Showing results: 1951 - 1965 of 2046 items found.
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KLA-Tencor Corp
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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PXI-C1553 -
Avionics Interface Technologies
Dual redundant, single, dual or quad stream configurationsSoftware selectable Transformer, Direct, and Bus Stub Coupling Modes - Concurrent Bus Controller, 31 Remote Terminals, & Bus monitor operation - Full error injection and detection - Multi-level triggers for capture and filtering - Ten high voltage (up from 30V) programmable DIO lines - IRIG-B time code encoder/decoder with free-wheeling mode - Time Synchronization to PXI 10MHz reference clock - Real-Time recording and physical bus replay - PXI trigger generation on 1553 bus events - Initiate BC, RT Simulation and BM Capture on PXI Triggers - Application interface supporting C, C++, C#, and .NET development - Device driver support: Windows, Linux, LabVIEW Real-Time (others on request) - Compatible with AIT’s Flight Simulyzer GUI Bus Analyzer Software
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Celadon
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe card as well as DUT probing solutions. These custom cryogenic probe card solutions are widely used to test Space, Military, Medical and Quantum Computing products. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovative custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cableout designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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Celadon
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe cards as well as DUT probing solutions. These Cryogenic probe cards have all the benefits of Celadon’s Crash Resistant™ probe technology but with the ability to probe as cold as humanly possible. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovate custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cable-out designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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Omnicor
Ethernet switches, routers and gateways have their distinct purposes and it is important to test their performance well. During R&D and DVT products are usually tested on L2/L7 while in production basic L2/L3 tests are usually sufficient. For those who follow testing methodology RFC 2544 and RFC 2889 are also available.IP traffic packet generators/analyzers for 10/100/1000 Mbps, gigabit and 10 gigabit with PoE options are the most important test instruments to ensure Ethernet switch or router product quality is verified. Gigabit TAP analyzers, media convertors, production test software suites and Ethernet cable emulators are additional tools used in conjunction with stream generators to help ensure fast development cycle and high quality. Our IP performance test systems are economic and known worldwide for excellence in quality and service support.
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Eurofins E&E
Electromagnetic Compatibility testing analyzes the ability of electronic devices to operate as anticipated when in proximity to other electronic devices or in the presence of electromagnetic disturbances that interfere with their intended operation.We help you ensure EMC compliance and attain the needed EMC certifications by assisting you in maximizing accuracy, reducing testing cycles, and getting your products to market faster — from design conception to end-product completion even against the most demanding electromagnetic regulations.We understand that time to market is everything which is why our global testing capabilities and custom testing solutions utilize the latest technology and automation software, helping you meet demanding time-to-market needs. Our streamlined testing process brings your product from development to end use efficiently in accordance with government, regulatory, military, or industry standards based on your compliance needs.
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eXpress -
Spherea Technology Ltd.
eXpress is a software suite of diagnostic engineering tools that encompass diagnostics, testability, prognostics and systems engineering and represents the result of over 30 years of software development. It provides enormous short and long-term cost-savings, realized throughout the entire life cycle.eXpress provides the capability to capture design information from a systems perspective and may be used to seamlessly combine disparate sources of data. eXpress couples the Systems Engineering, Reliability, Testability, Maintainability and Diagnostic/Testability disciplines. This provides a true end-to-end solution, which can begin as early as concept exploration, and carries through run-time deployment and beyond.eXpress' approach handles system-level design capture and analysis across large engineering teams. By providing the most in-depth Testability and Diagnostics assessment capabilities on the market today, eXpress can tackle tasks ranging from the smallest embedded component to entire aircraft systems.
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Spectris plc
Test and Measurement supplies test, measurement, and analysis equipment and software for product design optimisation, manufacturing control, and environmental monitoring systems. Markets are principally the aerospace, automotive, consumer electronics and oil and gas industries. For customers in the automotive and aerospace industries, our products and applications help them to design and test new products whilst reducing time to market. In consumer electronics, our equipment and software enable customers to refine the performance and accuracy of their products and to test them in the production process. In the environmental monitoring market, the desire for higher standards of community comfort is creating additional demand. In the oil and gas industries, our products and solutions optimise the recovery rates of oil and gas reservoirs and support the development of cost-efficient extraction processes in a safe manner that minimises the impact on the local environment. The operating companies in this segment are Brüel & Kjær Sound & Vibration, ESG Solutions, HBM and Millbrook.
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LF1 set -
Langer EMV-Technik GmbH
The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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SystematIC
On basis of extensive experience in Hall Sensor readout and related intellectual property SystematIC has developed several customer-specific and application-specific Hall IC products.For isolated current sensing at DC and low frequencies the Hall sensing technique is a valuable technique. It allows full integration of the sensor elements (Hall plates) and the readout electronics in standard CMOS technology. SystematIC succeeded in combining the full integration with good accuracy parameters and high bandwidth. With a compact die containing magnetic field sensors and programmable readout amplifiers SystematIC contributed to the customers fully integrated current sensor product.SystematIC did the full integrated circuit development and supported in wafer and final test programming. As a result of cooperation with our customer a current-sensor-IC with low offset, high gain accuracy, low TC's and excellent isolation properties has been released for production.
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AEP Technology
AEP Technology offers several ASTM, ISO DIN compliant friction and wear tester models optimized for various applications. The modular design allows it to run on one platform (rotary, linear reciprocating, linear, block-to-ring, etc.), and to ensure high repeatability, during the testing process our downward force friction and wear testing machine controls several standard tests. High-end electronics, multi-core 64-bit processor that allows it to use multiple in-situ sensing technologies (recording friction, wear, displacement, force, volume, temperature, humidity, position, speed, etc., during testing) with high resolution Embedded powerful platform imaging head (sections of atomic force microscopes, etc.). Ease of use and robust unique design make AEP Technology a powerful tool in friction and wear testing machine development and production environments.
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AVR And Raspberry Pi® -
Proteus
Proteus Visual Designer combines world class Proteus VSM simulation with an easy to use flowchart editor and a gallery of virtual hardware to provide a truly integrated and intuitive development environment for Arduino and Raspberry Pi. The peripheral gallery makes hardware design easy. Simply add a shield or sensor from the gallery and Visual Designer will automatically place the correct circuitry on the Proteus schematic for you and add some simple methods to Visual Designer that allow you to control the hardware. The software is then designed as a flowchart so you can easily drag and drop these methods along with decisions, delays and assignments to drive the hardware. Compile and simulate at the press of the button, making use of our renowned simulation and debugging technology to watch your design come to life on screen.Finally, transfer to the physical hardware with a single mouse click and see it working first time in the real world.
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ACMAS Technologies Pvt. Ltd.
Xenon is one of the noble gases and is a major component of arc lamps and flash lamp and it also has its importance in general anesthetics. One of the major applications of xenon lamp is that it can be used in research applications to simulate the sunlight.Weiber walk in xenon lamp chamber uses xenon lamp to simulate the whole sunlight spectrum that can produce many destructive effects on the products. This simulation environment provided in the chamber is used to test the resistance of various manufactured products towards these destructive conditions. This chamber is used for quality control, product development and scientific researches and many more. With a variety of models and options, you can customize your chamber to fit your testing needs. With walk in option you have a facility to test your product in bulk quantity and even for the products which are larger in size. This chamber also known as Uv Test Chamber and Xenon Lamp Weather Resistance Test Chamber.
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68G6 -
North Atlantic Industries
The 68G6 is a SOSA™-Aligned 3U OpenVPX board that can be configured with up to three NAI smart I/O and communication function modules. In addition to the standard expansion plane (EP) PCIe and control plane (CP) Ethernet control interfaces, the 68G6 facilitates convenient external access to supported NAI PCIe function modules through its 1 x1 PCIe interface, enabling seamless expansion of host SBC functions for enhanced project solutions, while also offering external access to supported NAI FMx modules via a SATA II interface. The 68G6 is on NAI’s certifiable product development roadmap supporting DO-178C and DO-254 design assurance guidelines for safety-critical applications. Ideally suited for rugged Mil-Aero applications, the 68G6 delivers off-the-shelf solutions that accelerate deployment of SWaP-optimized systems in air, land and sea applications.
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9420 -
NH Research, Inc.
AC Source with HiVAR Technology Ideal for ATE use in Aviation, Aerospace, Defense, Military/Mission Critical Testing, Manufacturing Test, Research & Development & More! The Model 9420 AC Power Source redefines selection of an AC Source by addressing how to compensate for reactive power from capacitive or inductive elements in the load. Often overlooked when sizing a source, reactive power negates some portion of nominal VA power in order to arrive at true power (Watts) that does the real work. Traditional AC sources list only their VA rating leaving it up to the user to figure out how much true power remains after reactive power reductions. In many cases that reduction is substantial and then requires selecting a much larger VA-rated source than originally anticipated. The increased cost and size penalties are often considerable.
