure the complete thickness profile. Thus, you have full process control in the current production.
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GX5296 -
Marvin Test Solutions, Inc.
The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Teledyne Defense Electronics
Teledyne Advanced Electronic Solutions assembles and tests a variety of complex circuit card assemblies (CCAs) using leading edge, advanced technology assembly automation. We specialize in low-volume, high-mix assembly of highly complex CCAs.- RF, analog, high-speed and digital circuits on rigid-flex and Cu core substrates- Typical lot sizes from 3 to 300 pieces- 4 high speed, flexible SMT lines- Production processes for components from 0201 chips to large grid-array components and connectors- 100% solder paste, automated optical, and x-ray inspection- Forced air convection reflow with inert atmosphere option- Special processes for RF assemblies (filters, shields, etc)- BGA underfill, conformal coating, etc.- Selective and wave solder pin-thru-hole processes- CCA and component bonding processes
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Dongguan Amade Instruments Technology Co., Ltd
Packaging testing equipment are intended to measure the resistance of corrugated containers to various crushes and burst at given conditions, applied to bursting strength test, ring crush test, edge crush test, flat crush test, pin adhesion test, puncture strength test, bending stiffness test, corrugating medium test, compression test, damp-proof test etc. As corrugated boxes assume the important responsibility of loading and protecting goods playing an inevitable role in modern logistics, so the properties of corrugated boards have to be mastered by manufacturers and users prior to use. The physical performances which are measured by a series of testings are core factors for judging the quality of packaging boxes. Paper testing items mainly include quantification, thickness measurement, whiteness, smoothness,breaking elongation, burst resistance, folding resistance, stiffness, tearability, degree of sizing, etc.
