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Showing results: 1831 - 1845 of 2049 items found.

  • Image Sensor/Fingerprint-on-Display Testing

    Enlitech

    Enli Tech provides the most advanced optical and non-destructive inspection technology, which can de-convolute the digital images back to the analog properties, such as quantum efficiency, spectral response, system gain K, Dynamic Range (DR), PRNU, DRNU, Linearity Error LE, and Chief-Ray-Angle (CRA). The testing solution can be applied to CCD and CMOS image sensors in aerospace, defense, and scientific camera field. Image sensor packages that can be tested by Enli Tech’s systems include bare wafers, dies, chips, or camera modules. Our image sensor testers can help users reduce the sensor-modules or camera-modules development time and RD budget.

  • HDMI Phy and Protocol Aux Channel Analyzer Module

    Teledyne LeCroy quantumdata

    The Teledyne LeCroy quantumdata 980 HDMI Phy & Protocol Aux Channel Analyzer module supports compliance testing of the HDMI DDC bus and HDMI 2.0 CEC testing (partial support only). The module’s CEC compliance tests enable you to identify compliance failures early in the development cycle. The solution is ideal for pre-testing and self-testing (where permitted) your HDMI 2.0 device. The module also supports compliance testing of the HDMI DDC bus voltage and timing parameters in accordance with HDMI 1.4b. Future releases of the module will support functional tests and compliance tests on other HDMI auxiliary channels.

  • Multi-Component Gas Analyzer

    VA-5000 / VA-5000WM Series - HORIBA, Ltd.

    The Multi-Component Gas Analyzer VA-5000 Series is an all-round analyzer that satisfies measurement needs as required for environmental monitoring, energy development support, quality controls, and continuous emission monitoring, etc. The VA-5000 Analyzer can be configured with up to 4 detector modules within a single case. Many combinations of detector modules with a wide selection of ranges allows this series of analyzers to be used for a variety of applications. The VS-5000 Sample Gas Conditioning Systems are designed to support the VA-5000 Analyzers by proving the optimal sample conditions for measurement. We also have wall mounted type analyzer (VA-5000WM) that enables to install in a limitted installation space.

  • Caibration Equipment For Lab Use

    Ponovo Power Co., Ltd.

    In the field of high-power semiconductor testing, PONOVO has launched a smart test platform with high-speed high-frequency, high-voltage, high-current power sources, combined with high-speed, high-precision high-voltage, high-current analog acquisition technology and high-speed digital processing control system. The platform can complete the testing of dynamic parameter parameters, static parameters, thermal parameters and mechanical parameters, and power life parameter of various types of high-power semiconductor devices, modules, and chips, which could meet different testing requirements. It is the universal testing platform for automated testing for different application purpose, such as the research and development testing, engineering acceptance test, factory acceptance test, etc.

  • Flexible Test Environments and Integration Services for your Integrated System Tests

    TESTERLYZER® Frame 4.0 - Ruetz Technologies GmbH

    The TESTERLYZER® Frame 4.0 provides a flexible test environment for vehicle control units in an integrated system and is easily accessible from all sides. Customized adaption is provided for panel designs, control unit holders and cable adapters. A TESTERLYZER® I-Box 4.0 is a standard component of the TESTERLYZER® Frame 4.0 and provides the basis for a wide range of structures for the testing of control units, software and services relating to vehicles in research and development. The backbone of the I-Box provides all signals required with distribution to standardized adapter sockets and interfaces. The modular assembly structure ensures swift and safe setting up of the required test environment.

  • Ionic Contamination Test Systems

    CM+ Series - Gen3 Systems Limited

    The Contaminometer (CM+ Series) system was originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s. Historically, International Standard IPC-J-STD001 stated that assemblies be cleaned to a value of <1.5µg/cm2 of NaCl equivalence. However, the new design is linked to the introduction of the new process control metric introduced by Gen3 Systems: Process Ionic Contamination Testing. The CM+ Series measure the amount of ionic contamination in accordance with all existing test methods, often referred to as ROSE testing, as well as the new PICT test.

  • Copper Diffusion TestSystems

    Materials Development Corporation

    MDC announces the addition of software and hardware for copper diffusion studies to its CSM/Win suite of semiconductor test systems and software.  This new CSM/Win feature plays an important part in the development of processes and materials for the next advance in integrated circuit technology that employscopper as a conductor.  Special Current-Voltage Bias-Temperature Stress (IV-BTS) software can measure the degradation of insulator quality due to copper diffusion.Multiple test sites can be stressed with a constant voltage while the current through each site is measured and recorded.  The Current-Voltage Bias-Temperature Stress test supplements conventional MOS C-V measurements and Triangular Voltage Measurements (TVS) that are also employed in copper diffusion studies.

  • STANAG3910/EFEX Test And Simulation Module for Standard Ethernet

    ANET3910 - AIM GmbH

    STANAG3910/EFEX Test and Simulation module for Standard Ethernet. The ANET embedded Linux Operating System gives the unique capability to run the optional PBA.pro Engine right in the box. Another option is the ANET-ADK onboard software development kit where users create run-time applications (e.g. STANAG3910/EFEX to Ethernet Converter, STANAG3910/EFEX to Ethernet Gateway) to execute right in the box. For wireless applications, an ANET compatible USB Wifi dongle is optionally available.The capability to execute Python scripts in the ANET is a standard feature. For applications with multiple ANET devices AIM offers the ADock ANET Docking Station to host up to 4 ANET modules.

  • Sensors And Components

    Ion Science, Ltd.

    ION Science is a leading manufacturer of VOC gas sensors, with PID sensor technology trusted by major gas detection manufacturers globally for accurate detection of volatile organic compounds (VOCs). To the ever-growing sensing portfolio, ION Science offers Development Boards and Kits specially designed to offer OEMs at a simple, low-cost with means of integrating MiniPID sensors into existing systems and applications. Due to tightening legislation and the growing global focus on air quality, worker safety and environmental emissions are driving the requirements for a new generation of measurement and monitoring systems. The multi-award-winning Disc Pumps are now available and distributed by ION Science.

  • Suspension Component Test Systems

    MB Dynamics Inc.

    Acoustic quality, vehicle dynamics and stability, and driver comfort play an increasingly important role in the development of new chassis and suspension systems – both passive and active. Noises in suspension components can cause customer dissatisfaction and lead to high warranty costs and are difficult to diagnose especially on historically-used, noisy hydraulic test rigs. The MB Suspension Component Test Rig (SCTR) enables dynamic simulation of real road excitations and synthesized waveforms, performing industry-standard Force-Velocity and Force-Displacement tests and low speed friction tests, and assessing other NVH and structure-borne noises for comprehensive performance characterization and sound and vibration analyses on a wide variety of chassis components.

  • At-Speed Non-Intrusive Functional Testing

    ScanExpress JET - Corelis, Inc.

    Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.

  • Sensor IP

    SystematIC

    In our world of smart appliances sensing the physical aspects of our environment is key: we like to know (measure) temperature, sunlight, position, distance, pressure and so on, and use that information in our (control) systems. For that data to be processed the (analog) physical signals need to be converted to electrical signals: the function of the sensor. An integrated (smart) sensor can do this and when realized in semiconductor technology can be mass-produced at low-cost. With our analog IC design expertise we have been involved in the development of many sensor readout circuits. But we also take care of integration of the related signal processing such as high resolution AD conversion and the digital interfacing.

  • Test Cell Measurement

    Accurate Technologies Inc.

    Accurate Technologies’ long history in powertrain development provided insight into the day-to-day issues that were occurring during engine testing at a time when electronic devices were being introduced to monitor performance instead of traditional mechanical means. Outside of the harsh physical environments, devices used in these applications need to perform difficult high-voltage signal conditioning and high-speed synchronous pulse processing. ATI developed unique products that satisfy specific test cell or dynamometer challenges. These highly accurate products measure engine timing (IGTM) or speed (SmartTach) in convenient ways to provide information that otherwise may not be available.

  • Video Analyzer / Generator for HDMI 8K Testing

    M41h - Teledyne LeCroy quantumdata

    The Teledyne LeCroy quantumdata M41h 48G Video Analyzer/Generator for HDMI 8K Testing is a compact versatile test instrument offering entry level functional testing that can be extended through software licenses to a full compliance tester with sophisticated analysis and diagnostic capabilities. The M41h enables design and test engineers to validate their products for interoperability and reliability for the HDMI 2.1 video interface. The M41h is a flexible test instrument that can be upgraded from a functional tester for sources and sinks to a sophisticated analyzer and, if desired, can test full standards compliance, enabling developers to pre-test or self-test independently, reducing delays and costs during the product development cycle.

  • CANBUS OBD ECU Simlator

    mOByDic1610 - Ozen Elektronik Inc.

    The CAN BUS multiple ECU simulator provides a professional OBD development platform which allow the user to test the OBD functionality on the table. Simulates 4 differnt ECUs. reading VIN and suspended DTC is possible . Using 5 potensiometer , 5 live data can be changed and some fixed PID values are provided. Pressing DTC bouton the trouble codes are generated and the MIL LED is ON. Service 4 commands clear the DTCs and the MIL LED. Connection to the tester is provided via a J1962 female OBD port . it needs an external 12 V power supply . More information you can get from the corresponding chipset datasheet.

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